Information
-
Patent Grant
-
6593726
-
Patent Number
6,593,726
-
Date Filed
Friday, February 15, 200222 years ago
-
Date Issued
Tuesday, July 15, 200321 years ago
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Inventors
-
Original Assignees
-
Examiners
Agents
-
CPC
-
US Classifications
Field of Search
US
- 323 284
- 323 282
- 323 273
- 323 274
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International Classifications
-
Abstract
An apparatus and method for compensating for a decreasing internal voltage that is generated from a higher external voltage. In response to the internal voltage decreasing in excess of a voltage margin, the amount by which the higher external voltage is reduced in generating the internal voltage is adjusted to raise the internal voltage.
Description
TECHNICAL FIELD
The present invention is related generally to the field of electronic semiconductor devices, and more particularly, to voltage converter circuitry included therein for generating a relatively stable output voltage.
BACKGROUND OF THE INVENTION
Many semiconductor devices are designed to operate at various supply voltages and signal voltages. To accommodate the use of different supply voltages, the semiconductor device is typically designed to operate at the lower supply voltage. The lower supply voltage is often generated by including a voltage converter that steps-down the voltage of a higher external voltage level to a lower internal voltage level that is provided by an internal power supply. Thus, the device will be able to function whether the voltage of the external supply is greater than or equal to the voltage of the internal voltage supply. However, an issue that exists for any internal power supply of a device, both for devices that can operate at multiple supply voltage levels as well those that cannot, is whether the internal power supply has sufficient current drive capabilities.
A common occurrence that challenges the drive capabilities of an internal supply occurs when a device becomes active from a stand-by mode. Many devices are designed to automatically enter into a stand-by mode where power consumption is reduced to a minimum when the device is not currently in use. However, when the device becomes active again, the current loading often increases suddenly, placing a severe current load on the internal power supply. In some instances, the current loading of the internal power supply is so sudden that it causes the voltage of the internal power supply to drop-off. In severe cases, the voltage drop-off may be great enough to cause the device to malfunction.
Many different approaches have been taken in response to the current loading issue. One such approach is to simply design an internal power supply having greater current drive capabilities. However, although this is simple in principle, the implementation of such often poses several challenges. Another issue is the amount of space required to include an internal power supply having greater current drive capabilities. Where miniaturization is a priority in the design of the device, including an internal power supply having adequate current drive capabilities, but takes up more space, may not be an acceptable alternative. Another approach taken has been to accept increased power consumption in a stand-by state to reduce the current load when the device returns to an active mode. However, this alternative is undesirable because, as previously mentioned, it is generally desirable to design devices that are power efficient. Therefore, there is a need for a voltage converter that can provide a relatively stable output voltage in spite of sudden increases in current loading on the output.
SUMMARY OF THE INVENTION
The present invention is directed to an apparatus and method for compensating for a decreasing internal voltage that is generated from a higher external voltage. In response to the internal voltage decreasing in excess of a voltage margin, the amount by which the higher external voltage is reduced in generating the internal voltage is adjusted. The internal voltage is generated by a voltage conversion circuit having an input node to which the higher external voltage is applied, an output node at which the lower internal voltage is provided, and a control node to which a control signal having a control voltage is applied. The voltage conversion circuit generates an internal voltage having a voltage relative to the higher external voltage based on the voltage of the control signal. A compensation circuit is coupled to the voltage conversion circuit and includes a sense node coupled to the output node of the voltage conversion circuit, a supply node coupled to the input node of the voltage conversion circuit, and a feedback node coupled to the control node of the voltage conversion circuit. The compensation circuit generates a feedback signal at the feedback node to compensate for a decrease in the output voltage in response to the voltage of the output voltage falling below the voltage margin.
BRIEF DESCRIPTION OF THE DRAWINGS
FIG. 1A
is a schematic drawing of a voltage converter according to an embodiment of the present invention and
FIG. 1B
is a schematic drawing of a feedback circuit according to an alternative embodiment of present invention.
