This application claims the priority benefit of Taiwan application serial no. 112129874, filed on Aug. 9, 2023. The entirety of the above-mentioned patent application is hereby incorporated by reference herein and made a part of specification.
The disclosure relates to a measurement system, and in particular relates to a volume measurement system and a method the same thereof
With the continuous development of e-commerce platforms, the volume of goods transported in B2C and C2C models is increasing year by year. For logistics and warehousing businesses, the volume of goods directly affects the overall logistics storage and transportation costs. If the measurement of the volume of goods is not accurate, it will increase the cost of logistics storage and transportation. Therefore, regardless of whether it is warehouse storage or transportation, it is necessary to rely on a more precise volume measurement system to control the storage and transportation status of goods.
Currently, volume measurement systems on the market generally use time of fly (TOF) technology. However, when measuring the volume of goods with metallic or reflective materials, errors may easily occur due to reflection. If shielding technology is adopted, the material of the goods bearing surface must be penetrable for a through-beam sensor. However, high-precision shielding technology cannot be introduced to the high-performance automated conveyor belt.
In the era of rapid development of e-commerce platforms, where the daily volume of goods transported is measured in tens of thousands, automated equipment is often paired with conveyor belts to enhance work efficiency. How to take into account both the high efficiency of automated conveyance and the high precision of volume measurement of goods is an urgent problem that needs to be solved.
A volume measurement system, which includes a sensing gate, a pedometer, and a processor, is provided in the disclosure. The sensing gate is configured to sense a device under test to obtain multiple sensing data. The pedometer is configured to generate multiple pulse signals. The processor is coupled to the sensing gate and the pedometer, and is configured to: receive the multiple pulse signals when the device under test starts passing through the sensing gate; record multiple X-axis values corresponding to multiple positions of the device under test in response to each of the pulse signals, and read the multiple sensing data to calculate a Y-axis value and a Z-axis value corresponding to each of the X-axis values; record a maximum X-axis value corresponding to a final position of the device under test in response to a final pulse signal among the multiple pulse signals when the device under test finishes passing through the sensing gate; set a maximum of the multiple Y-axis values corresponding to the multiple X-axis values as a maximum Y-axis value, and set a maximum of the multiple Z-axis values corresponding to the multiple X-axis values as a maximum Z-axis value; and calculate a volume of the device under test based on the maximum X-axis value, the maximum Y-axis value and the maximum Z-axis value.
A volume measurement method is further provided in the disclosure, including: obtaining multiple sensing data by sensing a device under test through a sensing gate; receiving multiple pulse signals generated by a pedometer when the device under test starts passing through the sensing gate; recording multiple X-axis values corresponding to multiple positions of the device under test in response to each of the pulse signals, and reading the multiple sensing data to calculate a Y-axis value and a Z-axis value corresponding to each of the X-axis values; recording a maximum X-axis value corresponding to a final position of the device under test in response to a final pulse signal among the multiple pulse signals when the device under test finishes passing through the sensing gate; set a maximum of the multiple Y-axis values corresponding to the multiple X-axis values as a maximum Y-axis value, and set a maximum of the multiple Z-axis values corresponding to the multiple X-axis values as a maximum Z-axis value; and calculate a volume of the device under test based on the maximum X-axis value, the maximum Y-axis value and the maximum Z-axis value.
Based on the above, the volume measurement system and the method the same thereof provided by the disclosure may determine that there is an object at the sensing position when the sensing signal is blocked. On one hand, a feedback type sensor with a ranging function is disposed in the Z-axis direction to sense whether there is a feedback signal from the object, thereby obtaining the height value of the object. On the other hand, a through-beam type sensor is disposed in the Y-axis direction to sense whether the information is shielded by the object, thereby obtaining the width value of the object. Furthermore, the volume of an object may be calculated by determining the maximum length of the object through a pedometer, and by searching for the maximum height value and maximum width value of the object from the height value and width value of the object at each position. Therefore, the disclosure may overcome common issues in the volume measurement system and the method the same thereof using TOF technology, which are often affected by metals and reflective objects. It takes into account both the high efficiency of automated conveyance and the high precision of volume measurement of goods.
