The present invention generally relates to pressure and temperature transducers and more particularly to small diameter transducers for use in measuring high pressures at high temperatures.
Apparatus for measuring high pressures at low temperatures are known in the prior art. For example, measurement of pressure at temperatures below 350° F. is frequently accomplished with pressure transducers that position a large diameter diaphragm such that the diaphragm is exposed to the pressure to be measured. Such diaphragms are typically thin or corrugated and have relatively large diameters. The diaphragms are often rigidly clamped or welded in place at the perimeter of the diaphragm such that the central portion of the diaphragm is compliant and deflects proportionally in response to pressure. The amount of deflection of the diaphragm may be used to calculate the pressure.
Pressure measurement techniques for relatively moderate temperatures are well known in the prior art. As the range of pressure to be measured in a family of transducers increases, it may be necessary to increase the thickness of the diaphragm to assure all of the transducers in the family deflect approximately the same amount when each transducer in the family is subjected to 100% of its pressure rating. All other factors being equal, the stress on the diaphragm increases as the thickness of the diaphragm increases or as the diameter of the diaphragm decreases. So, for a given diameter of transducer, there exists a maximum pressure rating above which the stresses in the diaphragm exceed the allowable stresses for the material, and the transducer begins to yield and deform plastically. Yielding and plastic deformation occur because the bending stresses around the circumference of the diaphragm exceeds the elastic strength of the diaphragm material. Such yielding and plastic deformation results in a loss of repeatability and stability of the transducer.
Pressure measurement at high temperatures creates additional problems due to the melting point of some materials used in conventional transducers and because the strength of most materials diminish at high temperatures. Therefore, there exists a need for novel arrangements of apparatus and novel methods for using such apparatus to measure relatively high pressures at high temperatures with small diameter transducers.
Apparatus, methods, and other embodiments associated with measuring environmental parameters are described herein. In one embodiment, a transducer comprises a tube, an elongated member, a first reflective surface, a second reflective surface, and an optical fiber. The tube has a first end and a second end, and the elongated member also has a first end and a second end, with the first end of the elongated member secured to the tube. The second reflective surface is secured to the second end of said elongated member, and the first reflective surface is spaced apart from the second reflective surface and secured to the second end of the tube. The optical fiber is positioned to direct light towards the first and second reflective surfaces and to collect the reflected light from these two surfaces. As the pressure exerted on the transducer changes, the gap between the two reflective surfaces changes. The two reflective surfaces comprise an interferometric sensor, and the light reflected from these two surfaces may be interrogated to determine the precise gap between the two surfaces at any pressure. By calibrating the transducer at known pressures and temperatures, one can determine the precise pressure or temperature for any measured gap.
Operation of the invention may be better understood by reference to the following detailed description taken in connection with the following illustrations, wherein:
While the invention is described herein with reference to a number of embodiments and uses, it should be clear that the invention should not be limited to such embodiments or uses. The description of the embodiments and uses herein are illustrative only and should not limit the scope of the invention as claimed.
Apparatus for measuring high pressure at high temperatures and methods of using such apparatus may be arranged such that the environmental parameters being measured do not damage the sensing apparatus or cause the sensing apparatus to inaccurately measure the environmental parameter. For example, when measuring high pressures with a transducer, the transducer may be arranged such that forces applied by the high pressure being measured do not damage or otherwise negatively affect the sensing components measuring the pressure. In an embodiment, the components that measure the high pressure do not directly bear the forces applied by the high pressures; however, the components are arranged such that the pressure affects the components, and those effects may be quantified to accurately measure the pressure.
Similarly, when measuring a high temperature with a transducer, the transducer may be arranged such that the temperature does not cause undue stress that may damage or otherwise negatively affect the sensing components that measure the temperature. In an embodiment, a transducer is arranged such that a series of certain components are selected such that the rate of thermal expansion of each of the components is similar, and bonds between such components are not compromised by thermal stresses at high temperatures. In addition, transducers may be arranged such that the transducer may measure a high pressure in an environment that is also subject to high temperature. In an embodiment, the components that measure the high pressure are arranged such that thermal expansion of the components is similar, and bonds between such components are not compromised at high temperatures, thus resulting in accurate measurements of the high pressure.