FIG. 2
is a schematic drawing of a differential amplifier that can be used in the voltage converter of FIG.
1
A.
FIG. 3
is a signal diagram of various voltage signals of the voltage converter of
FIG. 1A
without a feedback circuit.
FIG. 4
is a signal diagram of various voltage signals of the voltage converter of
FIG. 1A
with a feedback circuit according to an embodiment of the present invention.
FIG. 5
is a block diagram of a memory device including a voltage converter according to an embodiment of the present invention.
FIG. 6
is a block diagram of a computer system including the memory device of FIG.
5
.
DETAILED DESCRIPTION OF THE INVENTION
Embodiments of the present invention are directed to a voltage converter providing a relatively stable output voltage despite increasing current loads on the output signal. Certain details are set forth below to provide a sufficient understanding of the invention. However, it will be clear to one skilled in the art that the invention may be practiced without these particular details. In other instances, well-known circuits, control signals, and timing protocols have not been shown in detail in order to avoid unnecessarily obscuring the invention.
FIG. 1A
illustrates a voltage converter
100
according to an embodiment of the present invention. The voltage converter
100
includes a differential amplifier
104
in which an output signal VOUT is generated from an external voltage VCCEXT, and will have a voltage level based on a reference voltage VREF and a feedback voltage VDIV. Generation of the VREF signal is made through a reference voltage generator (not shown) and is typically supplied to various circuitry within a memory device. Such reference voltage generators are known by those of ordinary skill in the art, and can be implemented using conventional circuitry. As illustrated in
FIG. 1A
, the VOUT signal is provided at a node
116
and fed back to the differential amplifier
104
through the use of a voltage divider circuit including resistors
108
and
112
. The VOUT signal is provided to the gate of a transistor
120
, which is used as a voltage controlled impedance to step-down the voltage of VCCEXT for a internal voltage supply at an output node
122
having an internal voltage VCCINT. A capacitor
124
is coupled to the gate of the transistor
120
and ground to reduce fluctuations in the VOUT signal. As will be described in more detail below, the capacitor
124
is also used by a feedback circuit
140
to reduce voltage drop-off of the VCCINT voltage when the current load on the internal voltage supply rapidly increases.
The feedback circuit
140
is coupled to the output node
122
and a node
110
at which the VCCEXT voltage is provided. An output
142
of the feedback circuit
140
is coupled to the node
116
at which the gate of the transistor
120
and the capacitor
124
are coupled as well. As shown in
FIG. 1A
, the feedback circuit
140
includes a diode-coupled transistor
132
having a gate coupled to the output node
122
through a capacitor
128
. A second diode-coupled transistor
134
is coupled to the drain of the transistor
132
to form a voltage dividing circuit with the transistor
132
. The second diode-coupled transistor
134
can be a p-type transistor, as shown, or an n-type transistor coupled as a diode, or a resistor, which serves the same biasing purpose. It will be appreciated that it is advantageous to have both the transistors
132
and
134
highly resistive to minimize power consumption by the voltage converter
100
and to increase the compensation efficiency of the feedback circuit
140
by making the coupling of capacitor
128
more effective. That is, having transistors
132
and
134
highly resistive will minimize the current drain from the node
110
, to which the VCCEXT voltage is applied, to ground. At the same time, the highly resistive transistor
132
will improve the decoupling between the node
110
and node
133
, so that the node
133
will follow the node
122
in its voltage behavior without influence from the node
110
. A transistor
136
is coupled between the node
110
and the node
116
to provide a conductive path through which the VCCEXT voltage can be coupled to the capacitor
124
and the gate of the transistor
120
. The gate of the transistor
136
is coupled to the voltage dividing circuit of transistors
132
and
134
to bias the gate of the transistor
136
such that when the VCCINT voltage drops-off below a trigger voltage, the transistor
136
becomes conductive. That is, feedback is provided by the feedback circuit
140
when the VCCINT voltage decreases in excess of a voltage difference defined by the trigger voltage.
