The present invention relates to a valve device, and a flow control method, a fluid control device and a semiconductor manufacturing method using the valve device.
In the semiconductor manufacturing process, in order to supply accurately metered process gases to a processing chamber, a fluid control device integrated with various fluid control devices such as open-close valves, regulators, and mass flow controllers is used.
Usually, a process gas outputted from the above fluid control device is directly supplied to a processing chamber, but in the processing process of depositing a film on a substrate by the atomic layer deposition (ALD) method, in order to stably supply the process gas, the process gas supplied from the fluid control device is temporarily stored in a tank as a buffer, and valves provided in the immediate vicinity of the processing chamber are frequently opened and closed to supply the process gas from the tank to the processing chamber in a vacuum atmosphere. See, for example, Patent Literature 1 as a valve provided in the immediate vicinity of the process chamber.
The ALD method is one of chemical vapor deposition methods, in which two or more types of process gases are alternately flowed on the substrate surface under film-forming conditions of temperature and time etc. to react with atoms on the substrate surface to deposit a film layer by layer, and in terms of film quality, since every atomic layer can be controlled, a uniform film thickness can be formed and a film can be grown very densely.
In the semiconductor manufacturing process by the ALD method, it is necessary to precisely adjust the flow rate of the process gas.
PTL 1: Japanese Laid-Open Application No. 2007-64333
PTL 2: International Publication No. WO2018/088326
In an air-driven diaphragm valve, the flow rate changes with time by such causes as deformation of the resin valve seat over time, expansion or contraction of the resin valve seat due to heat changes.
Therefore, in order to more precisely control the flow rate of the process gas, it is necessary to adjust the flow rate according to the change with time of the flow rate.
The applicants have proposed in Patent Literature 2 a valve device provided with an adjustment actuator for adjusting the position of an operating member that operates a diaphragm, in addition to a main actuator operable by a pressure of supplied driving fluid, so as to automatically adjust the flow rate with precision.
Conventionally, to the valve device disclosed in Patent Literature 2, there has been a demand to detect the opening degree of the diaphragm as a valve element and to control the flow rate more precisely.
An object of the present invention is to provide a valve device which can adjust the flow rate precisely.
Another object of the present invention is to provide a flow control method, a fluid control device, a semiconductor manufacturing method and a semiconductor manufacturing apparatus using the above valve device.
The valve device according to the present invention comprises: a valve body that defines a flow path through which a fluid flows and an opening that opens externally in a middle of the flow path;
The flow control method of the present invention is a flow rate control method for adjusting the flow rate of a fluid by using a valve device having the above configuration.
The fluid control device of the present invention is a fluid control device comprises a plurality of fluid devices that is arranged,
The semiconductor manufacturing method of the present invention comprises using a valve device having the above configuration for controlling a flow rate of a process gas in a manufacturing process of a semiconductor device that requires a processing step using the process gas in a sealed chamber.
The semiconductor manufacturing apparatus of the present invention comprises a valve device having the above configuration used for controlling a flow rate of a process gas in a manufacturing process of a semiconductor device that requires a processing step using the process gas in a sealed chamber.
According to the present invention, by detecting the displacement of the operating member with respect to the valve body, it is possible to detect the valve opening degree, and it is possible to adjust the flow rate further precisely by the adjustment actuator.
The valve device 1 has a housing box 301 provided on a support plate 302, a valve main unit 2 installed in the housing box 301, and a pressure regulator 200 installed in the ceiling portion of the housing box 301.
In
The valve body 10 is made of a metal such as stainless steel, and defines flow paths 12, 13. The flow path 12 has, at one end, an opening 12 a which opens at one side of the valve body 10, and a pipe joint 501 is connected to the opening 12a by welding. In the flow path 12, the other end 12b is connected to the flow path 12c extending in the vertical directions A1, A2 of the valve body 10. The upper end portion of the flow path 12c is opened at the upper surface side of the valve body 10, the upper end portion is opened at the bottom surface of the recess 11 formed on the upper surface side of the valve body 10, and the lower end portion is opened at the lower surface side of the valve body 10. A pressure sensor 400 is provided at the opening on the lower end side of the flow path 12c to close the opening on the lower end side of the flow path 12c.
