Embodiments of the invention relate to electronic circuitry commonly employed to receive data and binary signals transmitted over lengths of interconnect from other electronic circuits, devices and systems. Such circuitry falls under the category of Data Communication Circuits.
Phase-locked loops (PLL's) and delay-locked loops (DLL's) are commonly employed in clock and data recovery functions of data communication systems. PLL's are often employed for extracting a clock signal out of encoded symbol streams such as 8b/10b encoded data. Clock and Data Recovery (CDR) architectures often use PLL's because they not only assist in recovering the clock signal embedded within the data stream, but also provide a constant, tracking phase relationship with respect to data transitions, enabling accurate sampling of the received data. This is particularly important when data is transmitted over long distances, or over lossy interconnect that attenuate and distort the transmitted signals substantially where accurate sampling clock placement is essential to recovering data symbols distorted by attenuation, inter-symbol interference (ISI) and data channel-to-channel crosstalk. Such PLL's are called Clock-Extraction PLL's in the art and find common use in optoelectronic data communication systems and electronic data transmission systems operating at very high data rates.
In data communication systems where the operating bit-rate remains essentially constant, DLL's may be used in place of PLL's, since clock recovery is not an essential function, while accurate phase positioning is desired for error-free data sampling. DLL's are also useful in generating multiple edges within a clock period that can be employed to transmit and receive multiple data bits within one clock period. DLL's have advantages in their inherent simplicity and consequent stability; they also do not generate as much jitter as PLL's using high-gain voltage controlled oscillators (VCO's) do, or transfer as much reference clock energy into the output clock signal.
In certain applications, as for example digital video interfaces (DVI) and high-definition multi-media interfaces (HDMI), due principally to backward compatibility requirements, interface links are required to be able to transmit data over a wide range of data transmission rates. In DVI links, for example, data and clock are transmitted on separate channels (twisted wire pairs in the context of cable interconnect) of a cable link, with the data transmission rate being 10 times the clock frequency, while the clock frequency may also vary over as much as a decade in range, from 25 MHz up to 250 MHz. Such links that transmit a clock along with data channels are termed “Source Synchronous” links. These links often require a PLL for de-jittering purposes as well as for the synthesis of higher frequency sampling clock employed to recover data. Additionally, since video data is transmitted over cables of significant length (10 meters or more, typically), de-skewing of the data channels is essential both for accurate data sampling and for re-alignment of the bit-streams with each other. Depending upon the extent of length mismatches between data channels, channel-to-channel skew may be less than, or substantially greater than a single data bit period. In order to be able to accurately sample a skewed data channel, it is important to be able to control the placement of a sampling clock signal within a small fraction of a data bit cell.
Prior art including chips from fables semiconductor company Silicon Image has successfully addressed the wide dynamic range requirement and skewed data sampling problem through the use of “Oversampling”, a technique that has also been applied to other high-speed serial data links such as the Universal Serial Bus (USB) and Serial-ATA. Oversampling is an architecture that samples data streams at a multiple of the data bit rate, and votes with values of the successive samples obtained in order to determine a digital bit value at any given point in time. A minimum number of samples per bit cell (one data bit period) is typically 3. This architecture avoids the use of delay-locked loops, and is “digital” in nature, thereby capable of high speeds while being simple in implementation as well. Yet, with only 3 samples in a bit-cell, there is a finite probability of error in the recognition of each bit cell, particularly when the data signals received are highly distorted. As shown in reference [1], there is a trade-off between clock quality, signal-to-noise ratio (SNR) and bit error probability in the two data recovery architectures. The analysis shows that at lower signal to noise ratio values, and with low jitter, extraction (a single sample technique) has a lower probability of bit error. The oversampling architecture is therefore not desirable for link implementations at high frequencies and over long lengths, and a need exists for another suitable architecture.
Whereas dual-loop clock and data recovery architectures do exist in the art, an architecture that combines a primary wideband PLL with tracking, wideband, open-loop data channel DLL's, to the best knowledge of the author of this invention, is not currently disclosed. The prior art oversampling architecture continues to be scaled in frequency in order to provide required higher frequencies of operation and data rates (10.2 billion bits per second or Gbps across a link) as in the HDMI 1.3 standard. Binary signal transmission suffers from a need for substantially higher channel bandwidth as compared with analog transmission of the same data. The author believes that bit error rates will increase as link signal distortion worsens and signal to noise ratio degrades due to higher frequency of operation and/or greater lengths of links, leading to lower overall video quality. While this lower video quality may be masked to some extent by the ongoing transition to high-definition video, the need to improve product quality while reducing cost will require a transition to the arguably more accurate data recovery architecture disclosed.
The invention employs a wideband PLL to receive the source clock and PLL-tracking DLL's and phase interpolators to generate frequency-tracking, multiple, sampling clock edges. Multi-phase clock distributions and their associated jitter are completely avoided in this architecture; a single PLL output clock is distributed to all data channel receivers and PLL-tracking DLL's. The DLL's obtain frequency information from the wideband PLL in the form of a reference current that enables their open-loop delay lines to track the period of the clock frequency generated. Carefully designed mixers and amplifiers minimize duty-cycle distortion and develop a significant number of sub-cycle sampling edges. The transmission of a frequency-tracking current from the clock-receiver PLL to all the data channels forces delay lines local to each data channel to ‘lock’ on to this frequency information and adjust their stage delay accordingly irrespective of process, voltage and temperature variation. By designing DLL delay stages to be identical or ratioed with respect to the delay stages of the PLL VCO, the delay stages of each local DLL track the PLL frequency closely despite the lack of feedback. Inaccuracies in this delay tracking are rendered inconsequential by a bang-bang data recovery loop that chooses an optimal sampling edge. A high-performance, low-jitter PLL and the accurate placement of a sampling edge within bit cells accomplished by this dual-loop architecture significantly minimize bit errors in data transmission while minimizing power and area usage through the use of open-loop data channel DLL's.
