This application claims priority under 35 U.S.C. § 119 to Korean Patent Application No. 10-2022-0069731 filed on Jun. 8, 2022 in the Korean Intellectual Property Office, the subject matter of which is hereby incorporated by reference in its entirety.
Embodiments of the inventive concept relate generally to voltage regulators and electronic devices including same.
A power management integrated circuit (PMIC) may be used in an electronic device to provide one or more voltages (e.g., a power source voltage applied to an application processor, a memory device or an electronic circuit). In this regard, the PMIC may include one or more voltage regulators, wherein a voltage regulator is a circuit configured to provide a constant level voltage. Voltage regulators may be classified as linear regulators or switching regulators in accordance with a constituent voltage regulation scheme. Switching regulators provide good efficiency but poor noise characteristics, whereas linear regulators provide good noise characteristics but poor efficiency. Given their better noise characteristics linear regulators are often preferred to supply a precise, stable voltage.
The low drop-out (LDO) regulator is one type of linear regulator. A LDO regulator may be used to reliably supply power with an electronic device. For example, one or more LDO regulator(s) may be used within a PMIC of a mobile device, such as a smart phone or tablet personal computer (PC).
Most LDO regulators are generally configured to compensate for change in an output voltage in response to a feedback voltage corresponding to the output voltage. Accordingly, because compensation for change in the output voltage is performed using a single loop approach, substantial changes in the output voltage may not be quickly compensated.
Embodiments of the inventive concept provide voltage regulators exhibiting improved performance and reliability. For example, certain embodiments of the inventive concept provide voltage regulators capable to quickly compensating for an abrupt change in output voltage through a fast feedback loop, thereby allowing the output voltage to be stably maintained at a prescribed target voltage through a slow feedback loop. Other embodiments of the inventive concept provide electronic devices including such voltage regulators.
In one embodiment, the inventive concept provides a voltage regulator configured to output an output voltage includes a compensator that compares a first feedback voltage corresponding to the output voltage with a reference voltage to output a comparison voltage; a first current bias connected between a first power source voltage and a first node; a first transistor connected between the first node and the comparison voltage to operate in response to a voltage of a second node; a buffer circuit that buffers a voltage of the first node to output a gate voltage; a pass transistor connected between an input voltage and an output node through which the output voltage is output to operate in response to the gate voltage; a second current bias connected between the first power source voltage and the second node; and a second transistor connected between the second node and the output node to operate in response to the voltage of the second node.
In another embodiment, the inventive concept provides a voltage regulator configured to output an output voltage includes a compensator that compares a first feedback voltage corresponding to the output voltage with a reference voltage to output a comparison voltage; a buffer circuit that buffers an buffer input voltage to generate a gate voltage; a pass transistor that outputs an output voltage through an output node in response to the gate voltage; a fast voltage compensating circuit that controls a second feedback voltage based on a change in the output voltage; and a buffer input control circuit that controls the buffer input voltage based on the second feedback voltage and the comparison voltage, wherein the fast voltage compensating circuit operates as a common gate amplifier for the change in the output voltage, and the buffer input control circuit operates as a common source amplifier for the second feedback voltage and as a common gate amplifier for the first feedback voltage.
In still another embodiment the inventive concept provides an electronic device includes a reference voltage generator that generates a reference voltage; a voltage regulator that generates an output voltage corresponding to the reference voltage based on the reference voltage; and a load circuit that operates based on the output voltage, wherein, when the output voltage is different from a target level, the voltage regulator compensates for a difference between the output voltage and the target level through a fast feedback loop and maintains the output voltage at the target level through a slow feedback loop, a first transistor of the voltage regulator operates as a common gate amplifier in the slow feedback loop, and in the fast feedback loop, the first transistor of the voltage regulator operates as a common source amplifier and a second transistor of the voltage regulator operates as a common gate amplifier.