In an embodiment of a transducer as described herein, the sensing components may include fiber optic sensing components such as, for example, optical fibers, Fabry-Perot interferometric sensors, and the like. Fiber optic sensing components may be well suited for use with transducers as described herein because such components can typically withstand high temperatures and harsh environments and are not generally affected by electromagnetic interference.
An exemplary embodiment of a transducer 10 arranged to measure high pressure is schematically illustrated in
A fluid inlet 22 allows fluid from the surrounding environment to enter the annular cavity 20 and apply pressure to the exterior surface 14 of the tube 12. For example, when a transducer 10 is lowered to the bottom of an oil well, oil flows through the inlet 22 and into the annular cavity 20 surrounding the tube 12 and applies pressure to the exterior 14 of the tube 12 that is equal to the pressure at the bottom of that oil well.
Exemplary components positioned within the interior cavity 16 of the tube 12 include: an elongated member 24, a first reflective surface 26, a second reflective surface 28, and an optical fiber 30. The elongated member 24 may be a pin with an elongated body 32 and a flattened head portion 34. The head 34 of the pin 24 may be secured to a first end 36 of the tube 12 and the body 32 of the pin 24 may extend away from the first end 36 of the tube 12 towards a second and opposing end 38 of the tube 12. The head portion 34 of the pin 24 may be secured to the first end 36 of the tube 12 by welding to promote proper alignment and positioning of the elongated body 32 of the pin 24 with respect to the tube 12. Although the pin 24 is described and shown herein as welded to the tube 12, it will be readily understood by those skilled in the art that any number of securing methods may be used to secure a pin to a tube. For example, a pin may be secured to the tube with adhesive bonds, a pin may be integrally formed with the tube, a pin may be mechanically fastened to the tube, the cavity may be machined using electrostatic discharge machining methods, and the like.
The second reflective surface 28 may be incorporated or secured to a component 52, such as a support member or substrate, secured to an end 40 of the pin 24 located closest to the second end 38 of the tube 12. The substrate 52 may be positioned such that the second reflective surface 28 is perpendicular or nearly perpendicular to the length of the elongated body 32 of the pin 24. In an alternative embodiment, the second reflective surface 28 may be incorporated into the end 40 of the pin 24. For example, the end 40 of the pin 24 may be polished to form a reflective surface, or a reflective surface may be otherwise formed in the end 40 of the pin 24 during fabrication.
The first reflective surface 26 may be directly or indirectly secured to the second end 38 of the tube 12 and positioned to be parallel and spaced apart from the second reflective surface 28. Such positioning of the reflective surfaces 26, 28 forms a gap 42 between the reflective surfaces 26, 28. In one embodiment, an annular ring 44, which may be made of glass, metal, or other such material, is secured to the second end 38 of the tube 12. A glass window 46 with a tapered surface 54 and an opposing non-tapered surface is secured to the annular ring 44. The non-tapered surface may be polished or coated such that it forms the first reflective surface 26. Once the non-tapered surface is polished or coated, the window 46 may be secured to the annular ring 44. In such an arrangement, the first reflective surface 26 may be positioned parallel to and spaced apart from the second reflective surface 28 to form the gap 42 between the surfaces 26, 28. The optical fiber 30 may be positioned proximate to the first reflective surface 26. The optical fiber 30 may be arranged to direct light at the first and second reflective surfaces 26, 28 and receive light that is reflected back by the first and second reflective surfaces 26, 28. Such a gap 42 may form a Fabry-Perot interferometer sensor.
The first reflective surface 26 is partially reflective. That is the surface 26 will reflect a portion of the light directed to it by the optical fiber 30 and allow a portion of the light to pass through the surface 26 and on to the second reflective surface 28. The portion of the light reflected by the first reflective surface 26 is reflected back into the optical fiber 30. The second reflective surface 28 may be arranged to be 100% reflective or partially reflective. The light reflected from the second reflective surface 28 is reflected back through the first reflective surface 26 and into the optical fiber 30. The light reflected from the reflective surfaces 26, 28 and received by the optical fiber 30 may be measured by computerized equipment 48 to quantitatively determine the value or length of the gap 42. The computerized equipment 48 may be positioned relatively near the transducer 10 or may be positioned at great distance from the transducer 10. For example, a transducer 10 located in an oil well may relay optical signals several thousand feet to computerized equipment 48 located on the earth's surface above the oil well. As will be described below, by measuring the value of the gap 42, the value of the pressure in the reservoir exerted on the transducer 10 may be determined. Apparatus and methods of arranging reflective surfaces and measurement of light reflected from those reflective surfaces are described in U.S. patent application Ser. No. 11/377,050 to Lopushansky et al., and entitled “High Intensity Fabry-Perot Sensor,” which is hereby incorporated by reference in its entirety.
