Voltage regulator

Information

  • Patent Grant
  • 6828763
  • Patent Number
    6,828,763
  • Date Filed
    Thursday, July 24, 2003
    22 years ago
  • Date Issued
    Tuesday, December 7, 2004
    21 years ago
Abstract
A voltage regulator comprises a differential amplifier for comparing an output of a reference voltage circuit with an output of a voltage dividing circuit and outputting a first signal and a phase compensating circuit having a resistor and a capacitor connected in series. A MOS transistor is connected between a power supply and the phase compensating circuit and has a gate electrode connected to receive the output of the differential amplifier and a grounded source. A constant current circuit is connected between the MOS transistor and ground, and an output transistor having a gate electrode connected to receive a second signal output from a connection point between the MOS transistor and the phase compensating circuit is connected between the power supply and the voltage dividing circuit. A resistor side of the phase compensating circuit is connected to an output terminal of the differential amplifier and a capacitor side of the phase compensating circuit is connected to a drain electrode of the MOS transistor.
Description




BACKGROUND OF THE INVENTION




1. Field of the Invention




The present invention relates a voltage regulator (hereinafter referred to as a V/R) capable of achieving an improvement in response property of the V/R and of stably operating with a small output capacitance.




2. Description of the Related Art




According to the conventional V/R, as described in JP 04-195613 A, the V/R is composed of an error amplifier with a single stage voltage amplification. In other words, the conventional V/R has a circuit as shown in FIG.


5


. The V/R is composed of: an error amplifier


13


for amplifying a differential voltage between a reference voltage of a reference voltage circuit


10


and a voltage at a connection point of bleeder resistors


11


and


12


that divides an output voltage Vout of the V/R; and an output transistor


14


. When an output voltage of the error amplifier


13


is given by Verr, an output voltage of the reference voltage circuit


10


is given by Vref, and the voltage at the connection point of bleeder resistors


11


and


12


is given by Va, if Vref>Va is established, Verr becomes lower. On the other hand, if Vref≦Va is established, Verr becomes higher.




If Verr becomes lower, because the output transistor


14


is a P-ch MOS transistor in this case, a voltage between the gate and the source becomes larger and an ON resistance becomes smaller, with the result that the V/R functions to rise the output voltage Vout. On the other hand, if Verr becomes higher, the V/R functions to increase the ON resistance of the output transistor


14


and to reduce the output voltage, thereby keeping the output voltage Vout at a fixed value.




In the case of the conventional V/R, because the error amplifier


13


is a single stage voltage amplifying circuit, a two-stage voltage amplification structure is obtained by using such a circuit and a voltage amplification stage which is composed of the output transistor


14


and a load


25


. A phase compensating capacitor


15


is connected between the output of the error amplifier


13


and the drain of the output transistor


14


. A frequency band of the error amplifier


13


is narrowed by a mirror effect, thereby preventing oscillation of the V/R. Consequently, since the frequency band of the entire V/R becomes narrower, the response property of the V/R is deteriorated.




In general, when the response property of the V/R is improved, it is necessary to widen the frequency band of the entire V/R. However, when the frequency band of the entire V/R is widened, it is necessary to increase a consumption current of the voltage amplifying circuit. In particular, when the V/R is used for a battery of a portable device or the like, its operating time becomes shorter.




Also, when a three-stage voltage amplification is used, even if a consumption current is relatively small, the frequency band of the V/R can be widened. However, because a phase is easily delayed by 180 degrees or more, the operation of the V/R becomes unstable, causing oscillation thereof in the worst case. Therefore, in the case of the three-stage voltage amplification, it is required to return the phase at a zero point resulting from the load and an ESR (equivalent series resistance) of the capacitor. Note that, when the ESR is very small as in a ceramic capacitor, in order to reduce a frequency at the zero point, it is necessary to increase a capacitance value of the ceramic capacitor.




In the conventional V/R, in order to ensure the stability against oscillation, it is required to narrow the frequency band. Accordingly, there is a problem in that the response property is deteriorated. In addition, when the response property is improved, the consumption current is increased and the stability is deteriorated, so that a large capacitance is required for the output of the V/R.




SUMMARY OF THE INVENTION




Therefore, in order to solve the above-mentioned conventional problems, an object of the present invention is to obtain a V/R which has a preferable response property with a small consumption current and is stably operated with a small output capacitance.




