Embodiments of the present invention relate to mask-less fabrication processes for thin film batteries.
Thin film batteries (TFBs) have been projected to dominate the micro-energy applications space. TFBs are known to exhibit several advantages over conventional battery technology such as superior form factors, cycle life, power capability and safety.
The electrolyte layer (e.g. LiPON) is the most challenging TFB device layer to deposit using a shadow mask because of the deposition process—radio frequency physical vapor deposition (RF PVD) magnetron sputtering—and also due to the electrolyte layer typically being one of the thickest device layers and typically requiring a longer deposition time than other layers. The electrolyte layer is typically deposited with a physical shadow mask in place. The substrate temperature increases with deposition time and RF power, which can result in warping of the shadow mask and loss of mask alignment. In an attempt to combat these problems, the shadow mask is typically fixed in place with Kapton® tape, and/or in some instances by magnets on the backside of the substrate. However, the additional backside magnets are found to interact with the RF PVD process, which dramatically reduces TFB yields. Furthermore, Kapton® tape generally cannot withstand the higher temperature and higher power processes that are required for higher deposition rates (and thus higher throughput), therefore using Kapton® necessitates the use of lower deposition rate processes to avoid shadow mask alignment shifts and inaccurate pattern transfer. In conclusion, there is a need for an alternative to shadow masks for patterning the electrolyte layer during physical vapor deposition (PVD).
The concepts and methods of the present invention are intended to permit reduction of the cost and complexity of thin film battery (TFB) high volume manufacturing (HVM) by eliminating the use of shadow masks for electrolyte deposition. Furthermore, embodiments of the present invention may improve the manufacturability of TFBs on large area substrates at high volume and throughput. This may significantly reduce the cost for broad market applicability as well as provide yield improvements and improved pattern alignment accuracy. According to aspects of the invention, these and other advantages are achieved with the use of a selective laser ablation process, where the laser patterning process removes the blanket electrolyte layer in selected areas while leaving the current collector layers below intact.
According to some embodiments of the present invention, a method of fabricating a thin film battery may include blanket deposition of an electrolyte layer followed by selective laser patterning of the electrolyte layer. Some or all of the other device layers may be formed using shadow masks. Process flows are described which integrate the selective laser patterning of the electrolyte layer into the flow of deposition steps using shadow masks.
Furthermore, this invention describes tools for carrying out the above method.
These and other aspects and features of the present invention will become apparent to those ordinarily skilled in the art upon review of the following description of specific embodiments of the invention in conjunction with the accompanying figures, wherein:
Embodiments of the present invention will now be described in detail with reference to the drawings, which are provided as illustrative examples of the invention so as to enable those skilled in the art to practice the invention. The drawings provided herein include representations of devices and device process flows which are not drawn to scale. Notably, the figures and examples below are not meant to limit the scope of the present invention to a single embodiment, but other embodiments are possible by way of interchange of some or all of the described or illustrated elements. Moreover, where certain elements of the present invention can be partially or fully implemented using known components, only those portions of such known components that are necessary for an understanding of the present invention will be described, and detailed descriptions of other portions of such known components will be omitted so as not to obscure the invention. In the present specification, an embodiment showing a singular component should not be considered limiting; rather, the invention is intended to encompass other embodiments including a plurality of the same component, and vice-versa, unless explicitly stated otherwise herein. Moreover, applicants do not intend for any term in the specification or claims to be ascribed an uncommon or special meaning unless explicitly set forth as such. Further, the present invention encompasses present and future known equivalents to the known components referred to herein by way of illustration.