Illustrated in
FIG. 1B
is an alternative feedback circuit
160
that can be substituted for the feedback circuit
140
shown in FIG.
1
A. The feedback circuit
160
includes an inverter formed by p-type and n-type transistors
172
and
174
, respectively, coupled between the VCCEXT voltage at the node
110
and ground. The inverter of Ad transistors
172
,
174
has an input node
173
coupled directly to the node
122
at which VCCINT is provided. The inverter further has an output
175
coupled to the node
116
through a capacitor
158
. The feedback circuit
160
provides negative feedback when the voltage of VCCINT decreases, causing the transistor
172
to become more conductive and the transistor
174
to be less conductive. Consequently, the voltage at the inverter output
175
will increase, thereby increasing the voltage of the node
116
through the capacitor
158
.
Illustrated in
FIG. 2
is a differential amplifier
200
that can be substituted for the differential amplifier
104
shown in FIG.
1
A. The VCCEXT voltage is used as a supply voltage from which VOUT signal is generated. Load transistors
210
and
212
are coupled to the VCCEXT voltage, and the gates of the input transistors
220
,
222
and
230
each receive a respective input signal, namely, the VREF and VDIV voltages, that are used to adjust the voltage of the VOUT signal. In the configuration shown in the voltage converter
100
(FIG.
1
A), the VDIV voltage is at a relatively constant voltage below the VOUT signal, and the VREF voltage is also a relatively constant voltage that, as previously mentioned, is provided by a reference voltage generator (not shown). Transistors
250
and
252
form an enable circuit that allows the differential amplifier to operate when an enable signal EN is active. As shown in
FIG. 2
, the EN signal is an active HIGH signal. The EN signal is applied to the gate of the transistor
252
and an inverted enable signal EN_is applied to the gate of the transistor
250
. Generation of such enable signals is well known in the art, and will not be discussed in greater detail in the interest of brevity.
The operation of the voltage converter
100
will be initially described as operating without the benefit of the feedback circuit
140
in order to illustrate the benefits that the feedback circuit
140
provide to the voltage converter
100
. Without the assistance of the feedback circuit
140
, the drop-off in the VCCINT voltage can be quite dramatic where the current load on the internal voltage supply increases rapidly. As previously mentioned, this can occur when a memory device is activated from a stand-by state. In some instances, the current load can suddenly increase from approximately 100 μA in stand-by state to approximately 200 mA in an active state. The sudden increased current at the output node
122
causes the voltage drop across the transistor
120
to suddenly increase as well. Consequently, the increasing current load on the internal voltage supply causes the VCCINT voltage to drop-off until the voltage applied to the gate of the transistor
120
can increase to compensate for the increased current load. Due to parasitic source-gate capacitance of the transistor
120
, the decrease in the VCCINT voltage also causes the gate voltage of the transistor
120
to decrease as well. This phenomena is commonly referred to as the Miller capacitance effect. The decrease in the gate voltage of the transistor
120
exacerbates the drop-off in the VCCINT voltage because the decreasing gate voltage causes the transistor
120
to become more resistive, and consequently, the VCCINT voltage to drop-off even more. As illustrated in the signal diagram of
FIG. 3
, the result is that the VCCINT voltage can drop-off by as much as 600 mV before the internal voltage supply can be charged back to a stable VCCINT voltage. As previously mentioned, where circuitry relies on the internal voltage supply, the dramatic drop-off in the VCCINT voltage may cause those circuits to malfunction.