A valve seat 15 is provided around the opening of the upper end portion of the flow path 12c. The valve seat 15 is made of synthetic resin (PFA, PA, PI, PCTFE, etc.) and is fitted and fixed to the mounting groove provided in the opening periphery of the upper end side of the flow path 12c. In the present embodiment, the valve seat 15 is fixed in the mounting groove by caulking.
The flow path 13 has one end opened at the bottom surface of the recess 11 of the valve body 10, and has, at the other end, an opening 13a which opens at the other side of the valve body 10 opposite to the flow path 12, and a pipe joint 502 is connected to the opening 13a by welding.
The diaphragm 20 is disposed above the valve seat 15, while defining a flow path communicating the flow path 12c and the flow path 13, the central portion thereof is moved up and down to contact to and separate from the valve seat 15, to open and close a gateway between the flow paths 12 and 13. In the present embodiment, the diaphragm 20 has a natural spherical shell shape in which an upwardly convex arc shape is formed by upwardly bulging the central portion of a metal sheet and a nickel-cobalt alloy sheet such as special stainless steel. The diaphragm 20 is formed by laminating three sheets of special stainless steel and one sheet of nickel-cobalt alloy.
The diaphragm 20 is pressed toward a protruding portion side of the valve body 10 via a stainless alloy presser adapter 25 and is held and fixed in an air-tight state by placing the outer peripheral edge portion of the diaphragm 20 on a protruding portion formed on the bottom of the recess 11 of the valve body 10 and screwing the lower end portion of the bonnet 30 inserted into the recess 11 into the screw portion of the valve body 10. As the nickel-cobalt alloy thin film, those having other configurations can be used as a diaphragm which is arranged to the gas contact side.
An operating member 40 is a member for operating the diaphragm 20 so as to open and close the gateway between the flow path 12 and the flow path 13, and is formed in a substantially cylindrical shape, in which the upper end side is open. The operating member 40 is fitted to the inner peripheral surface of the bonnet 30 via an O-ring OR (see
On the lower end surface of the operating member 40, a diaphragm presser 48 is mounted, which has a holding portion made of a synthetic resin such as polyimide and abutting against the central portion of the upper surface of the diaphragm 20.
A coil spring 90 is provided between the upper surface of the flange portion 48a formed on the outer peripheral portion of the diaphragm presser 48 and the ceiling surface of the bonnet 30, and the operating member 40 is constantly urged downward A2 by the coil spring 90. Therefore, when the main actuator 60 is not activated, the diaphragm 20 is pressed against the valve seat 15, and the gateway between flow path 12 and flow path 13 is closed.
Between the lower surface of the actuator receiver 27 and the upper surface of the diaphragm presser 48, a disc spring 120 is provided as an elastic member.
A casing 50 consists of an upper casing member 51 and a lower casing member 52, a screw of the lower end portion of the inner periphery of the lower casing member 52 is screwed with a screw of the upper end portion of the outer periphery of the bonnet 30. Further, a screw of the lower end portion of the inner periphery of the upper casing member 51 is screwed with a screw of the upper end portion of the outer periphery of the lower casing member 52.
An annular bulkhead 65 is fixed between the upper end of the lower casing member 52 and the opposing surface 51f of the upper casing member 51. Between the inner peripheral surface of the bulkhead 65 and the outer peripheral surface of the operating member 40 and between the outer peripheral surface of the bulkhead 65 and the inner peripheral surface of the upper casing member 51 are respectively sealed by O-rings OR.
