Embodiments of the disclosure relate to a technical field of manufacturing electronic devices, especially relate to a vacuum evaporation coating equipment.
Vacuum evaporation coating equipment is widely used in manufacturing integrated circuits, LEDs (light-emitting diode) and other semiconductor wafer chips, and the common mode is electron beam heating.
In the multi-layer film coating process, the corresponding thickness of different layers is different. For example, in the case of metal electrode preparation, for example, the layer with an electrical conductivity property in the metal electrode film has a maximum thickness (about several micrometers), and the layer with function of adhesion, block, or ohmic contact is relatively thinner (about dozens of nanometers). The difference between the thicknesses of the two layers may be up to tens of times or even hundreds of times, such a large thickness difference would cause the difference in fall height of the evaporated liquid during the evaporation coating process for fabricating the respective two layers. As a result, the impact of the evaporation angle on fabricating the two layers is different, and it is difficult to make all the layers uniform under high benchmark conditions, while sharing the same correction mask.
Therefore, in prior art, for the various types of evaporation sources in the cavity of the vacuum evaporation coating equipment, it is difficult to ensure that all the layers simultaneously satisfy high uniformity benchmark, by using only one correction mask.
The object of the disclosure is to provide a vacuum evaporation coating equipment, and solve the problem that high uniformity of all the layers cannot be satisfied while using a single correction mask in a plurality of evaporation sources in prior art.
A vacuum evaporation coating equipment, comprising: an evaporation source and a carrier for mounting a substrate to be coated, wherein the vacuum evaporation coating equipment further comprises: a plurality of masks connected to each other, which are disposed between the evaporation source and the carrier, wherein a plurality of masks form at least two sets of correction masks; a driving mechanism for driving the correction mask, wherein the driving mechanism is connected to each set of the correction masks.
In order to clearly illustrate the technical solution of the embodiments of the disclosure, the drawings of the embodiments will be briefly described in the following; it is obvious that the described drawings are only related to some embodiments of the disclosure and thus are not limitative of the disclosure.
In order to make objects, technical details and advantages of the embodiments of the disclosure apparent, the technical solutions of the embodiments will be described in a clearly and fully understandable way in connection with the drawings related to the embodiments of the disclosure. Apparently, the described embodiments are just a part but not all of the embodiments of the disclosure. Based on the described embodiments herein, those skilled in the art can obtain other embodiment(s), without any inventive work, which should be within the scope of the disclosure
An embodiment of the disclosure provides a vacuum evaporation coating equipment, which comprises an evaporation source and a carrier for mounting a substrate to be coated, herein, the vacuum evaporation coating equipment further comprises: a plurality of masks connected to each other and form at least two sets of correction masks, the plurality of masks are disposed between the evaporation source and the carrier; and a driving mechanism for driving the correction masks, the driving mechanism is connected to each set of the correction masks.
In the vacuum evaporation coating equipment provided in the present embodiment, by increasing the number of the correction masks, different sets of the correction masks can be selected for different films in the evaporation stroke of the evaporation source, so as to ensure the uniformity of the different films.
In the vacuum evaporation coating equipment provided in the present embodiment, when the first set of correction masks is located within the evaporation stroke of the evaporation source material, other sets of correction masks are perpendicular to an evaporation liquid level of the evaporation source, or located on the other side facing the evaporation source with respect to the first set of correction masks. With this arrangement, the current evaporation coating process will not be affected by other sets of correction masks, while the first set of correction masks is used for the current evaporation coating process.
As illustrated in
The vacuum evaporation coating equipment further comprises a driving mechanism which is connected to both the first set of connection mask and the second set of connection mask, for example, the driving mechanism comprises: a driving motor 40; a support rod 30 connected to an output shaft of the driving motor 40. The first set of the correction mask 41 and the second set of correction mask 42 are fixedly connected to the support rod 30, respectively.
The support rod 30 is connected to and penetrated into the middle of each of the masks. As illustrated in
Additionally, in order to achieve the above connection between the first set of correction mask 41 and the second set of correction mask 42, as an example, an opening is formed in the middle of one set of correction mask, the other set of the correction mask is inserted vertically into the opening, and the support rod 30 is fixedly connected to both sets of the correction masks respectively, so that the first set of the correction mask 41 and the second set of the correction mask 42 are cross-connected at their respective middle position. As another example, the first set of the correction mask 41 and the second set of the correction mask 42 respectively comprises two portions, for example, as illustrated in
In at least some of embodiments, the first set of correction mask 41 and the second set of correction mask 42 are made of a heat-resisting material, and the thickness is required to be as thin as possible in condition of having enough mechanical strength. Specific materials and structures of correction masks are not described in detail herein.
During the operation of the vacuum evaporation coating equipment described in the first embodiment, the first set of the correction mask 41 and the second set of the correction mask 42 are perpendicular to each other, when the first set of the correction mask 41 is configured to shield the evaporation source 10 during the current evaporation coating process, the correction mask 41 is parallel to the evaporation liquid level of the evaporation source 10, and the second set of the correction mask 42 is perpendicular to the evaporation liquid level. In this case, the region which the evaporation stroke of the evaporation source 10 is shielded by the second set of the correction mask 42 has a smaller area and is located within the shielding region of the first set of correction mask 41, so the shielding function of the second set of the correction mask 42 is relatively weak.
