Abberior Instruments GmbH

Organization

Organizations

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Patents Grantslast 30 patents

Information Patent Grant
Detecting movements of a sample with respect to an objective
- Patent number 12,111,455
- Issue date Oct 8, 2024
- ABBERIOR INSTRUMENTS GMBH
- Roman Schmidt
- G02 - OPTICS
Information Patent Grant
Method and light microscope for a high-resolution examination of a...
- Patent number 12,055,728
- Issue date Aug 6, 2024
- ABBERIOR INSTRUMENTS GMBH
- Roman Schmidt
- G02 - OPTICS
Information Patent Grant
Method of and microscope comprising a device for detecting movement...
- Patent number 11,967,090
- Issue date Apr 23, 2024
- Abberior Instruments GmbH
- Roman Schmidt
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Bandpass filter for light having variable lower and upper cut-off w...
- Patent number 11,947,097
- Issue date Apr 2, 2024
- ABBERIOR INSTRUMENTS GMBH
- Joachim Fischer
- G02 - OPTICS
Information Patent Grant
Method, computer program, and apparatus for adapting an estimator f...
- Patent number 11,933,729
- Issue date Mar 19, 2024
- ABBERIOR INSTRUMENTS GMBH
- Roman Schmidt
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Apparatus for monitoring a focal state of microscope
- Patent number 11,774,740
- Issue date Oct 3, 2023
- ABBERIOR INSTRUMENTS GMBH
- Joachim Fischer
- G02 - OPTICS
Information Patent Grant
Fluorescence microscope with stabilized adjustment and group of com...
- Patent number 11,598,943
- Issue date Mar 7, 2023
- ABBERIOR INSTRUMENTS GMBH
- Joern Heine
- G01 - MEASURING TESTING
Information Patent Grant
Methods and apparatuses for checking the confocality of a scanning...
- Patent number 11,493,744
- Issue date Nov 8, 2022
- ABBERIOR INSTRUMENTS GMBH
- Joachim Fischer
- G02 - OPTICS
Information Patent Grant
Apparatus for selectively shaping phase fronts of a light beam, and...
- Patent number 11,460,618
- Issue date Oct 4, 2022
- ABBERIOR INSTRUMENTS GMBH
- Matthias Reuss
- G02 - OPTICS
Information Patent Grant
Method of aligning a laser-scanning fluorescence microscope and las...
- Patent number 11,131,630
- Issue date Sep 28, 2021
- ABBERIOR INSTRUMENTS GMBH
- Joern Heine
- G02 - OPTICS
Information Patent Grant
Method, device and laser scanning microscope for generating rasteri...
- Patent number 10,795,140
- Issue date Oct 6, 2020
- ABBERIOR INSTRUMENTS GMBH
- Andreas Schoenle
- G01 - MEASURING TESTING
Information Patent Grant
Methods of high-resolution imaging a structure of a sample, the str...
- Patent number 10,488,342
- Issue date Nov 26, 2019
- ABBERIOR INSTRUMENTS GMBH
- Andreas Schoenle
- G01 - MEASURING TESTING
Information Patent Grant
Methods of high-resolution imaging a structure of a sample, the str...
- Patent number 10,429,305
- Issue date Oct 1, 2019
- ABBERIOR INSTRUMENTS GMBH
- Andreas Schoenle
- G02 - OPTICS
Information Patent Grant
Method of using a high resolution laser scanning microscope and hig...
- Patent number 10,386,621
- Issue date Aug 20, 2019
- ABBERIOR INSTRUMENTS GMBH
- Benjamin Harke
- G01 - MEASURING TESTING
Information Patent Grant
Scanner head and device with scanner head
- Patent number 9,645,376
- Issue date May 9, 2017
- ABBERIOR INSTRUMENTS GMBH
- Joachim Fischer
- G02 - OPTICS
Information Patent Grant
Device for separately modulating the wave fronts of two components...
- Patent number 9,632,297
- Issue date Apr 25, 2017
- ABBERIOR INSTRUMENTS GMBH
- Matthias Reuss
- G02 - OPTICS

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Patents Applicationslast 30 patents

