The present invention relates to an ultrasonic probe for picking up an ultrasound image (for example, a diagnostic image) of an object to be inspected, an ultrasonic imaging apparatus, and an ultrasonic imaging method.
An ultrasonic imaging apparatus transmits and receives ultrasonic beams to and from an object to be inspected by an ultrasonic probe, and reconstructs an ultrasound image based on electrical signals output from the ultrasonic probe. The ultrasonic probe is formed by arranging a plurality of ultrasonic transducers which convert electrical signals into ultrasonic waves and vice versa.
In general, the transducers of this ultrasonic probe are formed by a piezoelectric material such as crystal, piezoelectric ceramics. Thus, the width of each transducer has a relatively large size (for example, a few millimeters) as a result of the manufacturing process, etc., of the piezoelectric material. Accordingly, the mutual distances among the plurality of transducers become large, and a certain limitation arises in the improvement of the resolution (resolving power) of an ultrasound image.
It is therefore desired to improve the resolution by decreasing the width of the transducers in the array direction including the method of manufacturing. Also, it is desired to develop an ultrasonic probe capable of changing the sound pressure of ultrasound beams in accordance with the distance between an imaging portion and the ultrasonic probe.
Also, the resolution of an ultrasound image depends on the beam width or the diameter (in the following, generically called a beam width) at the focal point resulting from the sound-pressure distribution of ultrasound beams. The beam width is determined by the width in the array direction (in the following, called a major-axis direction) of transducers and the width of the orthogonal direction to the major-axis direction (in the following, called a minor-axis direction). In order to narrow the width of the beams in the major-axis direction, dynamic focus processing is performed. At the same time, in order to narrow the width of the beams in the minor-axis direction, an acoustic lens is sometimes disposed at the ultrasonic-wave emission side of an ultrasonic probe, and individual transducers are sometimes formed to have different sizes and shapes with each other for adjusting the sound-pressure distribution of the ultrasound beams (for example, refer to Patent Document 1).
However, according to the method of disposing an acoustic lens or the method of having different size and shape of transducers are used, the sound-pressure distribution of the ultrasound beams is fixed, and thus the beam width and the focal point cannot be changed at image-pickuping time. Accordingly, a plurality of ultrasonic probes having different beam widths and the focal points must be prepared, and each of the ultrasonic probes must be replaced in accordance with an imaging portion, thereby the apparatus becomes difficult to use.
An object of the present invention is to achieve an ultrasonic probe having an improved resolution of ultrasound images and ease of use, and an ultrasonic imaging apparatus.
Patent Document 1: Japanese Unexamined Patent Application Publication No. 5-41899
According to the present invention, there is provided an ultrasonic probe including a plurality of transducers in an array for converting drive signals into ultrasonic waves to transmit the waves to an object to be inspected and converting the waves into electrical signals to receive ultrasonic waves generated from the object, wherein each of the transducers includes a plurality of oscillation elements, each of the oscillation elements has a characteristic of changing an electromechanical coupling coefficient in accordance with strength of a direct-current bias applied by being superposed on the drive signal, and an electrode of each of the transducers is connected to a terminal provided with the drive signal.
That is to say, an oscillation element having an electromechanical coupling coefficient changing in accordance with the strength of a direct-current bias can be made small compared with a piezoelectric element. Accordingly, an transducer can be formed with making intervals between the oscillation elements relatively small, and this is equivalent to subdividing the transducer, which makes it possible to improve the resolution of ultrasound images.
In particular, by making the strength of the direct-current bias applied on each oscillation element different individually, the strength of an ultrasonic wave emitted from each oscillation element differs in accordance with the strength of the direct-current bias. Accordingly, by controlling the strength of the direct-current bias applied on each oscillation element, it becomes possible to vary the strength of the ultrasound beam, or to have a desired sound-pressure distribution. As a result, it is possible to adjust the beam width of the ultrasound beam, the depth direction of a focal direction, and the position of the orientation direction in real time (for example, during an ultrasonic diagnosis) as needed, and thus an improvement in ease of use is achieved.
