This invention relates in general to thermoelectric cooling devices, and more particularly to variable watt density thermoelectrics.
The basic theory and operation of thermoelectric devices has been developed for many years. Presently available thermoelectric devices used for cooling typically include an array of thermocouples which operate in accordance with the Peltier effect. Thermoelectric devices may also be used for heating, power generation and temperature sensing.
Thermoelectric devices may be described as essentially small heat pumps which follow the laws of thermodynamics in the same manner as mechanical heat pumps, refrigerators, or any other apparatus used to transfer heat energy. A principal difference is that thermoelectric devices function with solid state electrical components (thermoelectric elements or thermocouples) as compared to more traditional mechanical/fluid heating and cooling components.
Thermoelectric materials such as alloys of Bi2Te3, PbTe and BiSb were developed thirty to forty years ago. More recently, semiconductor alloys such as SiGe have been used in the fabrication of thermoelectric devices. Typically, a thermoelectric device incorporates both a P-type semiconductor and an N-type semiconductor alloy as the thermoelectric materials.
As cooling applications progressively require higher watt density thermoelectric devices, existing thermoelectric designs and manufacturing techniques have been unable to produce effective solutions.
In accordance with the present invention, the disadvantages and problems associated with preferentially cooling a non-uniform temperature, heat generating device, in an efficient manner, such that the temperature at any point on the device is below a maximum temperature have been substantially reduced or eliminated. In particular, thermoelectric modules featuring variable watt density heat pumping capabilities across the thermoelectric module are provided.
In accordance with one embodiment of the present invention, a thermoelectric device is provided that includes a top plate with a surface including first and second portions. A first plurality of thermoelectric elements are coupled to the first portion, and a second plurality of thermoelectric elements are coupled to the second portion. A base plate is coupled to the first and second plurality of thermoelectric elements. The first and second plurality of thermoelectric elements are operable to transfer thermal energy from the top plate to the base plate when an electrical current is passed through the first and second plurality of thermoelectric elements. The second plurality of thermoelectric elements receives a higher electrical current density than the first plurality of thermoelectric elements, and the second plurality of thermoelectric elements transfer more thermal energy per unit area of the top plate than the first plurality of thermoelectric elements.
Particular embodiments may include each of the second plurality of thermoelectric elements electrically coupled in series to other ones of the second plurality of thermoelectric elements, and the first plurality of thermoelectric elements being divided into at least first and second groups of thermoelectric elements that are electrically coupled in parallel. A further particular embodiment may include the second plurality of thermoelectric elements having a shorter average height than the first plurality of thermoelectric elements. Further, a plurality of blocks of thermally conductive and electrically conductive material may be coupled to the second plurality of thermoelectric elements, such that each one of the second plurality of thermoelectric elements is coupled to one of the plurality of blocks. Additionally, each of the combinations of ones of the second plurality of thermoelectric elements with ones of the plurality of blocks may be approximately the same height as each of the first plurality of thermoelectric elements.
In accordance with another embodiment of the present invention, a method is provided that includes coupling first and second pluralities of thermoelectric elements to first, and second portions, respectively, of a top plate. A base plate is coupled to the first and second plurality of thermoelectric elements. The first and second plurality of thermoelectric elements are operable to transfer thermal energy from the top plate to the base plate when an electrical current is passed through the first and second plurality of thermoelectric elements. The second plurality of thermoelectric elements receives a greater amount of electrical current than the first plurality of thermoelectric elements, and the second plurality of thermoelectric elements transfer more thermal energy per unit area of the top plate than the first plurality of thermoelectric elements.
Technical advantages of certain embodiments of the present invention include preferentially cooling hotspots, such as hotspots present in a central processing unit (CPU), to keep the hotspot temperature below the maximum device temperature, while minimizing wasted electrical energy and waste heat produced by the thermoelectric cooler. This is accomplished because the thermoelectric cooler incorporates sections of thermoelectric elements which may be operable to pump differing amounts of heat through a unit of area in the same amount of time. The higher wattage areas of the thermoelectric cooler correspond to the hotspots of the device. In this manner, thermal energy from the hotspots may be dissipated at a greater rate than the energy from the cooler areas of the device. Thus, less energy is required to cool the device, than would be required if the entire thermoelectric cooler were maintained at a wattage capable of cooling the hotspots.
Other technical advantages of certain embodiments of the present invention include electrically coupling the thermoelectric elements of the thermoelectric cooler in such a way that one continuous circuit is formed, but the cooler incorporates variable wattage cooling areas. This is accomplished by coupling rows of thermoelectric elements present in the lower wattage sections in parallel, while coupling thermoelectric elements in the higher wattage areas in series. This may streamline the manufacturing of variable wattage thermoelectric coolers and may reduce material costs.
