1. Field
The present disclosure relates to a transistor drive circuit, a constant voltage circuit, and a method thereof, and more particularly to a transistor drive circuit, a constant voltage circuit, and a method thereof capable of effectively generating a constant output voltage with a power transistor by using two or more error amplifying circuits.
2. Discussion of the Related-Art
A background related-art constant voltage circuit can be grouped into two types; a power supply circuit having a relatively greater current consumption with improvements in a ripple elimination ratio and load transient response characteristics and another power supply unit having a relatively small current consumption with an inferiority in response characteristics.
An apparatus such as a mobile cellular phone has a regular operation mode which operates with a regular current consumption and a standby mode (e.g., a sleep mode) which does not normally need a relatively high responsivity and consumes a relatively small amount of current. In such an apparatus, the constant voltage circuit has a problem of consuming a wasteful current in a standby mode which does not normally need a relatively high responsivity.
A controller 100 connected to the first error amplifying circuit 104 starts and stops operations of the first error amplifying circuit 104. The controller 100 activates the first error amplifying circuit 104 to initiate an operation in the normal mode. Also, the controller 100 stops the first error amplifying circuit 104 and reduces an operative current of the first error amplifying circuit 104.
In the configuration of
Also, the output voltage Vo may vary if an amplifying ratio is different between the first and second error amplifying circuits 104 and 105.
In view of the foregoing, the present patent specification describes a transistor drive circuit which is capable of effectively driving a power transistor to generate a constant power voltage by using two or more error amplifying circuits. In one example, a transistor drive circuit which drives a power transistor to output a power voltage from an output terminal and to control the power voltage to have a predefined voltage value, includes a reference voltage generator, a power voltage detector, and a plurality of error amplifying circuits. The reference voltage generator is configured to generate a reference voltage. The power voltage detector is configured to detect the power voltage output from the output terminal and to generate a divided voltage in proportion to the power voltage. Each of the plurality of error amplifying circuits is configured to be activated in response to a control signal input thereto to control an operation of the power transistor in a way such as to substantially equalize the divided voltage with the reference voltage. The plurality of error amplifying circuits have different operational characteristics. In such a transistor drive circuit, the power voltage detector is further configured to suitably change a proportionality constant of the divided voltage for each one of the plurality of error amplifying circuits which is selectively activated so as to control the power voltage generated by the power transistor to have the predefined power voltage.
In another example, a transistor drive circuit which drives a power transistor to output a power voltage from an output terminal and to control the power voltage to have a predefined voltage value, includes a reference voltage generator, a power voltage detector, and a plurality of error amplifying circuits. The reference voltage generator is configured to generate a reference voltage. The power voltage detector is configured to detect the power voltage output from the output terminal and to generate a divided voltage in proportion to the power voltage. Each of the plurality of error amplifying circuits is configured to be activated in response to a control signal input thereto to control an operation of the power transistor in a way such as to substantially equalize the divided voltage with the reference voltage. The plurality of error amplifying circuits have different operational characteristics. In such a transistor drive circuit, the reference voltage generator is further configured to suitably change a voltage value of the divided voltage for each one of the plurality of error amplifying circuits which is selectively activated so as to control the power voltage generated by the power transistor to have the predefined power voltage.
In another example, a transistor drive circuit which drives a power transistor to output a power voltage from an output terminal and to control the power voltage to have a predefined voltage value, includes a reference voltage generator, a power voltage detector, and a plurality of error amplifying circuits. The reference voltage generator is configured to generate a reference voltage. The power voltage detector is configured to detect the power voltage output from the output terminal and to generate a divided voltage in proportion to the power voltage. Each of the plurality of error amplifying circuits is configured to be activated in response to a control signal input thereto to control an operation of the power transistor in a way such as to substantially equalize the divided voltage with the reference voltage. The plurality of error amplifying circuits have different operational characteristics. In such a transistor drive circuit, the reference voltage generator is further configured to suitably change a voltage value of the reference voltage for each one of the plurality of error amplifying circuits which is selectively activated so as to control the power voltage generated by the power transistor to have the predefined power voltage.