For example, if an transducer is formed by arranging oscillation elements in a minor-axis direction, the minor-axis direction is subdivided by the oscillation elements, and thus the resolution of an ultrasound image can be further improved. At the same time, it is possible to arbitrarily control the beam width in the minor-axis direction and the focal depth by controlling the sound-pressure distribution in the minor-axis direction.
In this case, the plurality of oscillation elements can be divided into a plurality of groups, and the electrode of each of the oscillation elements pertaining to a same group can be commonly connected. By this, it is possible to ensure the necessary strength of the ultrasonic wave for picking up an ultrasound image by determining the number of the oscillation elements pertaining to each group in consideration of the strength of the ultrasonic wave emitted from a single oscillation element.
Also, a plurality of oscillation elements may be divided into a plurality of groups in a minor-axis direction, and the electrode of each of the oscillation elements pertaining to the same group may be commonly connected. Also, a plurality of oscillation elements may be formed at equal intervals, the oscillation elements may be divided into a plurality of groups having an equal number of the oscillation elements, and the electrode of each of the oscillation elements pertaining to the same group are commonly connected. Also, a plurality of oscillation elements may be divided into a plurality of groups in a major-axis direction.
Also, a plurality of oscillation elements may be divided into a plurality of groups, the number of the oscillation elements pertaining to each of the divided groups may increase for each group as the element goes near a center of an ultrasonic aperture, and the electrode of each of the oscillation elements pertaining to the same group may be commonly connected. Also, the terminal connected to a electrode of the oscillation element may be connected to a power source through switching means.
Also, the oscillation elements may be formed by a material including a semiconductor compound. For example, the oscillation element may include a semiconductor substrate, a frame body made of a semiconductor compound placed on the semiconductor substrate, a film body made of a semiconductor compound disposed by closing the aperture of the frame body, and an electrode connected to the semiconductor substrate and the film body.
Also, according to the present invention, there is provided an ultrasonic imaging apparatus including: an ultrasonic probe described above; transmitting means for supplying drive signals to the oscillation elements of the ultrasonic probe; receiving means for processing electrical signals output from the oscillation elements; and image processing means for reconstructing an ultrasound image based on signals output from the receiving means; wherein bias means applying a direct-current bias on the oscillation elements by superposing the bias on the drive signal is connected to electrodes of the oscillation elements through the terminal.
In this case, the bias means may include a direct-current power source, distribution means for dividing a direct-current bias provided from the direct-current power source, and switching means for applying each direct-current bias supplied from the distribution means to electrodes of the oscillation elements in accordance with a control command through the terminal.
Also, a plurality of the oscillation elements may be divided into a plurality of groups, and the bias means may apply a direct-current bias having different strength for each of the groups to each of the oscillation elements. At this time, the plurality of oscillation elements are preferably divided into a plurality of groups in a minor-axis direction. Also, the plurality of oscillation elements may be divided into a plurality of groups in a major-axis direction. Also, the bias means may apply a direct-current bias increasing for each group as the element gets closer a center of an ultrasonic aperture. Also, the bias means may apply a direct-current bias to each oscillation element such that an electromechanical coupling coefficient of each of the oscillation elements increases as the element gets closer a center of a minor-axis direction. Also, a plurality of oscillation elements may be divided into a plurality of groups, and the bias means may select the oscillation element to which a direct-current bias is applied for each group in accordance with a distance from the ultrasonic probe to an imaging portion.
Also, it is possible to include storage means for storing signal strength of an ultrasonic wave transmitted from each of the oscillation elements before starting ultrasonic imaging and correction control means for generating a command to correct an electromechanical coupling coefficient of each of the oscillation elements based on the signal strength to a setting value. When ultrasonic imaging is performed, the bias means may apply a direct-current bias corrected based on the correction command to each of the oscillation elements.
Also, the bias means may alternatively apply a direct-current bias applied to each of the oscillation elements when an ultrasonic wave is transmitted from each of the oscillation elements to the object, or apply a direct-current bias to each of the oscillation elements when ultrasonic waves generated from the object are received by each of the oscillation elements.
