Tunable Film Bulk Acoustic Resonators and Filters with Integrated Biasing Resistors

Abstract

In wireless communications, many radio frequency bands are used. For each frequency band, there are two frequencies one for transmit and the other for receive. As the band widths are small and separation between adjacent bands is also small, many band pass filters with different band pass frequencies are required for each communication unit such as mobile handset. The present invention provides frequency tunable film bulk acoustic resonators (FBAR) with different structures. Thin film biasing resistors are integrated into the FBAR structure for DC biasing and RF isolation. A plurality of the present tunable FBARs are connected to form microwave filters with tunable bandpass frequencies and oscillators with selectable resonating frequencies by varying DC biasing voltages to the resonators.

Description

FIELD OF THE INVENTION

This invention relates to resonators and filters with tunable and tunable and adjustable frequency for communication systems. More specifically, it relates to tunable and adjustable piezoelectric semiconductor resonators and filters with integrated biasing resistor for RF isolation.

BACKGROUND OF THE INVENTION

Communication systems that operate at radio frequencies (RF) require small and low cost bandpass filters. These bandpass filters are used to select transmit or receive signals within a certain band width BW at a specified frequency and to reject signals at frequencies outside the band width. Some examples include global positioning systems GPS, mobile telecommunication systems: Global Systems for Mobile Communications GSM, personal communication service PCS, the Universal Mobile Telecommunications System UMTS, Long Term Evolution Technology LTE, data transfer units: Bluetooth, Wireless Local Area Network WLAN, satellite broadcasting and future traffic control communications. They also include other high frequency systems for high rate data transmission/acquisition in air and space vehicles.

Bandpass filters for RF signal filtering are fabricated using different technologies: (a) ceramic filters based on dielectric resonators, (b) filters using surface acoustic wave resonators (SAW), and (c) filters using thin film bulk acoustic wave resonators (FBAR). For mobile communication systems such as handsets, although the power capability required for the RF filters is only 5 W or less, the size and cost requirements are rather critical. The main properties of piezoelectric materials for filters are acoustic wave propagation velocity and coupling coefficient. The velocity determines the resonant frequency with electrode pitch and the coupling coefficients affect the band width. For FBARs, the main properties are velocity of acoustic waves and thickness of active piezoelectric layer.

FIG. 1A shows a schematic cross-sectional diagram of a prior art film bulk acoustic resonator FBAR (100a) on a substrate (110) with a substrate thickness (110t). It comprises an air cavity (115) having an air cavity depth (115t), a bottom electrode (140) with a bottom electrode thickness (140t), a piezoelectric layer (150) having a piezoelectric layer thickness (150t) and a top electrode (190) with a top electrode thickness (190t). The purpose of the air cavity (115) is to prevent the acoustic waves from getting into the substrate. Therefore, the acoustic energy is confined in the piezoelectric layer (150) with a minimum loss into the substrate (110). The resonant frequency of the FBAR (100a) is mainly determined by the piezoelectric layer thickness (150t). On the other hand, due to the presence of the air cavity (115), the dissipation of heat generated in the piezoelectric layer (150), the bottom metal electrode layer (140) and the top metal electrode layer (190) to the substrate (110) of the FBAR is limited. Hence, in order to prevent circuits instability due to excessive heating of the piezoelectric layer (150), the operating power of systems involving FBARs with an air cavity (115) cannot be too high. In the prior art FBAR shown in FIG. 1A, the piezoelectric layer (150) is responsible for the interactions between the acoustic waves and the RF electric field to be applied between the top electrode layer (190) and bottom electrode layer (140). Because the piezoelectric layer (150) has a constant thickness (150t), the acoustic waves resonant frequency are fixed.

In order to improve dissipation of heat from the piezoelectric layer, another structure of FBAR has been adopted and used in RF filters. FIG. 1B shows a schematic cross-sectional diagram of another prior art FBAR (100b) named solidly mounted bulk acoustic resonator (SMBAR or SMR). The SMBAR (100b) is deposited on the substrate (110) with a substrate thickness (110t), having a thin film reflector stack (120) having alternating low impedance layers (120-L1, 120-L2, 120-L3) and high impedance layers (120-H1, 120-H2) with a total thin film reflector stack thickness (120Tt), a bottom electrode (140) with a bottom electrode thickness (140t), a piezoelectric layer (150) with a piezoelectric layer thickness (150t), a top electrode (190) with a top electrode thickness (190t). The resonant frequency f_o is determined by the velocity v of the acoustic waves and the piezoelectric layer thickness (150t). To confine the acoustic wave energy in the piezoelectric layers and to minimize loss to the substrate (110), low impedance layer thickness (120-Lt) and high impedance layer thickness (120-Ht) are selected to be λ/4, here λ is the wavelength of the acoustic wave in the respective layer. As there is no air gap between the piezoelectric layer (150) and the substrate (110), the dissipation rate of heat generated in the piezoelectric layer (150) and electrode layers (140, 190) to the substrate (110) is greater than that of the FBAR (100a) with an air cavity (115) as shown in FIG. 1a. In the prior art FBAR (100b), the piezoelectric layer (150) is the active layer responsible for the interactions between RF electric field to be applied between the top electrode layer (190) and the bottom electrode layer (140) and the acoustic waves. Because the thickness of the piezoelectric layer is constant, the resonant frequency of acoustic waves is fixed. Therefore, once a filter involving FBARs has been fabricated, the central frequency f_o of transmission and bandwidth BW are fixed by the geometry and materials used.

Due to the large number of bands used in the mobile handsets in different regions and countries, and even in the same country, a practical handset needs to have an RF front end covering several frequency bands. A true world phone will need to have about 40 bands, each with a transmit band and receive band. As each RF filter has only one central frequency of resonant and a fixed bandwidth, therefore, such a true world phone will need to have 80 filters for the front end. Due to the resource limitations, some designers design mobile phone handsets to cover 5 to 10 bands for selected regions or countries. Even with this reduced number of bands, the number of RF filters currently required is still large: from 10 to 20 units. Therefore, there is a strong need to reduce the dimensions and cost of the RF filters. It would be ideal to reduce the number of filters by having tunable RF filters, each to cover at least two frequency bands. If this is successful, the number of filters can be reduced in the mobile handsets and many other microwave and wireless systems. Thus, it would be critical to develop an RF filter which can cover as many bands or frequency ranges as possible so that the size and power consumption of RF front ends in a mobile phone handset and microwave systems can be reduced.

BRIEF SUMMARY OF THE INVENTION

One object of the invention is to provide a M₁D₁M₂ or a MDM FBAR structure with integrated biasing resistors for forming a microwave acoustic filter, an oscillator and a switch, with the central frequency of resonant adjustable and tunable by the application of a first DC voltage through the integrated biasing resistors for the construction of wireless or microwave systems.

One other object of the invention is to provide a M₁I₁D₂M₂ or a MIDM FBAR structure with integrated biasing resistors for forming a microwave acoustic filter, an oscillator and a switch, with the central frequency of resonant adjustable and tunable by the application of a first DC voltage through the integrated biasing resistors for the construction of wireless or microwave systems.

Another object of the invention is to provide a M₁D₁D₂M₂ or a MDDM FBAR structure with integrated biasing resistors for forming a microwave acoustic filter, an oscillator and a switch, with the central frequency of resonant adjustable and tunable by the application of a first DC voltage through the integrated biasing resistors for the construction of wireless or microwave systems.

Yet another object of the invention is to provide a M₁D₁I₁D₂M₂ or a MDIDM FBAR structure with integrated biasing resistors for forming a microwave acoustic filter, an oscillator and a switch, with the central frequency of resonant adjustable and tunable by the application of a first DC voltage through the integrated biasing resistors for the construction of wireless or microwave systems.

Still another object of this invention is to provide a tunable filter with a plurality of tunable series resonators, a plurality of tunable parallel resonators, a plurality of coupling capacitors, a plurality of isolation resistors and with a first DC voltage source to control and select resonant frequencies of the resonators and to tune and control the transmission central frequency in the tunable filter.

Yet still another object of this invention is to provide a tunable filter with a plurality of tunable series resonators, a plurality of tunable parallel resonators, a plurality of coupling capacitors, a plurality of isolation resistors and with a first DC voltage source and a second DC voltage source to control and select resonant frequencies of the resonators and to tune and control the transmission central frequency in the tunable filter.

BRIEF DESCRIPTION OF THE SEVERAL VIEWS OF THE DRAWING

FIG. 1A is a schematic cross-sectional diagram showing a prior art film bulk acoustic resonator FBAR (100a) with a fixed resonant frequency which comprises a bottom substrate (110), an air cavity (115), a bottom electrode (140), a piezoelectric layer (150) and a top electrode (190).

FIG. 1B is a schematic cross-sectional diagram showing a prior art FBAR solidly mounted bulk acoustic resonator (100b) on a bottom substrate (110), having a thin film reflector stack (120) with low impedance layers (120-L1, 120-L2, 120-L3) and high impedance layers (120-H1, 120-H2), a bottom electrode (140), a piezoelectric layer (150), and a top electrode (190). The resonant frequency f_o of the prior art FBAR is determined by the velocity of acoustic waves v and the piezoelectric layer thickness (150t) and is fixed.

FIG. 2A is a schematic cross-sectional diagram of a frequency tunable M₁D₁M₂ FBAR (200a) with integrated biasing resistors according to this invention. The MDM FBAR structure comprises a substrate, an acoustic wave isolation region, a bottom support membrane, a first metal electrode (M₁), a first piezoelectric semiconductor layer (D₁) with a first piezoelectric depletion region forming a piezoelectric active region and a second metal electrode (M₂).

FIG. 2B shows thin film biasing resistors (281 or 282) having rectangular shapes, with a length (281L or 282L), a width (281W or 282W) and a thickness (281T or 282T).

FIG. 2C shows variation of electric field ξ(x) with distance along a line A-A′ in the MDM structure shown in FIG. 2A with a DC biasing voltage applied between the first metal electrode and the second metal electrode for frequency tuning. A change in the DC biasing voltage ΔV_DC causes a change in the electric field Δξ_o in the first piezoelectric semiconductor layer (D₁) and a change in the depletion region thickness ΔW_o and hence a change in the resonant frequency of the MDM FBAR.

FIG. 2D shows a schematic cross-sectional view of a frequency tunable M₁I₁D₁M₂ FBAR (200d) with integrated biasing resistors according to this invention. The MIDM FBAR structure comprises a substrate, an acoustic wave isolation region, a bottom support membrane, a first electrode (M₁), a first intrinsic piezoelectric semiconductor layer (I₁), a first piezoelectric semiconductor layer (D₁) and a second metal electrode (M₂). The first piezoelectric depletion region in the first piezoelectric layer and the first intrinsic semiconductor layer form a combined piezoelectric active region for interactions between the RF signals and the mechanical acoustic vibrations.

FIG. 2E shows variation of electric field ξ(x) with distance along the line B-B′ in the MIDM structure shown in FIG. 2D with a DC biasing voltage applied between the first metal electrode and the second metal electrode for frequency tuning. A change in the DC biasing voltage ΔV_DC causes a change in the electric field Δξ_o in the first intrinsic piezoelectric semiconductor layer (I₁), a change in the depletion region thickness ΔW_n, a change in the thickness of the combined piezoelectric active region and hence a change in the resonant frequency of the MIDM FBAR.

FIG. 3A is a schematic cross-sectional diagram of a frequency tunable M₁D₁D₂M₂ FBAR (300a) with integrated biasing resistors according to this invention. The MDDM FBAR structure comprises a bottom substrate, an acoustic wave isolation region, a bottom support membrane, a first metal electrode (M₁), a first piezoelectric layer (D₁) doped to a first piezoelectric conducting type, a second piezoelectric layer (D₂) doped to a second piezoelectric conducting type opposite to the first piezoelectric conducting type, a second metal electrode (M₂). A first piezoelectric depletion region in the first piezoelectric layer and a second piezoelectric depletion region in the second piezoelectric semiconductor layer form a combined piezoelectric active region for interactions between the RF signals and the mechanical acoustic vibrations.

FIG. 3B shows variation of electric field magnitude ξ(x) with distance along the line C-C′ in the MDDM FBAR structure shown in FIG. 3A with a DC biasing voltage applied between the first metal electrode and the second metal electrode for frequency tuning. A change in the DC biasing voltage ΔV_DC causes a change in the electric field in the first piezoelectric layer and the second piezoelectric layer, hence a change in the first piezoelectric depletion region thickness ΔW_n and a change in the second piezoelectric depletion region thickness ΔW_p. The change in the combined piezoelectric active region thickness ΔW_n+ΔW_p effects a change in the resonant frequency of the MDDM FBAR.

FIG. 3C is a schematic cross-sectional diagram of a frequency tunable M₁D₁I₁D₂M₂FBAR (300c) with integrated biasing resistors according to this invention. The MDIDM FBAR structure comprises a bottom substrate, an acoustic wave isolation region, a bottom support membrane, a first metal electrode (M₁), a first piezoelectric layer (D₁) doped to a first piezoelectric semiconducting type, a first intrinsic piezoelectric layer (I₁), a second piezoelectric layer (D₂) doped to a second piezoelectric conducting type opposite to the first piezoelectric conducting type and a second metal electrode (M₂). Together with the first intrinsic piezoelectric layer, a first piezoelectric depletion region in the first piezoelectric layer and a second piezoelectric depletion region in the second piezoelectric semiconductor layer form a combined piezoelectric active region for interactions between the RF signals and the mechanical acoustic vibrations.

