1. Field of the Invention
The present invention relates to a wavelength separation film capable of transmitting light having a passband wavelength and reflecting light having a stopband wavelength, and a filter for optical communication using the same.
2. Related Art
As an optical communication module that sends and receives light transmitted bidirectionally with an optical fiber, such a module has been known that has a light separation prism provided on an optical axis on an apical surface of an optical fiber, in which the light separation prism transmits light having a first wavelength in the optical axis direction and reflects light having a second-wavelength in the perpendicular direction to the optical axis (see, for example, JP-A-2000-180671). The light separation prism has provided therein a wavelength separation film inclined at an angle of from 40 to 50° with respect to the incident direction of the light. The wavelength separation film has a structure containing a first thin film formed of a material having a high refractive index and a second thin film formed of a material having a low refractive index laminated alternately. Conventionally, TiO2 has been generally used as the first thin film having a high refractive index, and SiO2 has been generally used as the second thin film having a low refractive index. The thin films are laminated alternately in about 60 layers to constitute the wavelength separation film.
In the wavelength separation film constituted by laminating the thin films of TiO2 and SiO2, however, there is a problem that the wavelengths of the passband and the stopband are shifted when the incident angle of the light incident on the wavelength separation film is deviated, thereby failing to provide the intended optical characteristics.
Transmitted light and reflected light formed from light incident on the inclined wavelength separation film are separated into a P polarized component and an S polarized component, which are different from each other in optical characteristics. In the conventional wavelength separation film, the separation width between the P polarized component and the S polarized component is as large as about 300 nm, and the intended characteristics in the passband can be satisfied only by the P polarized component.
JP-A-2000-162413 discloses a light separation prism having a wavelength separation film that contains a TiO2 thin film or a SiO2 thin film laminated alternately with a Si thin film. In the laminated thin film, however, when the total number of the high refractive index thin films and the low refractive index thin films is decreased, there is a problem that the stopband is narrowed, and the wavelength shift widths of the passband and the stopband are increased on deviation of the light incident angle.
An object of the invention is to provide a wavelength separation film that can decrease the total number of the laminated films, can decrease the thickness of each of the laminated films, can decrease the separation width in optical characteristics between the P polarized component and the S polarized component formed from light incident on the inclined wavelength separation film, can decrease the wavelength shift widths of the passband and the stopband on deviation of the light incident angle, can enhance the stopband as compared to conventional ones, and can decrease the transmission loss due to absorption with Si by decreasing the total thickness of Si, and also to provide a filter for optical communication using the wavelength separation film.
The wavelength separation film of the invention has a structure containing plural thin films laminated to each other including a first thin film containing a high refractive index material, a second thin film containing a low refractive index material, and a third thin film containing a material having an intermediate refractive index that intervenes between the refractive index of the high refractive index material and the refractive index of the low refractive index material, the high refractive index material being silicon, the low refractive index material being at least one selected from silicon oxide, magnesium fluoride and aluminum oxide, and the material having an intermediate refractive index being at least one selected from titanium oxide, tantalum oxide, niobium oxide, zirconium oxide, hafnium oxide and aluminum oxide.
The wavelength separation film of the invention has the structure containing the plural thin films laminated to each other including the first thin film, the second thin film and the third thin film, thereby providing the following advantages.
(1) The total number of films laminated can be decreased, and the thickness of each of the laminated films can be decreased. Accordingly, the total thickness of the wavelength separation film can be decreased as compared to conventional ones.
(2) The separation width in optical characteristics between the P polarized component and the S polarized component formed from light incident on the inclined wavelength separation film can be decreased.
(3) The wavelength shift widths of the passband and the stopband on deviation of the light incident angle can be decreased.
(4) The stopband can be enhanced as compared to conventional ones.
(5) The total thickness of Si can be decreased to decrease the transmission loss due to absorption with Si as compared to a conventional wavelength separation film using a Si film.
According to the invention, the first thin film has a large difference in refractive index from the second thin film and the third thin film, and therefore, the total number of films laminated can be decreased. For example, a conventional wavelength separation film having SiO2 thin films and TiO2 thin films laminated has a lamination number of 44 layers and a thickness of about 10 μm, whereas the wavelength separation film of the invention has a lamination number of about from 30 to 36 layers and a total thickness of about 5 μm.
A conventional wavelength separation film having Si thin films and SiO2 thin films or TiO2 thin films laminated has a lamination number of the Si thin films of 14 layers and a thickness of about 1,400 nm, whereas according to the invention, the lamination number of Si thin films can be about 10 layers, and the total thickness can be about 800 nm.
