Patent Grant
11994411
The present disclosure relates to position sensors and more specifically to a vernier position sensor including self-calibration to increase accuracy.
A vernier sensors may be used to obtain linear or angular measurements of a movable element. These measurements may include a calibration to improve accuracy.
In some aspects, the techniques described herein relate to a method for calibrating a position sensor, the method including: moving a movable element of the position sensor over a measurement range to acquire: a first output signal from a first sensor, the first output signal having increments repeating at a first frequency, and a second output signal from a second sensor, the second output signal having increments repeating at a second frequency; computing a difference signal based on the first output signal and the second output signal; calculating an offset of the difference signal and a variability of the difference signal; determining a first calibration and a second calibration to reduce the offset and the variability; and applying the first calibration to the first output signal and the second calibration to the second output signal.
In some aspects, the techniques described herein relate to a method, further including: repeating the computing, the calculating, the determining, and the applying for a number of iterations to determine the offset and the variability of the difference signal for each iteration; comparing the offset and the variability of repetitions of the iterations to select an iteration that generated a minimum offset and a minimum variability; and storing, in a memory, the first calibration and the second calibration of the selected iteration.
In some aspects, the techniques described herein relate to a method, wherein the first calibration includes a plurality of first calibration coefficients and the second calibration includes a plurality of second calibration coefficients.
In some aspects, the techniques described herein relate to a method, wherein the measurement range is a portion of a total measurement range of the position sensor.
In some aspects, the techniques described herein relate to a method, wherein the portion is less than less than 90% of the total measurement range.
In some aspects, the techniques described herein relate to a method, wherein the portion does not include a maximum of the total measurement range or a minimum of the total measurement range.
In some aspects, the techniques described herein relate to a method, wherein the first output signal and the second output signal include measurements taken at positions in the measurement range that are not equally spaced.
In some aspects, the techniques described herein relate to a method, wherein the position sensor is an angular position sensor.
In some aspects, the techniques described herein relate to a method, wherein the first sensor and the second sensor are inductive sensors.
In some aspects, the techniques described herein relate to a method, wherein the variability is a variance of the difference signal.
In some aspects, the techniques described herein relate to a method, wherein calculating the variance of the difference signal includes approximating an expected value of the variance of the difference signal based on (i) a frequency of the second sensor being larger than the first sensor and (ii) a frequency of the second sensor being coprime with the frequency of first sensor.
In some aspects, the techniques described herein relate to a method, wherein the frequency of the second sensor is greater than or equal to 10 times the frequency of the first sensor.
In some aspects, the techniques described herein relate to a method, wherein the approximating includes eliminating harmonic components in the expected value of the variance of the difference signal that are common to the first sensor and the second sensor.
In some aspects, the techniques described herein relate to a method wherein computing a difference signal based on the first output signal and the second output signal includes: appending the increments of the first output signal to generate a first absolute signal; appending the increments of the second output signal to generate a second absolute signal; scaling the first absolute signal relative to the second absolute signal to generate a first scaled absolute signal; scaling the second absolute signal relative to the first absolute signal to generate a second scaled absolute signal; and subtracting, point by point, the first scaled absolute signal from the second scaled absolute signal to compute the difference signal.
In some aspects, the techniques described herein relate to a position measurement system including: a position sensor including: a first sensor configured to output a first output signal; a first sensor correction circuit configured to apply a first calibration to the first output signal to generate a first corrected signal; a second sensor configured to output a second output signal; and a second sensor correction circuit configured to apply a second calibration to the second output signal to generate a second corrected signal; and a processor coupled to the position sensor and configured by software instructions to: generate a difference signal based on the first corrected signal and the second corrected signal; calculate an offset of the difference signal; calculate a variability of the difference signal; and determine a calibration quality based on the offset and the variability.
In some aspects, the techniques described herein relate to a position measurement system, wherein the processor is further configured by software instructions to: calculate an angle based on the first corrected signal and the second corrected signal.
In some aspects, the techniques described herein relate to a position measurement system, wherein to calculate the angle the processor is further configured by software instructions to: map the first corrected signal and the second corrected signal to a closest point on an ideal map of outputs, wherein each point on the ideal map of output corresponds to an angle.
In some aspects, the techniques described herein relate to a position measurement system, wherein the processor is further configured by software instructions to: generate a message when the calibration quality drops below a threshold.