Also, a plurality of oscillation elements may be divided into a plurality of groups, and the bias means may apply a direct-current bias having weight for each group symmetrically with respect to a center of an ultrasonic aperture in a minor-axis direction or in a major-axis direction to each of the oscillation elements. Also, a plurality of oscillation elements may be divided into a plurality of groups, and the bias means may apply a direct-current bias having weight for each group asymmetrically with respect to a center of an ultrasonic aperture in a minor-axis direction or in a major-axis direction to each of the oscillation elements.
Also, according to the present invention, there is provided a method of ultrasonic imaging including the steps of: applying a direct-current bias to a plurality of oscillation elements possessed by each transducer arrayed in an ultrasonic probe and changing an electromechanical coupling coefficient of each of the oscillation elements to a setting value; supplying a drive signal to each of the oscillation elements by superposing the drive signal on the direct-current bias and transmitting an ultrasonic wave to an object to be inspected from each of the oscillation elements; and receiving an ultrasonic wave generated by the object by each of the oscillation elements to convert the wave into an electrical signal and reconstructing an ultrasound image based on the converted electrical signal.
A description will be given of a first embodiment of an ultrasonic probe to which the present invention is applied and an ultrasonic imaging apparatus with reference to the drawings.
As shown in
In such an ultrasonic imaging apparatus, the transmitting means 12 supplies drive signals to the ultrasonic probe 10 that is in contact with an object to be inspected. Each transducer of the ultrasonic probe 10 transmits an ultrasonic wave to the object by the supplied drive signal. The ultrasonic wave generated from the object is received by each transducer of the ultrasonic probe 10. The reflection echo signal output from the ultrasonic probe 10 is subjected to receiving processing such as amplification, analog-digital conversion, by the receiving means 16. The reflection echo signal which was subjected to the receiving processing is subjected to beam-forming and addition by the beam-forming addition means 18. The reflection echo signal which was subjected to the beam-forming and addition is reconstructed into an ultrasound image (for example, a diagnosis image such as a tomogram, a blood-flow image) by the image processing means 20. The reconstructed diagnosis image is displayed to the display means 22.
The transducers 26a to 26m convert drive signals supplied from the transmitting means 12 into ultrasonic waves to transmit the ultrasonic waves to an object to be inspected, and receives the ultrasonic waves generated from the object to convert the waves into electrical signals. The backing material 28 restrains excessive oscillations of the transducers 26a to 26m by absorbing the propagation of the ultrasonic waves emitted at the back surface side of the transducers 26a to 26m. The matching layer 30 performs the matching of acoustic impedance between the transducers 26a to 26m and the object, thereby improving the transmission efficiency of the ultrasonic waves. The acoustic lens 32 is formed by being curved toward the object side, and makes the ultrasound beams emitted from the transducers 26a to 26m converge. In this regard, the arranging direction of the transducers 26a to 26m is called the major-axis direction X, and the direction orthogonal to the major-axis direction X is called as the minor-axis direction Y.
The oscillation elements 34-1 to 34-30 are formed by being disposed at equal intervals in the major-axis direction X and in the minor-axis direction Y. However, the elements may be formed at irregular intervals. Also, the oscillation elements 34-1 to 34-30 are divided into three groups (in the following, called sections) P1 to P3 in the minor-axis direction Y. The oscillation elements 34-1 to 34-10 pertaining to the section P1 are commonly connected to an electrode 35. The oscillation elements 34-11 to 34-20 pertaining to the section P2 are commonly connected to an electrode 36. The oscillation elements 34-21 to 34-30 pertaining to the section P3 are commonly connected to an electrode 37.