In the embodiment illustrated in
The tube 12 and cap 50 may be generally cylindrical. The transducer 10 may be arranged such that when high pressures are applied to the external surfaces 14 of the tube 12 and cap 50, the physical dimensions of the tube 12 change in response to the high pressure. These dimensional changes to the tube 12 are relayed to the pin 24 to cause the end 40 of the pin 24 securing the second reflective surface 28 to move and thus change the value or length of the gap 42 between the reflective surfaces 26, 28. For example, if a transducer 10 is located at the bottom of an oil well, oil may flow into the annular cavity 20 through the inlet 22 and apply a hydrostatic pressure to the external surface 14 of the tube 12. Such pressure subjects the cylindrical tube 12 to radial compressive forces substantially equal to the surface area of the tube 12 multiplied by the pressure. In addition, this hydrostatic pressure also applies a force on the cap 50, which translates the pressure as a longitudinal compressive force on the tube 12 that is substantially equal to the cross-sectional area of the tube 12 multiplied by the pressure. The cavity 51 in the cap 50 positioned proximate to the location of the pin's 24 attachment to the tube 12 further insures that any force on the cap 50 is translated as a longitudinal compressive force on the tube 12.
The radial forces generally result in an elongation of the tube 12 in proportion with the Poisson ratio for the material of the tube 12. Elongation of the tube 12 generally results in an increase in the gap 42 between the reflective surfaces 26, 28. The elongation of tube 12 causes the second reflective surface 28 secured to the end 40 of the pin 24 to move, because the head portion 34 of the pin 24 is attached to the first end 36 of the tube 12. Furthermore, since the first reflective surface 26 is secured to the second end 38 of the tube 12, it will be understood that the gap 42 between the reflective surfaces 26, 28 increases as the tube 12 elongates. The compressive forces generally result in a compression of the tube 12 in proportion to Young's modulus for the material of the tube 12; therefore, the compressive forces typically cause the gap 42 to decrease. As will be understood, the net change in the length of the tube 12, and therefore the net change of the gap 42, may be either positive or negative depending on the pressure, properties of the material of the tube 12, and general dimensions of the transducer 10. For a given pressure the amount of deflection is a function of the length of the tube and not its diameter. It is therefore possible to design a family of transducers with the same diameter, and that diameter may be relatively small.
As also will be understood, design calculations may be performed to associate any gap length 42 with a pressure. By knowing the material properties of the tube 12—i.e., Poisson ratio and Young's modulus for the material from which the tube 12 is fabricated—and the physical dimensions of the transducer 10—the length, exterior diameter, and interior diameter of the tube 12 and the gap length 42 at an ambient pressure, and the gap at zero pressure—a gap length 42 may be calculated for any pressure applied to the transducer 10.
Such a transducer 10 may be subjected to a high-pressure environment and light may be provided from the optical fiber 30 to the first and second reflective surfaces 26, 28. Two interfering light signals may be reflected back into the optical fiber 30 from the reflective surfaces 26, 28. The interfering light signals may be channeled through the optical fiber 30 to the computerized equipment 48, where the interfering signals may be analyzed to calculate the actual gap length 42. Once the gap length 42 is calculated, that length 42 may be translated into a value for the pressure being exerted on the transducer 10 based on prior calibration data or by using the design calculations.
In one embodiment, a transducer that is 1.5 inches long and made of a high strength alloy, such as Inconel alloy 718 (Inconel-718), deflects about 10 micrometers for an applied pressure of 20,000 pounds per square inch (“psi”). Such deflections may be measured to within 0.01% providing precise measurements of gaps and applied pressure from the light reflected by reflective surfaces 26, 28 of the Fabry-Perot interferometer sensor.
