X-ray residual stress measuring instrument

Information

  • Patent Grant
  • D750783
  • Patent Number
    D750,783
  • Date Filed
    Wednesday, July 16, 2014
    10 years ago
  • Date Issued
    Tuesday, March 1, 2016
    8 years ago
  • US Classifications
    Field of Search
    • US
    • D24 158-161
    • D24 185
    • D24 186
    • D24 187
    • D24 107
    • D10 46
    • D10 47
    • CPC
    • G01N23/207
    • G01L1/25
    • G01L1/255
  • International Classifications
    • 2401
    • Term of Grant
      14Years
Abstract
Description


FIG. 1 is a front elevational view of a X-ray residual stress measuring instrument showing our new design;



FIG. 2 is a top plan view thereof;



FIG. 3 is a bottom plan view therefore;



FIG. 4 is a rear elevational view thereof;



FIG. 5 is a left side elevational view thereof;



FIG. 6 is a right side elevational view thereof;



FIG. 7 is a cross-sectional view thereof, taken along the line 7-7 of FIG. 1;



FIG. 8 is a cross-sectional view thereof, taken along the line 8-8 of FIG. 2;



FIG. 9 is a perspective view thereof; and,



FIG. 10 is a perspective view thereof.


Claims
  • The ornamental design for a X-ray residual stress measuring instrument, as shown and described.
Priority Claims (1)
Number Date Country Kind
2014-003304 Feb 2014 JP national
US Referenced Citations (8)
Number Name Date Kind
4694480 Skillicorn Sep 1987 A
D371197 Golden Jun 1996 S
D554754 Ito Nov 2007 S
7515684 Gibson Apr 2009 B2
D628296 Hoshino Nov 2010 S
D676554 Moon Feb 2013 S
D724214 Ihara Mar 2015 S
9146203 Toraya Sep 2015 B2