The oscillation element 34-1 is produced by micro fabrication by a semiconductor process. For example, a silicon wafer to be a substrate 40 is provided. An oxide film is formed on the silicon wafer in a wet atmosphere. The substrate on which the oxide film has been formed is subjected to pattern forming, resist application, etc., and then is subjected to etching processing to form the frame body 42. Predetermined gas is filled in the inside of the formed frame body 42. Nickel (Ni) is deposited on the frame body 42 by LPCVD (Low Pressure Chemical Vapor Deposition), thereby forming the film body 44. The electrodes 35-1 and 35-2 are formed by depositing metal electrode. A plurality of oscillation elements are formed on the silicon wafer by those processes. Each of the formed oscillation elements has a diameter of a few micrometers (for example, 10 μm). The wafer on which the oscillation elements are formed is cut into a plurality of pieces as the transducers 26a to 26m by MEMS (Micro Electro Mechanical System). The transducers 26a to 26m that have been cut are arranged on the backing material 28, and then are bonded on a probe-head substrate. The drive-signal power source 50 and the direct-current bias power source 51 are connected to the probe-head substrate through the connection terminals 49-1 and 49-2. In this regard, the matching layer 30, the acoustic lens 32, etc., are also attached to the transducers 26a to 26m.
To such oscillation elements 34-1 to 34-30, for example, CMUT (Capative Micromachined Ultrasonic Transducer: IEEE Trans. UItrason. Ferroelect. Freq. Contr. Vol15 pp. 678-690 May 1998) can be applied.
On the other hand, when a bias voltage Vb (Vb>Va) is applied to the oscillation element 34-1 instead of the bias voltage Va, the tension of the film body 44 is changed by the applied bias voltage Vb. Thus, the electromechanical coupling coefficient of the oscillation element 34-1 becomes Sb (Sb>Sa) (
As above, it is possible to change the degree of the tension of the film body 44 by controlling the bias voltage value applied to the oscillation element 34-1. The degree of the tension of the film body 44 causes the electromechanical coupling coefficient to change. Accordingly, it is possible to adjust the strength (for example, the magnitude of amplitude) of the ultrasonic wave transmitted and received by the oscillation element 34-1 by changing the electromechanical coupling coefficient by controlling the bias voltage value. As a result, it becomes possible to arbitrarily change the sound-pressure distribution of the ultrasound beams by adjusting the strength of each of the ultrasonic waves transmitted from and received to a plurality of the oscillation elements 34-1 to 34-30.
For convenience of explanation,
The switching means 53 is provided corresponding to the number of the sections P1 to PA. Accordingly, the value of the direct-current bias applied to the electrode of each of the sections P1 to PA is adjusted by the number of closings of the switches 53-1 to 53-n of each switching means 53. For example, for the section P1 located at the end of the transducer 55 in the minor-axis direction Y, a bias voltage Va is applied by turning only the switch 53-1 on. For the section P (A/2) located at the center of the transducer 55 in the minor-axis direction Y, a bias voltage (Va×n) is applied to the electrode by turning all the switches 53-1 to 72-n on. In this manner, by changing the number of switches 53-1 to 72-n to be turned on in each switching means 53, it is possible to make the bias voltage to be applied to each section of the transducer 55 different for each section.
When a bias voltage V1 is applied to the electrode 35 of the section P1 and the electrode 37 of the section P3, the electromechanical coupling coefficients of the oscillation elements 34-1 to 34-10 and 34-21 to 34-30 pertaining to the sections P1 and P3, respectively, become Sa. At the same time, when a bias voltage V2 (V2>V1) is applied to the electrode 36 of the section P2, the electromechanical coupling coefficients of the oscillation elements 34-11 to 34-20 pertaining to the sections P2 become Sb (Sa>Sb).
That is to say, when the bias voltage value is increased for each section as the position gets closer the center of the ultrasonic aperture, as shown in
As described above, according to the present embodiment, the oscillation elements 34-1 to 34-30 having the electromechanical coupling coefficient values changing in accordance with the direct-current bias value are formed to have, for example, a few micrometers in size. Thus, the oscillation element becomes finer than piezoelectric elements made of a piezoelectric material. Accordingly, by forming each transducer (for example, transducer 26a) with the intervals of the oscillation elements 34-1 to 34-30 made relatively small, it becomes equivalent to the fractionization of the transducer. Thus, it is possible to improve the resolution of an ultrasound image.