Optionally heat-treating the material from which the transducer 10 is fabricated may improve the stability of the transducer 10. For example, heat-treating a transducer 10 may reduce long-term drift of a transducer 10 subjected to high pressures for an extended period of time. In the embodiment of a transducer 10 fabricated from Inconel-718, the transducer 10 may be solution annealed after welding and age hardened to form a fine grain structure with high strength properties. Such an arrangement may withstand stress of 180,000 psi. Even in the solution annealed stage, Inconel-718 transducer 10 may withstand stress of 150,000 psi.
In an embodiment, the transducer 10 may be fabricated from an alloy or a glass such as, for example, Inconel-718 alloy, Hastelloy, borosilicate glass, or leaded glass. Indeed, the transducer 10 may be fabricated from any number of materials and should not be deemed as limited to any specific material or combination of materials.
In another embodiment, the transducer 10 illustrated in
In another embodiment, a portion of a transducer 10 is schematically illustrated in
As shown in
A reflective dielectric coating may be applied to the surface of the tapered window 46 nearest the pin 24 to form the first reflective surface 26. A reflective dielectric coating may also be applied to the polished glass surface of the substrate 52 bonded to the pin 24 to form the second reflective surface 28. For long-range, single mode applications, a highly reflective coating, i.e., 85% reflectance, may be utilized. For short-range, multimode applications a less reflective coating, i.e., 35% may be utilized. The tapered window 46 may be fabricated from Schott D-263 glass, leaded glass, or borosilicate glass. As shown in
In the embodiment illustrated in
As described in U.S. patent application Ser. No. 11/377,050, a ball lens 56 may be positioned at the end of the optical fiber 30. The ball lens 56 may be used to deliver light to the reflective surfaces 26, 28 by collimating the light directed to those surfaces 26, 28. The ball lens 56 may be fused to the end of the optical fiber 30 or may be a separate component aligned with the optical fiber 30. A ball lens 56 may be fused to the end of the optical fiber 30 by heating the optical fiber 30 to its melting point, where surface tension produces a sphere of transparent silica, which forms the ball lens 56 upon cooling. Such a heating and cooling process inherently centers the ball lens 56 on the longitudinal axis of the optical fiber 30. In one embodiment, the diameter of the ball lens 56 is approximately 340 micrometers.
As described in U.S. patent application Ser. No. 11/377,050, a ball and socket assembly 58 may be used to better align the optical fiber 30 and the ball lens 56. A ferrule 60 is positioned within the ball and socket assembly 58 and holds the optical fiber 30 such that the ball 62 may be rotated to align the optical fiber 30 as desired. The ball 62 may also be slid laterally to position the ball lens 56 relative to the tapered window 46. In another embodiment, alignment of the optical fiber 30 may be accomplished by polishing the end of the structure that supports the ball lens 56 at an angle that assures the light beam is perpendicular to the first and second reflective surfaces 26, 28.
Alternatively, the transducer 10 may function without the getters 70 if the Fabry-Perot gap 42 is vented to atmospheric pressure and the transducer 10 is designed for measuring gage pressure. In such an embodiment, any hydrogen that diffuses into the transducer 10 will escape into the atmosphere and will not affect the length of the gap.
In another embodiment, the pressure inlet 22 may be positioned adjacent to the end cap 50 as shown in
The pressure transducer 10 may also be affected by thermal sensitivity and may require a temperature measurement or thermal correction to ensure precise and accurate measurements. For example, a temperature sensor may be inserted behind the ball lens 56 to accurately measure the temperature of the transducer 10. The signal processor may thus be corrected for known thermal sensitivity of the pressure sensor.
The invention has been described above and, obviously, modifications and alternations will occur to others upon a reading and understanding of this specification. The claims as follows are intended to include all modifications and alterations insofar as they come within the scope of the claims or the equivalent thereof.
This application claims priority from U.S. Provisional Patent Application Ser. No. 60/897,093 entitled “PRESSURE TRANSDUCER FOR USE AT HIGH PRESSURES” filed on Jan. 24, 2007, which is hereby incorporated by reference in its entirety.