In some aspects, the techniques described herein relate to a position measurement system, wherein the processor is further configured by software instructions to: recalibrate the position sensor by: iteratively computing the offset and the variability of the difference signal for different calibrations coefficients to find a new first calibration for the first output signal and a new second calibration for the second output signal.
In some aspects, the techniques described herein relate to a position measurement system, wherein: the position sensor is an inductive angular sensor having a first number of repeating increments in a 360-degree measurement range; and the position sensor is an inductive angular sensor having a second number of repeating increments in the 360-degree measurement range, wherein the first number and the second number are coprime.
In some aspects, the techniques described herein relate to a method for determining calibration coefficients for a vernier position sensor, the method including: transforming a first incremental signal from a first sensor of the vernier position sensor to a first absolute signal; transforming a second incremental signal from a second sensor of the vernier position sensor to a second absolute signal; computing a difference signal of based on the first absolute signal and the second absolute signal; calculating an offset and a variability of the difference signal; and performing an optimization routine that includes adjusting calibration coefficients applied to the first incremental signal and the second incremental signal to reduce the offset and the variability of the difference signal.
In some aspects, the techniques described herein relate to a method for determining calibration coefficients for a vernier position sensor, wherein the optimization routine includes: gathering a calibration measurement using the vernier position sensor to obtain a first incremental signal for calibration and a second incremental signal for calibration; and iteratively: selecting calibration coefficients, applying the selected calibration coefficients to the first incremental signal and the second incremental signal, and calculating the offset and the variability of the difference signal for each iteration to determine calibration coefficients that result in a minimum offset and variability for the iterations.
The foregoing illustrative summary, as well as other exemplary objectives and/or advantages of the disclosure, and the manner in which the same are accomplished, are further explained within the following detailed description and its accompanying drawings.
The components in the drawings are not necessarily to scale relative to each other. Like reference numerals designate corresponding parts throughout the several views.
A position sensor may include a sensor that has an output that varies from minimum to maximum repeatedly as it is moved through a measurement range. This repeating pattern makes determining an absolute position within the measurement range impossible. Vernier sensors resolve this ambiguity through the use of two sensors. A first sensor and a second sensor each have an output that varies from minimum to maximum repeatedly as it is moved through the measurement range, however the first sensor repeats with a first frequency and the second sensor repeats with a second (different) frequency. In this situation it is possible to resolve the absolute position of the measurement because the output of the first sensor and the second sensor form unique pairs for all possible positions in the measurement range. Thus, absolute positions may be mapped to pairs of outputs from the first sensor and the second sensor. Harmonic distortion can affect the outputs of the first sensor and the second sensor so that mapping is difficult, which can create errors in the measurements obtained using the vernier sensor.
The present disclosure describes a vernier sensor and a method for calibration that can decrease an offset and a variability in the sensor outputs caused by harmonic distortion. The disclosed techniques are computationally efficient based (at least) on the fact that the first sensor and the second sensor are built with different geometrical frequencies, which are selected to make the calibration of the two sensors independent. Further, the disclosed techniques can ease the requirements for calibration. As a result, the calibration may be applied at either an end-of-line production step or in the field without requiring an accurate angular reference. What is more, the disclosed techniques can be implemented during operation of the vernier sensor as a diagnostic to monitor the sensor outputs and determine if the sensor outputs are drifting or out of calibration.
A vernier position sensor (i.e., vernier sensor), as described herein, may utilize a first sensor and a second sensor to determine a position in a range from zero to full scale. The position sensor may measure linear or angular positions.
In a possible implementation the first sensor and the second sensor are inductive sensors configured to measure an angle of a movable element (e.g., rotor). In this case, the measurement range may be 0≤θ≤360 degrees and the position measured by the vernier sensor 100 may be an angle in this range. Inductive position sensors (e.g., inductive angular sensors) can be used in numerous fields in a variety of different applications. For example, the inductive position sensors can be used to detect the position of a robotic arm for control of its movement in an industrial application (e.g., assembly).