As previously discussed, the Miller capacitance between the source of the transistor
120
, which is coupled to the output node
122
, and the gate of the transistor, which is coupled to the node
116
, exacerbates the reduction in the VCCINT voltage when the current load on the internal voltage supply rapidly increases. In operation, the feedback circuit
140
couples the node
110
to the node
116
in order to use the VCCEXT voltage to drive the gate of the transistor
120
in response to a drop-off in the VCCINT voltage that exceeds a voltage difference. Thus, because the source to gate (Miller) capacitance is an internal capacitance that cannot be decoupled, a drop-off in the VCCINT voltage is fed back to the feedback circuit
140
, which uses the VCCEXT voltage to drive the gate of the transistor
120
to be more conductive, and consequently, provide more current drive capability to the output node
122
when needed. In effect, the feedback circuit
140
(and the feedback circuit
160
of
FIG. 1B
) provides negative feedback to compensate for the Miller capacitance effect inherent in the transistor
120
, or in other words, the drop-off exceeding a 4 voltage difference in the VCCINT voltage is inverted and coupled to the gate of the transistor
120
to decrease its impedance.
FIG. 4
illustrates a signal diagram that shows the improvement in the stability of the VCCINT voltage that is provided by the feedback circuit
140
. With the benefit of the feedback circuit
140
, the drop-off in the VCCINT voltage can be reduced to approximately 350 mV.
It will be appreciated that the feedback circuit
140
provides minimum feedback delay which enables very good compensation for the Miller capacitance. The feedback circuit
140
can be made very responsive because in that particular embodiment only the transistor
136
needs to be switched ON to couple the VCCEXT voltage to drive the gate of the transistor
120
. Moreover, there is low DC current consumption through the resistive current paths, namely, from the node
116
to ground through resistors
108
and
112
, and from the node
110
to ground through transistors
132
and
134
. It will further be appreciated that the embodiment of the feedback circuit shown in
FIG. 1A
is activated only when compensation is needed, that is, when the VCCINT voltage drops-off. In the situation that the VCCINT voltage were to increase, the transistor
136
would remain OFF, and no compensation from the VCCEXT voltage would be provided. Thus, the feedback circuit
140
is limited to providing negative feedback.
As will be discussed below, the level of voltage drop-off or voltage difference before coupling of the node
110
to the node
116
occurs can be tailored to accommodate different levels of responsiveness. It will be appreciated that using the transistor
134
to set the bias point of the gates of transistors
132
and
136
through the transistor
134
can be used to adjust the amount of voltage drop-off before the feedback circuit
140
begins to couple the node
110
to the node
116
. That is, the bias level to which the gate of the transistor
136
can be used to set the responsiveness of the feedback circuit
140
.
For example, in one embodiment of the voltage converter
100
, the characteristics of the transistor
134
are selected to bias the gate and drain of the transistor
132
such that the transistor is barely conductive. That is, the source-to-gate voltage of the transistor
132
will be slightly greater than the threshold voltage of the transistor
132
, V
tp,132
. The characteristics of the transistor
136
are selected such that when the transistor
132
is biased such that it is barely conducting, the transistor
136
is barely non-conductive. That is, the source-to-gate voltage of the transistor
136
will be slightly less than its threshold voltage, V
tp,136
. In this condition, a relatively minor drop-off in the VCCINT voltage will cause the transistor
136
to begin conducting. As a result, the VCCEXT voltage can be quickly coupled to the node
116
to help maintain the charge on the capacitor
124
and drive the gate of the transistor
120
so that it is less resistive, and the VCCEXT voltage can be used to provide additional current drive capability to the internal voltage supply. Alternatively, in another embodiment, the characteristics of the transistors of the feedback circuit
140
are selected such that the gate of the transistor
136
is biased to near V
tp,136
, but not to the same degree as in the previous example. Although relaxing the bias point of the gate of the transistor
136
will result in the feedback circuit
140
being less responsive, minor variations in the voltage of the VCCINT voltage will be filtered. In some instances, this may be desirable.