FIG. 3D shows variation of electric field magnitude ξ(x) with distance along the line D-D′ in the MDIDM FBAR structure shown in FIG. 3C with a DC biasing voltage applied between the first metal electrode and the second metal electrode for frequency tuning. A change in the DC biasing voltage ΔV_DC causes a change in the electric field in the first piezoelectric layer and the second piezoelectric layer, hence a change in the first piezoelectric depletion region thickness ΔW_n and a change in the second piezoelectric depletion region thickness ΔW_p. The change in the combined piezoelectric active region thickness ΔW_n+ΔW_p effects a change in the resonant frequency of the MDIDM FBAR.

FIG. 4A shows a schematic diagram of a tunable microwave filter circuit (400a) formed by connecting two FBAR resonators (340, 350) according to this invention. The filter circuit comprises a first series resonator, a second parallel resonator, a first coupling capacitor, a second coupling capacitor and a first isolation resistor. A first DC voltage source V_DC1 is used to establish biasing in the first series resonator and in the second parallel resonator and to control the central frequency of resonant f_o1 of the filter (400a).

FIG. 4B shows a schematic diagram of a tunable microwave filter circuit (400b) formed by connecting two FBAR resonators (340, 350) according to this invention. It comprises a first series resonator, a second parallel resonator, a first coupling capacitor, a second coupling capacitor, a first isolation resistor, a second isolation resistor. A first DC voltage source V_DC1 and a second DC voltage source V_DC2, are applied to establish biasing to the resonators and to control the central frequency of the filter.

FIG. 4C shows a schematic diagram of a 3½ stage ladder tunable microwave acoustic filter (400c) according to this invention. It comprises a plurality of first series resonators, a plurality of second parallel resonators, a plurality of first coupling capacitors, a second coupling capacitor, a plurality of first isolation resistors and a second isolation resistor. A first DC voltage source V_DC1 is applied to establish biasing to the resonators and to control central frequency f_o1 of the filter.

FIG. 4D shows a schematic diagram of a 3½ stage tunable ladder microwave acoustic filter (400d) according to this invention. It comprises a plurality of first series resonators, a plurality of second parallel resonators or shunt resonators, a plurality of first coupling capacitors, a second coupling capacitor, a plurality of first isolation resistors and a plurality of second isolation resistors. A first DC voltage source V_DC1 and a second DC voltage source V_DC2 are used to establish biasing to the resonators and to control the central frequency f_o1 of transmission the filter.

DETAILED DESCRIPTION OF THE INVENTION

An M₁D₁M₂ FBAR Structure with Integrated Biasing Resistors

FIG. 2A shows a schematic diagram of a portion of an M₁D₁M₂ FBAR or an MDM FBAR structure (200a) with integrated biasing resistors according to one embodiment of this invention. Here, M₁ is a first metal electrode, D₁ is a doped first piezoelectric semiconductor layer and M₂ is a second metal electrode. The MDM FBAR structure comprises a bottom substrate (210) with a bottom substrate thickness (210t); an acoustic isolation region (215) having an acoustic isolation region thickness (215t); a bottom support membrane (230) with a bottom support membrane thickness (230t); a first metal electrode M₁ (240) having a first metal electrode thickness (240t); a first metal electrode contact (240C) having a first metal electrode contact thickness (240Ct) connected to a negative terminal of a DC biasing voltage source; a first piezoelectric semiconductor layer (250) with a first piezoelectric layer thickness (250t), a first piezoelectric layer doping type (p-type or n-type but preferably n-type) and a first piezoelectric layer doping concentration (N_D for n-type); a second metal electrode (290) having a second metal electrode thickness (290t); a second metal electrode contact (290C) having a second metal electrode contact thickness (290Ct) connected to a positive terminal of the DC biasing voltage source; a first passivation layer (298) with a first passivation layer thickness (298t); a first temperature compensation layer (295) with a first temperature compensation layer thickness (295t) to improve thermal stability of the FBAR (200a) and a second metal electrode interconnect (290I) with a second metal electrode interconnect thickness (290It), wherein the second metal electrode interconnect (290I) is electrically connected to the second metal electrode (290) through an opening in the first passivation layer (298) and the first temperature compensation layer (295). The acoustic isolation region (215) may be an air cavity or a multi layer reflector having a plurality of reflector layers, for acoustic wave isolation, according to this invention.

The first piezoelectric semiconductor layer (250) is separated by a first piezoelectric depletion region edge (250B) into two regions: a first piezoelectric depletion region (250d) with a first piezoelectric depletion region thickness (250dt) and a first piezoelectric neutral region (250n) with a first piezoelectric neutral region thickness (250nt). The first piezoelectric neutral region (250n) is electrically conducting with a conductivity approximately proportional to the doping concentration of the first piezoelectric semiconductor layer (250) and the first piezoelectric depletion region (250d) is intrinsic and electrically insulating due to a low free carrier density. In this MDM FBAR, the depletion region constitutes a piezoelectric active layer to allow interactions between the RF signals and the acoustic signals to take place.

When the loading effect and thickness effect of the electrodes are ignored, the resonant frequency f_o is determined by the acoustic wave velocity v in the piezoelectric depletion region and the thickness t of the piezoelectric depletion region so that: f_o=v/(2 t). Since the interactions between the RF signals and acoustic signals take place mainly in the piezoelectric active layer (namely the first piezoelectric depletion region), they are affected by the thickness of the piezoelectric active layer (i.e. the first piezoelectric depletion region thickness). Because the thickness (250dt) of the piezoelectric depletion region (250d) is adjustable by varying the DC biasing voltage applied between the first metal electrode (240) and the second metal electrode (290), therefore, the resonant properties and frequencies of the MDM FBAR structure and any filters, switches or other devices based on the semiconducting piezoelectric layers microwave acoustic effect can be tuned and adjusted by changing the polarity and/or the magnitude of the DC voltage according to this invention.

A first biasing resistor (281) with a first biasing resistor resistance value R₁ and a second biasing resistor (282) with a second biasing resistor resistance value R₂ are integrated with the MDM FBAR for providing a DC bias voltage and an isolation between the RF signal and the DC biasing circuit. The first biasing resistor (281) and the second biasing resistor (282) are preferably integrated thin film resistors and may have different shapes such as rectangle, zig-zag, square, oval, triangle, trapezium, diamond, rhombus and parallelogram. When the first biasing resistor (281) is preferably selected to have a rectangular shape for simplicity, as shown in FIG. 2B, it has a first biasing resistor length R_1L (281L), a first biasing resistor width R_1W (281W), a first biasing resistor thickness R_1T (281T) and a first biasing resistor sheet resistance R_□1. In FIG. 2A, the first biasing resistor (281) connects the first metal electrode (240) to the first metal electrode contact (240C), for providing a potential V_DC−, through (240C) and (281) to the first metal electrode (240 or M₁) and for providing isolation between the RF signals and the DC voltage source circuit. When the second biasing resistor (282) is preferably selected to have a rectangular shape as shown in FIG. 2B, it has a second biasing resistor length R_2L (282L), a second biasing resistor width R_2W (282W), a second biasing resistor thickness R_2T (282T) and a second biasing resistor sheet resistance R_□2. In FIG. 2A, the second biasing resistor (282) connects the second metal electrode (290 or M2) to the second metal electrode contact (290C) through the second metal electrode interconnect (290I) for DC biasing and RF signals isolation.

A potential V_DC+ is provided through the second metal electrode contact (290C), the second biasing resistor and the second metal electrode interconnect (290I) to the second metal electrode (290 or M₂). V_DC+ and V_DC− produce a first DC biasing voltage V₁=V_DC+−V_DC− between the second metal electrode (290 or M2) and the first metal electrode (240 or M1) which creates and regulates a first piezoelectric layer depletion region (250d) with a first piezoelectric layer depletion region thickness (250dt) in the first piezoelectric layer (250). RF signals (RF₊, RF₋) are either applied to the first metal electrode (240) and the second metal electrode interconnect (290I) or they are generated in the MDM FBAR (200a) and are obtained from the first metal electrode and the second metal electrode interconnect (290I).

It should be pointed out that in FIG. 2A, the first metal electrode contact (240C) can also be connected to a positive terminal of the DC biasing voltage source with the second metal electrode contact (290C) connected to the negative terminal of the DC biasing voltage. According to one embodiment of the present invention, the DC biasing and the RF isolation of the MDM FBAR structure can be provided by using only one biasing resistor (either 281 or 282). If only the first biasing resistor (281) is used, the second metal electrode interconnect (290I) will be directly connected to the second metal electrode contact (290C). On the other hand, if only the second resistor (282) is used, the first metal electrode contact (240C) will be directly connected to the first metal electrode (240). Furthermore, a combination of a biasing resistor and a biasing inductor connected in series can as well be used to replace the first or/and the second biasing resistor to provide DC bias voltage to the MDM FBAR structure and an isolation between the RF signal and the DC biasing circuit.

The resistance values R₁ and R₂ of the first biasing resistor (281) and the second biasing resistor (282) are greater than 200 ohms and are preferably greater than 1,000 ohms for isolation of RF signals. The biasing resistor width R_1W and R_2W are not greater than the biasing resistor length R_1L and R_1L. The biasing resistor thickness R_1T and R_2T are preferably less than 2 μm and more preferably less than 0.5 μm to facilitate subsequent patterning either by etching or by lift-off. The biasing resistor sheet resistance R_□1 and R_□2 are 10 ohms/□ or greater and is preferably 100 ohms/□ or greater to obtain a resistance value R₁ of 1,000 ohms or greater for allowing application of a DC biasing with a sufficient RF isolation. On the other hand, in order to keep a RC product low and to reduce any unwanted switching delay time for the FBAR, the resistance value R₂ and R₂ should not be too large. For instance, a typical FBAR may have a capacitance C (between M₁ and M₂) of 5 pF and a first biasing resistor (281) of 2,000 ohms, the value of τ₁=R₁×C=10⁻⁸ second. When the first biasing resistor resistance value R₁ is increased from 2,000 ohms to 2×10⁶ ohms, the value of τ₁ will increase from 10⁻⁸ second to 10⁻⁵ second.

Materials of the biasing resistors may be metals such as Ni, Cr, Ta, W, Mo, NiCr and their alloys. The biasing resistors may also be made of metal oxides and metal oxynitrides such as ZnO, ZnON, InSnO, InSnON, ZnInO ZnInON, ZnSnO, ZnSnON, RuO₂, TaN, Bi₂Ru₂O₇, RuO₂, Bi₂Ir₂O₇ and other semiconductors such as Si, as long as the sheet resistance of the biasing resistors is large enough and the biasing resistors have stable thermal properties. The layer of the biasing resistors may be deposited by vacuum methods such as evaporation, DC sputtering and RF sputtering in a chamber with Ar gas or with a gas mixture of Ar, O₂ and/or N₂. According to one embodiment of this invention, the first biasing resistor (281) and the second biasing resistor (282) are fabricated in same fabrication steps, preferably with same materials, thickness, composition, and sheet resistance on the bottom support membrane (230) or directly on the bottom substrate (210). They may also be fabricated in different fabrication steps and have different materials, different thickness, different composition, and different sheet resistance.

FIG. 2C shows the electric field magnitude ξ(x, V) as a function of distance along the line A-A′ in the MDM structure shown in FIG. 2A. The solid line represents the electric filed magnitude ξ(x, V₁) with the first DC biasing voltage V₁=V_DC+−V_DC− applied between the second metal electrode (290) and the first metal electrode (240) and the dotted line represents the electric filed magnitude ξ(x, V₂) with a second DC biasing voltage V₂ applied between (290) and (240). Under the first DC biasing voltage V₁, the first piezoelectric depletion region (250d) of a first piezoelectric depletion region thickness (250dt) together with a first mass loading due to a combination of the first piezoelectric neutral region (250n) and the second metal electrode (290) produce a first resonant frequency f₁. When a second DC biasing voltage V₂ with a larger value is applied between M2 (290) and M1 (240), the thickness of the first piezoelectric depletion region increases from (250dt) to (250dt′) which results in a decreased first piezoelectric neutral region thickness (250nt′). These changes give rise to an increased first piezoelectric depletion region thickness (250dt′) and a second mass loading with a decreased value as a result of a combination of the new first piezoelectric neutral region (250n′) and the second metal electrode (290), which effects resonance of the MDM FBAR at a second resonant frequency f₂. In the same fashion, when a third DC biasing voltage V₃ is applied, a third resonant frequency f₃ will be created for this FBAR.

Accordingly, a plurality of resonant frequencies may be achieved in the same FBAR (200a) by applying a plurality of DC biasing voltages with different values in a sequential manner through the first biasing resistor (281) and the second biasing resistor (282) thus voltage tuning of the resonant frequency is obtained without the requirement of moving parts in the FBAR. Difference between the second resonant frequency and the first resonant frequency Δf=f₂−f₁ for a given DC basing voltage difference ΔV_DC=V₂−V₁ is determined by the difference in the first piezoelectric depletion region thickness: Δ250dt=250dt′−250dt=ΔW_N and the change in the mass loading.