Other technical advantages of the present invention will be readily apparent to one skilled in the art from the following figures, descriptions, and claims. Moreover, while specific advantages have been enumerated above, various embodiments may include all, some, or none of the enumerated advantages.
For a more complete understanding of the present invention and its advantages, reference is now made to the following description, taken in conjunction with the accompanying drawings, in which:
Thermoelectric device 20 may be used as a heater, cooler, electrical power generator, and/or temperature sensor. If thermoelectric device 20 were designed to function as an electrical power generator, electrical connections 28 and 30 would represent the output terminals from such a power generator operating between hot and cold temperature sources.
Examples of thermoelectric devices and methods of fabrication are shown in U.S. Pat. No. 5,064,476 entitled Thermoelectric Cooler and Fabrication Method; U.S. Pat. No. 5,171,372 entitled Thermoelectric Cooler and Fabrication Method; and U.S. Pat. No. 5,576,512 entitled Thermoelectric Apparatus for Use With Multiple Power Sources and Method of Operation.
N-type semiconductor materials generally have more electrons than necessary to complete the associated crystal lattice structure. P-type semiconductor materials generally have fewer electrons than necessary to complete the associated crystal lattice structure. The “missing electrons” are sometimes referred to as “holes.” The extra electrons and extra holes are sometimes referred to as “carriers.” The extra electrons in N-type semiconductor materials and the extra holes in P-type semiconductor materials are the agents or carriers which transport or move heat energy between cold side or cold plate 124 and hot side or hot plate 126 through thermoelectric elements 122 when subject to a DC voltage potential. These same agents or carriers may generate electrical power when an appropriate temperature difference is present between cold side 124 and hot side 126.
In thermoelectric device 120, alternating thermoelectric elements 122a, and 122b of N-type and P-type semiconductor materials may have their ends connected by electrical conductors such as 134, 136 and 138. Conductors 134, 136 and 138 may be metalizations formed on thermoelectric elements 122a, 122b and/or on the interior surfaces of plates 124 and 126. Ceramic materials are frequently used to manufacture plates 124 and 126 which define in part the cold side and hot side, respectively, of thermoelectric device 120. Commercially available thermoelectric devices which function as a cooler generally include two ceramic plates with separate P-type and N-type thermoelectric elements formed from bismuth telluride (Bi2,Te3) alloys disposed between the ceramic plates and electrically connected with each other.
When DC electrical power from power supply 140 is properly applied to thermoelectric device 120 heat energy will be absorbed on cold side 124 of thermoelectric elements 122 and will be dissipated on hot side 126 of thermoelectric device 120. A heat sink or heat exchanger (sometimes referred to as a “hot sink”) may be attached to hot plate 126 of thermoelectric device 120 to aid in dissipating heat transferred by the associated carriers and phonons through thermoelectric elements 122 to the adjacent environment. In a similar manner, a heat sink or heat exchanger (sometimes referred to as a “cold sink”) may be attached to cold side 124 of thermoelectric device 120 to aid in removing heat from the adjacent environment. Thus, thermoelectric device 120 may sometimes function as a thermoelectric cooler when properly connected with power supply 140. However, since thermoelectric devices are a type of heat pump, thermoelectric device 120 may also function as a heater, power generator, or temperature sensor.
Coupling conductive blocks of material 146 to thermoelectric elements 142 and 146 may result in increased efficiency and/or greater heat transfer from cold plate 149 to hot plate 148. The reasons for this, as well as a description of one embodiment of a method of manufacturing the thermoelectric module of
When used as a cooler, a thermoelectric module may be known as a thermoelectric cooler. Thermoelectric coolers may be used to cool microelectronics. Heat generation from microelectronics continue to increase as chips become more powerful, utilizing higher clock speeds and ever increasing densities of transistors. The microelectronics industry is quickly reaching the limits of traditional air cooling for many applications. Failing to adequately dissipate the heat generated by these electronics may result in poor reliability, compromised performance, or permanent damage.
Thermoelectric coolers are one possible solution for helping keep microelectronics from getting too hot. Thermoelectric cooler power consumption is of concern since the input power to the thermoelectric cooler generates waste heat which may also need to be dissipated into the same heat sink as the heat from the electronic component. To minimize the input power to the thermoelectric cooler, the design of the thermoelectric cooler must be such that it affords operation near the theoretical maximum coefficient of performance for a given temperature difference across the thermoelectric cooler. The larger the temperature difference, the higher the input power and ultimately the higher the heat rejection. Operating at conditions far from the optimum coefficient of performance can significantly increase thermoelectric cooler power consumption. This has a compounding effect since the added heat from the thermoelectric cooler further raises the temperature of the heat sink, requiring the thermoelectric cooler to operate over an even larger temperature difference in order to provide a useful benefit.