The m sets of through-beam type sensors 114 includes m transmitters 114a and m receivers 114b. Specifically, each set of through-beam type sensors 114 includes corresponding transmitters 114a_1 to 114a_m and receivers 114b_1 to 114b_m. The m transmitters 114a_1 to 114a_m are arranged on the first side bracket 111 for transmitting through-beam type sensing signals 114c_1 to 114c_m one by one. Each of the transmitters 114a_1 to 114a_m is separated by a first separation distance. The m receivers 114b_1 to 114b_m are arranged on the second side bracket 112 and are aligned in sequence with each of the transmitters 114a_1 to 114a_m for receiving each through-beam type sensing signal 114c_1 to 114c_m transmitted by each transmitter 114a_1 to 114a_m. Each of the receivers 114b_1 to 114b_m is separated by a first separation distance. In other words, under the condition that there is no object blocking between the transmitters 114a_1 to 114a_m and the receivers 114b_1 to 114b_m in each set of through-beam type sensors 114, the through-beam type sensing signals 114c_1 to 114c_m emitted by the transmitters 114a_1 to 114a_m may be received by the aligned receivers 114b_1 to 114b_m. The through-beam type sensor 114 is, for example, a through-beam type infrared sensor or other similar device, which is not limited by the disclosure.
The n feedback type sensors 115 are arranged on the upper bracket 113. Each of the feedback type sensors 115_1 to 115_n is configured to emit electromagnetic signals, and to receive the reflected signals that are reflected by an object of the electromagnetic signals it has emitted itself. Each of the feedback type sensors 115_1 to 115_n is separated by a second separation distance. The feedback type sensor 115 is, for example, a photoelectric sensor or other similar device, which is not limited by the disclosure.
Referring to
The processor 13 is coupled to the sensing gate 11 and the pedometer 12. The processor 13 is, for example, a central processing unit (CPU), a physical processing unit (PPU), a programmable microprocessor, an embedded control chip, digital signal processor (DSP), an application specific integrated circuit (ASIC), or other similar devices.
The conveyor platform 14 is disposed between the first side bracket 111 and the second side bracket 112 and below the upper bracket 113 to drive the device under test to pass through the sensing gate 11 parallel to the X-axis. After the electromagnetic signal emitted by the feedback type sensor 115 disposed on the upper bracket 111 of the sensing gate 11 contacts the conveyor platform 14, the feedback type sensor 115 may receive the reflected signal. On the other hand, when the conveyor platform 14 drives the device under test to pass through the sensing gate 11 parallel to the X-axis, in addition to the fact that the electromagnetic signal emitted by the feedback type sensor 115 disposed on the upper bracket 113 of the sensing gate 11 is reflected back to the feedback type sensor 115 via the device under test, the through-beam type sensing signal emitted by at least one transmitter 114a disposed on the first side bracket 111 of the sensing gate 11 is blocked by the device under test, causing the aligned receiver 114b to be unable to receive the through-beam type sensing signal. The conveyor platform may be a conveyor belt device.
Next, the operation of measuring the volume of the device under test through the processor 13 in the volume measurement system 1 of the disclosure is further introduced.
First, the conveyor platform 14 drives the device under test to pass through the sensing gate 11 along a direction parallel to the X-axis. When the device under test starts passing through the sensing gate 11, the processor 13 receives multiple pulse signals 12a generated by the pedometer 12 in sequence. In response to each pulse signal 12a, the processor 13 records multiple X-axis values corresponding to multiple positions of the device under test. The multiple positions of the device under test refer to the multiple positions of the device under test in the physical space during the process of being driven by the conveyor platform 14 to pass through the sensing gate 11.
