Ultrasonic wave thickness meter

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Information

Patent Grant
D254778

References
Source

Patent Number
D254,778
Date Filed
Thursday, January 5, 1978
46 years ago
Date Issued
Tuesday, April 22, 1980
44 years ago

Inventors
Original Assignees
- Tokyo Keiki Co., Ltd.
Examiners
- Holtje; Nelson C.
Agents
- Haseltine, Lake & Waters

US Classifications
- D10 - Measuring, testing, or signalling instruments
Field of Search
- US
- D10 46
- D10 75
- D10 78
- D10 47
- 073 597
- 073 431
- 073 432 R
International Classifications
- Term of Grant
  14Years

Information

Abstract

Description

Claims

The ornamental design for an ultrasonic wave thickness meter, as shown and described.

Priority Claims (1)

Number	Date	Country	Kind
52-26412	Jul 1977	JPX

US Referenced Citations (4)

Number	Name	Date	Kind
D189849	Koch	Mar 1961
D213962	Potruch	Apr 1969
D246956	Perry	Jan 1978
D248734	Husseri	Aug 1978

Non-Patent Literature Citations (3)

Entry
Krautkramer-Brochure-2/76-D-Meter Wall Thickness Gauge.
Metrifast-Flyer-5/24/77-Metal Detector.
Product Engineering-10/78-p. 106-Thickness Gauge at top left.