In particular, by making the value of the direct-current bias applied on each of the oscillation elements 34-1 to 34-30 different for section or for each oscillation element, the strength of an ultrasonic wave emitted from each of the oscillation elements 34-1 to 34-30 becomes different in accordance with the value of the direct-current bias. Accordingly, by controlling the strength of the direct-current bias applied on each oscillation element, it becomes possible to vary the strength of the ultrasound beam, or to have a desired sound-pressure distribution. As a result, it is possible to adjust the beam width of an ultrasound beam, the depth direction of a focal direction, and the position of the orientation direction in real time (for example, during an ultrasonic diagnosis) as needed, and thus ease of use is improved.
For example, as shown in
Also, as shown in
Also, when the strength of the ultrasonic wave emitted from a single oscillation element (for example, the oscillation element 34-1) is strong, bias voltages having a different value for each of the oscillation elements 34-1 to 34-30 in place of for each section may be applied. By this, the adjustment range of the sound-pressure distribution of the ultrasound beams can be still further subdivided. Also, since the transducers 26a to 26c are divided into a plurality of sections P1 to P3 in the minor-axis direction Y, it is possible to adjust the sound-pressure distribution of the ultrasound beams in the minor-axis direction Y for each section.
The present invention has been described based on the first embodiment. However, the present invention is not limited to this. For example, the transducers in
Also, the beam width in the major-axis direction X and the focal depth of the transducers 26a to 26c shown in
Also, according to the present embodiment, by making the direct-current bias applied to each of the oscillation elements 34-1 to 34-30 different, if the transmitting means 12 supplies a common drive signal (for example, a drive signal having the same amplitude) to the ultrasonic probe 10, it is possible to control the sound-pressure distribution of the ultrasound beams. Accordingly, the circuit of the transmitting means 12 comes to have a simpler configuration than a transmitting system circuit generating drive signals with individually different amplitudes.
Also, as shown in
Also, for switching means shown in
A description will be given of a second embodiment of an ultrasonic probe to which the present invention is applied and an ultrasonic imaging apparatus with reference to the drawings. The present embodiment is different from the first embodiment in the point that a plurality of groups (sections) of each transducer is further divided into a plurality of groups, and a different direct-current bias value is applied to each group. Accordingly, the description of the same portion as that of the first embodiment is omitted, and a description will be given on the different points. In this regard, a description will be given by adding the same letters and numerals to the mutually corresponding portions.
By applying a bias voltage Va to the sections P1 to P3 pertaining the group G11 and the sections P7 to P9 pertaining the group G13, the electromechanical coupling coefficients of the oscillation elements pertaining to the sections P1 to P3 and P7 to P9 become Sa. At the same time, by applying a bias voltage Vb to the sections P4 to P6 pertaining the group G12, the electromechanical coupling coefficients of the oscillation elements pertaining to the sections P4 to P6 become Sb. That is to say, as shown in
Also, as shown in
By applying a bias voltage Va to the sections P1 and P2 pertaining the group G21 and the sections P8 and P9 pertaining the group G25, the electromechanical coupling coefficients of the oscillation elements pertaining to the sections P1, P2, P8, and P9 become Sa. By applying a bias voltage Vb to the sections P3 and P4 pertaining the group G22 and the sections P6 and P7 pertaining the group G24, the electromechanical coupling coefficients of the oscillation elements pertaining to the sections P3, P4, P6, and P7 become Sb. By applying a bias voltage Vc (Vc>Vb>Va) to the section P5 pertaining the group G23, the electromechanical coupling coefficients of the oscillation elements pertaining to the section P5 become Sc. That is to say, as shown in
According to the present embodiment, as is understood from the weighting functions 71 and 72 shown in
A description will be given of a third embodiment of an ultrasonic probe to which the present invention is applied and an ultrasonic imaging apparatus with reference to the drawings. The present embodiment is different from the first to the second embodiments in the point that a direct-current-bias applied section is changed in accordance with a focal depth. Accordingly, the description of the same portion as that of the first and the second embodiments is omitted, and a description will be given on the different points. In this regard, a description will be given by adding the same letters and numerals to the mutually corresponding portions.