The responsiveness of the feedback circuit
140
can be altered through other means in addition to those previously discussed. For example, the capacitance of the capacitor
128
can be selected to incorporate limited filtering of minor variations in the VCCINT voltage. Alternatively, changing the capacitance of the capacitor
124
can be used to change the responsiveness of the feedback circuit
140
as well. It will be appreciated that implementing modifications to adjust the responsiveness of the feedback circuit
140
are within the understanding of those of ordinary skill in the art, and additionally, such modifications remain within the scope of the present invention. Moreover, the size of the transistor
136
and the capacitor
128
(and the capacitor
158
in
FIG. 1B
) will affect the level or amount of compensation provided by the feedback circuit
140
. It will be appreciated that those of ordinary skill in the art have sufficient knowledge to select the size of the transistor
136
and capacitor
128
to be optimized to counteract the Miller capacitance effect inherent in the transistor
120
.
FIG. 5
illustrates a non-volatile memory device
500
including a voltage converter
514
according to an embodiment of the present invention incorporated therein. The voltage converter receives an external voltage VCCEXT, and converts the VCCEXT voltage to an internal voltage VCCINT, which is used throughout the memory device
500
. Commands are issued to a command state machine (CSM)
504
which acts as an interface between the an external processor (not shown) and an internal write state machine (WSM)
508
. When a specific command is issued to the CSM
504
, internal command signals are provided to the WSM
508
, which in turn, executes the appropriate algorithm to generate the necessary timing signals to control the memory device
500
internally, and accomplish the requested operation. The CSM
504
also provides the internal command signals to an ID register
508
and a status register
510
, which allows the progress of various operations to be monitored when interrogated by issuing to the CSM
504
the appropriate command.
Portions of the commands are also provided to input/output (I/O) logic
512
which, in response to a read or write command, enables the data input buffer
516
and the output buffer
518
, respectively. The I/O logic
512
also provides signals to the address input buffer
522
in order for address signals to be latched by an address latch
524
. The latched address signals are in turn provided by the address latch
524
to an address multiplexer
528
under the command of the WSM
506
. The address multiplexer
528
selects between the address signals provided by the address latch
524
and those provided by an address counter
532
. The address signals provided by the address multiplexer
528
are used by an address decoder
540
to access the memory cells of a memory bank
544
that correspond to the address signals. A gating/sensing circuit
548
is coupled to the memory bank
544
for the purpose of programming and erase operations, as well as for read operations.
During a read operation, data is sensed by the gating/sensing circuit
548
and amplified to sufficient voltage levels before being provided to an output multiplexer
550
. The read operation is completed when the WSM
506
instructs the output buffer
518
to latch data provided from the output multiplexer
550
to be provided to the extem processor. The output multiplexer
550
can also select data from the ID and status registers
508
,
510
to be provided to the output buffer
518
when instructed to do so by the WSM
506
. During a program or erase operation, the I/O logic
512
commands the data input buffer
516
to provide the data signals to a data register
560
to be latched. The WSM
506
also issues commands to program/erase circuitry
564
which uses the address decoder
540
to carry out the process of injecting or removing electrons from the memory cells of the memory bank
544
to store the data provided by the data register
560
to the gating sensing circuit
548
. To ensure that sufficient programming or erasing has been performed, a data comparator
570
is instructed by the WSM
506
to compare the state of the programmed or erased memory cells to the data latched by the data register
560
.
It will be appreciated that the embodiment of the memory device
500
that is illustrated in
FIG. 5
has been provided by way of example and that the present invention is not limited thereto. Those of ordinary skill in the art have sufficient understanding to modify the previously described memory device embodiment to implement embodiments of the voltage converter. For example, the voltage converter
514
is represented in
FIG. 5
as a separate circuit block. However, the voltage converter
514
may be incorporated into one of the other circuit blocks, or alternatively, may be split among several circuit blocks. In other cases, a portion of the circuits of the memory device
500
can be powered by an external voltage supply while others are powered by an internal voltage supply such as that generated by the voltage converter
514
. The particular arrangement of the voltage converter
514
within a memory device will be a matter of design preference. Additionally, although the voltage converter has been described as having an external voltage applied as the input and an internal voltage supply as the output, it will be appreciated that the voltage converter can convert voltage levels of other voltage supplies as well. Such types of modifications may be made without departing from the scope of the present invention.