Further, this patent specification describes a method of driving a power transistor which controls a current output from an input terminal to an output terminal in accordance with a signal input to a control electrode thereof. In one example, the method includes the steps of providing, activating, producing, generating, and controlling. The providing step provides a plurality of error amplifying circuits having different operational characteristics. The activating step activates one of the plurality of error amplifying circuits in response to a control signal input thereto to control an operation of the power transistor such that a voltage at the output terminal becomes a predefined power voltage. The producing step produces a reference voltage to the plurality of error amplifying circuits. The generating step generates a divided voltage in proportion to the voltage at the output terminal by using a proportionality constant in accordance with operational characteristics of each one of the plurality of error amplifying circuits. The controlling step controls the operation of the power transistor to substantially equalize the divided voltage with the reference voltage.
In another example, a method of driving a power transistor which controls a current output from an input terminal to an output terminal in accordance with a signal input to a control electrode thereof, includes the steps of providing, activating, producing, generating, and controlling. The providing step provides a plurality of error amplifying circuits having different operational characteristics. The activating step activates one of the plurality of error amplifying circuits in response to a control signal input thereto to control an operation of the power transistor such that a voltage at the output terminal becomes a predefined power voltage. The producing step produces a reference voltage for one of the plurality of error amplifying circuits which is selectively activated in accordance with the operational characteristics thereof. The generating step generates a divided voltage in proportion to the voltage at the output terminal by using a proportionality constant. The controlling step controls the operation of the power transistor to substantially equalize the divided voltage with the reference voltage.
In another example, a method of driving a power transistor which controls a current output from an input terminal to an output terminal in accordance with a signal input to a control electrode thereof, includes the steps of providing, activating, producing, generating, and controlling. The providing step provides a plurality of error amplifying circuits having different operational characteristics. The activating step activates one of the plurality of error amplifying circuits in response to a control signal input thereto to control an operation of the power transistor such that a voltage at the output terminal becomes a predefined power voltage. The producing step produces a reference voltage for each one of the plurality of error amplifying circuits in accordance with the operational characteristics thereof. The generating step generates a divided voltage in proportion to the voltage at the output terminal by using a proportionality constant. The controlling step controls the operation of the power transistor to substantially equalize the divided voltage with the reference voltage.
Further, this patent specification describes a constant voltage circuit which is capable of effectively generating a constant output voltage with a power transistor by using two or more error amplifying circuits, includes a power transistor, a reference voltage generator, a power voltage detector, and a plurality of error amplifying circuits. The power transistor is configured to output a power voltage from an output terminal and to control the power voltage to have a predefined voltage value. The reference voltage generator is configured to generate a reference voltage. The power voltage detector is configured to detect the power voltage output from the output terminal and to generate a divided voltage in proportion to the power voltage. Each of the plurality of error amplifying circuits is configured to be activated in response to a control signal input thereto to control an operation of the power transistor in a way such as to substantially equalize the divided voltage with the reference voltage. The plurality of error amplifying circuits have different operational characteristics. In such a constant voltage circuit, the power voltage detector is further configured to suitably change a proportionality constant of the divided voltage for each one of the plurality of error amplifying circuits which is selectively activated so as to control the power voltage generated by the power transistor to have the predefined power voltage.
In another example, a constant voltage circuit includes a power transistor, a reference voltage generator, a power voltage detector, and a plurality of error amplifying circuits. The power transistor is configured to output a power voltage from an output terminal and to control the power voltage to have a predefined voltage value. The reference voltage generator is configured to generate a reference voltage. The power voltage detector is configured to detect the power voltage output from the output terminal and to generate a divided voltage in proportion to the power voltage. Each of the plurality of error amplifying circuits is configured to be activated in response to a control signal input thereto to control an operation of the power transistor in a way such as to substantially equalize the divided voltage with the reference voltage. The plurality of error amplifying circuits have different operational characteristics. In such a constant voltage circuit, the reference voltage generator is further configured to suitably change a voltage value of the divided voltage for each one of the plurality of error amplifying circuits which is selectively activated so as to control the power voltage generated by the power transistor to have the predefined power voltage.