Number | Name | Date | Kind |
---|---|---|---|
1432149 | Bellingham | Oct 1922 | A |
3923400 | Hardy | Dec 1975 | A |
4210029 | Porter | Jul 1980 | A |
4329058 | James et al. | May 1982 | A |
4393714 | Schmidt | Jul 1983 | A |
4418981 | Stowe | Dec 1983 | A |
4428239 | Johnston | Jan 1984 | A |
4572669 | James et al. | Feb 1986 | A |
4576479 | Downs | Mar 1986 | A |
4583228 | Brown et al. | Apr 1986 | A |
4596466 | Ulrich | Jun 1986 | A |
4606638 | Sommargren | Aug 1986 | A |
4628211 | Ruppert | Dec 1986 | A |
4640616 | Michalik | Feb 1987 | A |
4647203 | Jones et al. | Mar 1987 | A |
4648083 | Giallorenzi | Mar 1987 | A |
4668889 | Adams | May 1987 | A |
4678909 | Jackson et al. | Jul 1987 | A |
4682500 | Uda | Jul 1987 | A |
4729654 | Akuta et al. | Mar 1988 | A |
4755668 | Davis | Jul 1988 | A |
4772786 | Langdon | Sep 1988 | A |
4777358 | Nelson | Oct 1988 | A |
4787741 | Udd et al. | Nov 1988 | A |
4806016 | Corpron et al. | Feb 1989 | A |
4844616 | Kulkarni et al. | Jul 1989 | A |
4873989 | Einzig | Oct 1989 | A |
4907035 | Galburt et al. | Mar 1990 | A |
4914666 | Glance | Apr 1990 | A |
4968144 | Thomas et al. | Nov 1990 | A |
4972077 | Willson et al. | Nov 1990 | A |
4995697 | Adamovsky | Feb 1991 | A |
5034603 | Wilson | Jul 1991 | A |
5089696 | Turpin | Feb 1992 | A |
5094534 | Cole et al. | Mar 1992 | A |
5119024 | Popovic | Jun 1992 | A |
5128537 | Halg | Jul 1992 | A |
5128798 | Bowen et al. | Jul 1992 | A |
5148604 | Bantien | Sep 1992 | A |
5177805 | Groger et al. | Jan 1993 | A |
5187546 | Johnston | Feb 1993 | A |
5202939 | Belleville et al. | Apr 1993 | A |
5202969 | Sato | Apr 1993 | A |
5218418 | Layton | Jun 1993 | A |
5218426 | Hall et al. | Jun 1993 | A |
5225888 | Selwyn et al. | Jul 1993 | A |
5239400 | Liu | Aug 1993 | A |
5247597 | Blacha et al. | Sep 1993 | A |
5276501 | McClintock et al. | Jan 1994 | A |
5283625 | Bunn, Jr. | Feb 1994 | A |
5319981 | Mei et al. | Jun 1994 | A |
5351317 | Weber | Sep 1994 | A |
5361130 | Kersey et al. | Nov 1994 | A |
5386729 | Reed et al. | Feb 1995 | A |
5392117 | Belleville et al. | Feb 1995 | A |
5400140 | Johnston | Mar 1995 | A |
5401956 | Dunphy et al. | Mar 1995 | A |
5401958 | Berkcan | Mar 1995 | A |
5420688 | Farah | May 1995 | A |
5444724 | Goto | Aug 1995 | A |
5451772 | Narendran | Sep 1995 | A |
5471428 | Baroni et al. | Nov 1995 | A |
5477323 | Andrews et al. | Dec 1995 | A |
5497233 | Meyer | Mar 1996 | A |
5509023 | Glance et al. | Apr 1996 | A |
5526114 | Eselun | Jun 1996 | A |
5550373 | Cole et al. | Aug 1996 | A |
5557406 | Taylor et al. | Sep 1996 | A |
5559358 | Burns et al. | Sep 1996 | A |
5631736 | Thiel et al. | May 1997 | A |
5641956 | Vengsarkar et al. | Jun 1997 | A |
5646762 | Delavaux et al. | Jul 1997 | A |
5647030 | Jorgenson et al. | Jul 1997 | A |
5657405 | Fujiwara | Aug 1997 | A |
5682237 | Belk | Oct 1997 | A |