The change in the DC biasing voltage causes a change in the electric field magnitude (Δξ_o) and a change in the first piezoelectric depletion region thickness (ΔW_n), here ΔW_n=x_n(V₂)−x_n(V₁)=250dt′−250dt. The change in the DC biasing voltage (ΔV_DC=V₂−V₁) is given as the area between the dotted electric field magnitude curve ξ(x, V₂) and solid electric field magnitude curve ξ(x, V₁). Since the slopes (S_P1, S_P2) of the electric field magnitude curve ξ(x, V₁) or ξ(x, V₂) is proportional to the first piezoelectric layer doping concentration N_D (for n-type doping) and the value of ΔW_n/ΔV_DC increases when N_D is decreased, the first piezoelectric layer doping concentration N_D may be adjusted according to the required frequency tuning sensitivity for the surface acoustic waves. The tuning sensitivity for the resonant frequency of the MDM FBAR (200a) is enhanced with the first piezoelectric layer doping concentration N_D to be selected in a range of 10¹⁴ cm⁻³ to 10²¹ cm⁻³ or to be more preferably selected in the range of 10¹⁵ to 10²⁰ cm⁻³.

Because the first piezoelectric depletion region (250d) acts as an active region for interactions between the RF signals to be applied (between (M₁) and (M₂)) and the mechanical acoustic vibrations in the first piezoelectric layer (250), and also because the mass loading which is formed by the first piezoelectric neutral region (250n) and the second metal electrode M₂ varies with the DC biasing voltage, the resonant frequency of the FBAR (200a) is tuned and adjusted by the DC biasing voltage applied. It should be noted that the distribution of doping concentration in the first piezoelectric layer (250 or D₁) need not be a constant. It can be graded, stepped or have other concentration distributions. A plurality of the tunable FBAR (200a) each with integrated biasing resistors (281) R₁ and (282) R₂ according to this invention may be combined to form a band pass filter, a switch or a power divider for microwaves or millimetre waves. It should be pointed out that for a first piezoelectric semiconductor layer (250) doped to have a p-type conduction, the electric field distributions should have a positive slope.

Material of the first piezoelectric layer D₁ (250) is selected from a group including: AlN, GaN, AlGaN, ZnO, GaAs, AlAs, AlGaAs, as long as they are piezoelectric with sufficient acoustic coupling coefficients, are semiconducting and can be doped to p-type and/or n-type conduction. The first piezoelectric layer thickness (250t) is selected to be in a range of 50 nm to 20 μm, dependent on the acoustic wave velocity in the first piezoelectric layer (250) and the first frequency f_o1 of resonant required for the application.

The first metal electrode M₁ (240) and the second metal electrode M₂ (290) in FIG. 2A may have multilayer structures. For the top layer in the first metal electrode M₁ which contacts the first piezoelectric semiconductor layer D₁ (250), the work function is advantageously selected so that M₁ forms a Schottky junction with the first piezoelectric semiconductor layer D₁ (250). The work function of the bottom layer in the second metal electrode M₂ (290) which contacts the first piezoelectric semiconductor layer D₁ (250) is advantageously selected so that M₂ (290) forms an ohmic contact with the first piezoelectric semiconductor layer D₁ (250).

Therefore, for a n-type doped first piezoelectric semiconductor layer D₁ (250), it is preferred to have the work function of the top layer in the first metal electrode (240) to be substantially larger than that of the first piezoelectric semiconductor layer (250). It is also preferred to have the work function of the bottom layer in the second metal electrode (290) to be the same or less than that of the first piezoelectric semiconductor layer (250). Materials for the top layer in the first metal electrode (240) may be selected from a group including: Ni, Pt, Pd, Au and their alloys, as long as they have a large enough work function. Whereas materials for the rest of the first metal electrode (240) may be selected from a group including: Mo, Al, Ti, Cu, Au and their alloys to reduce electrical resistance. Materials for the bottom layer in the second metal electrode (290) may be selected from a group including: Ti, Al, W, Mo, Ta, Nb, Ha and their alloys whereas materials for the rest of the second metal electrode (290) may be selected from a group including: Mo, Al, Ti, Cu, Au and their alloys to reduce electrical resistance.

When the first piezoelectric semiconductor D₁ (250) is doped p-type, it is preferred to have the work function of the top layer in the first metal electrode (240) to be substantially less than that of the first piezoelectric semiconductor layer (250). It is also preferred to have the work function of the bottom layer in the second metal electrode (290) to be the same as or larger than that of the first piezoelectric semiconductor layer (250). Materials for the top layer in the first metal electrode (240) may be selected from a group including: Ti, Al, W, Mo, Ta, Nb, Ha and their alloys, as long as they have a small enough work function. Whereas materials for the rest of the first metal electrode (240) may be selected from a group including: Mo, Al, Ti, Cu, Au and their alloys to reduce electrical resistance. Materials for the bottom layer of the second metal electrode (290) may be selected from a group including: Ni, Pt, Pd, Au and their alloys, as long as the work function is large enough. Materials for the rest of the second metal electrode (290) may be selected from a group including: Mo, Al, Ti, Cu, Au and their alloys to reduce electrical resistance.

Materials of the first metal electrode contact (240C) may be the same as that of first metal electrode (240) and it is preferably deposited in the same deposition run with the first metal electrode (240). Whereas materials of the second metal electrode contact (290C) and the second metal electrode contact interconnect (290I) may be the same as the second metal electrode (290) and they are preferably deposited in the same deposition run with the second metal electrode (290).

Materials of the bottom substrate (210) may be selected from a group including: Si, GaAs, sapphire, quartz and glass. Materials of the bottom support membrane (230) may be selected from a group including: SiO₂, Si₃N₄, SiON, as long as they have sufficient mechanical strength and low enough attenuation to acoustic waves. Materials of the bottom support membrane (230) and the bottom support membrane thickness (230t) may also be selected to effect a temperature compensation to reduce unwanted shift of resonant frequency due to temperature fluctuation during the operation.

In order to improve thermal stability of the device (200a), the temperature compensation layer (295) is included. Materials of the temperature compensation layer (295) may be SiO₂ or SiON. The first passivation layer (298) may be selected from a material group of: SiO₂, Si₃N₄, SiON, HfO₂, and their mixtures.

An M₁I₁D₁M₂ FBAR Structure with Integrated Biasing Resistors

To obtain an operation frequency, the value of DC biasing voltage V₁=V_DC+−V_DC− in the tunable M₁D₁M₂ FBAR provided in FIG. 2A may be too high for some mobile devices and the frequency tuning sensitivity may not be sufficiently precise. In order to reduce the required DC biasing voltage value and to improve the tuning sensitivity, a frequency tunable M₁I₁D₁M₂ FBAR structure with integrated biasing resistors is provided according to another embodiment of this invention.

FIG. 2D shows a schematic diagram of a portion of an M₁I₁D₁M₂ or an MIDM FBAR structure (200d) with integrated biasing resistors. Here, M₁ is a first metal electrode, I₁ is an intrinsic piezoelectric semiconductor layer, D₁ is a doped piezoelectric semiconductor layer and M₂ is a second metal electrode. It should be noted that a FBAR with an MDIM structure can be readily obtained by switch the intrinsic piezoelectric semiconductor layer with the doped piezoelectric layer in the structure. For simplicity reason, only MIDM FBAR structure will be described.

The MIDM FBAR structure in FIG. 2D comprises a bottom substrate (210) with a bottom substrate thickness (210t); an acoustic isolation region (215) having an acoustic isolation region thickness (215t); a bottom support membrane (230) with a bottom support membrane thickness (230t); a first metal electrode M₁ (240) having a first metal electrode thickness (240t); a first metal electrode contact (240C) having a first metal electrode contact thickness (240Ct) connected to a negative terminal of a DC biasing voltage source; a first intrinsic piezoelectric semiconductor layer (255) with a first intrinsic piezoelectric layer thickness (255t), a first piezoelectric layer doping type and a first piezoelectric layer doping concentration; a first piezoelectric semiconductor layer (250) with a first piezoelectric layer thickness (250t); a second metal electrode (290) with a second metal electrode thickness (290t); a second metal electrode contact (290C) having a second metal electrode contact thickness (290Ct) connected to a positive terminal of the DC biasing voltage source; a first temperature compensation layer (295) with a first temperature compensation layer thickness (295t) to improve thermal stability of the FBAR; a first passivation layer (298) with a first passivation layer thickness (298t) and a second metal electrode interconnect (290I) with a second metal electrode interconnect thickness (290It), wherein the second metal electrode interconnect (290I) is electrically connected to the second metal electrode (290) through an opening in the first passivation layer (298) and the first temperature compensation layer (295). In (200d), the acoustic isolation region (215) may be an air cavity or a multi layer reflector having a plurality of reflector layers for acoustic wave isolation.

It should be noted that in FIG. 2D, the first metal electrode contact (240C) can also be connected to a positive terminal of the DC biasing voltage source with the second metal electrode contact (290C) connected to the negative terminal of the DC biasing voltage.

The first piezoelectric semiconductor layer (250) is a doped semiconductor which may be n-type or p-type and preferably to be n-type. The first intrinsic piezoelectric layer (255) is not intentionally doped with a low doping concentration (10¹³ cm⁻³ or less) and is electrically insulating. The first piezoelectric semiconductor layer (250) has two parts separated by a first piezoelectric depletion region edge (250B): a first piezoelectric depletion region (250d) with a first piezoelectric depletion region thickness (250dt) and a first piezoelectric neutral region (250n) with a first piezoelectric neutral region thickness (250nt). The first piezoelectric neutral region (250n) is electrically conducting and the first piezoelectric depletion region (250d) is intrinsic and electrically insulating. In this MIDM FBAR, the first intrinsic piezoelectric layer (255) and the first piezoelectric depletion region (250d) make up a piezoelectric active layer to allow interactions between the RF signals and acoustic signals to take place.

Since the interactions between the RF signals and acoustic signals take place mainly in the first piezoelectric depletion region (250d) and the first intrinsic piezoelectric layer (255), they are affected by the thickness (250dt) of the first piezoelectric depletion region (250). In view of the fact that the thickness (250dt) is adjustable by varying the polarity or/and the magnitude of the DC biasing voltage applied between the first metal electrode (240) and the second metal electrode (290), therefore, the resonant properties and frequencies of the MDM FBAR structure and any filters, switches or other devices based on the semiconducting piezoelectric layers microwave acoustic effect can be tuned and adjusted by changing the polarity and/or the magnitude of the DC voltage according to this invention.

A first biasing resistor (281) with a first biasing resistor resistance value R₁ and a second biasing resistor with a second biasing resistor resistance value R₂ are integrated with the MIDM FBAR for providing a DC bias voltage and an isolation between the RF signal and the DC biasing circuit. The first biasing resistor (281) and the second biasing resistor (282) are preferably an integrated thin film resistor and may have different shapes such as rectangle, zig-zag, square, oval, triangle, trapezium, diamond, rhombus and parallelogram. When the first resistor (281) is preferably having a rectangular shape to simplify description, as shown in FIG. 2B, it has a first biasing resistor length R_1L (281L), a first biasing resistor width R_1W (281W), a first biasing resistor thickness R_1T (281T) and a first biasing resistor sheet resistance R_□1. In FIG. 2D, the first biasing resistor (281) connects the first metal electrode (240) to the first metal electrode contact (240C), for the purposes of providing a potential V_DC−, through (240C) and (281) to the first metal electrode (240 or M₁) and for providing isolation between the RF signals from the DC voltage source circuit. When the second biasing resistor (282) is preferably selected to have a rectangular shape as shown in FIG. 2B, it has a second biasing resistor length R_2L (282L), a second biasing resistor width R_2W (282W), a second biasing resistor thickness R_2T (282T) and a second biasing resistor sheet resistance R_□2. In FIG. 2D, the second biasing resistor (282) connects the second metal electrode (290 or M2) to the second metal electrode contact (290C) through the second metal electrode interconnect (290I) for DC biasing and RF signals isolation.

The first biasing resistor thickness R_1T and the second biasing resistor thickness R_2T are preferably less than 2 μm and are more preferably less than 0.5 μm to facilitate subsequent pattering either by etching or by lift-off. The sheet resistance R_□1 of the first biasing resistor (281) and the sheet resistance R_□2 of the second biasing resistor (282) are 10 ohms/□ or greater and are preferably 100 ohms/□ or greater to obtain a resistance value R₁ and R₂ of 1,000 ohms or greater for allowing application of a DC biasing with a sufficient RF isolation. On the other hand, in order to keep a small enough RC product and to reduce unwanted switching delay time for the FBAR, the resistance value R₂ and R₂ should not be too large.

Materials of the thin film biasing resistors may be metals such as Ni, Cr, Ta, W, Mo, NiCr and their alloys. They may also be metal oxide and metal oxynitride such as ZnO, ZnON, InSnO, InSnON, ZnInO ZnInON, ZnSnO, ZnSnON, RuO₂, TaN, Bi₂Ru₂O₇, RuO₂, Bi₂Ir₂O₇ and other semiconductors such as Si, as long as the sheet resistance of the biasing resistors is large enough and the biasing resistors have stable thermal properties. The layer of the biasing resistors may be deposited by vacuum methods such as evaporation, DC sputtering and RF sputtering in a chamber with Ar gas or with a gas mixture of Ar, O₂ and/or N₂. According to one embodiment of this invention, the first biasing resistor (281) and the second biasing resistor (282) are fabricated in same fabrication steps, preferably with the same materials, thickness, composition, and sheet resistance on the bottom support membrane (230) or on the bottom substrate (210). They may also be fabricated in different fabrication steps and have different materials, different thickness, different composition, and different sheet resistance.

It should also be noted that only one biasing resistor (either 281 or 282) can be used to provide a DC bias voltage and an isolation between the RF signal and the DC biasing circuit. According to one embodiment of the present invention, the DC biasing and the RF isolation of the MIDM FBAR structure can be provided by using only one biasing resistor (either 281 or 282). If only the first biasing resistor (281) is used, the second metal electrode interconnect (290I) will be directly connected to the second metal electrode contact (290C). On the other hand, if only the second resistor (282) is used, the first metal electrode contact (240C) will be directly connected to the first metal electrode (240). Furthermore, a combination of a biasing resistor and a biasing inductor connected in series can also be used to replace the first or/and the second biasing resistor to provide DC bias voltage to the MIDM FBAR structure and an isolation between the RF signal and the DC biasing circuit.

