Information
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Patent Grant
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D427088
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Patent Number
D427,088
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Date Filed
Monday, November 29, 199924 years ago
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Date Issued
Tuesday, June 27, 200024 years ago
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Inventors
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Original Assignees
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Examiners
Agents
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US Classifications
Field of Search
US
- D10 46
- D10 75
- D15 199
- 324 754
- 324 765
- 324 755
- 324 758
- 324 763
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International Classifications
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Claims
- The ornamental design for a wafer level burn-in tester, as shown and described.
Priority Claims (1)
Number |
Date |
Country |
Kind |
11-18322 |
Jul 1999 |
JPX |
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US Referenced Citations (5)
Foreign Referenced Citations (2)
Number |
Date |
Country |
991054 |
Sep 1997 |
JPX |
1009499 |
May 1998 |
JPX |