In conventional TFB manufacturing all layers are patterned using in situ shadow masks which are fixed to the device substrate by backside magnets and/or Kapton® tape. According to some embodiments of the present invention, instead of an in situ patterned deposition, blanket deposition without any shadow mask followed by laser patterning is proposed for the electrolyte layer in the TFB fabrication process (see
The present invention utilizes blanket deposition of electrolyte (LiPON) and ex situ laser patterning of electrolyte to improve yields, throughputs and pattern accuracy. The laser light is incident on the electrolyte from above—from the TFB stack side of the substrate. Blanket electrolyte (LiPON) deposition eliminates use of the electrolyte shadow mask, which relaxes constraints on the RF PVD process caused by potential thermal expansion induced alignment shifts of the mask and deleterious interactions between magnets for holding down the mask and the RF PVD deposition process. Blanket deposition of electrolyte (LiPON) therefore increases manufacturing throughputs, alignment accuracy and yields. For the following reasons, it is a practical, low cost process to completely ablate the LiPON from select areas of the CCC and ACC using picosecond (ps) or femtosecond (fs) lasers with little or no effect on the CCC and ACC. First, LiPON has a large absorption depth over the range from UV to IR wavelengths, for example, the absorption depth is approximately 500 nm at 355 nm wavelength. Second, the ACC and CCC generally are metals with very small optical absorption depths, for example, the absorption depth is approximately 14 nm at 355 nm wavelength. Third, the ps or fs laser ablation depth of a material is primarily determined by the optical absorption depth of said material. Fourth, only a very thin top part of the ACC or CCC is affected by the laser ablation, even if excessive laser fluence is used to remove the LiPON layer.
The laser processing and ablation patterns for the electrolyte layer may be designed to form TFBs with identical device structures to those fabricated using electrolyte masks, although more accurate edge placement may provide higher device densities and other design improvements. Higher yield and device density for TFBs over current manufacturing processes are expected for some embodiments of processes of the present invention since using an electrolyte shadow mask in TFB fabrication processes is a likely source of yield killing defects and removing the electrolyte shadow mask may remove these defects. It is also expected that some embodiments of processes of the present invention will provide better patterning accuracy of the electrolyte layer than for the equivalent shadow mask process, which will allow higher TFB device densities on a substrate. Further, some embodiments of the present invention are expected to relax constraints on the RF PVD process (restricted to lower power and temperature in the equivalent shadow mask deposition process) caused by potential thermal expansion induced alignment issues of the electrolyte shadow mask, and increase throughputs due to a significant deposition rate increase of the electrolyte.
Conventional laser scribe or projection technology may be used for the selective laser patterning processes of the present invention. A single laser may be used which generally is a laser with picosecond or femtosecond pulse width (selectivity controlled by laser fluence/dose and different optical response). The scanning methods of the laser scribe system may be stage movement, beam movement by Galvanometers, or both. The laser spot size of the laser scribe system may be adjusted from 100 microns to 1 cm. The laser area size of laser projection system may be 1 mm2 or larger. Furthermore, other laser types and configurations may be used.
Bonding pads may be deposited using shadow masks after: patterned cathode layer deposition and anneal; laser patterning of electrolyte layer; patterned anode layer deposition; or patterned barrier layer deposition. Furthermore, if the cathode anneal is a low temperature process, then in addition to the list above, the bonding pads may also be deposited using shadow masks after the patterned ACC layer deposition.
Further variations on the above TFB fabrication process may include: (1) combining the patterned CCC and ACC deposition steps into a single step; and (2) moving the step of depositing the patterned ACC to after either the patterned cathode deposition and anneal or after the laser patterning of the blanket electrolyte deposition. Note that the options for patterned bonding pad deposition remain the same for these variations.
The metal current collectors, both on the cathode and anode side, need to function as protective barriers to the shuttling lithium ions. In addition, the anode current collector needs to function as a barrier to the oxidants (H2O, O2, N2, etc.) from the ambient. Therefore, the material or materials of choice should have minimal reaction or miscibility in contact with lithium in “both directions”—i.e., the Li moving into the metallic current collector to form a solid solution and vice versa. In addition, the material choice for the metallic current collector should have low reactivity and diffusivity to those oxidants. Based on published binary phase diagrams, some potential candidates for the first requirements are Ag, Al, Au, Ca, Cu, Co, Sn, Pd, Zn and Pt. With some materials, the thermal budget may need to be managed to ensure there is no reaction/diffusion between the metallic layers. If a single metal element is incapable of meeting both requirements, then alloys may be considered. Also, if a single layer is incapable of meeting both requirements, then dual (multiple) layers may be used. Furthermore, in addition an adhesion layer may be used in combination with a layer of one of the aforementioned refractory and non-oxidizing layers—for example, a Ti adhesion layer in combination with Au. The current collectors may be deposited by (pulsed) DC sputtering of metal targets (approximately 300 nm) to form the layers (e.g., metals such as Cu, Ag, Pd, Pt and Au, metal alloys, metalloids or carbon black). Furthermore, there are other options for forming the protective barriers to the shuttling lithium ions, such as dielectric layers, etc.