The main actuator 60 has annular first to third pistons 61, 62, 63. The first to third pistons 61, 62, and 63 are fitted to the outer peripheral surface of the operating member 40 and are movable in the vertical directions A1 and A2 together with the operating member 40. Between the inner peripheral surfaces of the first to third pistons 61, 62, 63 and the outer peripheral surface of the operating member 40, and between the outer peripheral surfaces of the first to third pistons 61, 62, 63 and the upper casing member 51, the lower casing member 52, and the inner peripheral surface of the bonnet 30 are sealed with a plurality of O-rings OR.
As shown in
As shown in
Flow passages 40h1, 40h2, and 40h3 are formed to penetrate radially through the operating member 40 at positions communicating with the pressure chambers C1, C2, and C3. The flow passages 40h1, 40h2, 40h3 are each a plurality of flow passages formed at equal intervals in the circumferential direction of the operating member 40. The flow passages 40h1, 40h2, and 40h3 are each connected to the flow passages formed by the gap GP1.
The upper casing member 51 of the casing 50 is formed with a flow passage 51h which opens at the upper surface and extends in the vertical directions A1 and A2 and communicates with the pressure chamber C1. A supply pipe 150 is connected to the opening of the flow passage 51h via a pipe joint 152. Thus, the compressed air G supplied from the supply pipe 150 is supplied to the pressure chambers C1, C2, and C3 through the flow passages described above.
Space SP above the first piston 61 in the casing 50 is connected to the atmosphere through a through hole 70a of the adjusting body 70.
As shown in
As shown in
In the magnetic sensor 86, a wiring 86a is led out to the outside of the bonnet 30, the wiring 86a is composed of a feed line and a signal line, and the signal line is electrically connected to a control unit 300 to be described later. Examples of the magnetic sensor 86 include those utilizing a Hall element, those utilizing a coil, those utilizing an AMR element whose resistance value changes depending on the strength and orientation of the magnetic field, and the like, and position detection can be made non-contact by combining with the magnet.
The magnet 87 may be magnetized in the vertical directions A1, A2, or may be magnetized in the radial direction. The magnet 87 may be formed in a ring shape.
In the present embodiment, the magnetic sensor 86 is provided on the bonnet 30 and the magnet 87 is provided on the operating member 40, but it is not limited thereto, it can be appropriately modified. For example, the magnetic sensor 86 may be provided on the presser adapter 25, and the magnet 87 may be provided at a facing position on a flange portion 48a formed on the outer periphery of the diaphragm presser 8. It is preferable to install the magnet 87 on the side movable with respect to the valve body 10, and install the magnetic sensor 86 on the valve body 10 or on the side not movable with respect to the valve body 10.
Here, the operation of the piezoelectric actuator 100 will be described with reference to
The piezoelectric actuator 100 includes a laminated piezoelectric element (not shown) in the cylindrical casing 101 shown in
As shown in
As shown in
The tip end portion 102 of the piezoelectric actuator 100 is in contact with a conical receiving surface formed on the upper surface of the disk-shaped actuator receiver 27 as shown in
The pressure regulator 200 has a primary side connected to a supply pipe 203 via a pipe joint 201, and a secondary side connected to a pipe joint 151 provided at the tip end portion of a supply pipe 150.
The pressure regulator 200 is a well-known poppet valve type pressure regulator, although a detailed description thereof will be omitted, it is controlled so that the secondary pressure becomes a preset adjusted pressure by reducing the high-pressure compressed air G supplied through the supply pipe 203 to the desired pressure. When the pressure of the compressed air G supplied through the supply pipe 203 fluctuate due to pulsation or disturbance, this fluctuation is suppressed and output to the secondary side.
The semiconductor manufacturing apparatus 1000 in
In the semiconductor manufacturing process using the ALD method, it is necessary to precisely adjust the flow rate of the process gases, and it is also necessary to secure the flow rate of the process gases along with increase of the diameter of the substrate.
Fluid control devices 900A to 900C constitutes an integrated gas system that integrates various fluid devices such as open-close valves, regulators, and mass flow controllers to supply precisely measured process gas PG to each of the processing chambers CHA to CHC.