In another example, a constant voltage circuit includes a power transistor, a reference voltage generator, a power voltage detector, a plurality of error amplifying circuits. The power transistor is configured to output a power voltage from an output terminal and to control the power voltage to have a predefined voltage value. The reference voltage generator is configured to generate a reference voltage. The power voltage detector is configured to detect the power voltage output from the output terminal and to generate a divided voltage in proportion to the power voltage. Each of the plurality of error amplifying circuits is configured to be activated in response to a control signal input thereto to control an operation of the power transistor in a way such as to substantially equalize the divided voltage with the reference voltage. The plurality of error amplifying circuits having different operational characteristics. In such a constant voltage circuit, the reference voltage generator is further configured to suitably change a voltage value of the reference voltage for each one of the plurality of error amplifying circuits which is selectively activated so as to control the power voltage generated by the power transistor to have the predefined power voltage.
A more complete appreciation of the disclosure and many of the attendant advantages thereof will be readily obtained as the same becomes better understood by reference to the following detailed description when considered in connection with the accompanying drawings, wherein:
In describing preferred embodiments illustrated in the drawings, specific terminology is employed for the sake of clarity. However, the disclosure of this patent specification is not intended to be limited to the specific terminology so selected and it is to be understood that each specific element includes all technical equivalents that operate in a similar manner. Referring now to the drawings, wherein like reference numerals designate identical or corresponding parts throughout the several views, particularly to
As illustrated in
It should be noted that an MOS transistor indicated as an NMOS transistor or a PMOS transistor denotes an enhancement-type MOS transistor, unless otherwise specified.
The transistor drive circuit 2 includes a reference voltage generator 5, an output voltage detector 6, a first error amplifying circuit A1, and a second error amplifying circuit A2. The reference voltage generator 5 is configured to generate a predetermined reference voltage Vref. The output voltage detector 6 is configured to detect the output voltage Vo and to divide it by a specific division ratio to generate a divided voltage Vfb. The first error amplifying circuit A1 has characteristics of faster operations with a relatively large current consumption, and is configured to control the operations of the output transistor M1 in such a way that the divided voltage Vfb becomes substantially equal to the reference voltage Vref. The second error amplifying circuit A2 has characteristics of a relatively low current consumption, and is configured to control the output transistor M1 also in such a way that the divided voltage Vfb becomes substantially equal to the reference voltage Vref.
The transistor drive circuit 2 further includes a switch SW1 and a control circuit 7. The switch SW1 is configured to connect and disconnect an output terminal of the first error amplifying circuit A1 to a gate of the output transistor M1. The control circuit 7 is configured to receive a sleep signal SLP from an external host apparatus (not shown) and to control operations of the first and second error amplifying circuits A1 and A2, the switch SW1, and the output voltage detector 6 in response to the sleep signal SLP.
The output voltage detector 6 includes resistances R1-R4, NMOS transistors M2 and M3, and fuses F1 and F2. Each of the resistances R2-R4 can be adjusted with trimming. The control circuit 7 includes inverters INV1 and INV2.
The output transistor M1 is connected between the input terminal IN and the output terminal OUT, and the resistances R1-R4 are connected in series between the output terminal OUT and a ground. The resistance R2 is connected in parallel to the NMOS transistor M2 and the fuse F1. The resistance R4 is connected in parallel to the NMOS transistor M3 and the fuse F2.
