Transistorized high-voltage circuit suitable for initiating a detonator

Information

  • Patent Grant
  • 6389975
  • Patent Number
    6,389,975
  • Date Filed
    Monday, April 24, 2000
    24 years ago
  • Date Issued
    Tuesday, May 21, 2002
    22 years ago
Abstract
Disclosed, in a preferred embodiment, is a switching circuit incorporating a Field Effect Transistor (FET), two series dual-tap gas tube surge arrestors, and high-voltage resistors as part of a high voltage switch of a fireset for initiating an exploding foil initiator (EFI). Until energizing the FET via a firing command, an operating voltage of 1000 V is held off by a combination of the surge arrestors and high-voltage resistors. Upon receipt of a firing signal, a 28 V source is used to energize the FET that, in turn, decreases the voltage across the one surge arrestor connected directly to ground and increases the voltage across the other surge arrestor. Upon reaching the breakdown voltage of the ionizable gas within the second surge arrestor, the gas ionizes, becomes electrically conductive, and dumps the second surge arrestor's voltage across the first surge arrestor. This causes the first surge arrestor to also break down. Both surge arrestors are now conducting. Thus, the 1000 V source is free to energize the remainder of the circuit, discharging a 0.20 μf capacitor through the EFI. The breakdown of both arrestors occurs in nanoseconds, enabling an almost instantaneous initiation signal.
Description




FIELD OF THE INVENTION




A transistorized high-voltage switch. In particular, a preferred embodiment of the present invention replaces conventional spark gap circuits used in a fireset incorporating an exploding foil initiator (EFI).




BACKGROUND




In high voltage switching circuits incorporating an EFI, for example, conduction may be initiated through a dielectric by the complete dielectric breakdown between electrodes separated by the dielectric, e.g., air. Closing a switch allows energy to pass from a high-voltage power supply across the electrodes to the EFI. Switches with high voltage ratings, i.e., kilovolts (kV), are needed to hold off the voltages used with an energy storage capacitor, i.e., 1-3 kV, for a single EFI. When triggered, such switches should produce a pulse having a fast rise time in order to properly initiate the EFI. Typical pulses have stored energies of 0.1-0.6 milli-Joules (mJ), rise times of 30-60 nanoseconds (ns), peak currents of 1-7 kiloamps (kA), and peak powers of 1-15 megawatts (MW).




A typical spark gap device incorporates an ionizable gas in a chamber separating two electrodes. Spark gap devices are usually coupled in parallel with a circuit or device to be used only upon a deliberate initiation, e.g., an EFI. When the electrical potential across the load and across the spark gap reaches the breakdown voltage for the ionizable gas, the gas ionizes, and current flow is established between the electrodes. For applications in which spark gap switches have been used in over voltage and over current protection circuits, this breakdown shunts the high potential around the circuit or device being protected. For applications in which the intent is to deliver a high voltage that has been “held off” an initiator such as an EFI, the current is used to discharge a capacitor, thus delivering the necessary initiation current to the EFI.




Spark gap devices have been used to switch currents to other devices, as known from U.S. Pat. No. 3,275,891 issued to Swanson, September 1966. Such triggered spark gaps work well when the switching application requires rapid switch closure, but do not work well when rapid opening of the switch is required, as in the case of an over voltage protection circuit. Triggered spark gaps do not allow rapid and successive application of high voltage because the ionized gas in a triggered spark gap does not de-ionize rapidly. De-ionization is slow because the arc is surrounded by gas that does not allow the arc to cool rapidly. Using an electric field to activate a particular kind of switch is disclosed in U.S. Pat. No. 3,492,532 issued to Fayling, January 1970. An ionized flow path in a spark gap device is used to displace a liquid magnetic and electrically conductive material into a position inside the spark gap device which physically connects the electrodes, thus replacing the ionized gas flow path with a direct connection. A recent application of spark gaps in firesets includes a “microgap” in series with a high-voltage two electrode spark gap as disclosed in U.S. Pat. No. 5,641,935, Electronic Switching for Triggering Firing of Munitions, issued to Hunter et al, Jun. 24, 1997.




