3i Systems Corporation

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Sunnyvale, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Automatic inspection system for flat panel substrate
- Patent number 7,714,996
- Issue date May 11, 2010
- 3i Systems Corporation
- Zheng Yan
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for inspecting surfaces with improved light effic...
- Patent number 7,564,544
- Issue date Jul 21, 2009
- 3i Systems Corporation
- Guoheng Zhao
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for improved defect sensitivity for inspecting su...
- Patent number 7,221,444
- Issue date May 22, 2007
- 3i Systems Inc.
- Guoheng Zhao
- G01 - MEASURING TESTING

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Patents Applicationslast 30 patents

Information Patent Application
Method and system for inspecting surfaces with improved light effic...
- Publication number 20070222974
- Publication date Sep 27, 2007
- 3i Systems, Inc.
- Guoheng Zhao
- G01 - MEASURING TESTING