5739945 | Tayebati | Apr 1998 | A |
5760391 | Narendran | Jun 1998 | A |
5784507 | Holm-Kennedy et al. | Jul 1998 | A |
5796007 | Panagotopulos et al. | Aug 1998 | A |
5818586 | Lehto et al. | Oct 1998 | A |
5835214 | Cabib et al. | Nov 1998 | A |
5835645 | Jorgenson et al. | Nov 1998 | A |
5847828 | Downs | Dec 1998 | A |
5852498 | Youvan et al. | Dec 1998 | A |
5872628 | Erskine | Feb 1999 | A |
5889590 | Duggal et al. | Mar 1999 | A |
5891747 | Farah | Apr 1999 | A |
5910840 | Furstenau | Jun 1999 | A |
5923030 | Assard et al. | Jul 1999 | A |
5926591 | Labeye et al. | Jul 1999 | A |
5929990 | Hall et al. | Jul 1999 | A |
5949801 | Tayebati | Sep 1999 | A |
5986749 | Wu et al. | Nov 1999 | A |
5999261 | Pressesky et al. | Dec 1999 | A |
5999262 | Dobschal et al. | Dec 1999 | A |
6016702 | Maron | Jan 2000 | A |
6020963 | DiMarzio | Feb 2000 | A |
6057911 | Reich | May 2000 | A |
6064630 | Fersht et al. | May 2000 | A |
6069686 | Wang et al. | May 2000 | A |
6075613 | Schermer et al. | Jun 2000 | A |
6078706 | Nau et al. | Jun 2000 | A |
6088144 | Doerr | Jul 2000 | A |
6115521 | Tran et al. | Sep 2000 | A |
6118534 | Miller | Sep 2000 | A |
6122415 | Blake | Sep 2000 | A |
6137621 | Wu | Oct 2000 | A |
6151114 | Russell | Nov 2000 | A |
6157025 | Katagiri et al. | Dec 2000 | A |
6173091 | Reich | Jan 2001 | B1 |
6178001 | Kim | Jan 2001 | B1 |
6201289 | Jou | Mar 2001 | B1 |
6212306 | Cooper et al. | Apr 2001 | B1 |
6233286 | Wei | May 2001 | B1 |
6272926 | Fehrenbach et al. | Aug 2001 | B1 |
6281976 | Taylor et al. | Aug 2001 | B1 |
6282215 | Zorabedian et al. | Aug 2001 | B1 |
6289143 | Berthold et al. | Sep 2001 | B1 |
6304686 | Yamate et al. | Oct 2001 | B1 |
6328647 | Traudt | Dec 2001 | B1 |
6330255 | Hung | Dec 2001 | B1 |
6331892 | Green | Dec 2001 | B1 |
6396605 | Heflinger et al. | May 2002 | B1 |
6422084 | Fernald et al. | Jul 2002 | B1 |
6425290 | Willcox et al. | Jul 2002 | B2 |
6439055 | Maron et al. | Aug 2002 | B1 |
6469817 | Heflinger | Oct 2002 | B1 |
6486984 | Baney et al. | Nov 2002 | B1 |
6490038 | Jung et al. | Dec 2002 | B1 |
6492636 | Chen et al. | Dec 2002 | B1 |
6492800 | Woods et al. | Dec 2002 | B1 |
6496265 | Duncan et al. | Dec 2002 | B1 |
6501551 | Tearney et al. | Dec 2002 | B1 |
6522797 | Siems et al. | Feb 2003 | B1 |
6538748 | Tucker et al. | Mar 2003 | B1 |
6539136 | Dianov et al. | Mar 2003 | B1 |
6545760 | Froggatt et al. | Apr 2003 | B1 |
6552799 | Wright et al. | Apr 2003 | B1 |
6563986 | Kashihara et al. | May 2003 | B2 |
6581465 | Waters et al. | Jun 2003 | B1 |
6583882 | Scruggs et al. | Jun 2003 | B2 |
6594022 | Watterson et al. | Jul 2003 | B1 |
6597458 | Tayag et al. | Jul 2003 | B2 |
6603560 | Islam | Aug 2003 | B1 |
6608685 | Wood et al. | Aug 2003 | B2 |
6612174 | Sittler et al. | Sep 2003 | B2 |
6621258 | Davidson et al. | Sep 2003 | B2 |