According to the invention, the thickness of thin films laminated can be decreased, and the total number of films laminated can be decreased, whereby the production process can be simplified as compared to conventional ones.
It is preferred in the invention that the first thin film, the second thin film and the third thin film are laminated in such a manner that the first thin film is adjacent to the second thin film or the third thin film.
In the invention, the third thin film may contain plural thin films laminated to each other. Specifically, the third thin film may be constituted by laminating thin films of one kind selected from titanium oxide, tantalum oxide, niobium oxide, zirconium oxide, hafnium oxide and aluminum oxide, or laminating thin films of two or more kinds selected therefrom. The second thin film in the invention is formed with at least one kind of a low refractive index material selected from silicon oxide, magnesium fluoride and aluminum oxide, and in the case where the third thin film contains aluminum oxide, the second thin film contains silicon oxide or magnesium oxide.
The first thin film in the invention is formed with a silicon thin film. The silicon thin film has a refractive index that can be varied by changing the method and conditions for forming the thin film. The silicon thin film in the invention preferably has a refractive index in a range of from 2.85 to 4.20 at a wavelength of 1,490 nm. In the case where the refractive index is too small, the stopband may be narrowed, and the separation width in optical characteristics between the P polarized component and the S polarized component may be increased, in some cases. In the case where the refractive index is too small, the density of the thin film is generally decreased to receive influence of absorption of water and the like, whereby the resistance to environments may be lowered in some cases. The resistance to environments of the silicon thin film can be enhanced by increasing the refractive index thereof. However, too high the refractive index of the silicon thin film may increase ripple in the optical characteristics.
In the invention, the thickness of each of the thin films is appropriately selected depending on the setting of the passband and the stopband and thus is not particularly limited. In general, the thickness is selected from a range of from 50 to 300 nm, and a thin film having a thickness exceeding the range may be used in some cases. The total number of the thin films laminated is not particularly limited and may be, for example, in a range of from 20 to 50 layers.
The method for forming the thin films in the invention is not particularly limited, and for example, such a thin film forming method as a vacuum deposition method and a sputtering method may be used.
The filter for optical communication of the invention has the wavelength separation film of the invention disposed to be inclined with respect to a light incident direction, whereby light having a wavelength in the passband of the wavelength separation film is transmitted, and light having a wavelength in the stopband thereof is reflected.
In the filter for optical communication of the invention, the wavelength separation film is preferably disposed to be inclined with respect to the light incident angle at an angle of from 40 to 50°.
Examples of the filter for optical communication of the invention include a wavelength separation prism and a wavelength separation plate described later.
According to the invention, the total number of the laminated films can be decreased, the thickness of each of the laminated films can be decreased, the separation width in optical characteristics between the P polarized component and the S polarized component formed from light incident on the inclined wavelength separation film can be decreased, the wavelength shift widths of the passband and the stopband on deviation of the light incident angle can be decreased, the stopband can be enhanced as compared to conventional ones, and the transmission loss due to absorption with Si can be decreased by decreasing the total thickness of Si.
The invention will be described with reference to specific examples below, but the invention is not limited to them.
Light having a wavelength of 1,310 nm emitted from the optical fiber 11 is incident on the wavelength separation prism 1. The light has a wavelength within the stopband of the wavelength separation film 4, and thus the light is reflected by the wavelength separation film 4 and is incident on a photodiode (PD) 15 as a light receiving device through a lens 14 disposed below.
As described above, the wavelength separation film 4 of the wavelength separation prism 1 is set so as to transmit the light emitted from the LD 13 and to reflect the light emitted from the optical fiber 1, thereby enabling bidirectional communication using the optical fiber 11.
In the wavelength separation prism 1, the wavelength separation film 4 is disposed to be inclined, for example, with respect to the optical axis connecting the optical fiber 11 and the LD 13 at an angle of 45°. However, the light emitted from the LD 13 is incident on the optical fiber 11 while condensed by the lens 12, but is incident on the wavelength separation film 4 with some broadening. For example, the incident light has a broadening angle of +5° with respect to the incident angle of 45°. Since the light having a broadening angle of ±5° with respect to the incident angle of 45° is incident on the wavelength separation film 4, intended optical characteristics may not be obtained in some cases if the wavelengths of the passband and the stopband are largely shifted on deviation of the incident angle of the light.