FIG. 6
is a block diagram of a computer system
600
including computing circuitry
602
. The computing circuitry
602
contains a memory device
601
that includes a voltage converter according to an embodiment of the present invention. The computing circuitry
602
performs various computing functions, such as executing specific software to perform specific calculations or tasks. In addition, the computer system
600
includes one or more input devices
604
, such as a keyboard or a mouse, coupled to the computer circuitry
602
to allow an operator to interface with the computer system. Typically, the computer system
600
also includes one or more output devices
606
coupled to the computer circuitry
602
, such output devices typically being a printer or a video terminal. One or more data storage devices
608
are also typically coupled to the computer circuitry
602
to store data or retrieve data from external storage media (not shown). Examples of typical storage devices
608
include hard and floppy disks, tape cassettes, and compact disc read-only memories (CD-ROMs). The computer circuitry
602
is typically coupled to the memory device
601
through appropriate address, data, and control busses to provide for writing data to and reading data from the memory device
601
.
From the foregoing it will be appreciated that, although specific embodiments of the invention have been described herein for purposes of illustration, various modifications may be made without deviating from the spirit and scope of the invention. Accordingly, the invention is not limited except as by the appended claims.
Claims
- 1. A voltage converter for converting a first voltage to an output voltage having a lower voltage than the first voltage, the voltage converter, comprising:an input node to which a first voltage is provided; an output node at which an output voltage having a lower voltage than the first voltage is provided; a voltage reduction circuit interposed between the input and output nodes and having a control node to which a control signal is applied, the voltage reduction circuit reducing the voltage of the first voltage according to the voltage of the control signal to provide the output voltage at the output node; and a feedback circuit having first and second inputs coupled to the input and output nodes, respectively, and further having an output coupled to the control node of the voltage reduction circuit, the feedback circuit coupling the input node to the control terminal in response to the voltage of the output voltage decreasing in excess of a voltage difference to compensate for the decrease in the output voltage.
- 2. The voltage converter of claim 1 wherein the voltage reduction circuit comprises a voltage controlled impedance device.
- 3. The voltage converter of claim 1 wherein the voltage reduction circuit comprises a MOS transistor.
- 4. The voltage converter of claim 1, further comprising control signal generator having a supply node coupled to the input node, an output coupled to the control node, and a reference node to which a reference voltage is applied, the control signal generator generating a control signal having a voltage based on the voltage of the reference voltage and the first voltage.
- 5. The voltage converter of claim 1, further comprising a differential amplifier having an output coupled to the control node, a first input coupled to the output of the differential amplifier to receive a reduced voltage output, a second input to which a reference voltage is applied, and a supply node coupled to the input node, the differential amplifier providing an output signal as the control signal for the voltage reduction circuit.
- 6. The voltage converter of claim 1 wherein the feedback circuit comprises a switch coupled between the input node and the control node of the voltage reduction circuit and having a control terminal, the switch coupling the input node to the control node in response to the voltage at its control terminal decreasing in excess of the voltage difference.
- 7. The voltage converter of claim 6 wherein the feedback circuit further a comprises a voltage divider having active load elements coupled between the input node and ground and further having a bias node coupled to the control terminal of the switch and the output node, the voltage divider maintaining a voltage at the control terminal of the switch to isolate the input node and the control node of the voltage reduction circuit until the voltage of the output voltage decreases in excess of the voltage difference.
- 8. The voltage converter of claim 7 wherein the feedback circuit further comprises a capacitor coupled between the output node and the bias node.