Information Patent Application
METHOD, DEVICE AND COMPUTER PROGRAM FOR LOCALIZING AND/OR IMAGING L...
- Publication number 20240393249
- Publication date Nov 28, 2024
- Abberior Instruments GmbH
- Andreas SCHONLE
- G02 - OPTICS
Information Patent Application
LIGHT MICROSCOPY METHOD, DEVICE AND COMPUTER PROGRAM PRODUCT
- Publication number 20240346839
- Publication date Oct 17, 2024
- Abberior Instruments GmbH
- Jorn HEINE
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
LIGHT MICROSCOPY METHOD, DEVICE AND COMPUTER PROGRAM PRODUCT
- Publication number 20240346810
- Publication date Oct 17, 2024
- Abberior Instruments GmbH
- Jorn HEINE
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHODS AND DEVICE FOR DETECTING SINGLE PHOTONS FROM A SAMPLE COMPR...
- Publication number 20240280488
- Publication date Aug 22, 2024
- Abberior Instruments GmbH
- Andreas SCHONLE
- G01 - MEASURING TESTING
Information Patent Application
FOCUSING DEVICE, FOCUSING SYSTEM, MICROSCOPE AND METHOD FOR IMAGING...
- Publication number 20240264420
- Publication date Aug 8, 2024
- Abberior Instruments GmbH
- Benjamin HARKE
- G02 - OPTICS
Information Patent Application
LIGHT MODULATION DEVICE FOR A MICROSCOPE, MICROSCOPE AND METHOD FOR...
- Publication number 20240248291
- Publication date Jul 25, 2024
- Abberior Instruments GmbH
- Benjamin HARKE
- G02 - OPTICS
Information Patent Application
LUMINESCENCE MICROSCOPE FOR IMAGING A SAMPLE OR FOR LOCALIZING OR T...
- Publication number 20240231066
- Publication date Jul 11, 2024
- Abberior Instruments GmbH
- Joachim FISCHER
- G02 - OPTICS
Information Patent Application
METHOD, COMPUTER PROGRAM, AND APPARATUS FOR ADAPTING AN ESTIMATOR F...
- Publication number 20240219304
- Publication date Jul 4, 2024
- Abberior Instruments GmbH
- Roman SCHMIDT
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD, DEVICE AND COMPUTER PROGRAM FOR DETERMINING A POSITION OF A...
- Publication number 20240183782
- Publication date Jun 6, 2024
- Abberior Instruments GmbH
- Gerald DONNERT
- G01 - MEASURING TESTING
Information Patent Application
INTERRUPTER CIRCUIT WITH DIAGNOSTIC CIRCUIT
- Publication number 20240145189
- Publication date May 2, 2024
- Abberior Instruments GmbH
- Lars KASTRUP
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
LUMINESCENCE MICROSCOPE FOR IMAGING A SAMPLE OR FOR LOCALIZING OR T...
- Publication number 20240134176
- Publication date Apr 25, 2024
- Abberior Instruments GmbH
- Joachim FISCHER
- G02 - OPTICS
Information Patent Application
METHODS, COMPUTER PROGRAMS AND APPARATUS FOR ESTIMATING A POSITION...
- Publication number 20240133811
- Publication date Apr 25, 2024
- Abberior Instruments GmbH
- Roman SCHMIDT
- G01 - MEASURING TESTING
Information Patent Application
METHOD, LIGHT MICROSCOPE, AND COMPUTER PROGRAM FOR LOCALIZING OR TR...
- Publication number 20240094128
- Publication date Mar 21, 2024
- Abberior Instruments GmbH
- Roman SCHMIDT
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND LIGHT MICROSCOPE FOR A HIGH-RESOLUTION EXAMINATION OF A...
- Publication number 20240085680
- Publication date Mar 14, 2024
- Abberior Instruments GmbH
- Roman SCHMIDT
- G02 - OPTICS
Information Patent Application
METHOD AND LIGHT MICROSCOPE FOR LOCALIZING INDIVIDUAL EMITTERS IN A...
- Publication number 20240045190
- Publication date Feb 8, 2024
- Abberior Instruments GmbH
- Roman SCHMIDT
- G02 - OPTICS