Each time the processor 13 receives a pulse signal, it synchronously records the X-axis value corresponding to the position of the device under test in the physical space. At the same time, the through-beam type sensor 114 and the feedback type sensor 115 of the sensing gate 11 sense the device under test when the object is in each position to obtain corresponding sensing data.
When the processor 13 records each X-axis value corresponding to each position of the device under test when passing through the sensing gate 11, the sensing data obtained after the sensing gate 11 senses the device under test is read to calculate the Y-axis value and Z-axis value corresponding to each X-axis value. Each X-axis value corresponds to the position of the device under test, and the Y-axis value corresponding to the X-axis value is the height of the device under test sensed by the sensing gate 11 when it is at the position corresponding to the X-axis value. The Z-axis value corresponding to the X-axis value is the width of the device under test sensed by the sensing gate 11 when it is at the position corresponding to the X-axis value.
Next, the part where the processor 13 calculates the Y-axis value corresponding to each X-axis value (i.e., the height of the device under test sensed by the sensing gate 11 at each position) is described.
The m sets of through-beam type sensors 33 also has m receivers 33b_1 to 33b_m, all of which are disposed on the second side bracket 32. Each of the receivers 33b_1 to 33b_m respectively corresponds to each of the transmitters 33a_1 to 33a_m. The first side bracket 31 and the second side bracket 32 are located on two sides of the conveyor platform.
T Therefore, during the process of the device under test DUT passing through the sensing gate 11, when the device under test DUT is located at each position, the processor 13 cannot receive part of the through-beam type sensing signals 33c_1˜33c_m that are blocked and calculates the quantity a of the corresponding part of the through-beam type sensors 33. The Y-axis value corresponding to each X-axis value is calculated according to the quantity a of the part of the through-beam type sensors 33.
The processor 13 calculates the Y-axis value corresponding to each X-axis value according to formula (1):
Wherein, Yi is the Y-axis value corresponding to the X-axis value when the device under test DUT is located at the ith position, Y1 is the first height, a is the quantity of the part of the through-beam type sensors blocked by the device under test DUT, Yr is the first separation distance, and m is the total quantity of transmitters 43a_1 to 43a_m.
For example, as shown in
Next, the part where the processor 13 calculates the Z-axis value corresponding to each X-axis value (i.e., the width of the device under test sensed by the sensing gate 11 at each position) is described.
Specifically, when the conveyor platform 14 is stationary, each feedback type sensor 55_1 to 55_n of the sensing gate 11 emits an electromagnetic signal 55c. The electromagnetic signal forms a reflected signal 55d after contacting the horizontal surface 14a of the conveyor platform 14, n feedback type sensors 55_1 to 55_n all receive the reflected signal 55d to obtain the sensing reference values Zbase1 to Zbasen of each feedback sensor 55_1 to 55_n. That is, the feedback type sensor 55_1 obtains the sensing reference value Zbase1, the feedback type sensor 55_n obtains the sensing reference value Zbasen. After obtaining the sensing reference values Zbase1 to Zbasen of each feedback type sensor 55_1 to 55_n, the height of the device under test on the conveyor platform 14 may be measured.
Next, the processor 13 determines whether the sensing feedback values Zbase1 to Zbasen of each feedback type sensor 55_1 to 55_n are equal to the sensing reference values Zvalue1 to Zvaluen. When the sensing feedback value Zbasei corresponding to a part of the feedback type sensors is not equal to the corresponding sensing reference value Zvaluei, the processor 13 determines that the device under test DUT is passing through the sensing gate 11.
