Acorn Technologies, Inc.

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La Jolla, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Communication system determining time of arrival using matching pur...
- Patent number 10,749,778
- Issue date Aug 18, 2020
- Acorn Technologies, Inc.
- Steven C Thompson
- G01 - MEASURING TESTING
Information Patent Grant
Method for depinning the fermi level of a semiconductor at an elect...
- Patent number 10,388,748
- Issue date Aug 20, 2019
- Acorn Technologies, Inc.
- Daniel E. Grupp
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Tensile strained semiconductor photon emission and detection device...
- Patent number 10,193,307
- Issue date Jan 29, 2019
- Acorn Technologies, Inc.
- Paul A. Clifton
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Method for depinning the fermi level of a semiconductor at an elect...
- Patent number 10,186,592
- Issue date Jan 22, 2019
- Acorn Technologies, Inc.
- Daniel E. Grupp
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Nanowire transistor with source and drain induced by electrical con...
- Patent number 10,170,627
- Issue date Jan 1, 2019
- Acorn Technologies, Inc.
- Paul A. Clifton
- B82 - NANO-TECHNOLOGY
Information Patent Grant
MIS contact structure with metal oxide conductor
- Patent number 10,147,798
- Issue date Dec 4, 2018
- Acorn Technologies, Inc.
- Paul A. Clifton
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for depinning the Fermi level of a semiconductor at an elect...
- Patent number 10,090,395
- Issue date Oct 2, 2018
- Acorn Technologies, Inc.
- Daniel E. Grupp
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Strained semiconductor using elastic edge relaxation of a stressor...
- Patent number 10,084,091
- Issue date Sep 25, 2018
- Acorn Technologies, Inc.
- Paul A. Clifton
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Tensile strained semiconductor photon emission and detection device...
- Patent number 10,008,827
- Issue date Jun 26, 2018
- Acorn Technologies, Inc.
- Paul A. Clifton
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Method for depinning the fermi level of a semiconductor at an elect...
- Patent number 9,905,691
- Issue date Feb 27, 2018
- Acorn Technologies, Inc.
- Daniel E. Grupp
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for depinning the Fermi level of a semiconductor at an elect...
- Patent number 9,812,542
- Issue date Nov 7, 2017
- Acorn Technologies, Inc.
- Daniel E. Grupp
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Least squares channel identification for OFDM Systems
- Patent number 9,762,414
- Issue date Sep 12, 2017
- Acorn Technologies, Inc.
- Fernando Lopez de Victoria
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Metal contacts to group IV semiconductors by inserting interfacial...
- Patent number 9,755,038
- Issue date Sep 5, 2017
- Acorn Technologies, Inc.
- Walter A Harrison
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Strained semiconductor using elastic edge relaxation of a stressor...
- Patent number 9,673,327
- Issue date Jun 6, 2017
- Acorn Technologies, Inc.
- Paul A. Clifton
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
MIS contact structure with metal oxide conductor
- Patent number 9,620,611
- Issue date Apr 11, 2017
- ACORN TECHNOLOGY, INC.
- Paul A. Clifton
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Insulated gate field effect transistor having passivated schottky b...
- Patent number 9,583,614
- Issue date Feb 28, 2017
- Acorn Technologies, Inc.
- Daniel E. Grupp
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
OFDM receiver with time domain channel estimation
- Patent number 9,497,046
- Issue date Nov 15, 2016
- Acorn Technologies, Inc.
- Steven C Thompson
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Metal contacts to group IV semiconductors by inserting interfacial...
- Patent number 9,484,426
- Issue date Nov 1, 2016
- Acorn Technologies, Inc.
- Walter A Harrison
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for depinning the Fermi level of a semiconductor at an elect...
- Patent number 9,461,167
- Issue date Oct 4, 2016
- Acorn Technologies, Inc.
- Daniel E. Grupp
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for depinning the Fermi level of a semiconductor at an elect...
- Patent number 9,425,277
- Issue date Aug 23, 2016
- Acorn Technologies, Inc.
- Daniel E. Grupp
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Strained semiconductor using elastic edge relaxation of a stressor...
- Patent number 9,406,798
- Issue date Aug 2, 2016
- Acorn Technologies, Inc.
- Paul A. Clifton
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Metal contacts to group IV semiconductors by inserting interfacial...
- Patent number 9,362,376
- Issue date Jun 7, 2016
- Acorn Technologies, Inc.
- Walter A Harrison
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Block time domain channel estimation in OFDM system
- Patent number 9,319,260
- Issue date Apr 19, 2016
- Acorn Technologies, Inc.
- Steven C Thompson
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Tensile strained semiconductor photon emission and detection device...
- Patent number 9,270,083
- Issue date Feb 23, 2016
- Acorn Technologies, Inc.
- Paul A. Clifton
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Method for depinning the fermi level of a semiconductor at an elect...
- Patent number 9,209,261
- Issue date Dec 8, 2015
- Acorn Technologies, Inc.
- Daniel E. Grupp
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Non-linear time domain channel estimation in OFDM systems
- Patent number 9,154,337
- Issue date Oct 6, 2015
- Acorn Technologies, Inc.
- Steven C Thompson
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Method and system for activation of performance enhancements for mo...
- Patent number 9,094,821
- Issue date Jul 28, 2015
- Acorn Technologies, Inc.
- Steven J. Caliguri
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Transistor with longitudinal strain in channel induced by buried st...
- Patent number 9,059,201
- Issue date Jun 16, 2015
- Acorn Technologies, Inc.
- Paul A. Clifton
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Tensile strained semiconductor photon emission and detection device...
- Patent number 9,036,672
- Issue date May 19, 2015
- Acorn Technologies, Inc.
- Paul A. Clifton
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Strain-enhanced silicon photon-to-electron conversion devices
- Patent number 9,029,686
- Issue date May 12, 2015
- Acorn Technologies, Inc.
- Paul A Clifton
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...