Information Patent Application
METHOD, DEVICE AND NON-TRANSITORY COMPUTER-READABLE MEDIUM FOR LOCA...
- Publication number 20240046595
- Publication date Feb 8, 2024
- Abberior Instruments GmbH
- Roman SCHMIDT
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD AND FLUORESCENCE MICROSCOPE FOR DETERMINING THE LOCATION OF...
- Publication number 20230384223
- Publication date Nov 30, 2023
- Abberior Instruments GmbH
- Benjamin HARKE
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD, LIGHT MICROSCOPE AND COMPUTER PROGRAM FOR DETERMINING A REF...
- Publication number 20230375473
- Publication date Nov 23, 2023
- Abberior Instruments GmbH
- Benjamin HARKE
- G02 - OPTICS
Information Patent Application
METHOD AND APPARATUS FOR HIGH-RESOLUTION LOCALIZATION OF A SINGLE E...
- Publication number 20230350179
- Publication date Nov 2, 2023
- Abberior Instruments GmbH
- Roman Schmidt
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND DEVICE FOR CAPTURING NANOSCOPIC IMAGES OF SAMPLES DYED W...
- Publication number 20230296520
- Publication date Sep 21, 2023
- Abberior Instruments GmbH
- Benjamin HARKE
- G01 - MEASURING TESTING
Information Patent Application
High-Resolution Microscope with a Housing Covering Optical Elements...
- Publication number 20230251478
- Publication date Aug 10, 2023
- Abberior Instruments GmbH
- Lars Kastrup
- G02 - OPTICS
Information Patent Application
METHOD, APPARATUS AND COMPUTER PROGRAM FOR LOCALIZING AN EMITTER IN...
- Publication number 20230251479
- Publication date Aug 10, 2023
- Abberior Instruments GmbH
- Roman SCHMIDT
- G01 - MEASURING TESTING
Information Patent Application
Apparatuses for Testing the lateral and Axial Confocality of a Scan...
- Publication number 20230194383
- Publication date Jun 22, 2023
- Abberior Instruments GmbH
- Joachim Fischer
- G01 - MEASURING TESTING
Information Patent Application
DETECTION DEVICE FOR A LASER SCANNING MICROSCOPE
- Publication number 20230176353
- Publication date Jun 8, 2023
- Abberior Instruments GmbH
- Haugen MITTELSTÄDT
- G02 - OPTICS
Information Patent Application
METHOD OF DISTURBANCE CORRECTION, AND LASER SCANNING MICROSCOPE HAV...
- Publication number 20230003651
- Publication date Jan 5, 2023
- Abberior Instruments GmbH
- Benjamin HARKE
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR CORRECTING ABERRATIONS IN FLUORESCENCE MIC...
- Publication number 20220244515
- Publication date Aug 4, 2022
- Abberior Instruments GmbH
- Matthias Reuss
- G02 - OPTICS
Information Patent Application
METHODS AND APPARATUSES FOR CHECKING THE CONFOCALITY OF A SCANNING...
- Publication number 20220113524
- Publication date Apr 14, 2022
- Abberior Instruments GmbH
- Joachim Fischer
- G02 - OPTICS
Information Patent Application
METHOD OF AND MICROSCOPE COMPRISING A DEVICE FOR DETECTING MOVEMENT...
- Publication number 20220114738
- Publication date Apr 14, 2022
- Abberior Instruments GmbH
- Roman Schmidt
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method and device for illuminating a sample in a microscope in points
- Publication number 20220057615
- Publication date Feb 24, 2022
- Abberior Instruments GmbH
- Benjamin HARKE
- G02 - OPTICS
Information Patent Application
METHOD, COMPUTER PROGRAM, AND APPARATUS FOR ADAPTING AN ESTIMATOR F...
- Publication number 20220042914
- Publication date Feb 10, 2022
- Abberior Instruments GmbH
- Roman SCHMIDT
- G01 - MEASURING TESTING