Advantages, benefits and features, as well as the making and use of the inventive concept will be better understood upon consideration of the following detailed description together with the accompanying drawings, in which:
Throughout the written description and drawings like reference numbers and labels are used to denote like or similar elements, components, features and/or method steps.
Figure (
The voltage generator 11 may be used to generate a reference voltage VREF in response to one or more externally-applied voltage(s) provided from a power source, such as a battery. In some embodiments, the voltage generator 11 may be a band-gap reference circuit configured to generate the reference voltage VREF.
The voltage regulator 100 may be configured to receive the reference voltage VREF from the voltage generator 11 and generate an output voltage VOUT in response to the reference voltage VREF.
The load circuit 12 may be configured to receive the output voltage VOUT from the voltage regulator 100 as a feedback voltage and stabilize the output voltage VOUT in accordance with a target level in response to the feedback voltage in order to stably provide the output voltage VOUT.
In some embodiments, the voltage regulator 100 may be a low dropout (LDO) regulator. For example, the voltage regulator 100 may be configured to detect change in the output voltage VOUT and then operate in such a manner to effectively compensate for the detected change. Thus, for example, even when a load current associated with the load circuit 12 rapidly changes, the output voltage VOUT may nonetheless remain stably provided.
In some embodiments, the voltage regulator 100 may be configure to include two (2) feedback loops (e.g., a fast feedback loop and a slow feedback loop) respectively configured to compensate for change in the output voltage VOUT. In this regard, the fast feedback loop may be a loop used to compensate for abrupt change in the output voltage VOUT (i.e., change in a high-frequency component), and the slow feedback loop may be a feedback loop used to maintain (or control) stabilization of the output voltage VOUT. Accordingly, the voltage regulator 100 may accurately control the output voltage VOUT while also quickly responding to abrupt change in the output voltage VOUT. Various embodiments and configuration options, as well as possible operating approaches related to voltage regulators according to embodiments of the inventive concept will be described hereafter in some additional detail. However, before presenting such embodiments, configuration options and operating approaches, certain background principles associated with voltage regulators will be reviewed in the context of the example illustrated in
The output capacitor is connected between a zeroth (or 0th, or voltage output) node n0 through which the output voltage (vout) is provided and a ground node (e.g., a node connected to ground voltage). The first and second resistors may be connected in series between the zeroth node and the ground node. A feedback voltage (vf) obtained by dividing (or sampling) the output voltage may be obtained at a node between the first and second resistors r1 and r2.
The reference voltage (vref) may be applied to a non-inverting input terminal (+) of the compensator, and the feedback voltage may be applied to an inverting input terminal (−) of the compensator comp. As a result, the compensator may output a first voltage (v1) in response to a difference between the reference voltage and the feedback voltage.
The buffer circuit may receive the first voltage as an output of the compensator, and then amplify the first voltage to provide a second voltage (v2). Here, for example, the buffer circuit may be a unit buffer, and the first voltage and the second voltage may have the same level.
The pass transistor may be connected between a power source voltage (e.g., vdd) and the zeroth node, and may be configured to operate in response to the second voltage. Here, for example, the pass transistor may be an N-type metal-oxide-semiconductor field-effect transistor (NMOSFET), but the working example is not limited thereto.
As described above, the voltage regulator may compensate for change in the output voltage by controlling the pass transistor in accordance with change in the output voltage. For example, when a load current associated with a load circuit receiving the output voltage abruptly increases, the level of the output voltage will decrease. Accordingly, the feedback voltage decreases, and the first voltage and the second voltage increase. Due to the increase in the second voltage, a current flowing through the pass transistor increases, such that the output voltage increases to compensate for the change in the output voltage.