For example, as shown in
The electromagnetic signal 55c emitted by the feedback type sensors 55_3 to 55_5 in the feedback type sensor 55 contacts the device under test DUT and forms a reflected signal 55d to obtain the sensing feedback values Zvalue3 to Zvalue5 of the feedback type sensors 55_3 to 55a_5, wherein the sensing feedback values Zvalue3 to Zvalue5 of the feedback type sensors 55a_3 to 55a_5 are not equal to the sensing reference values Zbase3 to Zbase5. The processor 13 may determine that the device under test DUT is passing through the sensing gate 11 based on the sensing feedback values Zvalue3 to Zvalue5 of the feedback type sensors 55_3 to 55_5 being different from the sensing reference values Zbase3 to Zbase5.
When the processor 13 determines that the device under test DUT is passing through the sensing gate 11, the processor 13 calculates the Z-axis value corresponding to each X-axis value according to formula (2):
Wherein, Zvaluei is the Z-axis value corresponding to the X-axis value when the device under test DUT is located at the ith position, b is the quantity of part of the feedback type sensors 55, Zr is the second separation distance, and n is the total quantity of feedback type sensors 55.
As shown in
Referring to
Before the device under test DUT starts to pass through the sensing gate 11, the processor 13 resets the accumulated pulse number Ei counted in response to each pulse signal 12a to the initial pulse number E0. Once the device under test DUT is located at the starting position S and begins to pass through the sensing gate 11 along the X-axis direction, the processor 13 receives the pulse signal 12a, counts the accumulated pulse number E; in response to each pulse signal 12a and records the X-axis value corresponding to each position of the device under test DUT. That is, the processor 13 receives a pulse signal 12a and synchronously records the X-axis value corresponding to the position of the device under test DUT in the physical space.
When the device under test DUT is located at the final position E, the accumulated pulse number Ei is set to the total pulse number of 1. The final position E of the device under test DUT is the position at the moment when the device under test DUT completely passes through the sensing gate 11. The processor 13 calculates the X-axis value of the device under test at each position from the starting position S to the final position E according to formula (3):
Wherein, Xi is the X-axis value of the device under test DUT recorded in response to the ith pulse signal 12a, E0 is the initial pulse number, Ei is the accumulated pulse number counted in response to the ith pulse signal 12a, EM is the unit distance value, EC is the unit pulse number, and l is the total pulse number.
When the device under test DUT finishes passing through the sensing gate 11 and is located at the final position E, in response to the final pulse signal among multiple pulse signals 12a, the processor 13 records the maximum X-axis value corresponding to the final position E of the device under test DUT. In other words, during the period from when the device under test DUT starts passing through the sensing gate 11 to when it finishes passing through the sensing gate 11, the maximum X-axis value recorded among the X-axis values by the processor 13 is the maximum length of the device under test DUT.
Then, the processor 13 searches for the largest one among the multiple Y-axis values corresponding to all the X-axis values, and sets the largest one among the multiple Y-axis values corresponding to the multiple X-axis values as the maximum Y-axis value. This maximum Y-axis value is the maximum height of the device under test DUT. The processor 13 also searches for the largest one among the multiple Z-axis values corresponding to all the X-axis values, and sets the largest one among the multiple Z-axis values corresponding to the multiple X-axis values as the maximum Z-axis value. This maximum Z-axis value is the maximum width of the device under test DUT.
Once the processor 13 receives the maximum X-axis value, the maximum Y-axis value and the maximum Z-axis value in the sensing data obtained by the sensing gate 11, the volume of the device under test DUT is calculated based on the maximum X-axis value, maximum Y-axis value and maximum Z-axis value.
After the processor 13 establishes the two-dimensional point cloud data 81a related to each X-axis value Xi, the processor 13 may further establish a point cloud diagram 82 related to the device under test DUT according to the multiple two-dimensional point cloud data 81a corresponding to all X-axis values Xi. In other words, the point cloud graph 82 includes the Y-axis value Yi and the Z-axis value Zvaluei corresponding to each of all X-axis values Xi.
In step S902, when the device under test DUT starts passing through the sensing gate 11, multiple pulse signals 12a generated by the pedometer 12 are received.