As shown in
The sensor may include other receive elements (not shown) that are arranged in the path of the coupling element 220 so that the output signal 250 from the sensor repeats in increments as the rotor 215 is rotated in one complete rotation. The first sensor 101 and the second sensor 102 of the vernier sensor 100 shown in
Each conductive loop may include a positive portion and a negative portion based on its winding direction relative to the magnetic field. For example, as shown in
Returning to
An absolute measurement of the angle can be obtained from each sensor if the increment for each measurement is known. For example, if the sensor is moved in one rotation (i.e., from 0 to FS) and an output signal is applied to a counter configured to offset the output signal for each increment (i.e., 1, 2, 3, . . . ), then an absolute signal may be generated.
The two sensors and their different frequencies (i.e., number of increments) can have a unique pair of outputs for measurements in a measurement range from 0 to full scale (e.g., 0≤θ≤360). The pairs of outputs may be plotted against one another to produce a graph (i.e., map) of outputs. Each point in the map of outputs may represent a position (e.g., angle) in the measurement range.
The graph (i.e., map) shown in
Calibration can be used to make non-ideal outputs closely match those of the ideal map. For example, while random errors caused by noise (e.g., thermal noise) may not be removed with calibration, systematic distortions, such as harmonic distortion, can be substantially removed (e.g., completely removed) through calibration. Further, if the sensor distortions and errors are independent, then calibrating one sensor to the other is possible. The systematic distortion may depend on the type of sensor implemented. As described previously, calibration can include transforming the (incremental) first output signal and the (incremental) second output signal into a first absolute signal and a second absolute signal.
The first absolute signal (i.e., Out1) may be given by equation (1), shown below.
Out1(θ)=(Nθ+Σc′kejkNθ)MOD 2π (1)
As expressed in equation (1), the first absolute signal (Out1) includes an absolute measurement term (NO) that is linearly related to the angle (θ) of the movable element and scaled by a first frequency (N) of the first sensor (i.e., coarse position sensor). The first absolute signal (Out1) further includes a harmonic distortion term that is a sum of sinusoids at multiples (k) (i.e., orders) of the first frequency (N), where each order has an amplitude (c′k), that decreases as the order increases, and where “j” is the imaginary unit.
Likewise, the second absolute signal (i.e., Out2) may be given by equation (2), shown below.
Out2(θ)=(Mθ+Σc″lejlMθ)MOD 2π (2)
As expressed in equation (2), the second absolute signal (Out2) includes an absolute measurement term (MO) that is linearly related to the angle (θ) of the movable element and scaled by a second frequency (M) of the second sensor (i.e., fine position sensor). The second absolute signal (Out2) further includes a harmonic distortion term that is a sum of sinusoids at multiples (l) (i.e., orders) of the second frequency (M), wherein each order has an amplitude (c″l), which decreases as the order increases.
The absolute signals can be scaled relative to each other so that they can be compared. Scaling can be applied so that both absolute measurements extend from the minimum level to the same maximum level. In other words, the first output signal may be scaled relative to the second output signal to generate a first scaled signal. Likewise, the second absolute signal may be scaled relative to the first absolute signal to generate a second scaled signal. The maximum value of the scaled signals can be the maximum value of the first absolute signal multiplied by the maximum value of the second absolute signal. Ideally the scaled absolute measurements overlay perfectly, and their difference is zero. However, errors due to noise and distortion can lead to differences. The disclosed calibration process can reduce these differences.
To scale, the first absolute signal (Out1) can be multiplied by the second frequency (i.e., M) of the second sensor, while the second absolute signal (Out2) can be multiplied by the first frequency (i.e., N) of the first sensor. The scaled signals can be subtracted to determine their difference. What results after subtraction is a difference signal that includes only the harmonic distortion terms. The difference signal is represented below in equation (3).
MOut1(θ)−NOut2(θ)=MΣcjkNθ−NΣc″lejlMθ (3)
The difference signal is a sum of harmonics at multiples of the first sensor frequency (i.e., N) and at multiples of the second frequency (i.e., M). Each harmonic can have an amplitude given by the coefficients (i.e., c′k, c″l). Calibration can include determining coefficients that minimize the effects of these harmonics.
The offset may result from an angular offset between the two sensors. The offset may be computed as the expected value (i.e., average) of the difference signal, as shown in equation (4) below.