Thus, stabilization of the output voltage through the voltage regulator of
With the comparative example of
In this regard, the compensator 110 may receive the reference voltage VREF and a slow feedback voltage Vsf, and output a comparison voltage Vc in response to (or based on) the reference voltage VREF and the slow feedback voltage Vsf. In some embodiments, the slow feedback voltage Vsf may indicate a voltage level directly corresponding to the output voltage VOUT. For example, the slow feedback voltage Vsf may indicate a level of the output voltage VOUT. Alternately, the slow feedback voltage Vsf may indicate a voltage obtained by dividing the output voltage VOUT at a predetermined ratio or a sampled voltage.
The buffer input control circuit 120 may generate a buffer input voltage Vpm in response to the comparison voltage Vc. For example, an increase in the comparison voltage Vc indicates that the slow feedback voltage Vsf has fallen below the reference voltage VREF. In this case the buffer input control circuit 120 may increase the buffer input voltage Vpm. A decrease of the comparison voltage Vc indicates that the slow feedback voltage Vsf has risen above the reference voltage VREF. In this case the buffer input control circuit 120 may decrease the buffer input voltage Vpm.
The buffer circuit 130 may receive the buffer input voltage Vpm generated from the buffer input control circuit 120, amplify (or buffer) the received buffer input voltage Vpm, and generate a gate voltage Vg. In some embodiments, the buffer circuit 130 may be a unit buffer.
The pass transistor 140 may output the output voltage VOUT in response to the gate voltage Vg output from the buffer circuit 130. In some embodiments, the pass transistor 140 may have a source-follower amplifier structure.
The fast voltage compensating circuit 150 may generate a fast feedback voltage Vff in response to change in the output voltage VOUT. In some embodiments, the fast voltage compensating circuit 150 may have a common-gate amplifier structure.
In some embodiments, the buffer input control circuit 120 may be further configured to control the buffer input voltage Vpm in response to the fast feedback voltage Vff generated from the fast voltage compensating circuit 150. That is, through the fast feedback voltage Vff generated from the fast voltage compensating circuit 150, it is possible to rapidly compensate for abrupt change in the output voltage VOUT. Additionally however, with reference to the limitations associated with the comparative example of
Further in this regard, the damping control circuit 160 may provide a stabilization voltage Vq to the buffer input control circuit 120. Accordingly, the buffer input control circuit 120 may be used to control the buffer input voltage Vpm in response to the stabilization voltage Vq. In this case, alternating current (or AC) characteristics of the buffer input voltage Vpm may be improved. For example, peaking of a high frequency band may occur at a node from which the buffer input voltage Vpm is output due to various factors. The damping control circuit 160 may prevent peaking in a high frequency band by providing the stabilization voltage Vq to a node from which the buffer input voltage Vpm is output.
Referring to
The compensator 110 may receive the reference voltage VREF through the non-inverting input terminal (+) and the slow (or first) feedback voltage Vsf through the inverting input terminal (−). In some embodiments, the slow feedback voltage Vsf may refer to a voltage apparent at the zeroth node (n0) from which the output voltage VOUT is provided. In some embodiments, the slow feedback voltage Vsf may be a voltage obtained by sampling the voltage apparent at the zeroth node n0 from which the output voltage VOUT is provided. Alternately, the slow feedback voltage Vsf may be a voltage indicative of the voltage apparent at the zeroth node n0, as divided by a specific ratio.
The compensator 110 may compare the reference voltage VREF with the slow feedback voltage Vsf in order to generate the comparison voltage Vc. In some embodiments, the output voltage VOUT may be lower than the target level, and the slow feedback voltage Vsf may be lower than the reference voltage VREF. Accordingly, the comparison voltage Vc may be relatively high. Alternately, the output voltage VOUT may be higher than the target level, and the slow feedback voltage Vsf may be higher than the reference voltage VREF. Accordingly, the comparison voltage Vc may be relatively low.