A voltage regulator according to the present invention includes: a reference voltage circuit connected between a power supply and a ground; voltage dividing circuit for dividing an output voltage supplied to an external load, which is composed of a bleeder resistor; and a differential amplifier for comparing an output of the reference voltage circuit with an output of the voltage dividing circuit and outputting a first signal. The voltage regulator further includes: a phase compensating circuit in which a resistor and a capacitor are connected in series; a MOS transistor in which an output of the differential amplifier is inputted to a gate electrode, which is connected between the power supply and the phase compensating circuit, and in which a source is grounded; a constant current circuit connected between the MOS transistor and the ground; and an output transistor in which a second signal from a connection point between the MOS transistor and the phase compensating circuit is inputted to a gate electrode and which is connected between the power supply and the voltage dividing circuit. Further, a resistor side of the phase compensating circuit is connected with an output terminal of the differential amplifier and a capacitor side of the phase compensating circuit is connected with a drain electrode of the MOS transistor. In addition, the output voltage is outputted from a connection point between the output transistor and the voltage dividing circuit.




The voltage regulator according to the present invention is characterized in that a value of the capacitor is equal to or larger than a gate capacitance value of the output transistor.




The voltage regulator according to the present invention is characterized in that a value of the resistor is equal to or larger than 20 kΩ and the value of the capacitor is equal to or larger than 10 pF.











BRIEF DESCRIPTION OF THE DRAWINGS




In the accompanying drawings:





FIG. 1

is an explanatory diagram of a V/R circuit of an embodiment of the present invention;





FIG. 2

shows gain-frequency characteristics of a differential amplifying circuit of the present invention;





FIG. 3

shows the gain-frequency characteristics of the differential amplifying circuit to which phase compensation is not suitable;





FIG. 4

is an explanatory view of a sectional structure of a capacitor; and





FIG. 5

is an explanatory diagram of a conventional V/R circuit.











DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENT(S)




A two-stage voltage amplification is used as an error amplifier of a V/R. A resistor and a capacitor which are used for phase compensation are inserted between a first output stage and a second output stage, and a zero point resulting from the resistor and the capacitor is generated at a low frequency, so that the V/R has a preferable response property and is stably operated even with a small output capacitance.




Embodiment




Hereinafter, an embodiment of the present invention will be described with reference to the drawings.

FIG. 1

is a V/R circuit diagram showing an embodiment of the present invention. A reference voltage circuit


10


, bleeder resistors


11


and


12


, an output transistor


14


, and a load


25


are the same as in the conventional case.




A differential amplifying circuit


20


is a single stage voltage amplifying circuit and the output terminal thereof is connected with the gate of a MOS transistor


23


composing a common source amplifying circuit and a resistor side as one terminal of a phase compensating circuit which is composed of a resistor


21


and a capacitor


22


. The transistor


23


is constant current-driven by a constant current circuit


24


. An output terminal of the common source amplifying circuit is connected with the other terminal of the phase compensating circuit and the gate of the output transistor


14


.




In other words, an error amplifying circuit includes: a two-stage voltage amplifying circuit which has the differential amplifying circuit


20


and the common source amplifying circuit composed of the transistor


23


; and the phase compensating circuit which is composed of the resistor


21


and the capacitor


22


. The output of the error amplifying circuit is amplified by a common source amplifying circuit which is composed of the output transistor


14


and the load


25


. Therefore, the V/R becomes a three-stage voltage amplifying circuit.




Because the V/R is formed as the three-stage voltage amplifying circuit, a GB product can be increased even in a low consumption current and response property of the V/R can be improved. However, in the case of the three-stage voltage amplifying circuit, a phase is easily delayed by 180 degrees or more, which readily causes oscillation.




Therefore, in order to prevent the oscillation, the phase is returned at the zero point resulting from the resistor


21


and the capacitor


22


.





FIG. 2

shows an example of frequency characteristics of a voltage gain of the differential amplifying circuit


20


in the circuit shown in FIG.


1


. In

FIG. 2

, the logarithm of a frequency is taken along the abscissa and the decibel of the voltage gain is taken along the ordinate. A first pole is present at a minimum frequency. Hereinafter, the pole is referred to as a 1st pole and its frequency is given by Fp


1


.




From the frequency Fp


1


, the voltage gain is attenuated at −6 dB/oct and a phase begins to delay by 90 degrees. A first zero point is present at a frequency increased from the frequency Fp


1


. Hereinafter, the point is referred to as a 1st zero point and its frequency is given by Fz


1


.




From the frequency Fz


1


, the voltage gain becomes constant with respect to a frequency. Because the phase leads by 90 degrees by the zero point, the phase delay becomes zero again. A second zero point is present at a frequency increased from the frequency Fz


1


. Hereinafter, this is referred to as a 2nd zero point and its frequency is given by Fz


2


.




From the frequency Fz


2


, the voltage gain is increased at +6 dB/oct with respect to a frequency. Because the phase leads by 90 degrees by the zero point, the phase begins to lead by 90 degrees. Second and third poles are present in frequencies increased from the frequency Fz


2


, Hereinafter, the poles are referred to as a 2nd pole and a 3rd pole and their frequencies are given by Fp


2


and Fp


3


.