As shown in
According to the present embodiment, by changing the section to which a bias voltage is applied for each time when reflection echo signals generated from the focal points A to C are received, it is possible to change the ultrasonic aperture for receiving the reflection echo signals in accordance with the depth of the focal points A to C. Accordingly, it becomes equivalent to the case where a variable-aperture technique, in which the receiving aperture is automatically made smaller as the focal depth becomes shallower, is applied. Thus, it is possible to improve the direction resolution of the portion near the ultrasonic probe 10 in the minor-axis direction.
Also, as is understood from the weighting functions 74, 75, and 76 shown in
Also, a description has been given mainly of the operation when reflection echo signals generated from the focal points A to C are received. However, the present embodiment can be applied to the case where ultrasonic waves are transmitted from the transducer 73. For example, a section of the transducer 73 is selected in accordance with the depth of the focal position of the ultrasound beam. When a drive signal is input into the transducer 73, a bias voltage is applied to the selected section ultrasonic waves are emitted from the sections to which the bias voltage has been applied. By this means, by controlling the number of sections to be selected and by controlling the value of voltage bias, it is possible to optimize the beam shape of the ultrasound beams in accordance with the depth of the focal point.
Also, the present embodiment can be appropriately combined with the first and the second embodiments and the variations thereof.
A description will be given of a fourth embodiment of an ultrasonic probe to which the present invention is applied and an ultrasonic imaging apparatus with reference to the drawings. The present embodiment is different from the first to the third embodiments in the point that a bias voltage having a different value is applied to each of the transducers arranged in the major-axis direction X in order to control the sound-pressure distribution of the ultrasound beams in the major-axis direction X. Accordingly, the description of the same portion as that of the first to the third embodiments is omitted, and a description will be given on the different points. In this regard, a description will be given by adding the same letters and numerals to the mutually corresponding portions.
In the present embodiment, a relatively large bias voltage is applied to the transducer located at the central part in the major-axis direction X. Also, a bias voltage having a smaller value for each transducer as the position goes from the central part to an end part in the major-axis direction X is applied to each transducer. For example, a relatively large bias voltage is applied to the transducer 26 (m/2). A relatively small bias voltage is applied to the transducers 26a and 26m. Thus, the sound-pressure distribution of the ultrasound beams in the major-axis direction X has a smaller strength as the position gets from the central part to an end part in the major-axis direction X as shown by the weighting function 78 in
According to the present embodiment, by controlling the value of the bias voltage applied to each of the transducers 26a to 26m arranged in the major-axis direction X, it is possible to change the sound-pressure distribution of the ultrasound beams in the major-axis direction X in real time. In this regard, when controlling the sound-pressure distribution of the ultrasound beams in the major-axis direction X, a dynamic focusing technique may be used at the same time.
Also, the present embodiment can be appropriately combined with the first to the third embodiments and the variations thereof.
A description will be given of a fifth embodiment of an ultrasonic probe to which the present invention is applied and an ultrasonic imaging apparatus with reference to the drawings. The present embodiment is different from the first to the fourth embodiments in the point that both of the sound-pressure distributions of the ultrasound beams in the major-axis direction X and in the minor-axis direction Y are controlled. Accordingly, the description of the same portion as that of the first to the fourth embodiments is omitted, and a description will be given on the different points. In this regard, a description will be given by adding the same letters and numerals to the mutually corresponding portions.
In the present embodiment, in the minor-axis direction Y, a bias voltage applied to the sections G11 and G13 are made relatively small, and a bias voltage applied to the section G12 is made relatively large. Thus, the sound-pressure distribution of the ultrasound beams in the minor-axis direction Y becomes the distribution represented as the weighting function 80 shown in
According to the present embodiment, as shown in
Also, the present embodiment can be appropriately combined with the first to the fourth embodiments and the variations thereof.