E[MOut1(θi)−NOut2(θi)]=Mc′0−Nc″0 (4)
In other words, the offset may include the zeroth order harmonic distortion. Calibration may include determining a calibration (e.g., a calibration coefficient) to minimize the offset (e.g., make zero). For example, the calibration coefficient may be added to the output of one sensor to compensate for their average difference. After minimizing the offset, the variance of the difference signal can be computed, as shown in equation (5) below.
E[Var(MOut1(θi)−NOut2(θi))]=M2ΣkN≠lM|c′k|2+N2ΣkN≠lM|c″l|2+ΣkN=lM|Mc′k−Nc″l|2 (5)
As shown in equation (5), the harmonic distortion may include orders (i.e., k=0, 1, 2, 3, . . . ) of the first frequency (i.e., kN) and orders (i.e., 1=0, 1, 2, 3, . . . ) of the second frequency (i.e., lM). The amplitude (i.e., coefficient) of each order may decrease as the order increases. For example, a 10th order coefficient may be smaller than a 1st order coefficient.
Determining a calibration (e.g., calibration coefficients) to reduce the variance may be carried for the first output and the second output independently for orders that are not common (i.e., kN≠lM) to both outputs. However, calibration may not be possible for orders that are common (i.e., kN=lM) because the calibration process for each output may not be independent. The vernier sensor of the present disclosure describes a calibration method that accounts for the common orders through an approximation that corresponds to relationships between the first frequency and the second frequency that are based on the physical designs of the first sensor (i.e., coarse sensor) and the second sensor (i.e., fine sensor).
Frequencies (N, M) of the first and second sensors may be selected so that orders common to both outputs (i.e., kN=lM) result in terms of the variance (equation (5)) that are small and can therefore be eliminated. This can be accomplished in two ways. First, the second frequency (M) may be made much higher (e.g., more than 10 times) than the first frequency (N). For example, if the first frequency (N) is 5 then the second frequency (M) can be 64. Second, the first frequency (N) and the second frequency (M) may be made coprime so that the first order that is common to both is their product (N·M). For example, the first common component in the harmonic distortion for N=5 and M=64 is the 320 harmonic. In his case, the third term of the variance question can be approximated as shown below in equation (6).
|64c′64−5c″5|2≈|5c″5|2 (6)
As a result, the independence can be maintained because the 64th order harmonic first absolute signal (i.e., c′64) is insignificant compared to the 5th order harmonic of the second absolute signal (i.e., c″5). For example, the 64th harmonic may be more than 100 times smaller than the 5 harmonics. Independent terms in the difference signal allow optimization of the coefficients for the first sensor without affecting the calibration coefficients for the second sensor, and vice versa. Further, the calibration process may limit itself to the most significant orders (e.g., 0≤orders≤5) of the harmonic distortion to increase speed and reduce complexity of the variance calculation.
The disclosed calibration technique, which is based on the offset and the variance, can be much less computationally complex than other calibration techniques. For example, calibration using a Fourier transform to determine harmonic content can require more computational steps, more measurement points, and require more careful control of how a calibration measurement is made. The use of coprime frequencies can help to determine positions unambiguously and can help simplify the calibration the sensor using variance.
The disclosed calibration technique can also be more versatile in the measurements it uses to calibrate than other calibration techniques. For example, it may not be necessary to collect a full measurement range in order to acquire a difference signal suitable for calibration. This may be especially useful for calibrating a device (e.g., robotic arm) without changing its normal operating movement. For example, a difference signal may be acquired in the field as the device is operated. The offset (e.g., average) and/or variability (e.g., variance) of the difference signal may be analyzed routinely to determine how well the calibration is performing. If the offset and/or variability satisfy a criterion (e.g., exceed a threshold), then the device may be out of calibration. In this condition, another calibration process (i.e., a recalibration process) may be triggered or another action may be triggered, such as generating an alert that the device requires calibration.
The disclosed calibration technique can also be more immune to measurement variations than other calibration techniques. For example, the calibration does not require the measurement points in the difference signal (see
The system 800 further includes a coarse angular sensor interface 811 configured to couple signals from the coarse position sensor 801. The signals output from the coarse angular sensor interface may be sinusoidal signals as described for the inductive sensor shown in
The system 800 further includes a coarse sensor correction circuit 821 (i.e., module, block) configured to apply coarse calibration coefficients to the sinusoidal signals output from the coarse angular sensor interface 811. Accordingly, the coarse sensor correction block may be configured to store a set of calibration coefficients (i.e., first calibration coefficients) for the coarse sensor. The system 800 further includes a fine sensor correction circuit 822 (i.e., module, block) configured to apply fine calibration coefficients to the sinusoidal signals output from the fine angular sensor interface 812. Accordingly, the fine sensor correction circuit 822 may be configured to store a set of calibration coefficients (i.e., second calibration coefficients) for the fine sensor.