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Patents Applicationslast 30 patents

Information Patent Application
SOI WAFERS AND DEVICES WITH BURIED STRESSOR
- Publication number 20200273991
- Publication date Aug 27, 2020
- Acorn Technologies, Inc.
- Paul A. Clifton
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TENSILE STRAINED SEMICONDUCTOR PHOTON EMISSION AND DETECTION DEVICE...
- Publication number 20190115726
- Publication date Apr 18, 2019
- Acorn Technologies, Inc.
- Paul A. Clifton
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
NANOWIRE TRANSISTOR WITH SOURCE AND DRAIN INDUCED BY ELECTRICAL CON...
- Publication number 20190109241
- Publication date Apr 11, 2019
- Acorn Technologies, Inc.
- Paul A. Clifton
- B82 - NANO-TECHNOLOGY
Information Patent Application
MIS CONTACT STRUCTURE WITH METAL OXIDE CONDUCTOR
- Publication number 20190067439
- Publication date Feb 28, 2019
- Acorn Technologies, Inc.
- Paul A. Clifton
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
STRAINED SEMICONDUCTOR USING ELASTIC EDGE RELAXATION OF A STRESSOR...
- Publication number 20190006518
- Publication date Jan 3, 2019
- Acorn Technologies, Inc.
- Paul A. Clifton
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR DEPINNING THE FERMI LEVEL OF A SEMICONDUCTOR AT AN ELECT...
- Publication number 20180269298
- Publication date Sep 20, 2018
- Acorn Technologies, Inc.
- Daniel E. Grupp
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
STRAINED SEMICONDUCTOR-ON-INSULATOR BY DEFORMATION OF BURIED INSULA...
- Publication number 20180212056
- Publication date Jul 26, 2018
- Acorn Technologies, Inc.
- Paul A. Clifton
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR DEPINNING THE FERMI LEVEL OF A SEMICONDUCTOR AT AN ELECT...
- Publication number 20180166552
- Publication date Jun 14, 2018
- Acorn Technologies, Inc.
- Daniel E. Grupp
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
NANOWIRE TRANSISTOR WITH SOURCE AND DRAIN INDUCED BY ELECTRICAL CON...
- Publication number 20180145184
- Publication date May 24, 2018
- Acorn Technologies, Inc.
- Paul A. Clifton
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MIS CONTACT STRUCTURE WITH METAL OXIDE CONDUCTOR
- Publication number 20180083115
- Publication date Mar 22, 2018
- Acorn Technologies, Inc.
- Paul A. Clifton
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TENSILE STRAINED SEMICONDUCTOR PHOTON EMISSION AND DETECTION DEVICE...
- Publication number 20180062352
- Publication date Mar 1, 2018
- Acorn Technologies, Inc.
- Paul A. Clifton
- B82 - NANO-TECHNOLOGY
Information Patent Application
METHOD FOR DEPINNING THE FERMI LEVEL OF A SEMICONDUCTOR AT AN ELECT...
- Publication number 20180033862
- Publication date Feb 1, 2018
- Acorn Technologies, Inc.
- Daniel E. Grupp
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METAL CONTACTS TO GROUP IV SEMICONDUCTORS BY INSERTING INTERFACIAL...
- Publication number 20170373164
- Publication date Dec 28, 2017
- Acorn Technologies, Inc.
- Walter A. Harrison
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SOI WAFERS AND DEVICES WITH BURIED STRESSOR
- Publication number 20170323973
- Publication date Nov 9, 2017
- Acorn Technologies, Inc.
- Paul A. Clifton
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
STRAINED SEMICONDUCTOR USING ELASTIC EDGE RELAXATION OF A STRESSOR...
- Publication number 20170250283
- Publication date Aug 31, 2017
- Acorn Technologies, Inc.
- Paul A. Clifton
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INSULATED GATE FIELD EFFECT TRANSISTOR HAVING PASSIVATED SCHOTTKY B...
- Publication number 20170133476
- Publication date May 11, 2017
- Acorn Technologies, Inc.
- Daniel E. Grupp
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Communication System Determining Time of Arrival Using Matching Pur...
- Publication number 20170034027
- Publication date Feb 2, 2017
- Acorn Technologies, Inc.
- Steven C. Thompson
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
METHOD FOR DEPINNING THE FERMI LEVEL OF A SEMICONDUCTOR AT AN ELECT...
- Publication number 20160372564
- Publication date Dec 22, 2016
- Acorn Technologies, Inc.
- Daniel E. Grupp
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
STRAINED SEMICONDUCTOR USING ELASTIC EDGE RELAXATION OF A STRESSOR...
- Publication number 20160308057
- Publication date Oct 20, 2016
- Acorn Technologies, Inc.
- Paul A. Clifton
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METAL CONTACTS TO GROUP IV SEMICONDUCTORS BY INSERTING INTERFACIAL...
- Publication number 20160247890
- Publication date Aug 25, 2016
- Acorn Technologies, Inc.
- Walter A. Harrison
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
STRAINED SEMICONDUCTOR USING ELASTIC EDGE RELAXATION OF A STRESSOR...
- Publication number 20160240678
- Publication date Aug 18, 2016
- Acorn Technologies, Inc.
- Paul A. Clifton
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Least Squares Channel Identification for OFDM Systems
- Publication number 20160234042
- Publication date Aug 11, 2016
- Acorn Technologies, Inc.
- Fernando Lopez de Victoria
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
TENSILE STRAINED SEMICONDUCTOR PHOTON EMISSION AND DETECTION DEVICE...
- Publication number 20160211649
- Publication date Jul 21, 2016
- Acorn Technologies, Inc.
- Paul A. Clifton
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR DEPINNING THE FERMI LEVEL OF A SEMICONDUCTOR AT AN ELECT...
- Publication number 20160172491
- Publication date Jun 16, 2016
- Acorn Technologies, Inc.
- Daniel E. Grupp
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR DEPINNING THE FERMI LEVEL OF A SEMICONDUCTOR AT AN ELECT...
- Publication number 20160172492
- Publication date Jun 16, 2016
- Acorn Technologies, Inc.
- Daniel E. Grupp
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METAL CONTACTS TO GROUP IV SEMICONDUCTORS BY INSERTING INTERFACIAL...
- Publication number 20160163813
- Publication date Jun 9, 2016
- Acorn Technologies, Inc.
- Walter A. Harrison
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Least Squares Channel Identification for OFDM Systems
- Publication number 20150333933
- Publication date Nov 19, 2015
- Acorn Technologies, Inc.
- Fernando Lopez de Victoria
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
METHOD FOR DEPINNING THE FERMI LEVEL OF A SEMICONDUCTOR AT AN ELECT...
- Publication number 20150287800
- Publication date Oct 8, 2015
- Acorn Technologies, Inc.
- Daniel E. Grupp
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Tensile Strained Semiconductor Photon Emission and Detection Device...
- Publication number 20150249320
- Publication date Sep 3, 2015
- Acorn Technologies, Inc.
- Paul A. Clifton
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
BLOCK TIME DOMAIN CHANNEL ESTIMATION IN OFDM SYSTEM
- Publication number 20150043629
- Publication date Feb 12, 2015
- Acorn Technologies, Inc.
- Steven C. Thompson
- H04 - ELECTRIC COMMUNICATION TECHNIQUE