Alternatives to conventional spark gap switches have been proposed such as a device that requires moving parts as disclosed in U.S. Pat. No. 5,854,732, High Voltage Arcing Switch Initiated by a Disruption of the Electric Field, issued to Murray, Dec. 29, 1998. Although this switch is capable of handling voltages to 25 kV, it also requires a large package and because of the requirement for moving parts, it does not have an outstanding response time. Another alternative is the electrical safe arm device as disclosed in U.S. Pat. No. 5,436,791, Perforating Gun Using an Electrical Safe Arm Device and a Capacitor Exploding Foil Initiator Device, issued to Turano et al, Jul. 25, 1995 or U.S. Pat. No. 5,444,598, Capacitor Exploding Foil Initiator Device, issued to Aresco, Aug. 22, 1995. Although effective, these devices require complicated circuitry, a high voltage source on the order of 3 kV, and are not capable of outstanding response times.




Although transistors have been used in circuits for firing a detonator, these circuits have generally been low-voltage spark gap circuits, an example of which is U.S. Pat. No. 4,296,688, Electronic Circuit for Firing a Detonator, issued to Orlandi, Oct. 27, 1981. Further, the response time for these circuits is on the order of hundreds of milliseconds. Another example that seeks to avoid the bulk of a typical spark gap circuit is disclosed in U.S. Pat. No. 4,559,875, High Energy Switching Circuit for Initiator Means of the Like and Method Therefor, issued to Marshall, Dec. 24, 1985. This switch is intended for one-time use and consists of a number of junction diodes in series, providing the necessary reverse standoff voltage for a high-voltage source on the order of 3000 V. Yet another recent “one-shot” switch is disclosed in U.S. Pat. No. 5,249,095, Laser Initiated Dielectric Breakdown Switch, issued to Hunter, Sep. 28, 1993, wherein light from a laser source, possibly a laser diode, shines on dielectric material between two electrodes and initiates break down.




A commonly used spark gap switch is the ceramic-bodied, hard-brazed, miniature spark gap, incorporating either a vacuum or an ionizable-gas filled volume. Spark gaps require hermetic sealing, are expensive, have marginal reliability, a short operating life, and require expensive high-voltage trigger circuits. One other switch in use for this application is the explosively initiated shock conduction switch that uses a primary explosive detonator. This switch presents handling problems, producing chemical contamination and possible impact damage to nearby electronics.




Putting a high-voltage transistor in series with a component that has known electrical potential breakdown characteristics provides a simpler, less expensive, more durable and reliable circuit capable of repeated firings with outstanding response times and repeatability.




SUMMARY OF THE INVENTION




A preferred embodiment of the present invention envisions a dual-tube fireset incorporating two gas tube surge arrestors as part of a high voltage switch for switching a voltage on the order of 1000 V. Until a high-voltage Field Effect Transistor (FET) is energized, operating voltage is held off by the series combination of the surge arrestors and high-voltage resistors. Upon energizing the FET via a fire signal enabling a 28 V source, the voltage across the lower surge arrestor decreases and the voltage across the upper surge arrestor increases. Upon reaching the breakdown voltage in the upper surge arrestor, the gas inside the tube ionizes, becomes electrically conductive, and, upon breaking down, dumps its voltage across the lower surge arrestor. This causes the lower surge arrestor to also break down. Since both surge arrestors are now conducting and the 1000 V source is free to energize the circuit, the capacitor is discharged through the EFI. The breakdown of both arrestors occurs in nanoseconds. A high resistance bleed resistor is connected in parallel with the discharged capacitor. It will be used to bleed off the capacitor's charge in the event that the EFI is not to be initiated.




In a preferred embodiment representing a fireset incorporating an EFI, the 28 V source supplies energy for discharging a capacitor into the gate of the FET, initiated by a 5 V firing signal and limited by a resistor in series with the gate of the FET. Switching is enabled in less than 0.1 μsec, with excellent repeatability, durability, and reliability.