The divided voltage Vfb is output from a connection point between the resistances R2 and R3, and is input to a non-inverted input terminal of each of the first and second error amplifying circuits A1 and A2. The reference voltage Vref output from the reference voltage generator 5 is input to an inverted input terminal of each of the first and second error amplifying circuits A1 and A2. The output transistor M1 has a gate connected to an output terminal of the first error amplifying circuit A1 via the switch SW1, and to an output terminal of the second error amplifying circuit A2.
In the control circuit 7, the inverters INV1 and INV2 are connected in series to each other. The inverter INV1 has an input terminal to receive the sleep signal SLP, and an output terminal connected to a control-signal input terminal of the second error amplifying circuit A2 and an input terminal of the inverter INV2. The inverter INV2 has an output terminal connected to a control signal input terminal of the first error amplifying circuit A1, a control electrode of the switch SW1, and a gate of each of the NMOS transistors M2 and M3. Each of the first and second error amplifying circuits A1 and A2 starts an operation thereof upon receiving a high-leveled signal at the gate and stops the operation so as to reduce a current consumption upon receiving a low-leveled signal.
In the constant voltage circuit 1 having a structure as described above, each of the control signal input terminal of the first error amplifying circuit A1 and the control electrode of the switch SW1 receives a high-leveled signal so that the first error amplifying circuit A1 is turned into an activated state and the switch SW1 is turned on into a conductive state when the sleep signal SLP is a high-leveled signal. At this time, the second error amplifying circuit A2 receives a low-leveled signal at the control signal input terminal and stops its operations so as to cut off the current consumption. As a result, the output terminal of the second error amplifying circuit A2 is turned into a high impedance state. Also, each of the NMOS transistors M2 and M3 is turned on and therefore the output terminal OUT is connected to the ground only via the series resistances R1 and R3, regardless of states of the fuses F1 and F2. That is, the NMOS transistors M2 and M3 are used as switches. In this state, the output voltage Vo can be changed to a predetermined voltage by adjusting the divided voltage Vfb with a trimming of the resistance R3.
When the sleep signal SLP is at a low level, each of the control signal input terminal of the first error amplifying circuit A1 and the control electrode of the switch SW1 receives a low-leveled signal. Therefore, the first error amplifying circuit A1 stops its operation so as to cut off the current consumption. At the same time, each of the switch SW1 and the NMOS transistors M2 and M3 is turned off into a disconnection state. At this time, the second error amplifying circuit A2 receives a high level signal through the control signal input terminal thereof and is therefore in an active state. The resistances R2 and R3 are connected to the fuses F1 and F2, respectively, in parallel. Accordingly, in this condition, the divided voltage Vfb remains same as it is when the sleep signal SLP is at a high level.
If the first and second error amplifying circuits A1 and A2 have different offset voltages from each other, the output voltage Vo may differ by a voltage difference ΔVo between a time when the first error amplifying circuit A1 is activated and a time when the second error amplifying circuit A2 is activated. When a difference between the offset voltages of the first and second error amplifying circuits A1 and A2 is an offset voltage difference ΔVoff, the voltage difference ΔVo can be expressed as ΔVo=ΔVoff*Vo/Vfb.
Based on this relationship, substantially accurate agreement can be made between values of the output voltage Vo when the first and second error amplifying circuits A1 and A2 are activated in the normal mode and the standby mode, respectively. Specifically, when ΔVo is negative, the output voltage Vo is increased to a voltage gained when the first error amplifying circuit A1 is selected, by way of cutting the fuse F1 and trimming the resistance R2. Also, when ΔVo is positive, the output voltage Vo is decreased to a voltage gained when the first error amplifying circuit A1 is selected, by way of cutting the fuse F2 and trimming the resistance R4.
In
Another switch SW2 (see
Referring to
The constant voltage circuit 1a of
In a manner similar to the constant voltage circuit 1 of
The constant voltage circuit 1a of
In the transistor drive circuit 2a, the reference voltage generator 5a generates and outputs the reference voltage Vref, and the output voltage detector 6a detects the output voltage Vo and divides it to generate the divided voltage Vfb.