The higher heat dissipation requirements are further compounded by the fact that the heat dissipation required by certain microelectronics may be non-uniform. This may be the case because heat generation within the microelectronic device itself is non-uniform. There may be local hot spots that should be kept below the device maximum temperature. Smaller sizes of microelectronic devices also complicate matters. As the devices get smaller, the heat loads become more concentrated. These non-uniformities and concentrated heat loads make it desirable to use higher efficiency heat sinks to dissipate the heat and to keep the peak temperatures from exceeding the maximum levels.
Higher and more concentrated heat loads (higher watt density loads) may require thermoelectric coolers which are fabricated with very short thermoelectric elements in order to operate near the maximum efficiency (closer to theoretical maximum coefficient of performance). These short elements may require the processing of thin wafers.
Additionally, thermoelectric coolers may be tailored so that their heat pumping capacity better matches the actual non-uniform heat load. This may result in an overall improvement in efficiency and lower power consumption and/or relatively cooler temperatures.
One use of a thermoelectric cooler in microelectronics would be to cool a heat generating microelectronic device, such as the die 150 illustrated in
Integrated heat spreader 154 surrounds die 150 and may be thermally coupled to die 150 by a thermal interface material 156. The die may be packaged with an integrated heat spreader 154. Integrated heat spreader 154 is typically larger than die 150. Heat generated within die 150 is transferred through thermal interface material 156 and into integrated heat spreader 154. Integrated heat spreader 154 may be made of copper, aluminum, or other material with high conductivity. Integrated heat spreader 154 serves to spread the heat from the relatively smaller die 150 to a relatively larger area that may then contact the heat sink and/or thermoelectric cooler.
The heat generating device in
In one embodiment, die 150 may be a CPU die. CPU dies are designed to be smaller and more powerful than previous dies. This may result in greater heat generation from die 150 and an increase in the amount of heat to be dissipated. In addition, the higher density of heat being produced by the CPU results in larger temperature differences across the thermal interface material 156 and larger losses in the integrated heat spreader 154. Traditional heat sinks rely on passive air cooling to cool CPU dies. Die 150 could be actively cooled by coupling the thermoelectric module of
Adequate cooling of die 150 may be compounded if heat generation, and therefore heat dissipation, from die 150 is non-uniform. Portions of die 150 may generate more heat than other portions of die 150, and the result may be hot spots within die 150. The hot spots within die 150 should not exceed the maximum temperature for die 150. Therefore, a heat sink used to cool die 150 should be capable of dissipating enough heat to keep the hot spots of die 150 below this maximum temperature.
If a thermoelectric module is used as, or in conjunction with, a heat sink, cooling of the hot spots of die 150 may be achieved by passing a higher current through the thermoelectric elements of the thermoelectric module. Passing more current through the thermoelectric module would result in a greater temperature differential across the thermoelectric module. In this manner, the ability of the thermoelectric module to adequately cool die 150 could be increased. However, increasing the current which is passed through the thermoelectric elements of the thermoelectric module has the disadvantage of increasing the amount of heat which must be shunt from the combination of the die and the thermoelectric module. This is because the heat produced by the thermoelectric module may need to be dissipated into the same heat sink as the heat generated by the CPU die. Therefore, while increasing the current passed through the thermoelectric module is an option, it may be desirable to achieve adequate cooling of the hot spots of die 150 in a different manner.
One embodiment of a thermoelectric cooler that may be used to cool a die with a non-uniform heat distribution is illustrated by
At the end of first row 181 and second row 182, the current is once again combined and passed to third row 183 and fourth row 184. The combined current is then divided between third row 183 and fourth row 184. This is because third row 183 and fourth row 184 are also electrically coupled in parallel. In this manner approximately half of the current flowing through electrode 168, flows through third row 183 and approximately half the current flowing through electrode 168 flows through fourth row 184.
After the current flows through third row 183 and fourth row 184, it is once again combined and passed to fifth row 185 and sixth row 186. Fifth row 185 and sixth row 186 differ from first row 181, second row 182, third row 183, and fourth row 184 because fifth row 185 and sixth row 186 each pass through inner portion 166. Each of first-fourth rows 181-184 are disposed only in outer portion 164. The first portion of fifth row 185 and sixth row 186 and the last portion of these two rows run through outer portion 164. A middle portion of these two rows is disposed within inner portion 166. The portions of fifth row 185 and sixth row 186 that run through outer portion 164 are run in parallel with each other.