Advantages of preferred embodiments of the present invention as compared to switching and controls in existing firesets, in particular firesets employing spark-gap devices, include:




much faster response times, i.e., small delay and rise times for the electrical pulse;




long life over a wide operating temperature range, −54° C. (−65° F.)-88° C. (190° F.);




reduced size, providing inherent advantages for hermetic sealing of the circuit;




fewer and smaller components able to be purchased as COTS items;




reduced system capital costs;




the current to fire the EFI does not transit the FET;




increased operational readiness;




low maintenance costs;




high durability;




increased flexibility;




high reliability;




particularly suitable for modification and upgrade; and




readily applied to existing systems.




Embodiments of the present invention can be applied to any situation in which reliable repeated firing of an initiator is desired. Incorporating the invention into a design saves capital as well as operations and maintenance costs.




Preferred embodiments are fully disclosed below, albeit without placing limitations thereon.











BRIEF DESCRIPTION OF DRAWINGS





FIG. 1

is a circuit diagram of a preferred embodiment of the present invention.





FIG. 2

is a representation of a composite of oscilloscope traces that summarizes environmental testing of a preferred embodiment of the present invention for 3296 cycles.





FIG. 3

is a representation of a composite of oscilloscope traces that summarizes jitter performance of a preferred embodiment of the present invention for 3296 cycles.





FIG. 4

displays representative delay and rise times for a preferred embodiment of the present invention.





FIG. 5

is a representative current profile of a preferred embodiment of the present invention firing into a 0.005 ohm (Ω) current-viewing resistor (CVR).





FIG. 6

relates applied current to temperature for a preferred embodiment of the present invention using a 0.5Ω CVR.





FIG. 7

shows the effects of operating temperature on both rise time and delay time for a preferred embodiment of the present invention.











DETAILED DESCRIPTION




Refer to

FIG. 1. A

preferred embodiment of the present invention envisions a dual-tube fireset incorporating two gas tube surge arrestors


101


and


102


as part of a high voltage switch


100


, in turn, part of a fireset (not separately shown). Until a Field Effect Transistor (FET)


104


is energized, operating voltage of a 1000 V source


108


is held off by the series combination of surge arrestors


101


and


102


and high-voltage resistors


103


A,


103


B and


103


C. Upon energizing the FET


104


via a fire signal


107


enabling a 28 V source


106


that discharges a capacitor


111


B, the voltage across the lower surge arrestor


102


decreases and the voltage across the upper surge arrestor


101


increases. Upon reaching the breakdown voltage in the upper surge arrestor


101


, the gas (not separately shown) inside the tube ionizes, becomes electrically conductive, and, upon breaking down, dumps the accumulated voltage across the lower surge arrestor


102


. This causes the lower surge arrestor


102


to break down also. Since both surge arrestors


101


and


102


are now conducting and the 1000 V source


108


is free to energize the circuit, the high-energy storage capacitor


109


is discharged through the EFI


105


. The breakdown of both arrestors


101


and


102


occurs in nanoseconds. A high resistance bleed resistor


110


is connected in parallel with the capacitor


109


. It is used to bleed off the capacitor's charge in the event that the EFI


105


is not to be initiated.




Again referring to

FIG. 1

, the complete operation of a fireset incorporating a preferred embodiment of the present invention can be seen. The 28 V source


106


is initiated by a fire signal


107


through a current limiter (limiting resistor)


107


A. The 28 V source, reduced by the voltage drop across a 5.1 kΩ resistor


110


, activates the RC circuit


111


, represented by a 3.48 kΩ resistor


111


A and a 0.1 μf capacitor


111


B. Once the capacitor


111


B discharges, an activating current is supplied to the FET


104


, as limited by the 100Ω resistor


112


.




Results of tests conducted on a preferred embodiment of the present invention are presented in

FIGS. 2-6

. The circuit was tested for performance, durability, reliability, and environmental robustness over its designed operating range. The test setup (not separately shown) included an oscilloscope for recording the current and trigger pulse, a multimeter having a high-voltage probe, a high-voltage (1000 V) DC power supply, a low-voltage (28 V) DC power supply, and a function generator for providing a periodic 5 V signal indicating a firing command. To provide a “before and after” evaluation, the gas tubes and capacitors were measured initially.