A potential V_DC+ is provided through the second metal electrode contact (290C), the second biasing resistor (282) and the second metal electrode interconnect (290I) to the second metal electrode (290 or M₂). V_DC+ and V_DC− generate a first DC biasing voltage V₁=V_DC+−V_DC− between the second metal electrode (290 or M2) and the first metal electrode (240 or M1) which creates and regulates a first piezoelectric layer depletion region (250d) with a first piezoelectric layer depletion region thickness (250dt) in the first piezoelectric layer (250), which results in a first piezoelectric neutral region (250n) with a first piezoelectric neutral region thickness (250nt). RF signals (RF₊, RF₋) are either applied to the first metal electrode (240) and the second metal electrode interconnect (290I) or they are generated in the MIDM FBAR (200d) and are obtained from the first metal electrode and the second metal electrode interconnect (290I).

FIG. 2E shows the distribution of electric field magnitude ξ(x, V) with distance along the line B-B′ in the MIDM structure shown in FIG. 2D. The solid line represents the electric filed magnitude ξ(x, V₁) with a first DC biasing voltage V₁=V_DC+−V_DC− applied between the second metal electrode (290, M₂) and the first metal electrode (240, M₁). Under the first DC biasing voltage V₁, the first piezoelectric depletion region (250d) with a first piezoelectric depletion region thickness (250dt) is formed and a first mass loading due to a combination of the first piezoelectric neutral region (250n) and the second metal electrode (M₂, 290) yields a first resonant frequency f₁. When a second DC biasing voltage V₂ with a larger value is applied between and M2 (290) and M1 (240), the first piezoelectric depletion region thickness increases from (250dt) to (250dt′) which results in a decreased first piezoelectric neutral region thickness (250nt′). These changes give rise to a increased active layer thickness and a second mass loading with a reduced value, as a result of a combination of the new first piezoelectric neutral region (250n′) and the second metal electrode (290), which effects resonance of the MIDM FBAR at a second resonant frequency f₂. In the same fashion, when a third DC biasing voltage V₃ is applied, a third resonant frequency f₃ will be created for this MIDM FBAR.

Accordingly, a plurality of resonant frequencies may be achieved in the same MIDM FBAR (200d) by applying a plurality of DC biasing voltages with different values in a sequential manner through the first biasing resistor (281) and second biasing resistor (282) thus voltage tuning of the resonant frequency is achieved without the requirement of any moving parts in the MIDM FBAR. Difference between the second resonant frequency and the first resonant frequency Δf=f₂−f₁ for a given DC basing voltage difference ΔV_DC=V₂−V₁ is determined by the first piezoelectric depletion thickness difference Δ250dt=250dt′−250dt=ΔW_n and the change in the mass loading. It should be pointed out that for a first piezoelectric semiconductor layer (250) doped to have a p-type conduction, the electric field distributions should have a positive slope.

As the slopes (S_P1, S_P2) of the electric field magnitude curves ξ(x, V₁) and ξ(x, V₂) is proportional to the first piezoelectric doping concentration N_D (for n-type doping) and the value of ΔW_n/ΔV_DC increases when N_D is decreased, according to this invention, the tuning sensitivity for the resonant frequency of the MIDM FBAR (200d) can be enhanced by preferably selecting the first piezoelectric layer doping concentration N_D in a range of 10¹⁴ cm⁻³ to 10²¹ cm⁻³ or more preferably by selecting N_D in the range of 10¹⁵ to 10²⁰ cm⁻³.

The change in the DC biasing voltage causes a change in the electric field magnitude (Δξ_o) and a change in the first piezoelectric depletion region thickness (ΔW_n) of the first piezoelectric depletion region, here, ΔW_n=x_n(V₂)−x_n(V₁) or 250dt′−250dt. Due to the existence of the first intrinsic piezoelectric semiconductor layer (255), the change in the DC biasing voltage (ΔV_DC=V₂−V₁), given by the area between the dotted electric field magnitude curve V₂) and solid electric field magnitude curve ξ(x, V₁) is partly dropped across (255). And the area (ΔV_DC=V₂−V₁) has two parts: one between the two horizontal lines in the first intrinsic piezoelectric semiconductor layer (255) and the other between the two inclined lines in the first piezoelectric semiconductor layer (250). Therefore, the same DC voltage change will cause a smaller change in the ΔW_n (=x_n(V₂)−x_n(V₁)) as compared to the MDM structure shown in FIG. 2A.

Due to the low ion density in the first intrinsic piezoelectric semiconductor layer (255), the electric field magnitude ξ_o1 required to form a first piezoelectric depletion region thickness (250dt) for achieving the desired resonant frequency could be reduced compared to that in the MDM FBAR structure shown in FIG. 2A. Furthermore, the variation of x_n(V) with the variation of the DC biasing voltage V would be much less with the presence of the first intrinsic piezoelectric semiconductor layer (255), hence the tuning sensitivity of the resonant frequency by the DC voltage would increase. The MIDM FBAR structure also allows a higher doping concentration for the first piezoelectric semiconductor layer (250) than that for the MDM structure.

Because the first piezoelectric depletion region (250d) acts as an active region for interactions between the RF signals to be applied (between (M₁) and (M₂)) and the mechanical acoustic vibrations in the piezoelectric semiconductor layers (250, 255) and the thickness of the first piezoelectric depletion region thickness varies with the DC voltage, and also because the mass loading formed by the first piezoelectric layer neutral region (250n) and the second metal electrode M₂ (290) varies with the DC biasing voltage, the resonant frequency of the MIDM FBAR (200d) is tuned and adjusted by the DC biasing voltage. Since the change in the first piezoelectric depletion region thickness ΔW_n (250dt′−250dt) with the change in the DC voltage is larger when the first piezoelectric doping concentrations N_D is decreased, therefore, the first piezoelectric doping concentration N_D may also be adjusted according to the need for the tuning sensitivity of the surface acoustic waves frequency. It should be noted that the distribution of doping concentration in the first piezoelectric layer (250) need not be a constant. It can be graded, stepped or have other concentration distributions. A plurality of the tunable MIDM FBAR (200d) each with integrated biasing resistors (281) R₁ and (282) R₂, according to this invention may be combined to form a band pass filter, a switch or a power divider for microwaves or millimetre waves.

Material of the first piezoelectric semiconductor layer (250) is selected from a compound material group including: AlN, GaN, AlGaN, ZnO, GaAs, AlAs, AlGaAs as long as they are piezoelectric with sufficient acoustic-electric coupling coefficients and are semiconducting and can be doped to p-type and/or n-type conduction. Material of the first intrinsic piezoelectric layer (255) is selected from a compound material group including: AlN, GaN, AlGaN, ZnO, GaAs, AlAs, AlGaAs, LiNbO₃, PZT, BaTiO₃, quartz and KNbO₃ as long as they are piezoelectric with sufficiently large acoustic-electric coupling coefficients and are compatible to the first piezoelectric layer (250). The first piezoelectric layer thickness (250t) is selected to be in a range of 20 nm to 50 μm, dependent on the acoustic wave velocity in the first piezoelectric semiconductor layer (250) and the first frequency f_o1 of resonant and a plurality of other resonant frequencies required for the application. The first intrinsic piezoelectric layer thickness (255t) is selected in a range of 20 nm to 50 μm dependent on the acoustic wave velocity in the first intrinsic piezoelectric layer and the first frequency f_o1 and a plurality of other resonant frequencies required for the applications.

To improve thermal stability, a temperature compensation layer (295) with a temperature compensation layer thickness (295t) may be adopted. Materials of the temperature compensation layer may be selected from a group of SiO₂ and SiON. The first passivation layer (298) may be selected from a material group of: SiO₂, Si₃N₄, SiON, HfO₂, and their mixtures. Materials of the bottom substrate (210) may be selected from a group including: Si, GaAs, sapphire, quartz and glass. Materials of the bottom support membrane (230) may be selected from a group including SiO₂, Si₃N₄, SiON, as long as they have sufficient mechanical strength and low enough attenuation to acoustic waves. Materials of the bottom support membrane (230) and the bottom support membrane thickness (230t) may also be selected to effect a temperature compensation to reduce unwanted shift of resonant frequency due to temperature fluctuation during the operation.

A plurality of the tunable FBAR (200d) with an MIDM structure each with integrated biasing resistors (281) R₁ and (282) R₂ according to this invention may be combined to form a band pass filter, switch, power divider for microwaves or millimetre waves.

An M₁D₁D₂M₂ FBAR Structure with Integrated Biasing Resistors

FIG. 3A shows a schematic diagram of a portion of an M₁D₁D₂M₂ FBAR or an MDDM FBAR Structure (300a) with integrated biasing resistors according to one other embodiment of this invention. Here, M₁ is a first metal electrode, D₁ is a doped first piezoelectric semiconductor layer, D₂ is a doped second piezoelectric semiconductor layer and M₂ is a second metal electrode. The M₁D₁D₂M₂ FBAR or MDDM FBAR structure (300a) comprises a bottom support membrane (230) with a bottom support membrane (230t) on a bottom substrate (210) with a bottom substrate thickness (210t); an acoustic isolation region (215) having an acoustic isolation region thickness (21St); a first metal electrode (240) with a first metal electrode thickness (240t); a first metal electrode contact (240C) having a first metal electrode contact thickness connected to a negative terminal of a DC biasing voltage source; a doped first piezoelectric semiconductor layer (250) with a first doped piezoelectric layer thickness (250t), a first piezoelectric layer doping type and a first piezoelectric layer doping concentration; a doped second piezoelectric semiconductor layer (270) with a second doped piezoelectric layer thickness (270t), a second piezoelectric layer doping type which is opposite to the first piezoelectric layer doping type, and a second piezoelectric layer doping concentration; a second metal electrode (290) with a second metal electrode thickness (290t); a second metal electrode contact (290C) having a second metal electrode contact thickness (290Ct) connected to a positive terminal of the DC biasing voltage source; a first passivation layer (298) with a first passivation layer thickness (298t); a first temperature compensation layer (295) with a first temperature compensation layer thickness (295t) to improve thermal stability of the MDDM FBAR (300a); and a second metal electrode interconnect (290I) with a second metal electrode interconnect thickness (290It), wherein the second metal electrode interconnect (290I) is electrically connected to the second metal electrode (290) through an opening in the first passivation layer (298) and the first temperature compensation layer (295). In (300a), the acoustic isolation region (215) may be an air cavity or a multi layer reflector having a plurality of reflector layers for acoustic wave isolation.

The first piezoelectric semiconductor layer (250) is a doped semiconductor which may be n-type or p-type and preferably to be n-type. The second piezoelectric semiconductor layer (270) is also a doped semiconductor. In FIG. 3A, the first piezoelectric semiconductor layer (250) is separated by a first piezoelectric depletion region edge (250B) into two regions: a first piezoelectric depletion region (250d) with a first piezoelectric depletion region thickness (250dt) and a first piezoelectric neutral region (250n) with a first piezoelectric neutral region thickness (250nt). Similarly, the second piezoelectric semiconductor layer (270) is separated by a second piezoelectric depletion region edge (270B) into two regions: a second piezoelectric depletion region (270d) with a second piezoelectric depletion region thickness (270dt) and a second piezoelectric neutral region (270n) with a second piezoelectric neutral region thickness (270nt). The first piezoelectric neutral region (250n) and the second piezoelectric neutral region (270n) are electrically conducting and the first piezoelectric depletion region (250d) and the second piezoelectric depletion region (270n) are intrinsic and electrically insulating. In this MDDM FBAR, the first piezoelectric depletion region (250d) and the second piezoelectric depletion region (270d) constitute a combined piezoelectric active layer to allow interactions between the RF signals and the acoustic signals to occur.

Since the interactions between the RF signals and acoustic signals take place mainly in the first piezoelectric depletion region (250d) and the adjacent second piezoelectric depletion region (270d), they are affected by the thicknesses (250dt, 270dt) of the first piezoelectric depletion region (250) and the second piezoelectric depletion region (270dt). Given that (250dt) and (270dt) are adjustable by varying the polarity or/and the magnitude of the DC biasing voltage applied between the first metal electrode (240) and the second metal electrode (290), therefore, the resonant properties and frequencies of the MDDM FBAR structure and any filters, switches or other devices based on the semiconducting piezoelectric layers microwave acoustic effect can be tuned and adjusted by changing the polarity and/or the magnitude of the DC voltage according to this invention.