When fifth row 185 and sixth row 186 enter inner portion 166, thermoelectric elements 161 and 162 of fifth row 185 and sixth row 186 are no longer electrically coupled in series within the rows and in parallel between the rows but are now electrically coupled in series between the rows. In this manner, the half of the current that was traveling through fifth row 185 combines with the half of the current that was flowing through sixth row 186 as the rows enter inner portion 166. As the current flows through inner portion 166, each of the elements in fifth row 185 and sixth row 186 have the full current flowing through electrode 168, flowing through them. This current is once again split into two approximately half currents once fifth row 185 and sixth row 186 exit inner portion 166 and re-enter outer portion 164. This pattern continues for each of the rows passing through inner portion 166. The remainder of the rows which do not pass through inner portion 166 may be run in parallel configuration in the same manner as first row 181 and second row 182.
In a particular example of the above described embodiment, 10 amps may flow through electrode 168. This 10 amps could be divided between first row 181 and second row 182. The current will then be combined at the ends of first row 181 and 182. Third row 183 and fourth row 184 will then each receive approximately 5 amps. Fifth row 185 and sixth row 186 would also receive 5 amps for the portions of these rows that are disposed within outer portion 164. Once passing into inner portion 166, each thermoelectric element of fifth row 185 and sixth row 186 would once again receive 10 amps. This current would again be divided upon exiting inner portion 166.
In this manner each of the thermoelectric elements present in outer portion 164 receives half of the current that is received by the thermoelectric elements of inner portion 166. Utilizing this configuration, inner portion 166 is able to transfer heat at a greater rate than outer portion 164. This is because a thermoelectric element's ability to pump heat is directly proportional to the current passing through it. In other words, as the amount of current passed through a thermoelectric is increased, the amount of heat being pumped by the thermoelectric element is also increased.
The embodiment illustrated in
The embodiment illustrated in
The scope of the present invention is not intended to be limited to the specific embodiments described above, but is meant to encompass series/parallel configurations of thermoelectric elements where the areas with the highest heat load are coupled in series and the lower heat load areas are coupled in parallel. Further, in the areas including parallel circuit configurations, areas of relatively greater heat load may include fewer parallel circuits while areas of relatively less heat load may include more parallel circuits.
An embodiment of the present invention that may be used in lieu of or in conjunction with the embodiment illustrated in
Another embodiment of the present invention that may be used in lieu of or in conjunction with the embodiment illustrated in
A further alternative embodiment of the present invention that may be used in lieu of or in conjunction with the embodiment described in
Another further alternative embodiment of the present invention which could be used in conjunction with or in lieu of the embodiment illustrated in
In certain embodiments, using the highest heat pumping thermoelectric elements in regions of relatively lower heat loading may not be justified. Certain thermoelectric elements, such as, for example, thermoelectric elements 198, may have higher contact resistance losses and higher interconnect losses than a traditional thermoelectric element, such as, for example thermoelectric element 196. Therefore, it may be desirable to use the former type of elements in areas where the benefits of elevated heat pumping ability outweigh the drawbacks of elevated contact resistance losses and interconnect losses. As contact barriers improve and interconnect losses are decreased, the regions which can efficiently benefit from the higher heat pumping thermoelectric elements may increase. Even as the range of efficient use of the higher heat pumping thermoelectric elements is increased, the varied cooling requirements across a surface of an object to be cooled may be best met by a mixture of thermoelectric elements as taught by one of the embodiments described herein.
An additional alternative embodiment of the present invention which could be used in conjunction with or in lieu of the embodiment illustrated in
In many of the above-described embodiments, the height of the thermoelectric elements present in thermoelectric array 160 may be constant across the thermoelectric array 160. In other words, the height of each thermoelectric element is substantially the same as the height of every other thermoelectric element. In this discussion, the height of the thermoelectric element would be the dimension of the thermoelectric element between base ceramic 170 and top ceramic 172. Such a configuration would allow base ceramic 170 to be approximately parallel to top ceramic 172 while contacting each thermoelectric element.
In a particular embodiment, each of the thermoelectric elements may not be the same height. Differences in the heights of the thermoelectric elements may be compensated for by using taller electrical connections in areas of shorter thermoelectric elements. Using taller electrical interconnections would allow the base ceramic 170 to be approximately parallel to top ceramic 172 while contacting each thermoelectric element.
