Technical Field
The disclosure concerns a chamber or reactor for processing a workpiece such as a semiconductor wafer using microwave power.
Description of Related Art
Processing of a workpiece such as a semiconductor wafer can be carried out using a form of electromagnetic energy, such as RF power or microwave power, for example. The power may be employed, for example, to generate a plasma, for carrying out a plasma-based process such as plasma enhanced chemical vapor deposition (PECVD) or plasma enhanced reactive ion etching (PERIE). Some processes need extremely high plasma ion densities with extremely low plasma ion energies. This is true for processes such as deposition of diamond-like carbon (DLC) films, where the time required to deposit some type of DLC films can be on the order of hours, depending upon the desired thickness and upon the plasma ion density. A higher plasma density requires higher source power and generally translates to a shorter deposition time.
A microwave source typically produces a very high plasma ion density while producing a plasma ion energy that is less than that of other sources (e.g., an inductively coupled RF plasma source or a capacitively coupled RF plasma source). For this reason, a microwave source would be ideal. However, a microwave source cannot meet the stringent uniformity required for distribution across the workpiece of deposition rate or etch rate. The minimum uniformity may correspond to a process rate variation across a 300 mm diameter workpiece of less than 1%. The microwave power is delivered into the chamber through a microwave antenna such as a waveguide having slots facing a dielectric window of the chamber. Microwaves propagate into the chamber through the slots. The antenna has a periodic power deposition pattern reflecting the wave pattern of the microwave emission and the slot layout, rendering the process rate distribution non-uniform. This prevents attainment of the desired process rate uniformity across the workpiece.
A limitation on processing rate is the amount of microwave power that can be delivered to a process chamber without damaging or overheating the microwave window of the chamber. Currently, a microwave window, such as a quartz plate, can withstand only low microwave power levels at which DLC deposition processes can require hours to reach a desired DLC film thickness. The microwave window provides a vacuum boundary of the chamber and is consequently subject to significant mechanical stress, rendering it vulnerable to damage from overheating.
A reactor for processing a workpiece comprises a chamber comprising a microwave transmissive window, a gas distribution plate, a microwave radiator overlying the microwave transmissive window and comprising a microwave input port, a rotary waveguide coupling comprising (a) a stationary member comprising a microwave power receiving port, and (b) a rotatable member coupled to the microwave input port of the microwave radiator, and a rotation actuator coupled to the rotatable member.
In one embodiment, the rotation actuator comprises a motor and a rotatable drive gear coupled to the motor, and the rotatable member comprises a driven gear fastened to the rotatable member and engaged with the rotatable drive gear. In a related embodiment, the rotatable drive gear is at a stationary location and is rotatable about a radial axis, and the driven gear is at a location fixed relative to the rotatable member.
A related embodiment further comprises an axial waveguide connected between the microwave input port of the microwave radiator and the rotatable member. The axial waveguide may be coaxial with the axis of symmetry.
A related embodiment further comprises a microwave generator and a flexible waveguide conduit connected between the microwave generator and the microwave power receiving port of the stationary member.
In a further embodiment, a reactor for processing a workpiece comprises (a) a chamber and a workpiece support in the chamber, the chamber comprising a ceiling and a side wall, the ceiling comprising a microwave transmissive window, (b) a first gas distribution plate overlying the workpiece support and comprising plural gas injection orifices, a process gas plenum overlying the first gas distribution plate and a process gas supply conduit coupled to the process gas plenum, (c) a microwave radiator overlying the microwave transmissive window and comprising a cylindrical hollow conductive housing having a top, a side wall and a bottom floor, an array of openings in the bottom floor, and a microwave input port, (d) a rotary waveguide coupling comprising a stationary member fixed with respect to the chamber and having a microwave power receiving port, and a rotatable member coupled to the microwave input port of the microwave radiator and having an axis of rotation coincident with an axis of symmetry of the cylindrical hollow conductive housing, and, a rotation actuator coupled to the rotatable member, whereby the microwave radiator is rotatable by the rotation actuator about the axis of symmetry.
In an embodiment, the rotation actuator comprises a motor and a rotatable drive gear coupled to the motor, and the rotatable member comprises a driven gear fastened to the rotatable member and engaged with the rotatable drive gear.