A first biasing resistor (281) with a first biasing resistor resistance value R₁ and a second biasing resistor (282) with a second biasing resistor resistance value R₂ are integrated with the MDDM FBAR (300a) for providing a DC bias voltage and an isolation between the RF signal and the DC biasing circuit. The first biasing resistor (281) and the second biasing resistor (282) are preferably integrated thin film resistors and may have different shapes such as rectangle, zig-zag, square, oval, triangle, trapezium, diamond, rhombus, parallelogram. When the first biasing resistor (281) is preferably having a rectangular shape as shown in FIG. 2B, it has a first biasing resistor length R_1L (281L), a first biasing resistor width R_1W (281W, FIG. 2B), a first biasing resistor thickness R_1T (281t) and a first biasing resistor sheet resistance R_□1. In the MDDM FBAR structure (300a), the first biasing resistor (281) connects the first metal electrode (240) to the first metal electrode contact (240C), for providing a potential V_DC− through (240C) and (281) to the first metal electrode (240 or M₁) and for providing isolation between the RF signals from the DC voltage source circuit. When the second biasing resistor (282) is preferably having a rectangular shape as shown in FIG. 2B, it has a second biasing resistor length R_2L (282L), a second biasing resistor width R_2W (282W, FIG. 2B), a second biasing resistor thickness R_2T (282T) and a second biasing resistor sheet resistance R_□2. In FIG. 3A, the second biasing resistor (282) connects the second metal electrode (290 or M2) to the second metal electrode contact (290C) through the second metal electrode interconnect (290I) for DC biasing and RF signals isolation. RF signals (RF₊, RF₋) are either applied to the first metal electrode (240) and the second metal electrode interconnect (290I) or they are generated in the MDDM FBAR (300a) and are obtained from the first metal electrode (240) and the second metal electrode interconnect (290I).

It should be pointed out that in FIG. 3A, the first metal electrode contact (240C) may also be connected to a positive terminal of the DC biasing voltage source with the second metal electrode contact (290C) connected to the negative terminal of the DC biasing voltage. According to one embodiment of the present invention, the DC biasing and the RF isolation of the MDDM FBAR structure (300a) may be provided by using only one biasing resistor (either 281 or 282). If only the first biasing resistor (281) is used, the second metal electrode interconnect (290I) will be directly connected to the second metal electrode contact (290C). On the other hand, if only the second resistor (282) is used, the first metal electrode contact (240C) will be directly connected to the first metal electrode (240). Furthermore, a combination of a biasing resistor and a biasing inductor connected in series can as well be used to replace the first or/and the second biasing resistor to provide DC bias voltage to the MDDM FBAR structure and an isolation between the RF signal and the DC biasing circuit.

The resistance values R₁ and R₂ of the first biasing resistor (281) and the second biasing resistor (282) are greater than 200 ohms and are preferably greater than 1,000 ohms for isolation of RF signals. The biasing resistor width R_1W and R_2W are not greater than the biasing resistor length R_1L and R_1L. The biasing resistor thickness R_1T and R_2T are preferably less than 2 μm and are more preferably less than 0.5 μm to facilitate subsequent pattering either by etching or by lift-off. The first and the second biasing resistor sheet resistances R_□1 and R_□2 are 10 ohms/□ or greater, preferably 100 ohms/□ or greater to obtain biasing resistor resistance value of 1,000 ohms or greater for allowing application of DC biasing voltages with a sufficient RF isolation. However, in order to keep a small enough RC constant and to reduce unwanted switching delay time for the FBAR, the biasing resistor resistance value R₁ and R₂ should not be too large.

Materials of the thin film biasing resistors may be metals such as Ni, Cr, Ta, W, Mo, NiCr and their alloys. They may also be metal oxide and metal oxynitride such as ZnO, ZnON, InSnO, InSnON, ZnInO ZnInON, ZnSnO, ZnSnON, RuO₂, TaN, Bi₂Ru₂O₇, RuO₂, Bi₂Ir₂O₇ and other semiconductors such as Si, as long as the sheet resistance of the biasing resistors is large enough and the biasing resistors have stable thermal properties. The layer of the biasing resistors may be deposited by vacuum methods such as evaporation, DC sputtering and RF sputtering in a chamber with Ar gas or with a gas mixture of Ar, O₂ and/or N₂. According to one embodiment of this invention, the first biasing resistor (281) and the second biasing resistor (282) are fabricated in same fabrication steps, preferably with the same materials, thickness, composition, and sheet resistance on the bottom support membrane (230) or on the bottom substrate (210). They may also be fabricated in different fabrication steps and have different materials, different thickness, different composition, and different sheet resistance.

A potential V_DC+ is provided through the second metal electrode contact (290C), the second biasing resistor (282) and the second metal electrode interconnect (290I) to the second metal electrode (290 or M₂). V_DC+ and V_DC− produce a first DC biasing voltage V₁=V_DC+−V_DC− between the second metal electrode (290 or M2) and the first metal electrode (240 or M1). This first DC biasing voltage V₁ creates the first piezoelectric depletion region (250d) in the first piezoelectric layer (250) and the second piezoelectric depletion region (270d) in the second piezoelectric layer (270) with the second piezoelectric depletion region (270d) adjacent to the first piezoelectric depletion region (250d). The first DC Biasing voltage V₁ also controls the first piezoelectric depletion region thickness (250dt) and the second piezoelectric depletion region thickness (270dt).

FIG. 3B shows the distribution of the electric field magnitude ξ(x, V₁) with distance along the line C-C′ in the MDDM FBAR structure in FIG. 3A. The solid line represents the electric filed magnitude ξ(x, V₁) with the first DC biasing voltage V₁=V_DC+−V_DC− applied between the second metal electrode (290 or M₂) and the first metal electrode (240 or M₁) and the dotted line represents the electric filed magnitude ξ(x, V₂) with a second DC biasing voltage V₂ applied between (290) and (240). It is noted that the maximum electrical field occurs at the interface between the first doped piezoelectric layer and second doped piezoelectric layer. Under the first DC biasing voltage V₁, the first piezoelectric depletion region (250d) of a thickness (250dt) and the second piezoelectric layer depletion region (270d) of a thickness (270dt) together with a first mass loading due to a combination of the first piezoelectric neutral region (250n) of a thickness (250nt), the second piezoelectric neutral region (270n) of a thickness (270nt) and the second metal electrode (M₂, 290) yield a first resonant frequency f₁. When a second DC biasing voltage V₂ with a larger value is applied, the electric field magnitude in the first piezoelectric depletion region (250d) and in the second piezoelectric depletion region (270d) increases to give new electric field distribution ξ(x, V₂). This change gives rise to a new first piezoelectric depletion region (250d′) with a new first piezoelectric depletion region thickness (250dt′), a new first piezoelectric neutral region (250n′) with a new first piezoelectric neutral region thickness (250nt′), a new second piezoelectric depletion region (270d′) with a new second piezoelectric depletion region thickness (270dt′) and a new second piezoelectric neutral region (270n′) with a new second piezoelectric neutral region thickness (270nt′). This results in increased thicknesses (250dt′, 270dt′) for the first and second piezoelectric depletion regions (250d′, 270d′) and decreased thicknesses (250nt′, 270nt′) for the first and the second piezoelectric neutral regions (250n, 270n), hence an increased combined piezoelectric active layer thickness. Together with a second mass loading with a decreased value as a result of a combination of the new first piezoelectric neutral region (250n′), the new second piezoelectric neutral region (270n′) and the second metal electrode (290), the increased combined piezoelectric active layer thickness effects resonance of the MDDM FBAR (300a) at a second resonant frequency f₂. When a third DC biasing voltage V₃ is applied, a third resonant frequency f₃ will be created for the MDDM FBAR.

Thus, a plurality of resonant frequencies may be achieved in the same MDDM FBAR (300a) by applying a plurality of DC biasing voltages in a sequential manner through the first biasing resistor (281) and the second biasing resistor (282) to obtain voltage tuning of the resonant frequency without requiring any moving parts in the FBAR. Difference between the second resonant frequency and the first resonant frequency Δf=f₂−f₁ for a given DC basing voltage difference ΔV_DC=V₂−V₁ is determined by the first piezoelectric depletion thickness difference Δ250dt=250dt′−250dt=ΔW_N, the second piezoelectric depletion thickness difference Δ270dt=270dt′−270dt=ΔW_p, and the change in the mass loading.

As the magnitude for the slopes of the electric distribution curves ξ(x, V₁) and ξ(x, V₂) in the first piezoelectric depletion region (250d, 250d′) is proportional to the first piezoelectric layer doping concentration, whereas the magnitude for the slopes of electric distribution curves ξ(x, V₁) or (x, V₂) in the second piezoelectric depletion region (270, 270d′) is proportional to the second piezoelectric layer doping concentration, thus the first piezoelectric layer doping concentration and the second piezoelectric layer doping concentration may be preferably adjusted according to the required frequency tuning sensitivity for the surface acoustic waves in the MDDM FBAR. The tuning sensitivity for the resonant frequency of the MDDM FBAR (300a) is enhanced with the first piezoelectric layer doping concentration and the second piezoelectric layer doping concentration to be selected in a range of 10¹⁴ cm⁻³ to 10²¹ cm⁻³ or to be more preferably selected in the range of 10¹⁵ to 10²⁰ cm⁻³. It is noted that the distribution of doping concentration in the first piezoelectric semiconductor layer (250) and the distribution of doping concentration in the second piezoelectric semiconductor layer (270) need not to be a constant. It can be graded, stepped or have other concentration distributions.

The change in the DC biasing voltage (ΔV_DC) causes a change in the electric field magnitude Δξ_o, a change in the first piezoelectric depletion region width (ΔW_n) and a change in the second piezoelectric depletion region width (ΔW_p). The change in the DC biasing voltage (ΔV_DC) is given as the area between the dotted electric field curve ξ(x, V₂) and the solid electric field curve ξ(x, V₁). The total change in the width of the depletion region (ΔW_n+ΔW_p)=[x_n(V₂)−x_n(V₁)]+[x_p(V₂)−x_p(V₁)]=[250dt′−250dt′]+[270dt′−270dt]. Since the depletion regions (250d, 270d) act as an combined active region for interactions between the RF signals and the mechanical acoustic vibrations in the piezoelectric layers and the thicknesses (250dt, 270dt) of the first and second piezoelectric depletion regions (250, 270) are controllable by varying the DC biasing voltage applied between (240) and (290), the resonant frequency of the MDDM FBAR (300a) is tuned and adjusted by the DC biasing voltage. It is noted that the distribution of doping concentration in the first piezoelectric layer (250) and in the second piezoelectric layer (270) need not be a constant. It can be graded, stepped or have other concentration distributions. A plurality of the tunable MDDM FBAR (300a) each with integrated biasing resistors (281) R₁ and (282) R₂ according to this invention may be combined to form a band pass filter, a switch or a power divider for microwaves or millimetre waves.

To improve thermal stability, a temperature compensation layer (295) with a temperature compensation layer thickness (295t) may be made of SiO₂ and SiON. The first passivation layer (298) may be selected from a material group of: SiO₂, Si₃N₄, SiON, HfO₂, and their mixtures. Materials of the bottom substrate (210) may be selected from a group including: Si, GaAs, sapphire, quartz and glass. Materials of the bottom support membrane (230) may be selected from a group including SiO₂, Si₃N₄, SiON, as long as they have sufficient mechanical strength and low enough attenuation to acoustic waves. Materials of the bottom support membrane (230) and the bottom support membrane thickness (230t) may also be selected to effect a temperature compensation to reduce unwanted shift of resonant frequency due to temperature fluctuation during the operation. It should be mentioned that for a first piezoelectric semiconductor layer (250) doped to have a p-type conduction, the electric field distributions should have a negative slope.

The first piezoelectric semiconductor layer (250) is selected from a material group including: AlN, GaN, AlGaN, ZnO, GaAs, AlAs, AlGaAs, as long as they are piezoelectric with sufficient acoustic coupling coefficients, are semiconducting and can be doped to p-type and/or n-type conduction. The second piezoelectric semiconductor layer (270) is also selected from a material group including: AlN, GaN, AlGaN, ZnO, GaAs, AlAs, AlGaAs, as long as they are piezoelectric with sufficient acoustic coupling coefficients, are semiconducting and can be doped to p-type and/or n-type conduction. The first piezoelectric layer thickness (250t) and the second piezoelectric layer thickness (255t) are selected in a range of 20 nm to 50 μm dependent on the acoustic wave velocity in the first piezoelectric layer, the acoustic wave velocity in the second piezoelectric layer, the first frequency f_o1 and a plurality of other resonant frequencies required for the applications.

The first metal electrode M₁ (240) and the second metal electrode M₂ (290) may have a multilayer structure. For the top layer in the first metal electrode (240) which contacts the first piezoelectric semiconductor layer D₁ (250), the materials is advantageously selected to have a appropriate work function so that the first metal electrode (240) forms a ohmic contact with the first piezoelectric semiconductor layer (250). Materials of the bottom layer in the second metal electrode (290) which contacts the second piezoelectric semiconductor D₁ (270) are advantageously selected to have a appropriate work function so that the second metal electrode (290) forms an ohmic contact with the second piezoelectric semiconductor layer (270).

When the first piezoelectric semiconductor layer (250) is n-type and the second piezoelectric semiconductor layer (270) is doped to p-type, it is preferred to have the work function of the top layer in the first metal electrode (240) to be the same as or less than the first piezoelectric semiconductor layer work function. Whereas it is preferred to have the work function of the bottom layer in the second metal electrode to be the same as or larger than that of the second piezoelectric semiconductor layer. Materials for the top layer of the first metal electrode (240) may be selected from a material group including: Ti, Al, W, Mo, Ta, Nb, Ha and their alloys, whereas materials for the rest of the first metal electrode (240) may be selected from a material group including: Mo, Al, Ti, Cu, Au and their alloys to reduce electrical resistance. Materials for the bottom layer of the second metal electrode (270) may be selected from a group including: Ni, Pt, Pd, Au and their alloys as long as the work function is large enough. Materials for the rest of the second metal electrode may be selected from a group including: Mo, Al, Ti, Cu, Au and their combinations to reduce electrical resistance.