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Trademarklast 30 trademarks

Information Trademark
98705854 - RAYSHAPE
- Serial number 98705854
- Filing date Aug 19, 2024
- Abberior Instruments GmbH
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
98705861 - FLEXPOSURE
- Serial number 98705861
- Filing date Aug 19, 2024
- Abberior Instruments GmbH
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
79215075
- Serial number 79215075
- Registration number 5420694
- Filing date May 12, 2017
- Abberior Instruments GmbH
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
79191277 - STEDYCON
- Serial number 79191277
- Registration number 5229966
- Filing date Jun 27, 2016
- Abberior Instruments GmbH
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
79193761 - ABBERIOR
- Serial number 79193761
- Registration number 5388753
- Filing date Jun 27, 2016
- Abberior Instruments GmbH
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments

Abberior Instruments GmbH

Organization

Patents Grantslast 30 patents

Detecting movements of a sample with respect to an objective

Method and light microscope for a high-resolution examination of a...

Method of and microscope comprising a device for detecting movement...

Bandpass filter for light having variable lower and upper cut-off w...

Method, computer program, and apparatus for adapting an estimator f...

Apparatus for monitoring a focal state of microscope

Fluorescence microscope with stabilized adjustment and group of com...

Methods and apparatuses for checking the confocality of a scanning...

Apparatus for selectively shaping phase fronts of a light beam, and...

Method of aligning a laser-scanning fluorescence microscope and las...

Method, device and laser scanning microscope for generating rasteri...

Methods of high-resolution imaging a structure of a sample, the str...

Methods of high-resolution imaging a structure of a sample, the str...

Method of using a high resolution laser scanning microscope and hig...

Scanner head and device with scanner head

Device for separately modulating the wave fronts of two components...

Patents Applicationslast 30 patents

METHOD, DEVICE AND COMPUTER PROGRAM FOR LOCALIZING AND/OR IMAGING L...

LIGHT MICROSCOPY METHOD, DEVICE AND COMPUTER PROGRAM PRODUCT

LIGHT MICROSCOPY METHOD, DEVICE AND COMPUTER PROGRAM PRODUCT

METHODS AND DEVICE FOR DETECTING SINGLE PHOTONS FROM A SAMPLE COMPR...

FOCUSING DEVICE, FOCUSING SYSTEM, MICROSCOPE AND METHOD FOR IMAGING...

LIGHT MODULATION DEVICE FOR A MICROSCOPE, MICROSCOPE AND METHOD FOR...

LUMINESCENCE MICROSCOPE FOR IMAGING A SAMPLE OR FOR LOCALIZING OR T...

METHOD, COMPUTER PROGRAM, AND APPARATUS FOR ADAPTING AN ESTIMATOR F...

METHOD, DEVICE AND COMPUTER PROGRAM FOR DETERMINING A POSITION OF A...

INTERRUPTER CIRCUIT WITH DIAGNOSTIC CIRCUIT

LUMINESCENCE MICROSCOPE FOR IMAGING A SAMPLE OR FOR LOCALIZING OR T...

METHODS, COMPUTER PROGRAMS AND APPARATUS FOR ESTIMATING A POSITION...

METHOD, LIGHT MICROSCOPE, AND COMPUTER PROGRAM FOR LOCALIZING OR TR...

METHOD AND LIGHT MICROSCOPE FOR A HIGH-RESOLUTION EXAMINATION OF A...

METHOD AND LIGHT MICROSCOPE FOR LOCALIZING INDIVIDUAL EMITTERS IN A...

METHOD, DEVICE AND NON-TRANSITORY COMPUTER-READABLE MEDIUM FOR LOCA...

METHOD AND FLUORESCENCE MICROSCOPE FOR DETERMINING THE LOCATION OF...

METHOD, LIGHT MICROSCOPE AND COMPUTER PROGRAM FOR DETERMINING A REF...

METHOD AND APPARATUS FOR HIGH-RESOLUTION LOCALIZATION OF A SINGLE E...

METHOD AND DEVICE FOR CAPTURING NANOSCOPIC IMAGES OF SAMPLES DYED W...

High-Resolution Microscope with a Housing Covering Optical Elements...

METHOD, APPARATUS AND COMPUTER PROGRAM FOR LOCALIZING AN EMITTER IN...

Apparatuses for Testing the lateral and Axial Confocality of a Scan...

DETECTION DEVICE FOR A LASER SCANNING MICROSCOPE

METHOD OF DISTURBANCE CORRECTION, AND LASER SCANNING MICROSCOPE HAV...

METHOD AND APPARATUS FOR CORRECTING ABERRATIONS IN FLUORESCENCE MIC...

METHODS AND APPARATUSES FOR CHECKING THE CONFOCALITY OF A SCANNING...

METHOD OF AND MICROSCOPE COMPRISING A DEVICE FOR DETECTING MOVEMENT...

Method and device for illuminating a sample in a microscope in points

METHOD, COMPUTER PROGRAM, AND APPARATUS FOR ADAPTING AN ESTIMATOR F...

Trademarklast 30 trademarks

98705854 - RAYSHAPE

98705861 - FLEXPOSURE

79215075

79191277 - STEDYCON

79193761 - ABBERIOR