Abhee 1, L.P.

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Los Altos, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Junction photovoltage probe face
- Patent number D645768
- Issue date Sep 27, 2011
- Abhee 1, L.P.
- Yuen Lim
- D10 - Measuring, testing, or signalling instruments
Information Patent Grant
Non contact method and apparatus for measurement of sheet resistanc...
- Patent number 7,804,294
- Issue date Sep 28, 2010
- Abhee 1, L.P.
- Vladimir Faifer
- G01 - MEASURING TESTING