The fast voltage compensating circuit 150 may include a second current bias IB2, the second transistor MN2, and a resistor Rd. The second current bias IB2 may be connected between the power source voltage VDD and a second node n2. The second transistor MN2 may be connected between the second node n2 and the zeroth node n0 (or output voltage node) and operate in response to a voltage apparent at the second node n2. That is, the second transistor may be diode-connected between the second node n2 and the zeroth node n0 (e.g., output voltage node). For example, the drain terminal of the second transistor MN2 may be connected to the second node n2, the source terminal may be connected to the zeroth node n0, and the gate terminal may be connected to the second node n2. In some embodiments, a fast (or second) feedback voltage Vff may be output through the second node n2. The resistor Rd may be connected between the zeroth node n0 and ground voltage.
The damping control circuit 160 may include a resistor Rq and a capacitor Cq. The resistor Rq and the capacitor Cq may be connected in series between a first (1st) node n1 and ground voltage. In some embodiments, the stabilization voltage Vq may be provided to the first node n1 by the resistor Rq and the capacitor Cq. The stabilization voltage Vq may be used to prevent peaking due to a complex pole in the frequency band of the voltage of the first node n1 (i.e., the buffer input voltage Vpm).
The buffer input control circuit 120 may include a first current bias IB1 and the first transistor MN1. The first current bias IB1 may be connected between the power source voltage VDD and the first node n1. The first transistor MN1 may be connected between the first node n1 and the output terminal (i.e., the comparison voltage Vc) of the compensator 110, and may operate in response to the fast feedback voltage Vff. For example, the drain terminal of the first transistor MN1 may be connected to the first node n1, the source terminal may be connected to the output terminal (i.e., Vc) of the compensator 110, and the gate terminal may be connected to the fast feedback voltage Vff.
In some embodiments, the buffer input voltage Vpm may be controlled or output by the buffer input control circuit 120 through the first node n1. For example, when the comparison voltage Vc or the fast feedback voltage Vff changes, the voltage of the first node n1 by the first transistor MN1 of the buffer input control circuit 120, that is, the buffer input voltage Vpm may be controlled. A control operation or an operation principle for the buffer input voltage Vpm will be described in some additional detail hereafter.
The buffer circuit 130 may receive the voltage apparent at the first node n1 (i.e., the buffer input voltage Vpm), and variably adjust (or buffer) the buffer input voltage Vpm in order to generate the gate voltage Vg.
The pass transistor 140 may include the third transistor MN3. The third transistor MN3 may be connected between an input voltage VSUP and the zeroth node n0 and operate in response to the gate voltage Vg. For example, the drain terminal of the third transistor MN3 may be connected to the input voltage VSUP, the source terminal may be connected to the zeroth node n0, and the gate terminal may be connected to the gate voltage Vg.
In some embodiments, the voltage regulator 100 may further include an output capacitor C0 connected between the zeroth node n0 and ground voltage. In some embodiments, as will be described hereafter, the voltage regulator 100 of
As noted above, the voltage regulator 100 may control the buffer input voltage Vpm using the slow feedback voltage Vsf or the fast feedback voltage Vff, thereby quickly stabilizing the output voltage VOUT. Certain operating schemes associated with the voltage regulators according to embodiments of the inventive concept will be described hereafter in some additional detail.
Referring to
For example, when the output voltage VOUT is at a target level (i.e., when the output voltage VOUT is in a stable state), various voltages (e.g., Vsf, Vff, Vq, Vpm, and Vg) may be maintained at constant levels. In this case, the load current used in the load circuit 12 may rapidly increase. In this case, the level of the output voltage VOUT connected to the load circuit 12 decrease, and accordingly, the voltage apparent at zeroth node n0 may decrease.
When the voltage of the zeroth node n0 decreases, the voltage of the second node n2 decreases. For example, the fast voltage compensating circuit 150 may have a common gate amplifier structure responsive to change in a voltage apparent at the zeroth node n0. In this case, when the voltage of the zeroth node n0 (i.e., the source voltage of the second transistor MN2) decreases, the voltage of the second node n2 (i.e., the drain voltage of the second transistor MN2) decreases. Accordingly, the fast feedback voltage Vff generated through the second node n2 may be relatively low.