The reference voltage generator 5a includes a constant voltage generator 11, resistances R11-R14, NMOS transistors M12 and M13, and fuses F11 and F12. The constant voltage generator 11 generates a constant voltage Vs. Each of the resistances R11, R13, and R14 can be adjusted with trimming. The output voltage detector 6a includes resistances R5 and F6.
The resistances R5 and R6 are connected in series between the output terminal OUT and the ground. The divided voltage Vfb is output from a connection point between the resistances R5 and R6. The divided voltage Vfb is input to each of the non-inverted input terminals of the first and second error amplifying circuits A1 and A2.
The resistances R11-R14 are connected in series between an output terminal of the constant voltage generator 11 generating the constant voltage Vs and the ground. The resistance R11 is connected in parallel to the NMOS transistor M12 and the fuse F11, and the resistance R13 is connected in parallel to the NMOS transistor M13 and the fuse F12. The reference voltage Vref is output from a connection point between the resistances R12 and R13, and is input to each of the non-inverted input terminals of the first and second error amplifying circuits A1 and A2. The inverter INV1 outputs a signal to the control signal input terminal. The inverter INV2 outputs a signal to the control signal input terminal of the first error amplifying circuit A1, the control electrode of the switch SW1, and each of the gates of the NMOS transistors M12 and M13.
In the above-described constant voltage circuit 1a, the first error amplifying circuit A1 falls into an active state and the switch SW1 is turned on and becomes conductive upon receiving the sleep signal SLP in a high level. At this time, the second error amplifying circuit A2 is caused to stop its operation so as to cut off the current consumption and makes the output terminal in a high impedance state. Also, each of the NMOS transistors M12 and M13 is turned on and therefore the output terminal of the constant voltage generator 11 generating the reference voltage Vs is connected to the ground only via the series resistances R12 and R14, regardless of states of the fuses F11 and F12. In this state, the output voltage Vo can be changed to a predetermined voltage by an adjustment of the reference voltage Vref with a trimming of the resistance R14.
When the sleep signal SLP is at a low level, each of the control signal input terminal of the first error amplifying circuit A1 and the control electrode of the switch SW1 receives a low-leveled signal. Therefore, the first error amplifying circuit A1 stops its operation so as to cut off the current consumption. At the same time, each of the switch SW1 and the NMOS transistors M2 and M3 is turned off into a disconnection state. At this time, the second error amplifying circuit A2 receives a high level signal through the control signal input terminal thereof and is therefore in an active state. The resistances R11 and R13 are connected to the fuses F11 and F12, respectively, in parallel. Accordingly, in this condition, the reference voltage Vref remains same as it is when the sleep signal SLP is at a high level.
If the first and second error amplifying circuits A1 and A2 have different offset voltages from each other, the output voltage Vo may differ by a voltage difference ΔVo between a time when the first error amplifying circuit A1 is activated and a time when the second error amplifying circuit A2 is activated. However, the output voltage Vo can be adjusted by changing the reference voltage Vref since the output voltage Vo is expressed as Vo=K*Vref, wherein K is a constant.
Based on this relationship, substantially accurate agreement can be made between values of the output voltage Vo when the first and second error amplifying circuits A1 and A2 are activated in the normal mode and the standby mode, respectively. Specifically, when ΔVo is negative, the reference voltage Vref is increased to a voltage gained when the first error amplifying circuit A1 is selected, by way of cutting the fuse F12 and trimming the resistance R13. Also, when ΔVo is positive, the reference voltage Vref is decreased to a voltage gained when the first error amplifying circuit A1 is selected, by way of cutting the fuse F11 and trimming the resistance R11.
Referring to
The constant voltage circuit 1b of
In a manner similar to the constant voltage circuit 1a of
The constant voltage circuit 1b of
In the transistor drive circuit 2b, the reference voltage generator 5b generates and outputs first and second reference voltages Vref1 and Vref2, and the output voltage detector 6a detects the output voltage Vo and divides it to generate the divided voltage Vfb, as described above.