- 9. A voltage converter for converting a first voltage to an output voltage having a lower voltage than the first voltage, the voltage converter, comprising:a voltage conversion circuit having an input node to which the first voltage is provided, an output node at which the output voltage is provided, and a control node to which a control signal having a control voltage is provided, the voltage conversion circuit generating an output voltage having a voltage relative to the first voltage based on the voltage of the control signal; and a feedback circuit having a sense node coupled to the output node, a supply node coupled to the input node, and a feedback node coupled to the control node, the feedback circuit generating a feedback signal at the feedback node to compensate for a decrease in the output voltage in response to the voltage of the output voltage falling below a trigger voltage.
- 10. The voltage converter of claim 9 wherein the feedback circuit comprises a switch having a control terminal coupled to the output node, the switch coupling the first voltage of the input node to the control node in response to the voltage of the output voltage falling below the trigger voltage.
- 11. The voltage converter of claim 10 wherein the feedback circuit further comprises a voltage divider circuit coupled to the supply node and ground, the voltage divider circuit having a bias node coupled to the control terminal of the switch and the output node to maintain a bias on the control terminal of the switch to isolate the input node and the control node of the voltage conversion circuit until the voltage of the output voltage falls below the trigger voltage.
- 12. The voltage converter of claim 11 wherein the voltage divider circuit comprises active load elements.
- 13. The voltage converter of claim 9, further comprising a capacitor having a first node coupled to the output node of the voltage conversion circuit and a second node coupled to the sense node of the feedback circuit.
- 14. The voltage converter of claim 9, further comprising a control circuit for generating a control signal for the voltage conversion circuit, the control circuit having a supply terminal coupled to the input node, a first reference voltage terminal to which a reference voltage is applied, an output terminal coupled to the control node of the voltage conversion circuit, and a second reference voltage terminal coupled to the output terminal, the control circuit generating an output signal from the first voltage having a voltage based on the reference voltage and the output signal.
- 15. A voltage converter for converting a first voltage to an output voltage having a lower voltage than the first voltage, the voltage converter, comprising:an input node to which a first voltage is provided; an output node at which an output voltage having a lower voltage than the first voltage is provided; a voltage controlled impedance device interposed between the input and output nodes and having a control node to which a control signal is applied, the voltage controlled impedance device reducing the voltage of the first voltage according to the voltage of the control signal to provide the output voltage at the output node; and a negative feedback circuit capacitively coupled between the control node of the voltage controlled impedance device and the output node to compensate for a decreasing output voltage by decreasing the impedance of the voltage controlled impedance device.
- 16. The voltage converter of claim 15 wherein the negative feedback circuit couples the input node to the control node of the voltage controlled impedance device in response to the voltage of the output voltage decreasing in excess of a voltage difference to compensate for the decreasing output voltage.
- 17. The voltage converter of claim 15 wherein the negative feedback circuit is capacitively coupled to the output node through a capacitor.
- 18. The voltage converter of claim 17 wherein device dimensions of the voltage controlled impedance device and the capacitor are optimized to counteract a Miller capacitance effect of the voltage controlled impedance device.
- 19. The voltage converter of claim 15 wherein the negative feedback circuit is capacitively coupled to the control node of the voltage controlled impedance device through a capacitor.
- 20. The voltage converter of claim 19 wherein device dimensions of the voltage controlled impedance device and the capacitor are optimized to counteract a Miller capacitance effect of the voltage controlled impedance device.
- 21. The voltage converter of claim 15 wherein the negative feedback circuit comprises a switch coupled between the input node and the control node of the voltage controlled impedance device and having a control terminal coupled to the output node, the switch coupling the input node to the control node in response to the voltage at the control terminal of the switch decreasing in excess of a voltage difference.