The system 800 further includes an absolute position calculator 850. The absolute position calculator is configured to receive the coarse signals and the fine signals and to produce an angle based on the results. For example, the absolute position calculator may be configured to convert an in-phase channel and a quadrature channel from the coarse sensor into a coarse incremental measurement, as described for
The system includes a calibration block 860 (i.e., calibration module, calibration program, calibration software) that is configured to generate/update the calibration coefficients used to obtain the calibrated absolute position. The calibration may be performed periodically and can be executed automatically (e.g., triggered based on the results of a calibration check) or manually (e.g., executed by a user). When calibration/checking is not necessary the calibration block 860 of the system may be disabled. In some implementations however the calibration block may be enabled during normal operation to monitor a calibration quality of the calibration coefficients. For example, the average and/or variance of a difference signal may be monitored. When the average and/or variance of the difference signal satisfies a criterion (e.g., exceeds a threshold) the calibration block may generate a calibration quality signal to trigger an action, such as an automatic recalibration or a warning message that the vernier sensor is not calibration.
The calibration block 860 includes a first incremental to absolute position module 831 for the coarse signal and a second incremental to absolute position module 832 for the fine signal. The modules are configured to convert the incremental measurements into absolute measurements, as shown
The method 900 further includes applying 910 coefficients to the measurement data to generate corrected measurement data. The method further includes computing 915 a difference signal from the corrected measurement data and calculating a mean and/or a variance of the difference signal 920. The results 960 of this calculation can be stored for comparison with subsequent calculations. The method further includes determining 940 if all iterations are complete. If not, the method iterates 930 the coefficients and repeats the process to determine results from corrected measurement data using the iterated coefficients. The iteration (i.e., change) to the coefficients may be based on a change in the mean and variance from a previous iteration. For example, if the mean and variance are increased the coefficients may be iterated in a way that opposes this change, while if the mean and variance are decreased, the coefficients may be iterated in a way that supports this change. When all iterations are complete, the method then determines 970 a result from all of the stored results 960 that has the minimum (i.e., lowest) mean and/or variance. The coefficients associated with this result are then stored as the calibration coefficients 980. For example, the coefficients resulting from this process may replace previously recorded coefficients. Alternatively, resulting from this process may be used to update (i.e., change) some previously recorded coefficients.
The position sensor 1020 may be communicatively coupled to a computing device 1030 via an interface 1031 (e.g., wireless interface). In a possible implementation, the computing device may be configured to communicate instructions to, and receive data from, the position sensor 1020 and the movable element 1010.
The computing device 1030 can include a memory 1033, such as a non-transitory computer readable memory that can store software instructions to configure a processor 1032 to perform any or all of the processing disclosed herein. In a possible implementation, the processor may configure the movable element 1010 and the position sensor 1020 in a calibration mode. In the calibration mode, the processor may be further configured to perform the functions of the calibration block 860, as shown in
The computing device 1030 may be coupled to a network 1040 (i.e., cloud) and some, or all, of the processing described herein may be performed by a remote computing device (or devices) coupled to the computing device 1030 through the network 1040. In a possible implementation the computing device may report a status regarding a calibration to the network. For example, the processor may be configured to monitor a quality of the calibration and if the calibration quality changes, the computing device may transmit a message to the network that the position sensor 1020 requires calibration.
The method 1100 further includes obtaining a first output signal (1st output) from the first sensor of the vernier sensor and a second output (2nd output) from the second sensor of the vernier sensor. Based on the movement, the first output and the second output will repeat in increments. The method 1100 further includes counting 1111 the increments of the first output (i.e., N) and counting 1121 the increments of the second output (i.e., M). The counting may include tagging or scaling each increment of the output signal according to its increment.