Valve devices 1A to 1C precisely control the flow rate of the process gas PG from the fluid control devices 900A to 900C by opening and closing the diaphragm valve 20 described above, and supply them to the processing chambers CHA to CHC, respectively. Open-close valves VA to VC execute supply and shut-off of compressed air G in response to a control command in order to open and close valve devices 1A to 1C.
In semiconductor manufacturing apparatus 1000 as described above, compressed air G is supplied from a common supply source 800, but open-close valves VA to VC are driven independently.
From the common supply source 800, compressed air G having a substantially constant pressure is always output, but when the open-close valves VA to VC are opened and closed independently, the pressure of the compressed air G supplied to the valve devices 1A to 1C is fluctuated due to the effects of pressure loss when the valve is opened and closed, and is not constant.
When the pressure of the compressed air G supplied to the valve devices 1A to 1C fluctuates, there is a possibility that the flow rate adjusting amount by the piezoelectric actuator 100 described above will fluctuate. In order to solve this problem, the pressure regulator 200 described above is provided.
Next, the control unit of the valve device 1 according to the present embodiment will be described referring to
As shown in
Next, referring to
The number and orientation of disc spring 120 can be appropriately modified depending on the condition. In addition to the disc spring 120, other elastic members such as coil spring and leaf springs can be used, but the use of disc spring makes it easy to adjust spring stiffness, stroking, etc.
As shown in
When the compressed air G is supplied into the valve device 1 through the supply pipe 150, as shown in
Next, the main causes of flow rate fluctuations in the valve device 1 will be described with reference to
Deformation of the valve seat 15 is one of the main causes of the flow rate changes with time in the valve device 1. The state shown in
Since stresses are repeatedly applied to the valve seat 15 by the diaphragm presser 48 through the diaphragm 20, for example, as shown in in
Since the valve seat 15 is exposed to a high temperature atmosphere, as shown in
Next, an example of the flow rate adjustment of the valve device 1 will be described with reference to
First, the position detecting mechanism 85 described above is constantly detecting the relative displacement between the valve body 10 and the magnetic sensor 86 in the state shown in
Here, the left side of the center line Ct in
When adjusting in the direction of reducing the flow rate of the fluid, as shown in
When adjusting in the direction of increasing the flow rate of the fluid, as shown in
In the present embodiment, the maximum value of the lift amount Lf of the diaphragm 20 is about 100 to 200 μm, and the adjustment amount by the piezoelectric actuator 100 is about ±20 μm.
That is, the stroke of the piezoelectric actuator 100 cannot cover the lift amount of the diaphragm 20, but by using the main actuator 60 operated by compressed air G and the piezoelectric actuator 100 together, while ensuring the supply flow rate of the valve device 1 with the main actuator 60 having a relatively long stroke, it is possible to precisely adjust the flow rate with the piezoelectric actuator 100 having a relatively short stroke, and since it becomes unnecessary to manually adjust the flow rate by the adjusting body 70 or the like, the flow rate adjusting man-hours are greatly reduced.
According to the present embodiment, since it is possible to precisely adjust flow rate only by changing the voltage applied to the piezoelectric actuator 100, the flow rate adjustment can be executed immediately, and it is also possible to control flow rate in real time.
In the above embodiment, the piezoelectric actuator 100 is used as an adjustment actuator utilizing a passive element that converts a given power into expansion or contraction forces, but the present invention is not limited thereto. For example, an electrically driven material made of a compound that deforms in response to a change in an electric field can be used as an actuator. The shape and size of electrically driven material can be varied by the current or voltage, and the open position of the restricted operating member 40 can be varied. Such an electrically driven material may be a piezoelectric material or an electrically driven material other than a piezoelectric material. When the material is an electrically driven material other than a piezoelectric material, the material may be an electrically driven type polymeric material.
