Ultrasonic wave thickness meter

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Information

Patent Grant
D271568

References
Source

Patent Number
D271,568
Date Filed
Friday, March 27, 1981
44 years ago
Date Issued
Tuesday, November 29, 1983
41 years ago

Inventors
Original Assignees
- Tokyo Keiki Co., Ltd.
Examiners
- Holtje; Nelson C.
Agents
- Fleit, Jacobson, Cohn & Price

US Classifications
- D10 - Measuring, testing, or signalling instruments
Field of Search
- US
- D10 46-47
- D10 57
- D10 75
- D10 78
- D10 102
- D10 103
- D10 61
- D10 70
- 073 597
- 073 431
- 073 432 R
International Classifications
- Term of Grant
  14Years

Information

Abstract

Description

Claims

The ornamental design for an ultrasonic wave thickness meter, as shown and described.

Priority Claims (1)

Number	Date	Country	Kind
55-45358	Oct 1980	JPX

US Referenced Citations (9)

Number	Name	Date	Kind
D189849	Koch	Mar 1961
D193715	Koch	Oct 1962
D213962	Potruch	Apr 1969
D246956	Perry	Jan 1978
D249475	Turner	Sep 1978
D254778	Kitada	Apr 1980
D255997	Maeda	Jul 1980
D256896	Kuramoto	Sep 1980
D264190	Muller	May 1982

Foreign Referenced Citations (6)

Number	Date	Country
13703	Mar 1978	DEX
13589	Apr 1978	DEX
40913	Jul 1977	FRX
443788	Nov 1976	JPX
443788	Jul 1977	JPX
982833	Jan 1979	GBX

Non-Patent Literature Citations (3)

Entry
Krautkamer-Brochure-2/76-"D-Meter" Wall Thickness Gauge.
Metrifast-Flyer-5/24/77-Metal Detector.
Product Engineering-10/78-p. 106-Thickness Gauge at top left.