- 22. The voltage converter of claim 21 wherein the feedback circuit further comprises a voltage divider having active load elements coupled between the input node and ground and further having a bias node coupled to the control terminal of the switch and the output node, the voltage divider maintaining a voltage at the control terminal of the switch to isolate the input node and the control node of the voltage reduction circuit until the voltage of the output voltage decreases in excess of the voltage difference.
- 23. A voltage converter for converting a first voltage to an output voltage having a lower voltage than the first voltage, the voltage converter, comprising:an input node to which a first voltage is provided; an output node at which an output voltage having a lower voltage than the first voltage is provided; a voltage controlled impedance device interposed between the input and output nodes and having a control node to which a control signal is applied, the voltage reduction circuit reducing the voltage of the first voltage according to the voltage of the control signal to provide the output voltage at the output node; and a feedback circuit coupled to the input, output, and control nodes to transfer charge from the input node to the control node of the voltage controlled impedance device on the order of a decrease in charge of the control node.
- 24. The voltage converter of claim 23 wherein the feedback circuit couples the input node to the control node of the voltage controlled impedance device in response to the voltage of the output voltage decreasing in excess of a voltage difference to compensate for a decreasing output voltage.
- 25. The voltage converter of claim 23 wherein the feedback circuit is capacitively coupled to the output node through a capacitor.
- 26. The voltage converter of claim 23 wherein the feedback circuit is capacitively coupled to the control node of the voltage controlled impedance device through a capacitor.
- 27. The voltage converter of claim 23 wherein the feedback circuit comprises a switch coupled between the input node and the control node of the voltage controlled impedance device and having a control terminal coupled to the output node, the switch coupling the input node to the control node in response to the voltage at the control terminal of the switch decreasing in excess of a voltage difference.
- 28. A method for generating an internal voltage from an external voltage, comprising:converting the external voltage to a lower internal voltage through a voltage controlled impedance device; and in response to the internal voltage decreasing in excess of a trigger amount, coupling the external voltage to the voltage controlled impedance device to reduce its impedance.
- 29. The method of claim 28 wherein coupling the external voltage comprises activating a voltage controlled switch having a control terminal coupled to receive the internal voltage.
- 30. The method of claim 28 wherein the voltage controlled impedance device comprises a metal-oxide-semiconductor (MOS) transistor.
- 31. The method of claim 28 wherein coupling the external voltage to the voltage controlled impedance device comprises coupling the external voltage to a control terminal of the voltage controlled impedance device.
- 32. A method for compensating for an internal voltage that is decreasing, the internal voltage generated from a higher external voltage, the method comprising in response to the internal voltage decreasing in excess of a voltage margin, adjusting an amount by which the higher external voltage is reduced in generating the internal voltage.
- 33. The method of claim 32 wherein adjusting the amount by which the higher external voltage is reduced comprises decreasing impedance of a voltage controlled impedance device.
- 34. The method of claim 32 wherein adjusting the amount by which the higher external voltage is reduced comprises coupling the higher external voltage to a control terminal of the voltage controlled impedance device to reduce its impedance.
- 35. The method of claim 32 wherein adjusting the amount by which the higher external voltage is reduced comprises activating a switch to couple the higher external voltage to a control terminal of the voltage controlled impedance device to reduce its impedance.
- 36. A method for generating an internal voltage from an external voltage, comprising:converting the external voltage to a lower internal voltage through a voltage controlled impedance device; and transferring charge from the external voltage on the order of a decrease in charge of the internal voltage to reduce impedance of the voltage controlled impedance device.
- 37. A method for generating an internal voltage from an external voltage, comprising:converting the external voltage to a lower internal voltage through a voltage controlled impedance device; inverting a decrease in the internal voltage to generate an feedback signal; and applying the feedback signal to the voltage controlled impedance device to reduce its impedance.
US Referenced Citations (2)
Number |
Name |
Date |
Kind |
3959713 |
Davis et al. |
May 1976 |
A |
4359609 |
Apfel |
Nov 1982 |
A |