An electrically driven type polymeric material is also referred to as an electroactive polymer material (EAP), and includes, for example, an electric EAP driven by an external electric field or a Coulombic force, a nonionic EAP in which a solvent swelling a polymer is flown by an electric field to deform the polymer, an ionic EAP driven by movement of ions and molecules by an electric field, and any one or a combination thereof can be used.
In the above embodiment, a so-called normally closed type valve is exemplified, but the present invention is not limited to this, and is also applicable to a normally open type valve.
In the above application example, the valve device 1 is used in a semiconductor manufacturing process by the ALD method, but the present invention is not limited to this, and the present invention can be applied to any object requiring precise flow rate control, such as an atomic layer etching (ALE) method.
In the above embodiment, as the main actuator, a piston incorporated in a cylinder chamber operated by gas pressure is used, but the present invention is not limited to this, and any optimum actuator to the control object is selectable.
In the above embodiment, a position detection mechanism including a magnetic sensor and a magnet has been exemplified, but the present invention is not limited thereto, and it is possible to employ a non-contact type position sensor such as an optical position detecting sensor.
Referring to
In the fluid control device shown in
Here, a “fluid device” is a device used in a fluid control device for controlling the flow of fluids, and the fluid device comprises a body defining a fluid flow path and has at least two flow path ports opening at a surface of the body. Specifically, the fluid devices include open-close valves (2-way valves) 991A, regulators 991B, pressure gauges 991C, open-close valves (3-way valves) 991D, mass flow controllers 991E, and the like, but not limited thereto. An inlet tube 993 is connected to an upstream flow path port of the flow path (not shown).
The present invention can be applied to various valve devices such as the above-mentioned open-close valves 991A, 991D and regulators 991B.
1, 1A, 1B, 1C: Valve device
2: Valve main unit
10: Valve body
11: Recess
12: Flow path
12
a: Opening
12
b: Other end
12
c,
13: Flow path
15: Valve seat
20: Diaphragm
25: Presser adapter
27: Actuator receiver
27
b: Regulating surface
30: Bonnet
40: Operating member
40
h
1, 40h2, 40h3: Flow passage
48: Diaphragm presser
48
a: Flange portion
48
t: Contact surface
50: Casing
51
h: Flow passage
51: Upper casing member
51
f: Opposing surface
52: Lower casing member
60: Main actuator
61: First piston
62: Second piston
63: Third piston
65: Bulkhead
70: Adjusting body
70
a: Through hole
80: Actuator presser
85: Position detecting mechanism
86: Magnetic sensor
86
a: Wiring
87: Magnet
90: Coil spring
100: Piezoelectric actuator (adjustment actuator)
101: Casing
102: Tip end portion
103: Base end portion
105: Wiring
120: Disc spring
130: Bulkhead member
150: Supply pipe
151, 152: Pipe joint
160: Limit switch
161: Movable pin
200: Pressure regulator
201: Pipe joint
203: Supply pipe
300: Control unit
301: Storage box
302: Support plate
400: Pressure sensor
501, 502: Pipe joint
800, 810: Supply source
900A-900C: Fluid control device
A: Circle
A1: Upward direction
A2: Downward direction
C1-C3: Pressure chamber
CHA, CHB, CHC: Processing chamber
CP: Closed position
Ct: Central line
G: Compressed air (driving fluid)
GP1, GP2: Gap
Lf: Lift amount
OP: Open position
OR: O-ring
PG: Process gas
SP: Space
V0: Predetermined voltage
VA-VC: Open-close valve
VOP: Open position
991A-991E: Fluid device
992: Flow path block
993: Inlet tube
1000: Semiconductor manufacturing apparatus
Number | Date | Country | Kind |
---|---|---|---|
2019-015355 | Jan 2019 | JP | national |
Filing Document | Filing Date | Country | Kind |
---|---|---|---|
PCT/JP2020/002341 | 1/23/2020 | WO | 00 |