As illustrated in
However, in the vacuum evaporation coating equipment provided in the present embodiment, during the entire evaporation coating process for preparing relatively thinner films (tens of nanometers, hundreds of nanometers, etc.), the consumption of evaporation source is small, and the change in liquid level height is tiny (almost no change), thus, a single set of correction mask is enough to complete the entire evaporation coating process, in the case of ensuring that the initial liquid level of the evaporation source is uniform. Moreover, during the entire evaporation coating process for preparing relatively thicker layers (several micrometers etc.), the consumption of evaporation source is large, the height of liquid level is decreased greatly, and the evaporation angle is changed greatly, in order to ensure uniformity of the films, two sets of correction masks may be used in the entire evaporation coating process.
When the vacuum evaporation coating equipment provided in the first embodiment is adopted, the number of evaporation sources is at least two, the first set of correction mask and the second set of correction mask may respectively correspond to the evaporation coating process of different evaporation sources. For example, when the evaporation coating process for forming the film is achieved by using a first evaporation source and the first set of correction mask and is completed, the second set of correction mask is driven by a driving mechanism and is rotated to correspond to a second evaporation source, and the second evaporation source and the second set of correction mask will be used in another evaporation coating process for forming another film.
Another vacuum evaporation coating equipment is provided in the second embodiment of the disclosure.
As illustrated in
The vacuum evaporation coating equipment further comprises a driving mechanism which is connected to each of masks, for example, the driving mechanism comprises: a driving motor (not shown); a support rod 30 connected to an output shaft of the driving motor, herein one end of each mask is fixedly connected to the support rod 30.
As illustrated in
During the operation of the vacuum evaporation coating equipment provided in the second embodiment, when the first set of correction masks (for example, the combination of the second mask 22 and the third mask 23) is used for shielding in the current evaporation coating process, that is, it is located within a shielding scope of the evaporation stroke of the evaporation source 10, the first mask 21 and the fifth mask 25 are arranged vertically, and the fourth mask 24 and the sixth mask 26 are located on the other side facing the evaporation source 10 (i.e., on back side of the first set of the correction mask with respect to the evaporation source 10). In addition to the second mask 22 and the third mask 23, the effective projection area of other masks relative to the evaporation source 10 is relatively small, and is shielded by the two masks 22, 23 of the first set of correction masks, so the shielding effect on the evaporation source 10 is relatively weak. Similarly, After all the correction masks are rotated by the driving mechanism, other sets of correction masks may be rotated to be located within the shielding scope of the evaporation stroke of the evaporation source 10 and may be also used for controlling the thickness of layers in the evaporation coating process.
By using the correction masks described above, during the entire evaporation coating process for preparing relatively thinner films (tens of nanometers, hundreds of nanometers, etc.), the consumption of evaporation source is small, and the change in liquid level height is tiny (almost no change), thus, a single set of correction mask is enough to complete the entire evaporation coating process, in the case of ensuring that the initial liquid level of the evaporation source is uniform. Moreover, during the entire evaporation coating process for preparing relatively thicker layers (several micrometers etc.), the consumption of evaporation source is large, the height of liquid level is decreased greatly, and the evaporation angle is changed greatly, in order to ensure uniformity of the films, three sets of correction masks may be used in the entire evaporation coating process.
In at least some of embodiments, six masks form six sets of correction masks respectively. Thus, there may be six evaporation sources, different sets of correction masks may respectively correspond to different evaporation coating processes of different evaporation sources. When an evaporation coating process is achieved by a first evaporation source and the first set of correction mask and is completed, other sets of correction masks are driven by a driving mechanism and will be used in another evaporation coating process.
In addition, in the above-mentioned plurality of sets of correction masks, for each set of correction masks, when a shape of one mask comprised in a set of correction masks is rationally designed, it is possible to adjust thickness uniformity of films evaporated by the evaporation source by optimizing the shape of another mask. Therefore, by using the vacuum evaporation coating equipment provided in the second embodiment, the thickness uniformity between the target films which are formed on an umbrella-shaped substrate by using five or six different kinds of evaporation sources can be ensured.
According to the principles provided in the disclosure, the arrangement and number of the correction masks are not limited to those shown in
Furthermore, according to the second embodiment, the first mask 21 and the fifth mask 25 are located in the same plane, the second mask 22 and the fourth mask 24 are located in the same plane, and the third mask 23 and the sixth mask 26 are located in the same plane, so the above two masks which are located in the same plane may be an integral structure and form a structure in which three masks are cross-connected at their respective middle position.
According to the vacuum evaporation coating equipment provided in the present embodiment, different correction masks can be switched during the evaporation coating process in which the same evaporation source is used, or different correction masks corresponds to different evaporation sources. Compared with the same correction mask used in prior art, the structure provided in the present embodiment is more freedom in keeping the uniformity of the plurality of films.
What is described above is related to the illustrative embodiments of the disclosure only and not limitative to the scope of the disclosure; the scopes of the disclosure are defined by the accompanying claims.
The present application claims the priority of Chinese patent application No. 201620051276.7 filed on Jan. 18, 2016, the disclosure of which is hereby incorporated by reference herein in its entirety.
Number | Date | Country | Kind |
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201620051276.7 | Jan 2016 | CN | national |
Filing Document | Filing Date | Country | Kind |
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PCT/CN2016/099916 | 9/23/2016 | WO | 00 |