Claims
- 1. A component for a variable capacitance measuring device comprising:
an electrode assembly including an electrode portion having a first width; an insulating material surrounding a portion of the electrode assembly; and a solid material lying between the electrode portion and the insulating material, wherein
the solid material has a second width that is wider than the first width.
- 2. The component of claim 1, wherein the solid material contacts the electrode portion and the insulating material.
- 3. The component of claim 1, further comprising a gettering material within the electrode assembly.
- 4. The component of claim 3, wherein the insulating material surrounds at least a portion of the gettering material.
- 5. The component of claim 1, wherein the electrode assembly is a single-piece electrode assembly.
- 6. A variable capacitance measuring device comprising the component of claim 1.
- 7. A component for a variable capacitance measuring device comprising:
an electrode assembly; a getter housing lying within the electrode assembly; and a ring laterally surrounding portions of the electrode assembly and the getter housing.
- 8. The component of claim 7, wherein:
the electrode assembly is a single-piece electrode assembly that comprises a first electrode; and the ring is electrically connected to a second electrode.
- 9. The component of claim 7, further comprising:
an insulating material lying between and contacting the electrode assembly and the ring; and the insulating material surrounds a portion of the gettering housing.
- 10. A variable capacitance measuring device comprising the component of claim 7.
- 11. A component for a variable capacitance measuring device comprising a single-piece electrode assembly, wherein:
the single-piece electrode assembly comprises an electrode portion; and the electrode portion has an electrode surface
- 12. The component of claim 11, further comprising:
a gettering housing lying within the single-piece electrode assembly; and an insulating material that surrounds at least part of the gettering housing.
- 13. A variable capacitance measuring device comprising the component of claim 11.
- 14. A method of forming a component for a variable capacitance measuring device comprising:
placing at least portions of a ring, an electrode assembly, a solid material, and an insulating material within a form, wherein:
the electrode assembly includes an electrode portion having a first surface; the electrode portion has a first width; and the solid material has a second width wider than the first width; and heating the insulating material, wherein the solid material substantially prevents the insulating material from contacting the first surface of the electrode portion.
- 15. The method of claim 14, wherein heating is performed during a first portion at a first temperature higher than a flow point of the insulating material.
- 16. The method of claim 15, wherein heating is performed during a second portion at a second temperature lower than the first temperature to form crystals within the insulating material.
- 17. The method of claim 14, wherein the electrode portion has an electrode surface opposite the first surface.
- 18. The method of claim 14, wherein the electrode portion has an electrode surface substantially perpendicular to the first surface.
- 19. A method of forming a variable capacitance measuring device comprising:
the method of forming the component of claim 14;attaching a diaphragm to the ring; attaching the ring to a housing; inserting a gettering material into the electrode assembly after heating the insulating material, wherein:
the insulating material surrounds a portion of the gettering material; and the electrode assembly is a single-piece electrode assembly; securing the gettering material so that it cannot fall out of the electrode assembly; and activating the gettering material after heating the insulating material.
- 20. A method of forming a component for a variable capacitance measuring device comprising:
placing an insulating material between a ring and an electrode assembly; and crystallizing the insulating material to form a glass-ceramic material that contacts the ring and the electrode assembly.
- 21. The method of claim 20, wherein heating is performed during a first portion at a first temperature higher than a flow point of the insulating material.
- 22. The method of claim 21, wherein heating is performed during a second portion at a second temperature lower than the first temperature to form the crystals from the insulating material.
- 23. A method of forming a variable capacitance measuring device comprising:
the method of claim 20;attaching a diaphragm to the ring; attaching the ring to a housing; inserting a gettering material into the electrode assembly after heating the insulating material, wherein the glass-ceramic material surrounds a portion of the gettering material; securing the gettering material so that it cannot fall out of the electrode assembly; and activating the gettering material after crystallizing the insulating material.
- 24. A method of forming a variable capacitance measuring device comprising a gettering material, an electrode assembly, and an insulating material, wherein the method comprises:
placing a gettering material within an electrode assembly; and activating the gettering material while a portion of the gettering material is surrounded by the insulating material.
- 25. A method of method of claim 24, further comprising:
attaching a diaphragm to the ring; attaching the ring to a housing; and securing the gettering material so that it cannot fall out of the electrode assembly before activating the gettering material.
RELATED APPLICATION
[0001] This application is a continuation-in-part of U.S. patent application Ser. No. 10/178,170 entitled “Variable Capacitance Measuring Device” by Mei filed Jun. 24, 2002. This application claims priority under 35 U.S.C. § 120 to that prior application, which is assigned to the current assignee hereof and incorporated herein by reference.
Continuation in Parts (1)
|
Number |
Date |
Country |
Parent |
10178170 |
Jun 2002 |
US |
Child |
10228612 |
Aug 2002 |
US |