6633593 | Ksendzov et al. | Oct 2003 | B2 |
6636321 | Bohnert | Oct 2003 | B2 |
6643025 | Degertekin et al. | Nov 2003 | B2 |
6647160 | Chi et al. | Nov 2003 | B1 |
6650420 | Houston et al. | Nov 2003 | B2 |
6668105 | Chen et al. | Dec 2003 | B2 |
6668111 | Tapalian et al. | Dec 2003 | B2 |
6668656 | Fernald et al. | Dec 2003 | B2 |
6680472 | Thingbø et al. | Jan 2004 | B1 |
6687011 | Lee et al. | Feb 2004 | B1 |
6687036 | Riza | Feb 2004 | B2 |
6690873 | Bendett et al. | Feb 2004 | B2 |
6714566 | Coldren et al. | Mar 2004 | B1 |
6714700 | Burger et al. | Mar 2004 | B2 |
6717965 | Hopkins, II et al. | Apr 2004 | B2 |
6735224 | Murry et al. | May 2004 | B2 |
6741357 | Wang et al. | May 2004 | B2 |
6747743 | Skinner et al. | Jun 2004 | B2 |
6765194 | Holz et al. | Jul 2004 | B2 |
6771905 | Bortz | Aug 2004 | B1 |
6776049 | Johnson et al. | Aug 2004 | B2 |
6785004 | Kersey et al. | Aug 2004 | B2 |
6791694 | Pezeshki | Sep 2004 | B2 |
6798940 | Lee et al. | Sep 2004 | B2 |
6806961 | Hill | Oct 2004 | B2 |
6820489 | Fernald et al. | Nov 2004 | B2 |
6822979 | Daiber | Nov 2004 | B2 |
6825934 | Baney et al. | Nov 2004 | B2 |
6829073 | Krol et al. | Dec 2004 | B1 |
6829259 | Pontis et al. | Dec 2004 | B2 |
6838660 | Duncan et al. | Jan 2005 | B2 |
6839131 | Kwon | Jan 2005 | B2 |
6842254 | Van Neste et al. | Jan 2005 | B2 |
6879421 | Clark et al. | Apr 2005 | B2 |
6882428 | Baney et al. | Apr 2005 | B2 |
6886365 | Rumpf et al. | May 2005 | B2 |
6886404 | Digonnet et al. | May 2005 | B2 |
6894787 | Youngner et al. | May 2005 | B2 |
6898339 | Shah et al. | May 2005 | B2 |
6900896 | Motamedi et al. | May 2005 | B2 |
6901088 | Li et al. | May 2005 | B2 |
6901176 | Balachandran et al. | May 2005 | B2 |
6904070 | Pontis et al. | Jun 2005 | B2 |
6909548 | Duggan | Jun 2005 | B2 |
6915048 | Kersey et al. | Jul 2005 | B2 |
6917736 | Ersoy | Jul 2005 | B1 |
6921894 | Swierkowski | Jul 2005 | B2 |
6925213 | Boyd et al. | Aug 2005 | B2 |
6940588 | Woodside et al. | Sep 2005 | B2 |
6947218 | Turner, III | Sep 2005 | B2 |
6955085 | Jones et al. | Oct 2005 | B2 |
6963404 | Chang | Nov 2005 | B2 |
6985235 | Bao et al. | Jan 2006 | B2 |
6989906 | Sandercock | Jan 2006 | B2 |
7002697 | Domash et al. | Feb 2006 | B2 |
7009691 | VanWiggeren et al. | Mar 2006 | B2 |
7016047 | May | Mar 2006 | B2 |
7019837 | Waagaard | Mar 2006 | B2 |
7043102 | Okamoto et al. | May 2006 | B2 |
7046349 | Everall et al. | May 2006 | B2 |
7047816 | Jones et al. | May 2006 | B2 |
7065108 | Park et al. | Jun 2006 | B2 |
7139081 | De Groot | Nov 2006 | B2 |
7139295 | Tsai et al. | Nov 2006 | B2 |
7173713 | Xu et al. | Feb 2007 | B2 |
7230959 | Johnson | Jun 2007 | B2 |
7305158 | Jeffers et al. | Dec 2007 | B2 |
7355684 | Jeffers et al. | Apr 2008 | B2 |
7355726 | Jeffers et al. | Apr 2008 | B2 |
7405829 | Shen | Jul 2008 | B2 |
7423762 | Schmidt | Sep 2008 | B2 |