When the first piezoelectric semiconductor layer (250) is p-type and the second piezoelectric semiconductor layer (270) is doped to n-type, it is preferred to have the work function of the top layer in the first metal electrode (240) to be the same as or larger than the first piezoelectric semiconductor layer work function. Whereas it is preferred to have the work function of the bottom layer in the second metal electrode to be the same as or less than that of the second piezoelectric semiconductor layer. Materials for the top layer of the first metal electrode (240) may be selected from group including: Ni, Pt, Pd, Au and their alloys as long the work function is large enough. Materials for the rest of the first metal electrode may be selected from a group including: Mo, Al, Ti, Cu, Au and their combinations to reduce electrical resistance. Materials for the bottom layer of the second metal electrode (290) may be selected from a group of: Ti, Al, W, Mo, Ta, Nb, Ha and their alloys. Materials for the rest of the second metal electrode may be selected from a group including: Mo, Al, Ti, Cu, Au and their combinations to reduce electrical resistance.

Materials of the first metal electrode contact (240C) may be the same as that of first metal electrode (240) and it is preferably deposited in the same deposition run with the first metal electrode (240). Whereas materials of the second metal electrode contact (290C) and the second metal electrode contact interconnect (290I) may be the same as the second metal electrode (290) and they are preferably deposited in the same deposition run with the second metal electrode (290).

Materials of the bottom substrate (210) may be selected from a group including: Si, GaAs, sapphire, quart and glass. Materials of the bottom support membrane (230) may be selected from a group including: SiO₂, Si₃N₄, SiON, as long as they have sufficient mechanical strength and low enough attenuation to acoustic waves. Materials of the bottom support membrane (230) and the bottom support membrane thickness (230t) may also be selected to effect a temperature compensation to reduce unwanted shift of resonant frequency due to temperature fluctuation during the operation.

In order to improve thermal stability of the device (300a), the temperature compensation layer (295) is included. Materials of the temperature compensation layer (295) may be SiO₂ or SiON. The first passivation layer (298) may be selected from a material group of: SiO₂, Si₃N₄, SiON, HfO₂ and their mixtures.

An M₁D₁I₁D₂M₂ FBAR Structure with Integrated Biasing Resistors

In order to obtain an operation frequency, the value of DC biasing voltage V₁=V_DC+−V_DC− in the tunable MDDM FBAR provided in FIG. 3A may be too high for some mobile devices and the frequency tuning sensitivity may not be sufficiently precise. In order to reduce the required DC biasing voltage value and to improve the tuning sensitivity, a tunable M₁D₁I₁D₂M₂ FBAR or an MDIDM FBAR structure with at least one biasing resistor is provided according to another embodiment of this invention.

FIG. 3C shows a schematic diagram of a portion of an M₁D₁I₁D₂M₂ or an MDIDM FBAR structure (300c) with integrated biasing resistors. Here, M₁ is a first metal electrode, D₁ is a doped first piezoelectric semiconductor layer, I₁ is an intrinsic first piezoelectric semiconductor layer, D₂ is a doped second piezoelectric semiconductor layer D₂, and M₂ is a second metal electrode.

The MDIDM FBAR structure (300c) comprises a bottom substrate (210) with a bottom substrate thickness (210t); an acoustic isolation region (215) having an acoustic isolation region thickness (215t); a bottom support membrane (230) with a bottom support membrane thickness (230t); a first metal electrode (240) with a first metal electrode thickness (240t); a first metal electrode contact (240C) having a first metal electrode contact thickness (240Ct) connected to a negative terminal of a DC biasing voltage source; a first piezoelectric semiconductor layer (250) with a first piezoelectric layer thickness (250t), a first piezoelectric layer doping type and a first piezoelectric layer doping concentration; a first intrinsic piezoelectric semiconductor layer (255) with a first intrinsic piezoelectric layer thickness (255t); a second piezoelectric semiconductor layer (250) with a second piezoelectric layer thickness (250t), a second piezoelectric layer doping type which is opposite to the first piezoelectric layer doping type and a second piezoelectric layer doping concentration; a second metal electrode (290) with a second metal electrode thickness (290t); a second metal electrode contact (290C) having a second metal electrode contact thickness (290Ct) connected to a positive terminal of the DC biasing voltage source; a first temperature compensation layer (295) with a first temperature compensation layer thickness (295t) to improve thermal stability of the FBAR; a first passivation layer (298) with a first passivation layer thickness (298t) and a second metal electrode interconnect (290I) with a second metal electrode interconnect thickness (290It), wherein the second metal electrode interconnect (290I) is electrically connected to the second metal electrode (290) through an opening in the first passivation layer (298) and the first temperature compensation layer (295). In (300c), the acoustic isolation region (215) may be an air cavity or a multi layer reflector having a plurality of reflector layers for acoustic wave isolation.

It should be noted that in FIG. 3C, the first metal electrode contact (240C) can also be connected to a positive terminal of the DC biasing voltage source with the second metal electrode contact (290C) connected to the negative terminal of the DC biasing voltage.

The first piezoelectric semiconductor layer (250) is a doped semiconductor which may be n-type or p-type and preferably to be n-type. The first intrinsic piezoelectric semiconductor layer (255) is not intentionally doped with a low doping concentration (10¹³ cm⁻³ or less) and is electrically insulating and the second piezoelectric semiconductor layer (270) is a doped semiconductor. In FIG. 3C, the first piezoelectric semiconductor layer (250) has two parts separated by a first piezoelectric depletion region edge (250B): a first piezoelectric depletion region (250d) with a first piezoelectric depletion region thickness (250dt) and a first piezoelectric neutral region (250n) with a first piezoelectric neutral region thickness (250nt). Similarly, the second piezoelectric semiconductor layer (270) also has two parts which is separated by a second piezoelectric depletion region edge (270B): a second piezoelectric depletion region (270d) with a second piezoelectric depletion region thickness (270dt) and a second piezoelectric neutral region (270n) with a second piezoelectric neutral region thickness (270nt). The first piezoelectric neutral region (250n) and the second piezoelectric neutral region (270n) are electrically conducting while the first piezoelectric depletion region (250d), the second piezoelectric depletion region (270d) and the first intrinsic piezoelectric layer (255) are intrinsic and electrically insulating. In this MIDM FBAR, the first piezoelectric depletion region (250d), the first intrinsic piezoelectric layer (255) and the second piezoelectric depletion region (270d) form a combined piezoelectric active layer to allow interactions between the RF signals and acoustic signals to take place. Since the interactions between the RF signals and acoustic signals take place mainly in the combined piezoelectric active and given that (250dt) and (270dt) are adjustable by varying the polarity or/and the magnitude of the DC biasing voltage applied between the first metal electrode (240) and the second metal electrode (290), therefore, the resonant properties and frequencies of the MDIDM FBAR structure and any filters, switches or other devices based on the semiconducting piezoelectric layers microwave acoustic effect can be tuned and adjusted by changing the polarity and/or the magnitude of the DC voltage according to this invention.

A first biasing resistor (281) with a first biasing resistor resistance value R₁ and a second biasing resistor (282) with a second biasing resistor resistance value R₂ are integrated with the MDIDM FBAR (300c) for providing a DC bias voltage and an isolation between the RF signal and the DC biasing circuit. The first biasing resistor (281) and the second biasing resistor (282) are preferably integrated thin film resistors and may have different shapes. When the first biasing resistor (281) is preferably having a rectangular shape, it has a first biasing resistor length R_1L (281L), a first biasing resistor width R_1W (281W, FIG. 2B), a first biasing resistor thickness R_1T (281t) and a first biasing resistor sheet resistance R_□1. In the MDIDM FBAR structure (300c), the first biasing resistor (281) connects the first metal electrode (240) to the first metal electrode contact (240C), for providing a potential V_DC− through (240C) and (281) to the first metal electrode (240 or M₁) and for providing isolation between the RF signals from the DC voltage source circuit. When the second biasing resistor (282) is preferably having a rectangular shape, it has a second biasing resistor length R_2L (282L), a second biasing resistor width R_2W (282W), a second biasing resistor thickness R_2T (282T) and a second biasing resistor sheet resistance R_□2. In FIG. 3C, the second biasing resistor (282) connects the second metal electrode (290 or M2) to the second metal electrode contact (290C) through the second metal electrode interconnect (290I) for DC biasing and RF signals isolation. RF signals (RF₊, R₋) are either applied to the first metal electrode (240) and the second metal electrode interconnect (290I) or they are generated in the MDIDM FBAR (300c) and are obtained from the first metal electrode (240) and the second metal electrode interconnect (290I).

It should be pointed out that in FIG. 3C, the first metal electrode contact (240C) may also be connected to a positive terminal of the DC biasing voltage source with the second metal electrode contact (290C) connected to the negative terminal of the DC biasing voltage. According to one embodiment of the present invention, the DC biasing and the RF isolation of the MDIDM FBAR structure (300c) may be provided by using only one biasing resistor (either 281 or 282). If only the first biasing resistor (281) is used, the second metal electrode interconnect (290I) will be directly connected to the second metal electrode contact (290C). On the other hand, if only the second resistor (282) is used, the first metal electrode contact (240C) will be directly connected to the first metal electrode (240). Furthermore, a combination of a biasing resistor and a biasing inductor connected in series can as well be used to replace the first or/and the second biasing resistor to provide DC bias voltage to the MDIDM FBAR structure and an isolation between the RF signal and the DC biasing circuit.

The resistance values R₁ and R₂ of the first biasing resistor (281) and the second biasing resistor (282) are greater than 200 ohms and are preferably greater than 1,000 ohms for isolation of RF signals. The biasing resistor width R_1W and R_2W are not greater than the biasing resistor length R_1L and R_1L. The biasing resistor thickness R_1T and R_2T are preferably less than 2 μm and are more preferably less than 0.5 μm to facilitate subsequent pattering either by etching or by lift-off. The first and the second biasing resistor sheet resistances R_□1 and R_□2 are 10 ohms/□ or greater, preferably 100 ohms/□ or greater to obtain biasing resistor resistance value of 1,000 ohms or greater for allowing application of DC biasing voltages with a sufficient RF isolation. However, in order to keep a small enough RC constant and to reduce unwanted switching delay time for the FBAR, the biasing resistor resistance value R₁ and R₂ should not be too large.

Materials of the thin film biasing resistors may be metals such as Ni, Cr, Ta, W, Mo, NiCr and their alloys. They may also be metal oxide and metal oxynitride such as ZnO, ZnON, InSnO, InSnON, ZnInO ZnInON, ZnSnO, ZnSnON, RuO₂, TaN, Bi₂Ru₂O₇, RuO₂, Bi₂Ir₂O₇ and other semiconductors such as Si, as long as the sheet resistance of the biasing resistors is large enough and the biasing resistors have stable thermal properties. The layer of the biasing resistors may be deposited by vacuum methods such as evaporation, DC sputtering and RF sputtering in a chamber with Ar gas or with a gas mixture of Ar, O₂ and/or N₂. According to one embodiment of this invention, the first biasing resistor (281) and the second biasing resistor (282) are fabricated in same fabrication steps, preferably with the same materials, thickness, composition, and sheet resistance on the bottom support membrane (230) or on the bottom substrate (210). They may also be fabricated in different fabrication steps and have different materials, different thickness, different composition, and different sheet resistance.

In FIG. 3C, a potential V_DC+ is provided through the second metal electrode contact (290C), the second biasing resistor (282) and the second metal electrode interconnect (290I) to the second metal electrode (290 or M₂). V_DC+ and V_DC− produce a first DC biasing voltage V₁=V_DC+−V_DC− between the second metal electrode (290 or M2) and the first metal electrode (240 or M1). This first DC biasing voltage V₁ creates the first piezoelectric depletion region (250d) in the first piezoelectric layer (250) and the second piezoelectric depletion region (270d) in the second piezoelectric layer (270) with the first piezoelectric depletion region (250d) and the second piezoelectric depletion region (270d) adjacent to the first intrinsic piezoelectric layer (255). The first DC Biasing voltage V₁ also controls the first piezoelectric depletion region thickness (250dt) and the second piezoelectric depletion region thickness (270dt).

FIG. 3B shows the distribution of electric field magnitude ξ(x, V₁) with distance along the line D-D′ in the MDIDM FBAR structure in FIG. 3C. The solid line represents the electric filed ξ(x, V₁) with the first DC biasing voltage V₁=V_DC+−V_DC− applied between the second metal electrode (290 or M₂) and the first metal electrode (240 or M₁) and the dotted line represents the electric filed ξ(x, V₂) with a second DC biasing voltage V₂ applied between (290) and (240). It is noted that the maximum electrical field occurs in the first intrinsic piezoelectric semiconductor layer (255). Under the first DC biasing voltage V₁, the first piezoelectric depletion region (250d), the first intrinsic piezoelectric semiconductor layer (255) and the second piezoelectric depletion region (270d) together with a first mass loading due to a combination of the first piezoelectric neutral region (250n), the second piezoelectric neutral region (270n) and the second metal electrode (M₂, 290) yield a first resonant frequency f₁. When a second DC biasing voltage V₂ with a larger value is applied, the electric field magnitude in the first piezoelectric depletion region (250d), in the first intrinsic piezoelectric layer (255) and in the second piezoelectric depletion region (270d) increases to give new electric field distribution ξ(x, V₂). This change gives rise to a new first piezoelectric depletion region (250d′) with an increased first piezoelectric depletion region thickness (250dt′), a new first piezoelectric neutral region (250n′) with a decreased first piezoelectric neutral region thickness (250nt′), a new second piezoelectric depletion region (270d′) with an increased second piezoelectric depletion region thickness (270dt′) and a new second piezoelectric neutral region (270n′) with a decreased second piezoelectric neutral region thickness (270nt′). This results in increased thicknesses values for the first and second piezoelectric depletion regions (250d′, 270d′) and decreased thicknesses values for the first and the second piezoelectric neutral regions (250n, 270n), hence an increased combined piezoelectric active layer thickness. Together with a second mass loading with a decreased value as a result of a combination of the new first piezoelectric neutral region (250n′), the new second piezoelectric neutral region (270n′) and the second metal electrode (290), the increased combined piezoelectric active layer thickness effects resonance of the MDIDM FBAR (300c) at a second resonant frequency f₂. When a third DC biasing voltage V₃ is applied, a third resonant frequency f₃ will be created for the MDDM FBAR.