Referring to

FIG. 1

, the EFI


105


was replaced with a CVR (not separately shown) and the remaining circuit elements were then tested. During the multiple cycling of the circuit, the following parameters were measured (as a function of the number of operating cycles experienced) and stored on the oscilloscope: peak current, rise time, delay time, and jitter time. Additionally the same four parameters were measured as a function of operating temperature.




The test procedure was as follows:




a. The circuit


100


was instrumented so that measurements for the above parameters could be taken. A thermocouple and electrical sensors (not separately shown) were attached and the circuit placed into a thermal test chamber (not separately shown). A 0.5ΩCVR simulated the EFI


105


for the temperature tests.




b. The circuit


100


was charged to 1000 V.




c. The circuit


100


was then repeatedly charged and fired at operating temperatures from 54° C.-91° C. in 12° C. increments, with the above measurements taken for each operating cycle.




d. At the end of this string of cycling, the circuit


100


was then fired an additional ten times at 91° C.




e. The circuit


100


was then allowed to cool and the function generator (not separately shown) was connected. The function generator was programmed to fire the circuit


100


automatically at regular intervals of 16 sec. The oscilloscope (not separately shown) was set in “persistence mode” in order to superimpose a picture of the waveform response for each cycle on the display.





FIG. 2

is a plot


200


of voltage versus time. It shows the overlayed traces


201


of peak pulse amplitude versus time for 3296 “shots” under the above test conditions. Note the single curve


202


to the right of the thick overlayed traces


201


. This trace


202


occurred after 3200 operating cycles and was the first sign of degradation.





FIG. 3

is a plot


300


of voltage versus time. It shows the overlayed traces


301


of jitter amplitude versus time for 3296 shots under the above test conditions. Note the traces on the right


302


show operation as the circuit


100


approaches failure while the traces on the left


303


show the result of the gas tubes (surge arrestors)


101


,


102


breaking down after circuit failure.





FIG. 4

is a plot


400


of current versus time. It depicts how individual delay and rise times were measured for individual traces


401


and


402


. Delay time, T


D




403


, is measured from the 50% point of the trigger signal


402


(5 V from the generator) to the 50% point of the current trace


401


. Rise time, T


R




404


, is the time as measured from the 10% and 90% points on the response curve


401


. Both measurements proved the excellent response of the circuit


100


throughout the testing, i.e., less than 0.1 μsec and nominally ˜50 ns.





FIG. 5

is a plot


500


of current versus time. It shows a typical pulse output from the circuit


100


as a trace


501


of amps versus seconds when the circuit


100


is fired into a 0.005ΩCVR


105


as a “worst case” load. The peak current


502


is approximately 1.56 kA with a rise time less than 0.1 μsec. This far exceeds the performance of a typical spark gap circuit.





FIG. 6

is a plot


600


of current versus temperature in ° F. It depicts the performance of the circuit


100


during temperature cycling, a trace


601


depicting amps versus circuit temperature (° F.). The circuit


100


reaches a “steady-state,” i.e., constant current, at about room temperature (75° F.)


602


and maintains this value to above 175° F.


603


.





FIG. 7

plots time versus temperature


700


(° F.) for both the circuit's rise time


701


and its delay time


702


. Both times exhibit only a moderate, almost linear, rise over the circuit's designed operating temperature range.




Results of measuring the gas tubes (surge arrestors)


101


,


102


at completion of testing revealed no change in breakdown voltages. However, both the transistor


104


and its driver (not separately shown) failed.




The above descriptions should not be construed as limiting the scope of the invention but as mere illustrations of preferred embodiments. Although examples discussed initiation of an EFI, any device that a user may need to initiate with a high energy pulse, the switching mechanism requiring a fast response time, may use an embodiment of the present invention. The scope shall be determined by appended claims as interpreted in light of the above specification.