A description will be given of a sixth embodiment of an ultrasonic probe to which the present invention is applied and an ultrasonic imaging apparatus with reference to the drawings. The present embodiment is different from the first to the fifth embodiments in the point that the variations of the electromechanical coupling coefficients due to the manufacturing process of oscillation elements is corrected. Accordingly, the description of the same portion as that of the first to the fifth embodiments is omitted, and a description will be given on the different points. In this regard, a description will be given by adding the same letters and numerals to the mutually corresponding portions.
In the present embodiment, before starting ultrasonic imaging, the bias means 14 applies a common bias voltage g0(n) to oscillation elements pertaining to each of the sections P1 to P7. By this, ultrasonic waves are transmitted from the oscillation elements pertaining to each of the sections P1 to P7. The strength of the signal of the transmitted ultrasonic wave is measured for each of the sections P1 to P7. The measured signal strength is stored in each of the RAMs 86-1 to 86-7 corresponding to each of the sections P1 to P7 (preliminary measurement process). The difference between the signal strength read out from the RAMs 86-1 to 86-7 and a predetermined setting value is obtained by the correction control means 88. A correction bias voltage to be the setting value of the electromechanical coupling coefficient for each of the sections P1 to P7 is calculated based on the obtained difference. The calculated correction bias is output from the correction control means 88 to the control means 24 (correction process). The control means 24 outputs a command to the bias means 14 based on the output correction bias voltage. The bias means 14 applies the correction bias voltages to each of the sections P1 to P7 in accordance with the command from the control means 24.
A detailed description will be given of the control of the correction control means 88. It is assumed that the electromechanical coupling coefficient of each of the sections P1 to P7 is f(n). When a drive signal with an amplitude of “1” is input into each of the sections P1 to P7, the ultrasonic signal S transmitted for each of the sections P1 to P7 is represented by α×f(n). In this regard, n is the number of the section and α is a predetermined coefficient.
If the electromechanical coupling coefficients of the individual the sections P1 to P7 are the same, the ultrasonic signals S transmitted for each of the sections P1 to P7 become the same. However, if the electromechanical coupling coefficients of the individual sections P1 to P7 are different (
On this point, in the present embodiment, the correction bias voltage g(n) for making uniform the ultrasonic signals of each of the sections P1 to P7 by the correction control means 88 is calculated as the expression 1.
g(n)=g0(n)/{α×f(n)} (Expression 1)
As is understood from the expression 1, the bias voltage is weighted in accordance with the value of the ultrasonic signal S of each of the sections P1 to P7 (
According to the present embodiment, when oscillation elements and sections P1 to P7 are formed in an transducer, if variations arise in the electromechanical coupling coefficients of the sections P1 to P7 caused by the formation process of the oscillation elements and sections, the bias voltages to be applied to the individual sections P1 to P7 are corrected in accordance with those variations. Thus, it becomes equivalent to the case where the electromechanical coupling coefficients of the individual sections P1 to P7 are uniform. This produces results in which the ultrasonic waves transmitted from individual sections P1 to P7 increase the strength at the focal point and decrease the strength at the other points, and thereby making it possible to form good ultrasonic beams.
In the present embodiment, a description will be given of the example in which bias voltages to be applied to the individual sections P1 to P7 are corrected based on the variations of the electromechanical coupling coefficients for each of the sections P1 to P7. However, the corrections may be performed for each transducer or for each oscillation element. Also, the present embodiment can be appropriately combined with the first to the fifth embodiments and the variations thereof.
A description will be given of a seventh embodiment of an ultrasonic probe to which the present invention is applied and an ultrasonic imaging apparatus. The present embodiment is different from the sixth embodiment in the point that the variations due to the transmitting/receiving circuit are corrected. The description of the same portion as that of the sixth embodiment is omitted, and a description will be given on the different points.
