TREA

Trace analysis instrument

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Information

  • Patent Grant
  • D834433
  • Patent Number
    D834,433
  • Date Filed
    Tuesday, June 13, 2017
    7 years ago
  • Date Issued
    Tuesday, November 27, 2018
    5 years ago
  • US Classifications
    Field of Search
    • US
    • D10 78
    • D10 81
    • CPC
    • G01N30/72
    • G01N30/02
    • G01N30/7206
    • G01N30/88
    • G01N2030/0095
    • G01N27/16
    • G01N27/18
    • G01N27/185
    • G01N33/0006
    • G01N33/0009-0075
    • G01N1/24
    • G01N1/2205
    • G01N1/2273
    • G01N2001/2276
    • G01N23/10
    • G01N23/223
    • G01N2223/076
    • G01N29/226
    • G01N2223/0763
    • G01N2223/0766
    • G01N21/8483
    • G01N21/84
    • G01N21/77
    • G01N21/78
    • G01N21/94
    • G01N21/01
    • G01N21/6428
    • G01N21/643
    • G01N21/293
    • G01N21/33
    • G01N1/02
    • G01N35/00009
    • G01N35/1095
    • G01N2001/024
    • G01N2001/028
    • G01N2001/022
    • G01N2001/2833
    • G01N2001/007
    • G01N2001/021
    • G01N2021/7786
    • G01N2021/7733
    • G01N33/0057
    • G01N33/227
    • G01N33/22
    • G01N33/0032
    • G01N31/22
    • G01N2201/0221
    • G01D11/24
    • G08B17/10-117
    • H05G1/02
    • H05G1/06
    • H05G1/023
    • A61B10/0045
    • A61B10/0051
    • A61B2010/0006
    • A61B2010/0009
    • G06K9/00
  • International Classifications
    • 1004
    • Term of Grant
      15Years
Information
Abstract
Description


FIG. 1 is a perspective view of the trace analysis instrument embodying our new design.



FIG. 2 is a side elevational view thereof.



FIG. 3 is a side elevational view thereof.



FIG. 4 is a top plan view thereof.



FIG. 5 is a bottom plan view thereof.



FIG. 6 is a side elevational view thereof.



FIG. 7 is a side elevational view thereof; and,



FIG. 8 is another perspective view thereof.


The broken lines in the figures are shown for the purpose of illustrating portions of the trace analysis instrument and/or environmental matter and form no part of the claimed design.


Claims
  • The ornamental design for a trace analysis instrument, as shown and described.
US Referenced Citations (5)
Number Name Date Kind
D330171 Wilson Oct 1992 S
D333441 Greene Feb 1993 S
5525799 Andresen et al. Jun 1996 A
6351983 Haas et al. Mar 2002 B1
20110088490 Ludwick Apr 2011 A1
Foreign Referenced Citations (1)
Number Date Country
WO 2011052863 May 2011 WO
Non-Patent Literature Citations (2)
Entry
Inficon, “HAPSITE ER”, Product Brochure 2009, 4 pages.
PerkinElmer, “Torion T-9”, Product Brochure 2015-2016, 8 pages.