Thus, a plurality of resonant frequencies may be achieved in same MDIDM FBAR (300c) by applying a plurality of DC biasing voltages in a sequential manner through the first biasing resistor (281) and the second biasing resistor (282) to obtain voltage tuning of the resonant frequency without requiring any moving parts in the FBAR. Difference between the second resonant frequency and the first resonant frequency Δf=f₂−f₁ for a given DC basing voltage difference ΔV_DC=V₂−V₁ is determined by the first piezoelectric depletion thickness difference Δ250dt=250dt′−250dt=ΔW_N, the second piezoelectric depletion thickness difference Δ270dt=270dt′−270dt=ΔW_P, and the change in the mass loading.

A plurality of the tunable MDIDM FBAR (300c) each with integrated biasing resistors (281) R₁ and (282) R₂ according to this invention may be combined to form a band pass filter, switch, power divider for microwaves or millimetre waves.

As the magnitude for the slopes of the electric distribution curve ξ(x, V₁) and ξ(x, V₂) in the first piezoelectric layer depletion region (250d or 250d′) is proportional to the first piezoelectric layer doping concentration, whereas the magnitude for slopes of the electric distribution curve ξ(x, V₁) or ξ(x, V₂) in the second piezoelectric layer depletion region (270 or 270′) is proportional to the second piezoelectric layer doping concentration, thus the first piezoelectric layer doping concentration and the second piezoelectric layer doping concentration may be preferably adjusted according to the required frequency tuning sensitivity for the surface acoustic waves in the MDIDM FBAR (300c). The tuning sensitivity for the resonant frequency of the MDIDM FBAR (300c) is enhanced with the first piezoelectric layer doping concentration and the second piezoelectric layer doping concentration to be selected in a range of 10¹⁴ cm⁻³ to 10²¹ cm⁻³ or to be more preferably selected in the range of 10¹⁵ to 10²⁰ cm⁻³. It is noted that the distribution of doping concentration in the first piezoelectric semiconductor layer (250) and the distribution of doping concentration in the second piezoelectric semiconductor layer (270) need not to be a constant. It can be graded, stepped or have other concentration distributions.

The change in the DC biasing voltage (ΔV_DC) causes a change in the electric field magnitude Δξ_o, a change in the first piezoelectric depletion region thickness (ΔW_N) and a change in the second piezoelectric depletion region thickness (ΔW_P). The change in the DC biasing voltage (ΔV_DC) causes a change in the electric field magnitude Δξ_o in the first intrinsic piezoelectric semiconductor layer (255) and a change in the total depletion region thickness (ΔW_n+ΔW_p=[x_n(V₂)−x_n(V₁)]+[x_p(V₂)−x_p(V₁)]=[250dt′−250dt]+[270dt′−270dt]).

Due to the existence of the first intrinsic piezoelectric semiconductor layer (255), the change in the DC biasing voltage (ΔV_DC=V₂−V₁), given by the area between the dotted electric field magnitude curve ξ(x, V₂) and solid electric field magnitude curve ξ(x, V₁) is partly dropped across (255). And the area (ΔV_DC=V₂−V₁) has three parts: one between the two horizontal lines in the first intrinsic piezoelectric semiconductor layer (255), one other between the two inclined lines in the first piezoelectric semiconductor layer (250) and the other between the two inclined lines in the second piezoelectric semiconductor layer (270). Therefore, the same DC voltage change will cause a smaller change in the thickness (ΔW_n+ΔW_p) (ΔW_n+ΔW_p=[x_n(V₂)−x_n(V₁)]+[x_p(V₂)−x_p(V₁) as compared to the MDDM structure (300a) shown in FIG. 3A.

Due to the low ion density in the first intrinsic piezoelectric semiconductor layer (255), the electric field ξ_o1 required to form a first piezoelectric depletion region thickness (250dt) and a second piezoelectric depletion region thickness (270dt) for achieving the desired resonant frequency could be reduced compared to that in the MDDM FBAR structure shown in FIG. 3A. Furthermore, the variation of x_n(V) and x_p(V) with the variation of the DC biasing voltage V would be much less with the presence of the first intrinsic piezoelectric semiconductor layer (255), hence the tuning sensitivity of the resonant frequency by the DC voltage would increase. The MDIDM FBAR structure (300c) also allows a higher doping concentration for the first piezoelectric semiconductor layer (250) and the second piezoelectric semiconductor layer (270) than that for the MDDM structure (300a).

Material of the first piezoelectric semiconductor layer (250) and the second piezoelectric semiconductor layer (270) are selected from a compound material group including: AlN, GaN, AlGaN, ZnO, GaAs, AlAs, AlGaAs as long as they are piezoelectric with sufficient acoustic-electric coupling coefficients and are semiconducting and can be doped to p-type and/or n-type conduction. Material of the first intrinsic piezoelectric layer (255) is selected from a compound material group including: AlN, GaN, AlGaN, ZnO, GaAs, AlAs, AlGaAs, LiNbO₃, PZT, BaTiO₃, quartz and KNbO₃ as long as they are piezoelectric with sufficiently large acoustic-electric coupling coefficients and are compatible to the first piezoelectric layer (250). The first piezoelectric layer thickness (250t) and the second piezoelectric layer thickness (270t) are selected to be in a range of 20 nm to 50 μm, dependent on the acoustic wave velocity in the first piezoelectric semiconductor layer (250) and the first frequency f_o1 of resonant and a plurality of other resonant frequencies required for the application. The first intrinsic piezoelectric layer thickness (255t) is selected in a range of 20 nm to 50 μm dependent on the acoustic wave velocity in the first intrinsic piezoelectric layer and the first frequency f_o1 and a plurality of other resonant frequencies required for the applications.

Materials of the temperature compensation layer may be selected from a group of SiO₂ and SiON. The first passivation layer (298) may be selected from a material group of: SiO₂, Si₃N₄, SiON, HfO₂, and their mixtures. Materials of the bottom substrate (210) may be selected from a group including: Si, GaAs, sapphire, quartz and glass and materials of the bottom support membrane (230) may be selected from a group including SiO₂, Si₃N₄, SiON, as long as they have sufficient mechanical strength and low enough attenuation to acoustic waves. Materials of the bottom support membrane (230) and the bottom support membrane thickness (230t) may also be selected to effect a temperature compensation to reduce unwanted shift of resonant frequency due to temperature fluctuation during the operation.

Tunable FBAR Microwave Filter Circuits

According to another embodiment of this invention, a plurality of tunable FBAR resonators are connected and biased by adjustable DC voltages for forming a FBAR filter with tunable or adjustable resonant frequencies.

FIG. 4A is a schematic diagram showing two tunable FBAR resonators (340, 350) connected to form a microwave filter circuit (400a). This filter circuit (400a) comprises a first series resonator (340) and a second parallel or shunt resonator (350) connected at a first contact point (350T); a first coupling capacitor (340C) and a second coupling capacitor (350C) for blocking DC voltages; a first isolation resistor (340R) for isolation of RF signals; and a first DC voltage source V_DC1 connected at a first source point (340ST). When the first DC voltage source V_DC1 with a voltage value V_1s is applied between the source point (340ST) and a common point (330), a first DC voltage V_1s′ is applied across the combination of the first series resonator (340) and the second parallel resonator (350) through the first isolation resistor (340R) to establish biasing of the first series resonator (340) and the second parallel resonator (350). The bias voltage across the second resonator (350) is V_1s″ and the bias voltage across the first resonator (340) is given by V_1s′-V_1s″. The biasing voltages control the resonant central frequency f_o1 and effect transmission of a RF signal (360) applied to a first RF input contact (310) so that microwaves signals at and around the central frequency f_o1 and within the bandwidth of the filter circuit (400a) are allowed to propagate through the first resonator (340) to reach an RF output contact (320). The transmission central frequency f_o1 of microwaves is selected or controlled by value of the first DC voltage source V_DC1 according to this invention. A single first DC voltage source V_DC1 and a single isolation resistor is adopted in the microwave filter circuit (400a) to maintain bias for the first resonator (340) and the second resonator (350).

FIG. 4B is a schematic diagram showing two tunable TFBAR resonators (340, 350) connected to form a microwave filter circuit (400b) according to this invention. The microwave filter circuit (400b) comprises a first series resonator (340) and a second parallel or shunt resonator (350) connected at a first contact point (350T); a first coupling capacitor (340C) and a second coupling capacitor (350C) for blocking DC voltages; a first isolation resistor (340R) and a second isolation resistor (350R) for isolation of RF signals; a first DC voltage source V_DC1 connected at a first source point (340ST) and a second DC voltage source V_DC2 connected at a second source point (350ST). Two DC voltage sources are adopted in the filter circuit (400b) according to this invention to maintain biasing of the first series resonator and the second parallel resonator. When the first DC voltage source V_DC1 with a voltage value V_1s is applied between the first source point (340ST) and a common ground point (330), the first DC voltage V_1s′ is applied through the first isolation resistor (340R) across the combination of the first series resonator (340) and second parallel resonator (350) to establish biasing of the first series resonator (340) and the second parallel resonator (350). When the second DC voltage source V_DC2 with a second voltage value V_2p is applied between the second source point (350ST) and the common ground point (330), the second DC voltage V_2p is applied through the second isolation resistor (350R) across the second parallel resonator (350) to establish biasing of the second parallel resonator (350). The bias voltage across the second resonator (350) is V_2p′ and the bias voltage across the first resonator (340) is given by V_1s′-V_2p′. The first and second DC voltage sources control the central frequency f_o1 and effect transmission of RF signal (360) applied to a first RF input contact (310) so that microwaves signal at and around the central frequency f_o1 and within the bandwidth of the filter circuit (400b) are allowed to propagate through the first series resonator (340) to reach an RF output contact (320). Central frequency f_o1 of transmission of microwaves is selected or controlled by value of the first DC voltage source V_DC1 and the second DC voltage source V_DC2. By changing the first DC voltage value V_1s and the second DC voltage value V_2p, the biasing voltage across the first series resonator (340) and the second parallel resonator (350) can separately be controlled.

FIG. 4C shows a schematic diagram of a 3½ stage ladder filter (400c) for microwaves according to this invention. The 3½ stage ladder filter (400c) comprises first series resonators (340-1, 340-2, 340-3); second parallel resonators (350-1, 350-2, 350-3, 350-4), first coupling capacitors (340-0C, 340-1C, 340-2C, 340-3C) and a second coupling capacitor (350-4C) for blocking of DC voltages; first isolation resistors (340-1R, 340-2R, 340-3R) and a second isolation resistor (350-1R) for isolation of RF signals; first DC voltage sources V_DC1 with a voltage value V_1s, V_s2, V_s2 connected at first source points (340ST) and a second DC voltage source V_DC2 with a voltage value V_0p) connected at a second source point (350ST). The first DC voltage sources V_DC1 could be three separated voltage sources with different voltage values V_1s, V_s2, V_s2 (i.e. V_1s≠V_s2≠V_s2) or with the same voltage value (i.e. V_1s=V_s2=V_s2). The first DC voltage sources V_DC1 could also be a single DC voltage source V_DC1 with a voltage value of V_1s or V_s2, or V_s2. In the 3½ stage ladder filter (400c), each pair of the series resonator and the parallel resonator is connected at a first contact point (340-1T, 340-2T, 340-3T) and the second parallel resonator (350-1) is connected to the first coupling capacitor (340-0C) and the second isolation resistor (350-1R) at a second contact point (350-1T). The first DC voltage source V_DC1 with voltage values V_1s, V_2s, V_3s is applied through the first isolation resistors (340-1R, 340-2R, 340-3R) across the combination of the first series resonators (340-1, 340-2, 340-3) and the second parallel resonators (350-2, 350-3, 350-4) to establish biasing of the first series resonators (340-1, 340-2, 340-3) and the second parallel resonators (350-2, 350-3, 350-4). The second DC voltage source V_DC2 with a voltage of V_0p is applied to the second parallel resonator (350-1) through the second isolation resistor (350-1R) to establish biasing to (350-1). The biasing voltages control the central frequency f_o1 of the 3½ stage ladder filter and effect transmission of a RF signal (360) applied to a first RF input contact (310) so that microwaves signals at and around the central frequency f_o1 and within the bandwidth of the filter are allowed to propagate through the first resonators (340-1, 340-2, 340-3) to reach an RF output contact (320). The transmission central frequency f_o1 is selected or controlled by adjusting values of the first DC voltage sources V_DC1 and values of second DC voltage source V_DC2 according to this invention. Additional inductors may be added between each second parallel resonator and the Common ground.