In the present embodiment, the RAMs 86-1 to 86-7 in
For example, assume that the output signal of the transmitting means 12 is T(n) when a drive signal with an amplitude of “1” is input into the transmitting means 12. Also, assume that the output signal of the transmitting/receiving separation switch 84 is TR-t(n) when a drive signal with an amplitude of “1” is input into the transmitting/receiving separation switch 84. In this case, the ultrasonic signal ST emitted from each of the sections P1 to P7 is represented as the expression 2. Accordingly, the correction control means 88 calculates the correction bias signal gt(n) to be applied to each of the sections P1 to P7 as the expression 3. As is understood from the expression 3, the correction is performed equivalently to the case where there are no signal variations which are caused by the transmitting system circuit and which influence on the ultrasonic wave transmitted from each of the sections P1 to P7. By this means, it is possible to decrease the artifact caused by the ultrasound image so as to improve the S/N of the ultrasound image.
ST=T(n)×TR-t(n)×(α×f(n)) (Expression 2)
gt(n)=g0(n)/ST (Expression 3)
Also, assume that the output signal of the transmitting/receiving separation switch 84 is TR-r(n) when a reflection echo signal with an amplitude of “1” is input into the transmitting/receiving separation switch 84. Also, assume that the output signal of the receiving means 16 is R(n) when a reflection echo signal with an amplitude of “1” is input into the receiving means 16. In this case, the reflection echo signal SR output from the receiving means 16 for each of the sections P1 to P7 is represented as the expression 4. Accordingly, the correction control means 88 calculates the correction bias signal gr(n) to be applied to each of the sections P1 to P7 as the expression 5. By this means, the correction is performed equivalently to the case where there are no signal variations which are caused by the receiving system circuit and which influence on the reflection echo signal output from each of the sections P1 to P7. By this means, it is possible to decrease the artifact caused by the ultrasound image so as to improve the S/N of the ultrasound image.
SR=TR−r(n)×R(n)×(α×f(n)) (Expression 4)
gr(n)=g0(n)/SR (Expression 5)
According to the present embodiment, the bias signal gt(n) is applied to each of the sections P1 to P7 when the ultrasound beams are transmitted. When ultrasound beams are received, the bias signal is changed to the bias signal gr(n) to be applied. Thus it is possible to correct the variations of the ultrasonic signals caused by the transmitting/receiving separation switch 84, the transmitting means 12, and the receiving means 16 in addition to the variations of the electromechanical coupling coefficients. Accordingly, it is possible to decrease the artifact caused by the ultrasound image so as to improve the S/N of the ultrasound image.
In summary, the present embodiment has a preliminary measurement process in which the direct-current bias g0(n) is applied to the oscillation elements for each of the sections P1 to P7 and the electromechanical coupling coefficients of individual sections P1 to P7 are measured. Also, the present embodiment has a correction process in which the value of the direct-current bias g0(n) is corrected to gr(n) based on the measured electromechanical coupling coefficients. By applying the bias with changing the direct-current bias gt(n) applied to the oscillation elements when the oscillation elements transmit the ultrasonic waves, and the direct-current bias gr(n) applied to the oscillation elements when the oscillation elements receive the waves, it is possible to correct the signal variations of the transmitting system circuit and the signal variations of the receiving system, respectively. In this regard, the value of the direct-current bias gt(n) may be different from the direct-current bias gr(n).
In the present embodiment, a description has been given of the example in which bias voltages to be applied to the individual sections P1 to P7 are corrected based on the variations of the electromechanical coupling coefficients for the individual sections P1 to P7. However, the corrections may be performed for each transducer or for each oscillation element. Also, the present embodiment can be appropriately combined with the first to the fifth embodiments and the variations thereof.
The present invention has been described based on the embodiments. However, the present invention is not limited to these. For example, in
Also, in
Number | Date | Country | Kind |
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2003-344512 | Oct 2003 | JP | national |
Filing Document | Filing Date | Country | Kind | 371c Date |
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PCT/JP04/13949 | 9/24/2004 | WO | 3/31/2006 |