RF sputtering has been the traditional method for depositing the cathode layer 340 (e.g., LiCoO2) and electrolyte layer 350 (e.g., Li3PO4 in N2), which are both insulators (more so for the electrolyte). However, pulsed DC has also been used for LiCoO2 deposition. Furthermore, other deposition techniques may be used.
The Li layer 360 can be formed using an evaporation or sputtering process. The Li layer will generally be a Li alloy, where the Li is alloyed with a metal such as tin or a semiconductor such as silicon, for example. The Li layer can be about 3 μm thick (as appropriate for the cathode and capacity balancing) and the encapsulation layer 370 can be 3 μm or thicker. The encapsulation layer can be a multilayer of parylene and metal and/or dielectric. Note that, between the formation of the Li layer 360 and the encapsulation layer 370, the part must be kept in an inert environment, such as argon gas; however, after blanket encapsulation layer deposition the requirement for an inert environment will be relaxed.
In order to illustrate the movement of a substrate through an in-line fabrication system such as shown in
Furthermore, a laser patterning tool may be a stand-alone tool.
A first apparatus for forming thin film batteries according to embodiments of the present invention may comprise: a first system for in situ patterned depositing of a patterned cathode current collector, a patterned anode current collector and a patterned cathode, and for blanket depositing of an electrolyte layer; and a second system for laser patterning of the electrolyte layer to reveal a portion of the cathode current collector and a portion of the anode current collector; and a third system for in situ patterned depositing of a patterned anode and a patterned encapsulation layer; wherein the in situ patterned depositing includes depositing through shadow masks. The first system and the third system may be the same system. The first system and the second system may be the same system. The first system, second system and the third system may be the same system. Furthermore, the third system may also be configured for in situ patterned deposition of bonding pads, or a fourth system may be provided for bonding pad deposition. The systems may be cluster tools, in-line tools, stand-alone tools, or a combination of one or more of the aforesaid tools. The systems may include some tools which are common to one or more of the other systems.
A second apparatus for forming thin film batteries according to embodiments of the present invention may comprise: a first system for in situ patterned depositing of a patterned cathode current collector and a patterned cathode, and for blanket depositing of an electrolyte layer; and a second system for laser patterning of the electrolyte layer to reveal a portion of the cathode current collector; and a third system for in situ patterned depositing of a patterned anode current collector, a patterned anode and a patterned encapsulation layer; wherein the in situ patterned depositing includes depositing through shadow masks. The first system and the third system may be the same system. The first system and the second system may be the same system. The first system, second system and the third system may be the same system. Furthermore, the third system may also be configured for in situ patterned deposition of bonding pads, or a fourth system may be provided for bonding pad deposition. The systems may be cluster tools, in-line tools, stand-alone tools, or a combination of one or more of the aforesaid tools. The systems may include some tools which are common to one or more of the other systems.
Although the present invention has been described herein with reference to TFBs, the teaching and principles of the present invention may also be applied to improved methods for fabricating other electrochemical devices, including electrochromic devices.
Although the present invention has been particularly described with reference to certain embodiments thereof, it should be readily apparent to those of ordinary skill in the art that changes and modifications in the form and details may be made without departing from the spirit and scope of the invention.
This application claims the benefit of U.S. Provisional Application No. 61/498,490 filed Jun. 17, 2011, incorporated herein by reference in its entirety.
This invention was made with U.S. Government support under Contract No. W15P7T-10-C-H604 awarded by the U.S. Department of Defense. The Government has certain rights in the invention.
Number | Date | Country | |
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61498490 | Jun 2011 | US |