From the frequency Fp


2


, the voltage gain becomes constant with respect to a frequency. Because the phase is delayed by 90 degrees by the poles, a phase leading becomes zero.




Further, from the frequency Fp


3


, the voltage gain is attenuated at −6 dB/oct with respect to a frequency and the phase begins to delay by 90 degrees.




In

FIG. 2

, an expression (1) is established with respect to a relationship of the respective frequencies.






Fp


1


<Fz


1


<Fz


2


<Fp


2


<Fp


3


  (1)






In other words, the frequency Fz


1


of the 1st zero point and the frequency Fz


2


of the 2nd zero point, which are lower than the frequency Fp


2


of the 2nd pole, are present. Therefore, the phase delay is cancelled in a range of the frequency Fz


1


to the frequency Fz


2


and the phase leads by 90 degrees in maximum in the range of the frequency Fz


1


to the frequency Fz


2


. Further, the phase delay and phase leading are not caused in a range of the frequency Fz


2


to the frequency Fp


2


. From a frequency Fp


3


, the phase begins to delay by 90 degrees.




Thus, when the frequency characteristics of the differential amplifying circuit is set as described above, the phase delay is not caused in the range of the frequency Fz


1


to the frequency Fp


3


, thereby the phase preferably leads. Thus, the stability of the entire V/R can be improved.




In the common source amplifying circuit composed of the transistor


23


as shown in

FIG. 1

, a pole is present at a frequency determined according to a node capacitance of the drain of the transistor


23


and an output resistance of the transistor


23


. Its frequency is given by Fp


2


nd. In addition, in the common source amplifying circuit which is composed of the output transistor


14


and the load


25


as shown in

FIG. 1

, a pole is present at a frequency determined according to a resistance and a capacitance of the load


25


. Its frequency is given by Fp


3


rd.




In both amplifying circuits, with respect to the frequencies of Fp


2


nd and Fp


3


rd, the voltage gain begins to attenuate at −6 dB/oct with respect to a frequency and the phase begins to delay by 90 degrees. Because the two poles are present, the phase is delayed by 180 degrees in total. When both Fp


2


nd and Fp


3


rd are lower than Fp


2


, the phase is returned by the 2nd zero point at the frequency Fz


2


. Therefore, when the voltage gain of the entire V/R becomes 0 at a frequency higher than the frequency Fp


2


, a phase margin is produced without fail, so that the V/R can be stably operated without causing oscillation.




If the frequency Fp


2


of the 2nd pole is lower than the frequency Fz


2


of the 2nd zero point as shown in

FIG. 3

in the frequency characteristics of the voltage gain of the differential amplifying circuit, the phase is delayed by 90 degrees in maximum in a range of the frequency Fp


2


to the frequency Fz


2


, Therefore, because the phase is delayed by 180 degrees by Fp


2


nd and Fp


3


rd which are described above, the phase is delayed by 180 degrees or more in the entire V/R, and the V/R is not stably operated.




Next, the resistor


21


and the capacitor


22


which compose the phase compensating circuit shown in

FIG. 1

will be described.

FIG. 4

is a sectional view when a capacitor is formed in an integrated circuit.

FIG. 4

shows an example in which the capacitor is formed on a P-type substrate. An impurity diffusion layer


53


of an N-type opposite to a P-type is formed in a P-type substrate


54


and a thin oxide film


52


is formed thereon. An electrode


50


is formed on the oxide film


52


and an electrode


51


is formed on the N-type impurity diffusion layer


53


, so that a capacitor using the oxide film


52


is formed between the electrodes


50


and


51


. In the case of the P-type substrate, because a potential of the P-type substrate is generally connected with a minimum potential of the integrated circuit, the N-type impurity diffusion layer


53


is always insulated from the P-type substrate


54


. Here, a PN junction capacitor is present between the N-type impurity diffusion layer


53


and the P-type substrate


54


. Accordingly, a parasitic capacitor is connected with the electrode


51


on the N-type impurity diffusion layer, which is produced between the electrode


51


and the P-type substrate. A value of the parasitic capacitor generally becomes about 1% to 20% of a value of the capacitor using the oxide film


52


.




If the connection between the resistance


21


and the capacitor


22


which compose the phase compensating circuit shown in

FIG. 1

is made reverse to connect the capacitor


22


with the differential amplifying circuit side, a new pole is generated by a parasitic capacitor of the capacitor


22


in the frequency characteristics of the voltage gain of the differential amplifying circuit


20


. The V/R is not stably operated.