In the transistor drive circuit 2b, the first error amplifying circuit A1 has the characteristics of performing fast operations with a large current consumption, and controls the output transistor M1 such that the divided voltage Vfb is substantially equalized with the first reference voltage Vrefl. Also, the second error amplifying circuit A2 has the characteristics of suppressing a current consumption, and controls the output transistor M1 such that the divided voltage Vfb is substantially equalized with the second reference voltage Vref2.
Connections and functions of the switch SW1, the output voltage detector 6a, and the control circuit 7 are same as those of the constant voltage circuit 1a of
The reference voltage generator 5b includes the constant voltage generator 11, resistances R21-R24, and fuses F21 and F22. The constant voltage generator 11 generates a constant voltage Vs, as described above. Each of the resistances R22 and R23 can be adjusted with trimming.
The resistances R21-R24 are connected in series between an output terminal of the constant voltage generator 11 having the constant voltage Vs and the ground. The resistances R22 and R23 have a connection point therebetween which is connected to the non-inverted input terminal of the first error amplifying circuit A1 to send the first reference voltage Vref1 thereto. The resistances R21 and R22 have a connection point therebetween which is connected via the fuse F21 to the non-inverted input terminal of the second error amplifying circuit A2 to send the second reference voltage Vref2 thereto. Also, the resistances R23 and R24 have a connection point therebetween which is connected via the fuse F22 to the non-inverted input terminal of the second error amplifying circuit A2 to send the second reference voltage Vref2 thereto.
With the above-described structure, the output voltage Vo generated during an operation of the first error amplifying circuit A1 with the sleep signal SLP at a high level may be greater than that generated during an operation of the second error amplifying circuit A2 with the sleep signal SLP at a low level. In this case, the output voltage Vo generated during an operation of the second error amplifying circuit A2 can be increased by increasing the second reference voltage Vref2. Specifically, the second reference voltage Vref2 can be made greater than the first reference voltage Vref1 by cutting off the fuse F22. The first and second reference voltages Vref1 and Vref2 can be adjusted by trimming the resistances R22 and R23.
On the contrary, the output voltage Vo generated during an operation of the first error amplifying circuit A1 with the sleep signal SLP at a high level may be smaller than that generated during an operation of the second error amplifying circuit A2 with the sleep signal SLP at a low level. In this case, the output voltage Vo generated during an operation of the second error amplifying circuit A2 can be decreased by decreasing the second reference voltage Vref2. Specifically, the second reference voltage Vref2 can be made smaller than the first reference voltage Vref1 by cutting off the fuse F21. The first and second reference voltages Vref1 and Vref2 can be adjusted by trimming the resistances R22 and R23.
In this way, the second reference voltage Vref2 can effectively be adjusted to eliminate an error of the output voltage Vo caused due to a difference of an offset voltage or an amplifying ratio between the first and second error amplifying circuits A1 and A2. As a result, the output voltage Vo generated during an operation of the first error amplifying circuit A1 can substantially be equalized with that generated during an operation of the second error amplifying circuit A2.
Referring to
The constant voltage circuit 1c of
As illustrated in
In the reference voltage generator 5c, the PMOS transistors M32 and M33 have sources connected to the input terminal IN and gates connected to each other and to a drain of the PMOS transistor M32. The depression-type NMOS transistor M31 is connected between the drain of the PMOS transistor M32 and the ground, and has a gate connected to the ground. The depression-type NMOS transistor M31 serves as a constant current source.