The wavelength separation film of the invention can decrease the wavelength shift widths of the passband and the stopband on deviation of the light incident angle as described above, thereby reducing influence of deviation of the light incident angle on the optical characteristics. Furthermore, the stopband can be enhanced as compared to conventional ones, whereby the design and administrative latitudes can be enhanced to facilitate provision of intended optical characteristics.
The wavelength separation film of the invention can decrease the separation width in optical characteristics between the P polarized component and the S polarized component formed from light incident on the inclined wavelength separation film. Accordingly, sufficient passband characteristics can be provided for both the P polarized component and the S polarized component.
The wavelength separation prism 1 is adhered to the end of the ferrule 10 in the example shown in
In the optical communication module shown in
The wavelength separation film of the invention can decrease the separation width in optical characteristics between the P polarized component and the S polarized component formed from light incident on the inclined wavelength separation film as described above. Accordingly, sufficient passband characteristics can be provided for both the P polarized component and the S polarized component.
The first thin film, the second thin film and the third thin film were formed on a glass substrate with the materials for films shown in Table 1 below according to the order and thickness shown in Tables 2 and 3 below to prepare wavelength separation films.
As shown in Table 1, Examples 7 to 11 used as the third thin film a single layer thin film containing one of a Nb2O5 film, a ZrO2 film, a TiO2 film, a Ta2O5 film and a HfO2 film, or a double layer thin film containing one of these films and an Al2O3 film.
In Examples and Comparative Examples, the thin films each were formed by a vacuum deposition method. The total thicknesses of the wavelength separation films were as shown in Tables 2 and 3.
The refractive indices of the thin films used in Examples and Comparative Examples at a wavelength of 1,490 nm are as follows.
Si thin film: 3.59
SiO2 thin film: 1.45
MgF2 thin film: 1.36
Al2O3 thin film: 1.64
Ta2O5 thin film: 2.13
Nb2O5 thin film: 2.23
ZrO2 thin film: 2.04
TiO2 thin film: 2.29
HfO2 thin film: 2.03
The wavelength separation films of Examples 1 to 11 and Comparative Examples 1 to 3 thus produced each were evaluated for optical characteristics.
Comparative Example 1 corresponds to a conventional wavelength separation film having a Si film and a SiO2 film laminated, and as shown in
Comparative Example 2 corresponds to a conventional wavelength separation film having a Si film and a TiO2 film laminated, and as shown in
Comparative Example 3 corresponds to a conventional wavelength separation film having a TiO2 film and a SiO2 film laminated, and as shown in
In Examples 1 to 11 according to the invention, as shown in
According to the invention, the wavelength shift in transmittance on deviation of the light incident angle can be decreased, and the separation width between the P polarized component and the S polarized component can be decreased.
Furthermore, as shown in Tables 2 and 3, the wavelength separation films of Examples 1 to 11 according to the invention can decrease the total number of films laminated and can decrease each of the films laminated in thickness, as compared to the conventional wavelength separation films of Comparative Examples 1 to 3. Accordingly, the wavelength separation films according to the invention can decrease the total thickness.
Moreover, the wavelength separation films of Examples 1 to 11 according to the invention can decrease the total thickness of Si, and thus can decrease the transmission loss due to absorption with Si.
A wavelength separation film of Example 12 was produced with the same film structure as in Example 10 shown in Tables 1 and 3 except that the refractive index of the Si thin film was 2.88.
A wavelength separation film of Example 13 was produced with the same film structure as in Example 10 except that the refractive index of the Si thin film was 4.19.
The refractive index of the Si thin film was changed by controlling the vapor deposition rate for forming the Si thin film. The Si thin film having a refractive index of 4.19 was formed by increasing the vapor deposition rate of the Si thin film, and the Si thin film having a refractive index of 2.88 was formed by decreasing the vapor deposition rate of the Si thin film.
As shown in
As shown in
As having been described above, according to the invention, the total number of the laminated films can be decreased, the thickness of each of the laminated films can be decreased, the separation width in optical characteristics between the P polarized component and the S polarized component formed from light incident on the inclined wavelength separation film can be decreased, the wavelength shift widths of the passband and the stopband on deviation of the light incident angle can be decreased, the stopband can be enhanced as compared to conventional ones, and the transmission loss due to absorption with Si can be decreased by decreasing the total thickness of Si.
Number | Date | Country | Kind |
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2007-332589 | Dec 2007 | JP | national |