In an alternative embodiment, the effective height of each thermoelectric element or selected thermoelectric elements could be changed by coupling a very short thermoelectric element with a thermally and electrically conductive material.
In an alternative embodiment, thermoelectric elements 198 may be used throughout the inner portion 166 and the outer portion 164. The thermoelectric elements in inner portion 166 may have the same or different effective heights than the thermoelectric elements 198 in outer portion 164. Further, thermoelectric elements 198 may be mixed with thermoelectric elements 196 to improve cooling throughout a thermoelectric array, or groups of thermoelectric elements 198 may be selectively placed in areas of greater heat load to improve cooling in those areas. Such implementation could be used with or without the series configuration of inner portion 166 or the parallel configuration of the rows of outer portion 164.
A method of manufacturing thermoelectric element 198 is illustrated by
Wafer 210 may be sliced from a larger ingot or larger block of thermoelectric material using a diamond saw, ID saw, wire saw, or other appropriate cutting mechanism. The ingots from which the wafers are cut, can be produced in a variety of ways. These ways include crystal growth methods (such as Bridgman), plastic deformation (such as hot forging or extrusion), or pressing and sintering operations. Each ingot fabrication method has its own limitations on the dimensions from which high performance thermoelectric elements can be fabricated.
Generally, the thinner the material is the more fragile it becomes making it much more difficult and costly to handle. For example, traditional Bridgman materials are notoriously fragile at thin wafer thicknesses because of the cleavage planes that are inherent to the microstructure. For Bridgman materials, practical wafers in volume production are generally limited to about 0.75 mm (0.030″) thickness. Powder formed materials or plastically deformed material are much better and can be taken to thickness of around 0.25 mm (0.010″). The desired element thickness may be less than these values. Such is the case for high efficiency designs for high heat dissipation electronics or automotive air conditioning applications. In some of these applications, thickness of 0.125 mm (0.005″) or less may be desirable.
Once wafer 210 is formed,
When stiff backing 230 is a thermally and electrically conductive material and is permanently mounted to wafer 210 and the combination is diced, the result is a block as illustrated in
In a particular embodiment of the present invention, a second stiff backing may be coupled to the wafer such that the wafer is sandwiched between two stiff backings. The stiff backings may be the same or different materials and one or both of the stiff backings may be intended to be permanent or temporary. The second stiff backing may be coupled to the wafer prior to dicing such that the resulting thermoelectric elements have a thin section of thermoelectric material between two portions of the stiff backing.
The above described method of manufacture is illustrated in flowchart form in
This method may provide a way of producing high watt density thermoelectric coolers (because the coolers can be fabricated using very short elements). The technique may also allow creation of elements that can be assembled using typical thermoelectric cooler assembly processes (i.e. ones where P and N elements are either hand or machine loaded into tooling and soldered onto ceramics) The technique could also be used for devices fabricated from co-extruded materials (See U.S. patent application Ser. No. 10/729,610), or devices using Build-in-place assembly techniques (See U.S. patent application entitled Build-In-Place Method of Manufacturing Thermoelectric Modules, No. 10/966,685). The technique allows varying the element geometry within the thermoelectric cooler (thermoelectric material portion of elements can be shorter in some areas as part of TE element essentially replaced by metal conductor). The method also allows creation of elements that can be mass loaded instead of hand loaded because the effective length to width can be changed to make mass loading easier (i.e. to move the element geometry away from being cubic). The method may also produce higher reliability thermoelectric coolers as stress concentrations, typically present at the ends of the elements, can be moved from the weaker thermoelectric/diffusion barrier region to a region within the stronger metal conductor.
The foregoing discussion details an approach for achieving variable heat pumping within a thermoelectric cooler to better match a non uniform heat flux dissipated by an electronic component such as a computer CPU. The improved thermoelectric cooler operates at a higher efficiency and thereby improves its ability to effectively enhance the effectiveness of existing air cooled or water cooled heat sinks.
The foregoing discussion also details an approach to achieving very short thermoelectric elements, which allow maximum coefficient of performance operation (high efficiency), and still allow the thermoelectric cooler to be fabricated using traditional fabrication techniques. In addition, the element technique opens new avenues for design, providing an easy method of producing thermoelectric coolers with variable watt density to handle the non uniform heat loads associated with typical CPU dies.
Although the present invention has been described with several embodiments, a myriad of changes, variations, alterations, transformations, and modifications may be suggested to one skilled in the art, and it is intended that the present invention encompass such changes, variations, alterations, transformations, and modifications as fall within the scope of the appended claims.