FIG. 4D is a schematic diagram of a 3½ stage ladder filter (400d) microwaves according to this invention. The stage ladder filter (400d) comprises first series resonators (340-1, 340-2, 340-3); second parallel resonators (350-1, 350-2, 350-3, 350-4); first coupling capacitors (340-0C, 340-1C, 340-2C, 340-3C) and a second coupling capacitor (350-4C) for blocking DC voltages; first isolation resistors (340-1R, 340-2R, 340-3R) and second isolation resistors (350-1R, 350-2R, 350-3R, 350-4R) for isolation of RF signals; first DC voltage sources V_DC1 with voltage values of V_1s, V_2s, V_3s and second DC voltage sources V_DC2 with voltage values of V_0p, V_1p, V_2p, V_3p. In the stage ladder filter (400d), each pair of the series resonator and the parallel resonator is connected at a first contact point (340-1T, 340-2T, 340-3T) and the second parallel resonator (350-1) is connected to the first coupling capacitor (340-0C) and the second isolation resistor (350-1R) at a second contact point (350-1T). The first DC voltage sources V_DC1 with voltage values V_1s, V_2s, V_3s are applied through the first isolation resistors (340-1R, 340-2R, 340-3R) across the combination of the first series resonators (340-1, 340-2, 340-3) and the second parallel resonators (350-2, 350-3, 350-4) to establish biasing of the first series resonators (340-1, 340-2, 340-3) and the second parallel resonators (350-2, 350-3, 350-4). The second DC voltage sources V_DC2 with voltage values of V_0p, V_1p, V_2p, V_3p are applied to the second parallel resonators (350-1, 350-2, 350-3, 350-4) through second isolation resistors (350-1R, 350-2R, 350-3R, 350-4R) to establish biasing to each of the parallel resonators (350-1, 350-2, 350-3, 350-4). The biasing voltages control the central frequency f_o1 and effect transmission of a RF signal (360) applied to a first RF input contact (310) so that microwaves signals at and around the central frequency f_o1 and within the bandwidth of the filter (400d) are allowed to propagate through the first series resonators (340-1, 340-2, 340-3) to reach an RF output contact (320). Central frequency f_o1 of transmission of the microwaves is selected or controlled by adjusting values of the first DC voltage sources V_DC1 and values of the second DC voltage sources V_DC2 according to this invention. Additional inductors may be added between each second parallel resonator and the common ground.

Claims

1. A frequency tunable film bulk acoustic resonator FBAR with an MDM structure and integrated biasing resistors for microwave and millimetre waves comprises: a bottom substrate with a bottom substrate thickness;an acoustic isolation region having an acoustic isolation region thickness;a bottom support membrane having a bottom support membrane thickness;a first metal electrode with a first metal electrode thickness;a first metal electrode contact having a first metal electrode contact thickness connected to one terminal of a DC biasing voltage source;a first piezoelectric semiconductor layer with a first piezoelectric layer thickness, a first piezoelectric layer doping type and a first piezoelectric layer doping concentration;a second metal electrode with a second metal electrode thickness;a second metal electrode contact having a second metal electrode contact thickness connected to another terminal of said DC biasing voltage source;a first passivation layer with a first passivation layer thickness;a second metal electrode interconnect having a second metal electrode interconnect thickness, said second metal electrode interconnect is electrically connected to said second metal electrode through an opening in said first passivation layer; anda first biasing resistor with a first biasing resistor resistance value and a second biasing resistor with a second biasing resistor resistance value, wherein said first biasing resistor connects said first metal electrode to said first metal electrode contact and said second biasing resistor connects said second metal electrode interconnect to said second metal electrode contact to effect a DC biasing voltage having a polarity and a value between said first metal electrode and said second metal electrode and to isolate RF signals from said DC biasing voltage source,said DC biasing voltage creates a first piezoelectric depletion region with a first piezoelectric depletion region thickness and a first piezoelectric neutral region with a first piezoelectric neutral region thickness in said first piezoelectric semiconductor layer and forms a piezoelectric active layer to effect interactions between said RF signals and mechanical vibrations, wherein said first piezoelectric depletion region thickness is controlled by said polarity and value of said DC biasing voltage, a change in said DC biasing voltage causes a change in said first piezoelectric depletion region thickness and a change in mass loading associated with said first piezoelectric neutral region and hence effect a change in resonant frequency of said MDM FBAR.

2. A frequency tunable FBAR with an MDM structure and integrated biasing resistors for microwave and millimetre waves as defined in claim 1, wherein said first biasing resistor resistance value and second biasing resistor resistance value are preferably larger than 200 ohms and are more preferably larger than 1000 ohms.

3. A frequency tunable FBAR with an MDM structure and integrated biasing resistors for microwave and millimetre waves as defined in claim 1, wherein said first biasing resistor and second biasing resistor are thin film resistors fabricated to form an integrated tunable FBAR with said first piezoelectric semiconductor layer.

4. A frequency tunable FBAR with an MDM structure and integrated biasing resistors for microwave and millimetre waves as defined in claim 1, wherein materials of said first biasing resistor and second biasing resistor are selected from a group comprising: metals, metal alloys, metal oxides, metal nitrides, metal oxynitrides and their combinations.

5. A frequency tunable FBAR with an MDM structure and integrated biasing resistors for microwave and millimetre waves as defined in claim 1, further comprising a first intrinsic piezoelectric semiconductor layer with a first intrinsic piezoelectric layer thickness deposited between said first metal electrode and said first piezoelectric semiconductor layer to reduce said DC biasing voltage value and increase tuning sensitivity of said resonant frequency, forming a frequency tunable FBAR with an MIDM structure, wherein said first intrinsic piezoelectric semiconductor layer is selected from a compound material group including: AlN, GaN, AlGaN, ZnO, GaAs, AlAs, AlGaAs, LiNbO3, PZT, BaTiO3, quartz and KNbO3.

6. A frequency tunable FBAR with an MDM structure and integrated biasing resistors for microwave and millimetre waves as defined in claim 1, further comprising a first intrinsic piezoelectric semiconductor layer with a first intrinsic piezoelectric layer thickness deposited between said second metal electrode and said first piezoelectric semiconductor layer to reduce said DC biasing voltage value and increase tuning sensitivity of said resonant frequency, forming a frequency tunable FBAR with an MDIM structure, wherein said first intrinsic piezoelectric layer is selected from a compound material group including: AlN, GaN, AlGaN, ZnO, GaAs, AlAs, AlGaAs, LiNbO3, PZT, BaTiO3, quartz and KNbO3.

7. A frequency tunable FBAR with an MDM structure and integrated biasing resistors for microwave and millimetre waves as defined in claim 1, wherein materials of said bottom support membrane and bottom support membrane thickness are selected to effect a temperature compensation to reduce unwanted shift of resonant frequency during operations.

8. A frequency tunable FBAR with an MDM structure and integrated biasing resistors for microwave and millimetre waves as defined in claim 1, wherein material of said first piezoelectric layer is selected from a group including: AlN, GaN, AlGaN, ZnO, GaAs, AlAs, and AlGaAs.

9. A frequency tunable FBAR with an MDM structure and integrated biasing resistors for microwave and millimetre waves as defined in claim 1, wherein material of said substrate is selected from a groups including: Si, GaAs, glass, sapphire, AlN, Al2O3 as long as it has sufficiently high electrical resistivity, sufficient thermal conductivity and flat surfaces.

10. A frequency tunable FBAR with an MDM structure and integrated biasing resistors for microwave and millimetre waves as defined in claim 1, wherein said first piezoelectric layer doping concentration is controlled to be in the range of 1014 to 1021 to enhance tuning sensitivity for said resonant frequency of said FBAR.

11. A frequency tunable film bulk acoustic resonator FBAR with an MDDM structure and integrated biasing resistors for microwave and millimetre waves comprises: a bottom substrate with a bottom substrate thickness;an acoustic isolation region having an acoustic isolation region thickness;a bottom support membrane having a bottom support membrane thickness;a first metal electrode with a first metal electrode thickness;a first metal electrode contact having a first metal electrode contact thickness connected to one terminal of a DC biasing voltage source;a first piezoelectric semiconductor layer with a first piezoelectric layer thickness, a first piezoelectric layer doping type and a first piezoelectric layer doping concentration;a second piezoelectric semiconductor layer with a second piezoelectric layer thickness, a second piezoelectric doping type opposite to said first piezoelectric layer doping type, and a second piezoelectric layer doping concentration;a second metal electrode with a second metal electrode thickness;a second metal electrode contact with a second metal electrode contact thickness connected to another terminal of said DC biasing voltage source;a first passivation layer with a first passivation layer thickness;a second metal electrode interconnect having a second metal electrode interconnect thickness, said second metal electrode interconnect is electrically connected to said second metal electrode through an opening in said first passivation layer; anda first biasing resistor with a first biasing resistor resistance value and a second biasing resistor with a second biasing resistor resistance value, wherein said firs biasing resistor connects said first metal electrode to said first metal electrode contact and said second biasing resistor connects said second metal electrode interconnect to second metal electrode contact to effect a DC biasing voltage having a polarity and a value between said first metal electrode and said second metal electrode and to isolate RF signals from said DC biasing voltage source,said DC biasing voltage creates a first piezoelectric depletion region with a first piezoelectric depletion region thickness and a first piezoelectric neutral region with a first piezoelectric neutral region thickness in said first piezoelectric semiconductor layer and a second piezoelectric depletion region with a second piezoelectric depletion region thickness and a second piezoelectric neutral region with a second piezoelectric neutral region thickness in said second piezoelectric semiconductor layer and form a piezoelectric active layer to effect interactions between said RF signals and mechanical vibrations, wherein said first piezoelectric depletion region thickness and said second piezoelectric depletion region thickness are controlled by said polarity and value of said DC biasing voltage, a change in said DC biasing voltage causes a change in said first and said second piezoelectric depletion region thicknesses and a change in mass loading associated with said first and second piezoelectric neutral regions and hence effect a change in resonant frequency of said MDDM FBAR.

12. A frequency tunable FBAR with an MDDM structure and integrated biasing resistors for microwave and millimetre waves in claim 11, wherein said first biasing resistor resistance value and second biasing resistor resistance value are preferably larger than 200 ohms and are more preferably larger than 1000 ohms.

13. A frequency tunable FBAR with an MDDM structure and integrated biasing resistors for microwave and millimetre waves in claim 11, wherein of said first biasing resistor and second biasing resistor are thin film resistors fabricated to form an integrated tunable FBAR with said first piezoelectric semiconductor layer and said second piezoelectric semiconductor layer.

14. A frequency tunable FBAR with an MDDM structure and integrated biasing resistors for microwave and millimetre waves in claim 11, wherein materials of said first biasing resistor and second biasing resistor are selected from a group comprising: metals, metal alloys, metal oxides, metal nitrides, metal oxynitrides and their combinations.

15. A frequency tunable FBAR with an MDDM structure and integrated biasing resistors for microwave and millimetre waves in claim 11, further comprising a first intrinsic piezoelectric semiconductor layer with a first intrinsic piezoelectric layer thickness deposited between said first piezoelectric semiconductor layer and said second piezoelectric semiconductor layer to reduce said DC biasing voltage value and increase tuning sensitivity of said resonant frequency, forming an MDIDM FBAR structure, wherein said first intrinsic piezoelectric semiconductor layer is selected from a compound material group including: AlN, GaN, AlGaN, ZnO, GaAs, AlAs, AlGaAs, LiNbO3, PZT, BaTiO3, quartz and KNbO3.

16. A frequency tunable FBAR with an MDDM structure and integrated biasing resistors for microwave and millimetre waves in claim 11, wherein material of said bottom support membrane and bottom support membrane thickness are selected to effect a temperature compensation to reduce unwanted shift of resonant frequency during operations.

17. A frequency tunable FBAR with an MDDM structure and integrated biasing resistors for microwave and millimetre waves in claim 11, wherein materials of said first piezoelectric semiconductor layer and said second piezoelectric semiconductor layer are selected from a group including: AlN, GaN, AlGaN, ZnO, GaAs, AlAs, and AlGaAs.

18. A frequency tunable FBAR with an MDDM structure and integrated biasing resistors for microwave and millimetre waves in claim 11, wherein material of said substrate is selected from a groups including: Si, GaAs, glass, sapphire, AlN, Al2O3 as long as it has sufficiently high electrical resistivity, sufficient thermal conductivity and flat surfaces.

19. A frequency tunable FBAR with an MDDM structure and integrated biasing resistors for microwave and millimetre waves as defined in claim 1, whereas said first piezoelectric layer doping concentration and said second piezoelectric layer doping concentration are controlled to be in the range of 1014 to 1021 to enhance tuning sensitivity of said resonant frequency of said MDDM FBAR.

20. A microwave FBAR filter with tunable central frequency of resonance and transmission comprises, at least one first series tunable FBAR resonator;at least one second parallel tunable FBAR resonator, each pair connected at a first contact point;at least a first coupling capacitor and at least a second coupling capacitor for blocking of a DC voltage;at least a first isolation resistor for blocking of RF signals;at least a first DC voltage source VDC1 with a voltage value V1s applied through said first isolation resistor and across the combination of said first series resonator and second parallel resonator to establish biasing for said first series resonator and second parallel resonator and to control and adjust central frequency of resonant and transmission in said FBAR filter so that RF signals applied to a first RF input contact at and around said central frequency of resonant are allowed to propagate through said first resonators to reach an RF output contact hence central frequency of resonance and transmission in said tunable microwave FBAR filter is selected and controlled to a desired value by said first DC voltage source.

21. A microwave FBAR filter with tunable central frequency of resonance as defined in claim 20, further comprising at least a second isolation resistor for isolation of RF signals and a second DC voltage VDC2 sources connected to said second isolation resistor, said first DC voltage VDC1 and said second DC voltage VDC2 are adjusted so that central frequency of resonance and transmission in said tunable FBAR filter is selected and controlled to a desired value by said first DC voltage VDC1 and said second DC voltage VDC2.