Therefore, with respect to the connection between the resistance


21


and the capacitor


22


which compose the phase compensating circuit, the resistor


21


is necessarily connected with the output terminal of the differential amplifying circuit. In addition, the electrode connected with the parasitic capacitor of the capacitor


22


which is produced between the capacitor


22


and the substrate is connected with the drain of the transistor


23


. According to such connection, the phase compensating circuit can minimize the influence of the parasitic capacitor of the capacitor


22


. Because the drain of the transistor


23


is connected with the gate of the output transistor


14


, the influence of the parasitic capacitor of the capacitor


22


is smaller than that of the gate capacitor.




Next, the frequency Fp


2


of the 2nd pole and the frequency Fz


2


of the 2nd zero point will be described. If an output impedance of the constant current circuit


24


is infinite, the frequency Fp


2


of the 2nd pole is substantially determined according to the output impedance of the transistor


23


and the node capacitance of the drain of the transistor


23


, that is, the gate capacitance of the output transistor


14


.




Also, the frequency Fz


2


of the 2nd zero point is substantially determined according to the value of the resistor


21


and the value of the capacitor


22


. As described above, when the V/R is stably operated, it is necessary to hold the relationship of Fz


2


<Fp


2


.




When the value of the resistor


21


is given by R


21


and the value of the capacitor


22


is given by C


22


, the frequency Fz


2


of the zero point resulting from the resistor and the capacitor is indicated by an expression (2),








Fz




2


=1/(2


·π·C




22


·


R




21


)  (2)






Here, when Fz


2


is set to a frequency lower than Fp


2


, it is necessary to increase the value of the resistor and the value of the capacitor. However, when a large capacitor is formed in the integrated circuit, a large area is required. Therefore, in a case where the same zero point frequency is produced from the resistor and the capacitor, when the value of the resistor is maximized, it is superior in view of area. On the other hand, the value of the capacitor


22


is reduced, the frequency Fp


1


of the 1st pole and the frequency Fz


1


of the 1st zero point are each shifted to a high frequency in FIG.


2


.




Here, because it is required that Fz


1


is lower than Fp


2


nd and Fp


3


rd, the value of the capacitor


22


cannot be set to a too small value. From such relation, it is desirable that the value of the resistor


21


is set to 20 kΩ or more.




Also, if the value of the resistor


21


is set to a value nearly equal to the output impedance of the transistor


23


, it is necessary to set the value of the capacitor


22


to a value larger than the gate capacitance of the output transistor


14


in order to satisfy Fz


2


<Fp


2


.




The value of the gate capacitance of the output transistor


14


is greatly changed according to the characteristic of the V/R, in particular, a current value treated in the V/R. In many cases, the value the gate capacitance becomes 10 pF or more in a general CMOS-integrated V/R. In other words, it is desirable that the value of the capacitor


22


is 10 pF or more.




The V/R of the present invention is constructed by the three-stage amplifying circuit. When the phase compensation of the differential amplifying circuit is suitably conducted, there is an effect that a high speed response property of the V/R is realized in a low consumption current and the V/R can be stably operated in a small output capacitance.



Claims
  • 1. A voltage regulator comprising:a reference voltage circuit connected between a power supply and a ground; a voltage dividing circuit for dividing an output voltage supplied to an external load, which is composed of a bleeder resistor; a differential amplifier for comparing an output of the reference voltage circuit with an output of the voltage dividing circuit and outputting a first signal; a phase compensating circuit in which a resistor and a capacitor are connected in series; a MOS transistor in which an output of the differential amplifier is inputted to a gate electrode, which is connected between the power supply and the phase compensating circuit, and in which a source is grounded; a constant current circuit connected between the MOS transistor and the ground; and an output transistor in which a second signal output from a connection point between the MOS transistor and the phase compensating circuit is inputted to a gate electrode, and which is connected between the power supply and the voltage dividing circuit, wherein the output voltage is outputted from a connection point between the output transistor and the voltage dividing circuit.
  • 2. A voltage regulator according to claim 1, wherein a resistor side of the phase compensating circuit is connected with an output terminal of the differential amplifier and a capacitor side of the phase compensating circuit is connected with a drain electrode of the MOS transistor.
  • 3. A voltage regulator according to claim 2, wherein a value of the capacitor is equal to or larger than a gate capacitance value of the output transistor.
  • 4. A voltage regulator according to claim 3, wherein a value of the resistor is equal to or larger than 20 kΩ and the value of the capacitor is equal to or larger than 10 pF.
Priority Claims (1)
Number Date Country Kind
2002-217758 Jul 2002 JP
US Referenced Citations (8)
Number Name Date Kind
5570004 Shibata Oct 1996 A
5686820 Riggio, Jr. Nov 1997 A
6049200 Hayashimoto Apr 2000 A
6104179 Yukawa Aug 2000 A
6420857 Fukui Jul 2002 B2
6509723 Matsushita Jan 2003 B2
6559626 Horie May 2003 B2
6696822 Takabayashi Feb 2004 B2