The NMOS transistor M34 is connected between the drain of the PMOS transistor M33 and the ground, and the drain of the PMOS transistor M33 is connected to a gate of the NMOS transistor M35. The NMOS transistor M35 has a drain connected to the input terminal IN and a source connected to the ground via the resistances R31-R36 in series. The resistances R32-R35 are connected in parallel to the fuses F31-F34, respectively. The fuse F35 is connected between a connection point of the resistances R31 and R32 and the non-inverted input terminal of the second error amplifying circuit A2. The fuse F36 is connected between a connection point of the resistances R35 and R36 and the non-inverted input terminal of the second error amplifying circuit A2. Thus, the second error amplifying circuit A2 is provided with the second reference voltage Vref2 through the non-inverted input terminal thereof. The resistance R33 has a connection point to the resistance R34, a gate of the NMOS transistor M34, and the non-inverted input terminal of the first error amplifying circuit A1. Thus, the first error amplifying circuit A1 is provided with the first reference voltage Vref1 through the non-inverted input terminal thereof.
In the constant voltage circuit 1c having the above-described structure, the gate and the source of the depression-type NMOS transistor M31 are commonly connected to the ground, that is, the gate is provided with a bias of 0 and therefore a drain current of the depression-type NMOS transistor M31 is constant. The drain current of the depression-type NMOS transistor M31 flows becomes a drain current of the NMOS transistor M34 via the current mirror circuit formed by the PMOS transistors M32 and M33. When the constant drain current flows through the NMOS transistor M34, a gate voltage of the NOMS transistor M34 also becomes a constant voltage since the gate voltage is in proportion to the drain current. This constant gate voltage of the NMOS transistor M34 is the first reference voltage Vref1. The first and second reference voltages Vref1 and Vref2 are substantially the same until the fuses F31-F36 are cut off.
With the above-described structure, the output voltage Vo generated during an operation of the first error amplifying circuit A1 with the sleep signal SLP at a high level may be greater than that generated during an operation of the second error amplifying circuit A2 with the sleep signal SLP at a low level. In this case, the output voltage Vo generated during an operation of the second error amplifying circuit A2 can be increased by increasing the second reference voltage Vref2. Specifically, the second reference voltage Vref2 can be made greater than the first reference voltage Vref1 by cutting off the fuse F36 and at least one of the fuses F31 and F32.
On the contrary, the output voltage Vo generated during an operation of the first error amplifying circuit A1 with a high level of the sleep signal SLP may be smaller than that generated during an operation of the second error amplifying circuit A2 with a low level of the sleep signal SLP. In this case, the output voltage Vo generated during an operation of the second error amplifying circuit A2 can be decreased by decreasing the second reference voltage Vref2. Specifically, the second reference voltage Vref2 can be made smaller than the first reference voltage Vref1 by cutting off the fuse F35 and at least one of the fuses F33 and F34.
In this way, the second reference voltage Vref2 can effectively be adjusted to eliminate an error of the output voltage Vo caused due to a difference of an offset voltage or an amplifying ratio between the first and second error amplifying circuits A1 and A2. As a result, the output voltage Vo generated during an operation of the first error amplifying circuit A1 can substantially be equalized with that generated during an operation of the second error amplifying circuit A2.
The above descriptions explain examples of a transistor drive circuit including two error amplifying circuits, i.e., the first and second error amplifying circuits A1 and A2. The technical idea described above, however, can also be applied to a transistor drive circuit including more than two error amplifying circuits.
In addition, the switch SW1 can be eliminated from each of the constant voltage circuits 1a-1c of
Also, in each of the constant voltage circuits 1a-1c of
Furthermore, a resistance with a trimmer used in the above-described examples can be made by a plurality of series connected resistances with parallel connections to a plurality of fuses, as illustrated in
Numerous additional modifications and variations are possible in light of the above teachings. It is therefore to be understood that within the scope of the appended claims, the disclosure of this patent specification may be practiced otherwise than as specifically described herein. For example, elements and/or features of different examples and illustrative embodiments may be combined with each other and/or substituted for each other within the scope of this disclosure and appended claims.
This patent specification is based on Japanese patent application, No. JPAP2005-273560 filed on Sep. 21, 2005 in the Japan Patent Office, the entire contents of which are incorporated by reference herein.
Number | Date | Country | Kind |
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2005-273560 | Sep 2005 | JP | national |