As the fast feedback voltage Vff decreases, the voltage apparent at the first node n1 may increase by the buffer input control circuit 120. For example, the first transistor MN1 of the buffer input control circuit 120 may have a common source amplifier structure responsive to change in the fast feedback voltage Vff. In this case, when the gate voltage (i.e., the fast feedback voltage Vff) of the first transistor MN1 decreases, the drain voltage (i.e., the voltage of the first node n1) of the first transistor MN1 increases.
When the voltage of the first node n1 increases, the buffer input voltage Vpm increases. As the buffer input voltage Vpm increases, the gate voltage Vg output from the buffer circuit 130 increases. As the gate voltage Vg increases, the voltage of the zeroth node n0 increases. For example, in response to change in the gate voltage Vg, which is the pass transistor 140, the third transistor MN3 may operate as a source follower. In this case, as the gate voltage (i.e., Vg) of the third transistor MN3 increases, the source voltage (i.e., the voltage apparent at the zeroth node n0) of the third transistor MN3 increases.
As noted above, when the output voltage VOUT decreases, the fast feedback voltage Vff is relatively reduced by the fast voltage compensating circuit 150, and due to the relatively low fast feedback voltage Vff, the buffer input voltage Vpm may relatively increase. As the buffer input voltage Vpm increases, the gate voltage Vg may increase, and the voltage apparent at the zeroth node n0 may increase due to the increased gate voltage Vg. Accordingly, it is possible to quickly compensate for the decrease in the output voltage VOUT by increasing the voltage apparent at the zeroth node n0.
In some embodiments, the resistor Rd included in the fast voltage compensating circuit 150 may be used for standby operation of the fast voltage compensating circuit 150. For example, the resistor Rd included in the fast voltage compensating circuit 150 may be set to a size capable of discharging currents generated from the first current bias IB1 of the buffer input control circuit 120 and the second current bias IB2 included in the fast voltage compensating circuit 150.
A stabilization operation for the output voltage VOUT through the slow feedback loop SL will now be described with reference to
As the voltage of the zeroth node n0 decreases, the slow feedback voltage Vsf, which is a voltage obtained by sampling or dividing the voltage of the zeroth node n0, may decrease. The slow feedback voltage Vsf may be lower than the reference voltage VREF. In this case, the comparison voltage Vc output from the compensator 110 may relatively increase.
As the comparison voltage Vc increases, the voltage of the first node n1 may increase by the buffer input control circuit 120. For example, in response to change in the comparison voltage Vc, the buffer input control circuit 120 may operate as a common gate amplifier. In this case, the comparison voltage Vc may be provided to the source terminal of the first transistor MN1 of the buffer input control circuit 120. Accordingly, when the comparison voltage Vc increases, the voltage of the first node n1—that is the drain terminal of the first transistor MN1 may increase.
As the voltage of the first node n1 increases, the buffer input voltage Vpm may increase. As the buffer input voltage Vpm increases, the gate voltage Vg output from the buffer circuit 130 may increase. As the gate voltage Vg increases, the voltage of the zeroth node n0 may increase by the third transistor MN3 which serves as the pass transistor 140. As the voltage of the zeroth node n0 increases, a decrease in the output voltage VOUT may be compensated, and the output voltage VOUT may be maintained at a target level.
As described above, when the output voltage VOUT decreases, the comparison voltage Vc is relatively increased by the compensator 110, and by the relatively increased comparison voltage Vc, the buffer input voltage Vpm may be relatively increased. As the buffer input voltage Vpm increases, the gate voltage Vg may increase, and the voltage of the zeroth node n0 may increase due to the increased gate voltage Vg. It is possible to compensate for decrease in the output voltage VOUT by an increase in the voltage of the zeroth node n0, thereby maintaining the output voltage VOUT at a target level.