The method 1100 further includes transforming 1112 the first output signal into a first absolute signal. The transforming includes appending the (scaled) increments of the first output in sequence according to their increment. The method 1100 further includes transforming 1122 the second output signal into a second absolute signal. The transforming 1122 includes appending the (scaled) increments of the first output in sequence according to their increment. The first absolute signal can increase from 0 to the number of increments in the first output (i.e., N) and the second absolute signal can increase from 0 to the number increments in the second output (i.e., M).
The method 1100 further includes scaling 1113 the first absolute signal according to the second absolute signal. For example, the first absolute signal may be multiplied by M so that its maximum value is N times M. The method 1100 further includes scaling 1123 the second absolute signal according to the first absolute signal. For example, the second absolute signal may be multiplied by N so that its maximum value is M times N.
The method 1110 further includes computing 1140 a difference signal as the point-by-point difference of the scaled absolute signals and computing 1150 an average and a variance of the difference signal.
The method 1110 further includes determining 1160 a first set of calibration coefficients corresponding for the first output and a second set of calibration coefficients for the second output that reduce the computed average and variance. The determination may use any optimization method (i.e., process, routine), such as the one shown in
In the specification and/or figures, typical embodiments have been disclosed. The present disclosure is not limited to such exemplary embodiments. The use of the term “and/or” includes any and all combinations of one or more of the associated listed items. The figures are schematic representations and so are not necessarily drawn to scale. Unless otherwise noted, specific terms have been used in a generic and descriptive sense and not for purposes of limitation.
Unless defined otherwise, all technical and scientific terms used herein have the same meaning as commonly understood by one of ordinary skill in the art. Methods and materials similar or equivalent to those described herein can be used in the practice or testing of the present disclosure. As used in the specification, and in the appended claims, the singular forms “a,” “an,” “the” include plural referents unless the context clearly dictates otherwise. The term “comprising” and variations thereof as used herein is used synonymously with the term “including” and variations thereof and are open, non-limiting terms. The terms “optional” or “optionally” used herein mean that the subsequently described feature, event or circumstance may or may not occur, and that the description includes instances where said feature, event or circumstance occurs and instances where it does not. Ranges may be expressed herein as from “about” one particular value, and/or to “about” another particular value. When such a range is expressed, an aspect includes from the one particular value and/or to the other particular value. Similarly, when values are expressed as approximations, by use of the antecedent “about,” it will be understood that the particular value forms another aspect. It will be further understood that the endpoints of each of the ranges are significant both in relation to the other endpoint, and independently of the other endpoint.
Some implementations may be implemented using various semiconductor processing and/or packaging techniques. Some implementations may be implemented using various types of semiconductor processing techniques associated with semiconductor substrates including, but not limited to, for example, Silicon (Si), Gallium Arsenide (GaAs), Gallium Nitride (GaN), Silicon Carbide (SiC) and/or so forth.
While certain features of the described implementations have been illustrated as described herein, many modifications, substitutions, changes and equivalents will now occur to those skilled in the art. It is, therefore, to be understood that the appended claims are intended to cover all such modifications and changes as fall within the scope of the implementations. It should be understood that they have been presented by way of example only, not limitation, and various changes in form and details may be made. Any portion of the apparatus and/or methods described herein may be combined in any combination, except mutually exclusive combinations. The implementations described herein can include various combinations and/or sub-combinations of the functions, components and/or features of the different implementations described.
It will be understood that, in the foregoing description, when an element is referred to as being on, connected to, electrically connected to, coupled to, or electrically coupled to another element, it may be directly on, connected or coupled to the other element, or one or more intervening elements may be present. In contrast, when an element is referred to as being directly on, directly connected to or directly coupled to another element, there are no intervening elements present. Although the terms directly on, directly connected to, or directly coupled to may not be used throughout the detailed description, elements that are shown as being directly on, directly connected or directly coupled can be referred to as such. The claims of the application, if any, may be amended to recite exemplary relationships described in the specification or shown in the figures.
As used in this specification, a singular form may, unless definitely indicating a particular case in terms of the context, include a plural form. Spatially relative terms (e.g., over, above, upper, under, beneath, below, lower, and so forth) are intended to encompass different orientations of the device in use or operation in addition to the orientation depicted in the figures. In some implementations, the relative terms above and below can, respectively, include vertically above and vertically below. In some implementations, the term adjacent can include laterally adjacent to or horizontally adjacent to.
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