In step S904, in response to each pulse signal 12a, multiple X-axis values corresponding to multiple positions of the device under test DUT are recorded, and the sensing data is read to calculate the Y-axis value and Z-axis value corresponding to each X-axis value, in which the sensing data is obtained by sensing the device under test DUT through the sensing gate 14. Details about recording the X-axis value corresponding to each position of the device under test DUT and reading the sensing data to calculate the Y-axis value and Z-axis value corresponding to each X-axis value have been explained in the previous paragraphs, and are not repeated herein.
In step S906, when the device under test DUT finishes passing through the sensing gate 14, in response to the final pulse signal among multiple pulse signals 12a, the maximum X-axis value corresponding to the final position of the device under test DUT is recorded, and the maximum X-axis value is the maximum length of the device under test DUT. Details about recording the maximum X-axis value corresponding to the final position E of the device under test DUT in response to the final pulse signal among multiple pulse signals 12a have been explained in the previous paragraphs, and are not repeated herein.
In step S908, the largest one among the multiple Y-axis values corresponding to the multiple X-axis values is set as the maximum Y-axis value, and the largest one among the multiple Z-axis values corresponding to the multiple X-axis values is set as the maximum Z-axis value. The maximum Y-axis value is the maximum height of the device under test DUT, and the maximum Z-axis value is the maximum width of the device under test DUT. Details about setting the largest one among the multiple Y-axis values corresponding to the multiple X-axis values as the maximum Y-axis value, and setting the largest one among the multiple Z-axis values corresponding to the multiple X-axis values as the maximum Z-axis value have been explained in the previous paragraphs, and are not repeated herein.
In step S910, the volume of the device under test DUT is calculated based on the maximum X-axis value, the maximum Y-axis value, and the maximum Z-axis value.
Before measuring the volume of the device under test DUT, the distance between the through-beam type sensors 53a_1 to 53a_n and the conveyor platform 14 is measured through the through-beam type sensors 53a_1 to 53a_n of the sensing gate 14. This distance is set as the sensing reference value Zbase1 to Zbasen, whether a device under test DUT is passing through the sensing gate 14 is determined by using the sensing reference values Zbase1 to Zbasen. Therefore, before step S902 of the volume measurement method 9, step S901 is also included.
In step S901 before step S902, when the conveyor platform 14 is stationary, the sensing reference values Zbase1 to Zbasen of the feedback type sensors 53a_1 to 53a_n are obtained by emitting electromagnetic signals from the feedback type sensors 53a_1 to 53a_n of the sensing gate 11 and receiving the reflected signal 55d of the electromagnetic signal 55c reflected by the conveyor platform 11.
Once the sensing reference values Zbase1 to Zbasen of the feedback type sensors 53a_1 to 53a_n are obtained, in step S802, it may be determined that the device under test DUT is passing through the sensing gate 11 through the sensing reference values Zbase1 to Zbasen.
To sum up, in the volume measurement system and the volume measurement method provided by the disclosure, through the concept of determining that there is an object at the sensing position when the sensing signal is blocked, on one hand, a feedback type sensor with a ranging function is disposed in the Z-axis direction to sense whether there is a feedback signal from the object, thereby obtaining the height value of the object. On the other hand, a through-beam type sensor is disposed in the Y-axis direction to sense whether the information is shielded by the object, thereby obtaining the width value of the object. Furthermore, the volume of an object may be calculated by determining the maximum length of the object through a pedometer, and by searching for the maximum height value and maximum width value of the object from the height value and width value of the object at each position. Therefore, the volume measurement system and the volume measurement method provided by the disclosure may overcome common issues in the volume measurement system and the method the same thereof using TOF technology, which are often affected by metals and reflective objects. It takes into account both the high efficiency of automated conveyance and the high precision of volume measurement of goods.
Number | Date | Country | Kind |
---|---|---|---|
112129874 | Aug 2023 | TW | national |