7434472 | Leitko et al. | Oct 2008 | B2 |
7492463 | Lopushansky et al. | Feb 2009 | B2 |
7511823 | Schultz et al. | Mar 2009 | B2 |
20010013934 | Varnham et al. | Aug 2001 | A1 |
20020015155 | Pechstedt et al. | Feb 2002 | A1 |
20020041722 | Johnson et al. | Apr 2002 | A1 |
20020109081 | Tarvin et al. | Aug 2002 | A1 |
20020167730 | Needham et al. | Nov 2002 | A1 |
20020186377 | Kuskovsky et al. | Dec 2002 | A1 |
20030020926 | Miron | Jan 2003 | A1 |
20030025912 | Hui et al. | Feb 2003 | A1 |
20030043697 | Vakoc | Mar 2003 | A1 |
20030081875 | Kochergin et al. | May 2003 | A1 |
20030128917 | Turpin et al. | Jul 2003 | A1 |
20030132375 | Blazo | Jul 2003 | A1 |
20030141440 | Kim et al. | Jul 2003 | A1 |
20030159518 | Sawatari et al. | Aug 2003 | A1 |
20030184867 | Clark | Oct 2003 | A1 |
20040008742 | Chou et al. | Jan 2004 | A1 |
20040013040 | Maas et al. | Jan 2004 | A1 |
20040013356 | Wang et al. | Jan 2004 | A1 |
20040113104 | Maida, Jr. | Jun 2004 | A1 |
20040141184 | Ueki | Jul 2004 | A1 |
20040151216 | Tsai et al. | Aug 2004 | A1 |
20040151438 | Ferguson | Aug 2004 | A1 |
20040196874 | Spiegelberg et al. | Oct 2004 | A1 |
20040202399 | Kochergin et al. | Oct 2004 | A1 |
20050046862 | Melnyk | Mar 2005 | A1 |
20050073690 | Abbink et al. | Apr 2005 | A1 |
20050105098 | Johansen et al. | May 2005 | A1 |
20050213870 | Kersey et al. | Sep 2005 | A1 |
20050218299 | Olsen et al. | Oct 2005 | A1 |
20050231729 | Lopushansky et al. | Oct 2005 | A1 |
20050231730 | Jeffers et al. | Oct 2005 | A1 |
20050237538 | Belleville | Oct 2005 | A1 |
20050241399 | Lopushansky et al. | Nov 2005 | A1 |
20050242096 | Jaghab | Nov 2005 | A1 |
20060034569 | Shih et al. | Feb 2006 | A1 |
20060126070 | Kauppinen | Jun 2006 | A1 |
20060139652 | Berthold | Jun 2006 | A1 |
20060146337 | Hartog | Jul 2006 | A1 |
20060152733 | Waagaard | Jul 2006 | A1 |
20060241889 | Lopushansky et al. | Oct 2006 | A1 |
20060274323 | Gibler et al. | Dec 2006 | A1 |
20070006663 | Zerwekh et al. | Jan 2007 | A1 |
20070064241 | Needham | Mar 2007 | A1 |
20070227252 | Leitko et al. | Oct 2007 | A1 |
20070252998 | Berthold et al. | Nov 2007 | A1 |
20080043245 | Needham | Feb 2008 | A1 |
20080174781 | Berthold et al. | Jul 2008 | A1 |
20080186506 | Lopushansky | Aug 2008 | A1 |
20080297808 | Riza et al. | Dec 2008 | A1 |
20090056447 | Berthold et al. | Mar 2009 | A1 |
20090086214 | Chin | Apr 2009 | A1 |
Number | Date | Country |
---|---|---|
3127333 | Jan 1983 | DE |
3411096 | Jun 1983 | DE |
0397388 | Nov 1990 | EP |
0400939 | Dec 1990 | EP |
0452993 | Oct 1991 | EP |
0549166 | Jun 1993 | EP |
0571107 | Nov 1993 | EP |
0597345 | Nov 1999 | EP |
1586854 | Oct 2005 | EP |
1168971 | Oct 1969 | GB |
Number | Date | Country | |
---|---|---|---|
20080186506 A1 | Aug 2008 | US |
Number | Date | Country | |
---|---|---|---|
60897093 | Jan 2007 | US |