In an embodiment, the rotatable drive gear is at a stationary location and is rotatable about a radial axis, and the driven gear is at a location fixed relative to the rotatable member.
In one embodiment, the reactor further comprising an axial waveguide connected between the microwave input port of the microwave radiator and the rotatable member. In an embodiment, the axial waveguide is coaxial with the axis of symmetry.
One embodiment further comprises a microwave generator and a flexible waveguide conduit connected between the microwave generator and the microwave power receiving port of the stationary member.
In one embodiment, the array of openings in the bottom floor of the microwave radiator has a periodic spacing corresponding to a function of a microwave wavelength.
An embodiment further comprises a second gas distribution plate underlying the first gas distribution plate and comprising second plural gas injection orifices, an underlying process gas plenum between the first and second gas distribution plates, and a second process gas supply conduit coupled to the underlying process gas plenum.
In a related embodiment, the first process gas supply conduit is coupled to receive a non-reactive process gas and the second process gas supply conduit is coupled to receive a reactive process gas.
One embodiment further comprises an inductively coupled RF power applicator adjacent to the microwave transmissive window and an RF power generator coupled to the inductively coupled RF power applicator. In one embodiment, the inductively coupled RF power applicator couples RF power through the microwave transmissive window. A related embodiment further comprises a controller governing an output power level of the RF power generator.
So that the manner in which the exemplary embodiments of the present invention are attained can be understood in detail, a more particular description of the invention, briefly summarized above, may be had by reference to the embodiments thereof which are illustrated in the appended drawings. It is to be appreciated that certain well known processes are not discussed herein in order to not obscure the invention.
To facilitate understanding, identical reference numerals have been used, where possible, to designate identical elements that are common to the figures. It is contemplated that elements and features of one embodiment may be beneficially incorporated in other embodiments without further recitation. It is to be noted, however, that the appended drawings illustrate only exemplary embodiments of this invention and are therefore not to be considered limiting of its scope, for the invention may admit to other equally effective embodiments.
The problem of process non-uniformity attributable to the periodic power deposition pattern of the microwave antenna is solved in one embodiment by continuously rotating the microwave antenna relative to the workpiece. The rotation is performed during or contemporaneously with application of microwave power. The rotation may be about an axis of symmetry. This axis of symmetry may be the axis of symmetry of the process chamber, the workpiece and/or the antenna.
The problem of having to limit microwave power to avoid damaging the microwave window is solved by providing a channel through the window and flowing a coolant through the channel. In one embodiment, the coolant is a liquid that does not absorb microwave power (or absorbs very little). In one embodiment, the microwave window is provided as a pair of window layers separated by the channel.
An advantage of the microwave plasma source is that it efficiently generates plasma in a wide range of chamber pressures, generally from above atmospheric pressure down to 10−6 Torr or below. This enables its use across a very wide range of processing applications. In contrast, other plasma sources, such as inductively coupled plasma sources or capacitively coupled plasma sources, can only be used in much more narrow ranges of chamber pressures, and are therefore useful in correspondingly limited sets of processing applications.
Rotating Microwave Source:
Referring now to
As shown in
A rotation actuator 140 is stationary relative to the chamber 100 and includes a rotation motor 140-1 and a rotating drive gear 140-2 driven by the rotation motor 140-1. A driven gear 118-3 bonded or fastened to the rotatable member 118-2 is engaged with the drive gear 140-2, so that the motor 140-1 causes rotation of the rotatable member 118-2 about the axis of symmetry 114a. The driven gear 118-3 may be implemented, for example, as a circular array of teeth on the bottom surface of the rotatable member 118-2.
In the embodiment of
In one embodiment depicted in
As shown in
Thermally Controlled Window:
Referring again to
Referring to
As depicted in dashed line in
Microwave Source with Controllable Ion Energy for Lattice Defect Repair During Film Deposition:
During deposition of a film in a PECVD process, the layer being deposited may have some empty atomic lattice sites. As additional layers are deposited, the additional layers cover the empty lattice sites, thus forming voids in the crystalline structure of the deposited material. Such voids are lattice defects and impair the quality of the deposited material. A microwave source such as that employed in the embodiment of
In the embodiment of
While the foregoing is directed to embodiments of the present invention, other and further embodiments of the invention may be devised without departing from the basic scope thereof, and the scope thereof is determined by the claims that follow.
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