Although the fast compensation operation for the output voltage VOUT through the fast feedback loop FL, and the stabilization operation for the output voltage VOUT through the slow feedback loop SL have been individually described in relation to
For convenience of description, certain embodiments in which a load current associated with the load circuit 12 increases have been described in relation to
In some embodiments, the voltage regulator 100 may be configured to control the buffer input voltage Vpm input to the buffer circuit 130 through the fast feedback loop FL. In this case, it is possible to provide a faster response characteristics in relation to an abrupt change in the output voltage VOUT. For example, the buffer circuit 130 may be a unity buffer that may be modeled as a current bias and a PMOS transistor. In this case, the output impedance (i.e., the impedance at the terminal from which the gate voltage Vg is output) of the buffer circuit 130 may be relatively larger than the input impedance (i.e., the impedance at the terminal to which the buffer input voltage Vpm is input). That is, when the output terminal (i.e., the gate voltage Vg) of the buffer circuit 130 is directly controlled, accurate control and driving may be difficult due to a relatively large output impedance. Alternately, because the voltage regulator 100 controls the buffer input voltage Vpm, which is the input of the buffer circuit 130, through the fast feedback loop FL, it may be relatively easy to control and drive.
Referring to
In contrast, an actual decrease in the output voltage by the voltage regulator of
Referring to
Of note in this regard, the fast voltage compensating circuit 150 described in relation to
In contrast, the fast voltage compensating circuit 150-1 of
Referring to
However, the voltage regulator 100-2 of
The first slow feedback voltage Vsf1 may be provided through a node between the first and second resistors R1 and R2. That is, the first slow feedback voltage Vsf1 may have a size in which the output voltage VOUT is divided by the resistance values of the first and second resistors R1 and R2. In this case, even when the reference voltage VREF is a fixed value, the level or target level of the output voltage VOUT may be controlled by adjusting the resistance values of the resistors R1 and R2 included in the voltage divider circuit 170.
Referring to
However, the voltage regulator 100-3 may replace the fast voltage compensating circuit 150 of
Referring to
However, the voltage regulator 100-4 of
In some embodiments, the voltage converter 180 may be a switching regulator configured to convert the first power source voltage VDD1 to the second power source voltage VDD2. In some embodiments, the voltage converter 180 may be one of various voltage conversion circuits such as a buck converter, a boost converter, a buck-boost converter, a charge pump, and the like.
As shown in
Referring to
However, the voltage regulator 100-5 may replace the fast voltage compensating circuit 150 of
As described above, the voltage regulator 100 of
In some embodiments, the first transistor MN1 of the buffer input control circuit 120 and the second transistor MN2 of the fast voltage compensating circuit 150 may have the same physical characteristics. For example, the first transistor MN1 and the second transistor MN2 may be designed to have the same ratio of the channel width to the channel length (i.e., W/L ratio). Alternately however, the first transistor MN1 and the second transistor MN2 may be designed to have different ratios (i.e., W/L ratio) of channel length to channel width. When the ratio (i.e., W/L ratio) of the channel width to the channel length of the first transistor MN1 is different from that of the second transistor MN2, the range of the output voltage VOUT controllable by the voltage regulator 100 may vary.
In some embodiments, the first current bias IB1 of the buffer input control circuit 120 and the second current bias IB2 of the fast voltage compensating circuit 150 may be configured to flow constant currents having about the same magnitude. Alternately however, the first current bias IB1 of the buffer input control circuit 120 and the second current bias IB2 of the fast voltage compensating circuit 150 may be configured to flow constant currents having different magnitudes. In this case, the range of the output voltage VOUT controllable by the voltage regulator 100 may vary.
Referring to
The PMIC 1100 may be configured to receive an external power signal PWR and generate the plurality of output voltages (e.g., VOUT1, VOUT2 and VOUT3) in response to the external power signal PWR. In the illustrated example of
Of particular note, one or more of the first, second and third voltage regulators 1110, 1120 and 1130 may include at least one voltage regulator implemented and operated in accordance with embodiments of the inventive concept (e.g., voltage regulators 100, 100-1, 100-2, 100-3, 100-4 and 100-5).
