Wafer level burn-in tester

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Information

Patent Grant
D426785

References
Source

Patent Number
D426,785
Date Filed
Monday, November 29, 1999
24 years ago
Date Issued
Tuesday, June 20, 2000
24 years ago

Inventors
- Yoshikazu Ezawa
- Yoshihiko Asai
Original Assignees
- Panasonic Corporation
Examiners
- Davis; Antoine Duval
Agents
- SAIDMAN DesignLaw Group

US Classifications
- D10 - Measuring, testing, or signalling instruments
Field of Search
- US
- D10 46
- D10 75
- D15 199
- 324 754
- 324 765
- 324 755
- 324 758
- 324 763
International Classifications
- 1004
- Term of Grant
  14Years

Information

Abstract

Description

Claims

The ornamental design for a wafer level burn-in tester, as shown and described.

Priority Claims (1)

Number	Date	Country	Kind
11-18323	Jul 1999	JPX

US Referenced Citations (5)

Number	Name	Date	Kind
D333144	Kolzumi	Feb 1993
D352911	Yamamoto et al.	Nov 1994
D365584	Nakagone et al.	Dec 1995
5851143	Hamid	Dec 1998
5929651	Leas et al.	Feb 1993

Foreign Referenced Citations (2)

Number	Date	Country
991054	Sep 1997	JPX
1009499	May 1998	JPX