A prior art embodiment of a dual-loop data recovery architecture is illustrated in
The invention architecture illustrated in
With reference to
Note that signal 4 or PHY_Clock (with reference to the embodiment of
The transmission of frequency information as a current value is appropriate for two fundamental reasons. Firstly, in most controlled delay-line based PLL's or DLL's, delay control is accomplished by means of current flow into and out of capacitors. In CMOS integrated circuit embodiments of PLL's and DLL's, these capacitors are formed by gate-oxide capacitance of transistor devices. The gate-oxide thickness (and consequently, gate capacitance) is one of the best-controlled parameters of a CMOS fabrication process. This ensures that a capacitor formed from a transistor device located in one region of an integrated chip (IC) and a similar capacitor formed at another location in the IC will be matched very closely in capacitance value. Hence the transmission of the delay-modulating current from a region of the IC to another region of the IC, where delays are generated by the flow of such current into and out of transistor capacitance constructs, ensures that delay-matching is as accurate as can be accomplished despite fabrication and processing variations. Secondly, a current transmitted from one portion of the chip to another, in the absence of any other intervening signal connection, appears at the destination as exactly the same value as that transmitted. This is because the current flow is generated by bias voltages at the transmitting location largely independent of the voltage on the node connecting between the transmitting location and the receiving location, and in accordance with Kirchoff's current summation law, the current flow at the receiver must equal that provided by the transmitter, regardless of the operating supply voltage differences between the two locations. Additionally, a current signal at the receiver generates local bias voltages that sustain the current at the receiver regardless of the variations in device properties at the receiver with respect to devices at the transmitter. Therefore a current signal is better suited to transmitting information than a voltage signal that necessarily requires the transmission of a companion reference signal. This is better understood through an examination of an embodiment illustrating current reference generation circuits at the transmitter and bias generation at the receiver as in
With reference to
Node IS2 is connected to device 14 in an OLDLL bias generation circuit, located in a different region of the IC integrating the PLL and OLDLL's, with this connection made through signal ‘freq_iref’ as shown in
The current reference freq iref signal in combination with device 14 in
It will be evident to one skilled in the art that the output of a delay chain as illustrated in
In order that the OLDLL delay stages track the operating frequency of the primary PLL accurately over the entire range of the PLL, it is important that the delay stages in the OLDLL are exactly the same in architecture as delay stages in the PLL. The load, control and tail current devices, as in a typical delay stage, may be ratioed in size with respect to the same devices in the PLL delay stages to provide a scaled delay. In one embodiment, the load and tail current devices of the OLDLL delay stages are doubled in their respective widths while the control devices remained identical with respect to the same devices in the primary PLL delay stages. This provided approximately one-half the delay of the PLL delay stage as the delay value in a stage of the OLDLL, and this ratio remained essentially constant, independent of operating voltage, temperature and processing variations throughout a decade-wide operating frequency range.
The OLDLL phase outputs (delayed clock edges) may be employed in any fashion desired to recover data in the data receiver channels. Oversampling techniques may be employed, for example, to determine where data transitions occur. A preferred embodiment employs a phase interpolator comprising of mixer circuits and low-swing to full-swing amplifiers to generate fine phase positions numbering 16 within one clock cycle. In this embodiment, the data receiver channel circuits include a ‘bang-bang’ data recovery loop that identifies an optimally placed clock edge among the 16 edges generated from the phase interpolator to best sample the received data. Such a data recovery loop tests each sub-cycle clock edge sequentially to locate the two edges that straddle the optimal data sampling point (approximately the middle of the data ‘eye’) and alternates the data sampling clock between these two phase positions. This search for the optimal edge is typically terminated after the loop determines these two phase clocks, choosing one as the sampling clock. Because the loop scans among the 16 phase clocks to determine the optimal sampling clock, it is not critical that the 16 phase clock's exactly span the duration of one cycle of the primary clock. In other words, the separation between the phase clocks need not be exactly 1/16th of the primary clock period. Therefore mismatches in the delay values of the delay stages of the OLDLL with delay stages of the primary PLL are rendered largely inconsequential with respect to the link bit error rate. This is also the case for an oversampling data recovery loop employed in an embodiment of the invention.
Although specific embodiments are illustrated and described herein, any circuit arrangement configured to achieve the same purposes and advantages may be substituted in place of the specific embodiments disclosed. This disclosure is intended to cover any and all adaptations or variations of the embodiments of the invention provided herein. All the descriptions provided in the specification have been made in an illustrative sense and should in no manner be interpreted in any restrictive sense. The scope, of various embodiments of the invention whether described or not, includes any other applications in which the structures, concepts and methods of the invention may be applied. The scope of the various embodiments of the invention should therefore be determined with reference to the appended claims, along with the full range of equivalents to which such claims are entitled. Similarly, the abstract of this disclosure, provided in compliance with 37 CFR §1.72(b), is submitted with the understanding that it will not be interpreted to be limiting the scope or meaning of the claims made herein. While various concepts and methods of the invention are grouped together into a single ‘best-mode’ implementation in the detailed description, it should be appreciated that inventive subject matter lies in less than all features of any disclosed embodiment, and as the claims incorporated herein indicate, each claim is to viewed as standing on it's own as a preferred embodiment of the invention.