The plurality of component devices 1210 to 1240 may include an electronic circuit or a logic circuit configured to support various operations of the electronic device 1000, or a memory circuit. The plurality of component devices 1210 to 1240 may receive power from the PMIC 1100 and operate in accordance with the received power. For example, the first component device 1210 may receive the first output voltage VOUT1 from the PMIC 1100 and operate in response to the first output voltage VOUT1. Each of the second and third component devices 1220 and 1230 may receive the second output voltage VOUT2 from the PMIC 1100 and operate in response to the second output voltage VOUT2. And the fourth component device 1240 may receive the third output voltage VOUT3 from the PMIC 1100 and operate in response to the third output voltage VOUT3.
In some embodiments, the various output voltages (e.g., VOUT1, VOUT2 and VOUT3) may have different levels. Accordingly, the voltage regulators (e.g., 1110, 1120 and 1130) may generate respective output voltages in response to different reference voltages. Alternately, the voltage regulators may generate the output voltages in response to different voltage dividing ratios (e.g., as controlled by the voltage divider circuit 170 of
Referring to
Here, the PMIC 2100 may generate multiple reference voltages (e.g., VREF1, VREF2 and VREF3) from an externally provided power signal PWR. For example, the PMIC 2100 may generate the reference voltages using a reference voltage generator.
Each of the plurality of component devices 2210 to 2240 may receive (and operate in response to) at least one of the reference voltages provided by the PMIC 2100. In this regard, each of the plurality of component devices 2210 to 2240 may include at least one voltage regulator consistent with embodiments of the inventive concept. Thus, a first voltage regulator associated with the first component device 2210 may generate a first operating voltage in response to the first reference voltage VREF1; a second voltage regulator associated with the second component device 2220 may generate a second operating voltage in response to the second reference voltage VREF2; a third voltage regulator associated with the third component device 2230 may generate a third operating voltage in response to the second reference voltage VREF2; and a fourth voltage regulator associated with the fourth component device 2240 may generate a fourth operating voltage in response to the third reference voltage VREF3.
Here, two or more of the operating voltages generated in relation to one or more of the reference voltages may be the same. For example, the second and third operating voltages generated from voltage regulators respectively associated with of the second and third component devices 2220 and 2230 may be the same. Alternately, operating voltages generated using the same reference voltage may have different levels. For example, the second and third operating voltages generated by voltage regulators respectively associated with the second and third component devices 2220 and 2230 may be different.
Referring to
In some embodiments, the system 3000 may include a main processor 3100, memories (e.g., 3200a and 3200b), and storage devices (e.g., 3300a and 3300b). In addition, the system 3000 may include at least one of an image capturing device 3410, a user input device 3420, a sensor 3430, a communication device 3440, a display 3450, a speaker 3460, a power supplying device 3470, and a connecting interface 3480.
The main processor 3100 may control all operations of the system 3000, more specifically, operations of other components included in the system 3000. The main processor 3100 may be implemented as a general-purpose processor, a dedicated processor, or an application processor.
The main processor 3100 may include at least one CPU core 3110 and further include a controller 3120 configured to control the memories 3200a and 3200b and/or the storage devices 3300a and 3300b. In some embodiments, the main processor 3100 may further include an accelerator 3130, which is a dedicated circuit for a high-speed data operation, such as an artificial intelligence (AI) data operation. The accelerator 3130 may include a graphics processing unit (GPU), a neural processing unit (NPU) and/or a data processing unit (DPU) and be implemented as a chip that is physically separate from the other components of the main processor 3100.