Claims
  • 1. A high-voltage switch, comprising:a high-voltage transistor; a capacitor; a resistor connected in parallel to said capacitor, said resistor and said capacitor forming an RC circuit, an upper gas tube and a lower gas tube, said upper and lower gas tubes operably connected in series to said high-voltage transistor and said RC circuit, said upper and lower gas tubes containing an ionizable gas; a first current limiter, said first current limiter operably connected in parallel with said upper gas tube, a second current limiter, said second current limiter operably connected in parallel with said lower gas tube; and wherein a voltage from said high-voltage transistor causes a serial breakdown of said ionizable gas in said upper and lower gas tubes, said serial breakdown enabling said capacitor to discharge.
  • 2. The switch of claim 1 wherein said high-voltage transistor is a field effect transistor (FET).
  • 3. The switch of claim 1 wherein said upper and lower gas tubes are surge arrestors.
  • 4. The switch of claim 1 wherein said first and second current limiters are high-voltage resistors.
  • 5. A method for providing energy to an initiator, comprising:limiting a current prior to initiation of an electrical event; initiating said electrical event; decreasing a first electrical potential, as a result of such initiation, across one gas tube of a pair of gas tubes, each containing an ionizable gas, said gas tubes being serially connected; increasing a second electrical potential across the second of said pair of gas tubes as a result of decreasing said first electrical potential across said first gas tube, wherein said ionizable gas in said second tube ionizes and becomes conductive, andwherein said second electrical potential increases to a breakdown threshold voltage causing a current to flow into said first gas tube from said second gas tube; andcausing said current to flow through an initiator from a charged capacitor wherein said capacitor is serially connected to said gas tubes and said initiator.
  • 6. The method of claim 5 energizing a field effect transistor (FET) as said electrical event.
  • 7. The method of claim 5 using high-voltage resistors to limit said current.
  • 8. The method of claim 5 using surge arrestors as said gas tubes.
  • 9. The method of claim 5 initiating via a fire signal enabling a low voltage source to discharge a capacitor and permit a current to flow to said FET.
  • 10. The method of claim 9 wherein said low voltage source is operably connected in series to a current limiter and an RC circuit containing said capacitor.
  • 11. A transistorized fireset, comprising:first and second capacitors; a high-voltage transistor; gas tubes, operably connected in series to said transistor and said second capacitor; and first current limiters operably connected in parallel to said gas tubes; a second current limiter operably connected in parallel to said first capacitor, forming an RC circuit; a third current limiter operably connected in parallel to said second capacitor; and a fourth current limiter operably connected in parallel to said RC circuit, wherein, initiation of a firing signal permits a low-voltage source to provide current to discharge said first capacitor, in turn, supplying a first activation current, limited by said fourth current limiter, to said high-voltage transistor, andwherein, serial breakdown of said gas tubes permits a high-voltage source to provide a second current to discharge said second capacitor, in turn, supplying a third current sufficient to activate an initiator.
  • 12. The fireset of claim 11 wherein said high-voltage transistor is a field effect transistor (FET).
  • 13. The fireset of claim 11 wherein said gas tubes are surge arrestors.
  • 14. The fireset of claim 11 wherein said first and third current limiters are high-voltage resistors and said second and fourth current limiters are resistors.
STATEMENT REGARDING FEDERALLY SPONSORED RESEARCH OR DEVELOPMENT

The invention described herein may be manufactured and used by or for the government of the United States of America for governmental purposes without the payment of any royalties thereon or therefor.

US Referenced Citations (17)
Number Name Date Kind
3275891 Swanson Sep 1966 A
3492532 Fayling Jan 1970 A
3967557 Irish, Jr. Jul 1976 A
4296688 Orlandi Oct 1981 A
4510844 Fritz et al. Apr 1985 A
4559875 Marshall Dec 1985 A
4934268 Levin Jun 1990 A
5249095 Hunter Sep 1993 A
5347929 Lerche et al. Sep 1994 A
5436791 Turano et al. Jul 1995 A
5444596 Aresco Aug 1995 A
5465030 Smith Nov 1995 A
5641935 Hunter et al. Jun 1997 A
5731538 O'Brien et al. Mar 1998 A
5854732 Murray Dec 1998 A
6105688 Vaynshteyn et al. Aug 2000 A
6144170 Beland et al. Nov 2000 A