The memories 3200a and 3200b may be used as main memory devices of the system 3000. Although each of the memories 3200a and 3200b may include a volatile memory, such as static random access memory (SRAM) and/or dynamic RAM (DRAM), each of the memories 3200a and 3200b may include non-volatile memory, such as a flash memory, phase-change RAM (PRAM) and/or resistive RAM (RRAM). The memories 3200a and 3200b may be implemented in the same package as the main processor 3100.
The storage devices 3300a and 3300b may serve as non-volatile storage devices configured to store data regardless of whether power is supplied thereto, and have larger storage capacity than the memories 3200a and 3200b. The storage devices 3300a and 3300b may respectively include storage controllers (STRG CTRL) 3310a and 3310b and NVM (Non-Volatile Memory)s 3320a and 3320b configured to store data via the control of the storage controllers 3310a and 3310b. Although the NVMs 3320a and 3320b may include flash memories having a two-dimensional (2D) structure or a three-dimensional (3D) V-NAND structure, the NVMs 3320a and 3320b may include other types of NVMs, such as PRAM and/or RRAM.
The storage devices 3300a and 3300b may be physically separated from the main processor 3100 and included in the system 3000 or implemented in the same package as the main processor 3100. In addition, the storage devices 3300a and 3300b may have types of solid-state devices (SSDs) or memory cards and be removably combined with other components of the system 300 through an interface, such as the connecting interface 3480 that will be described below. The storage devices 3300a and 3300b may be devices to which a standard protocol, such as for example, a universal flash storage (UFS), an embedded multi-media card (eMMC), and/or a non-volatile memory express (NVMe), are applied.
The image capturing device 3410 may capture still images or moving images. The image capturing device 3410 may include a camera, a camcorder, and/or a webcam.
The user input device 3420 may receive various types of data input by a user of the system 3000 and include a touch pad, a keypad, a keyboard, a mouse, and/or a microphone.
The sensor 3430 may detect various types of physical quantities, which may be obtained from the outside of the system 3000, and convert the detected physical quantities into electric signals. The sensor 3430 may include a temperature sensor, a pressure sensor, an illuminance sensor, a position sensor, an acceleration sensor, a biosensor, and/or a gyroscope sensor.
The communication device 3440 may transmit and receive signals between other devices outside the system 3000 according to various communication protocols. The communication device 3440 may include an antenna, a transceiver, and/or a modem.
The display 3450 and the speaker 3460 may serve as output devices configured to respectively output visual information and auditory information to the user of the system 3000.
The power supplying device 3470 may appropriately convert power supplied from a battery (not shown) embedded in the system 3000 and/or an external power source, and supply the converted power to each of components of the system 3000.
The connecting interface 3480 may provide connection between the system 3000 and an external device, which is connected to the system 3000 and capable of transmitting and receiving data to and from the system 3000. The connecting interface 3480 may be implemented using various interface schemes, such as advanced technology attachment (ATA), serial ATA (SATA), external SATA (e-SATA), small computer small interface (SCSI), serial attached SCSI (SAS), peripheral component interconnection (PCI), PCI express (PCIe), NVMe, IEEE 1394, a universal serial bus (USB) interface, a secure digital (SD) card interface, a multi-media card (MMC) interface, an eMMC interface, a UFS interface, an embedded UFS (eUFS) interface, and a compact flash (CF) card interface.
In some embodiments, the power supply device 3470, for example, may include at least one voltage regulator (or a PMIC including at least one voltage regulator) consistent with embodiments of the inventive concept. Thus, the power supply device 3470 may be configured to provide various power voltages to various components included in the electronic device 3000 using the at least one voltage regulator (or PMIC). Additionally or alternately, various other components included in the electronic device 3000 may include at least one voltage regulator consistent with embodiments of the inventive concept.
While the inventive concept has been described with reference to certain embodiments thereof, those skilled in the art will appreciate that various changes and modifications may be made thereto without departing from the scope of the inventive concept as set forth in the following claims.
Number | Date | Country | Kind |
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10-2022-0069731 | Jun 2022 | KR | national |