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Trademarklast 30 trademarks

Information Trademark
90385768 - TRUE NORTON
- Serial number 90385768
- Filing date Dec 16, 2020
- Acorn Technologies, Inc.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
90385766 - GEO NORTON
- Serial number 90385766
- Filing date Dec 16, 2020
- Acorn Technologies, Inc.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
90385771 - NORTLOCATION
- Serial number 90385771
- Filing date Dec 16, 2020
- Acorn Technologies, Inc.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
88637858 - PHY WIRELESS
- Serial number 88637858
- Registration number 6397354
- Filing date Oct 1, 2019
- Acorn Technologies, Inc.
- 38 - Telecommunications
Information Trademark
85151514 - HELLAPHY
- Serial number 85151514
- Registration number 4214550
- Filing date Oct 13, 2010
- Acorn Technologies, Inc.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
77042526 - AXFET
- Serial number 77042526
- Filing date Nov 13, 2006
- Acorn Technologies Inc.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
78629222 - XMOS
- Serial number 78629222
- Filing date May 12, 2005
- Acorn Technologies Inc.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments

Acorn Technologies, Inc.

Organization

Patents Grantslast 30 patents

Communication system determining time of arrival using matching pur...

Method for depinning the fermi level of a semiconductor at an elect...

Tensile strained semiconductor photon emission and detection device...

Method for depinning the fermi level of a semiconductor at an elect...

Nanowire transistor with source and drain induced by electrical con...

MIS contact structure with metal oxide conductor

Method for depinning the Fermi level of a semiconductor at an elect...

Strained semiconductor using elastic edge relaxation of a stressor...

Tensile strained semiconductor photon emission and detection device...

Method for depinning the fermi level of a semiconductor at an elect...

Method for depinning the Fermi level of a semiconductor at an elect...

Least squares channel identification for OFDM Systems

Metal contacts to group IV semiconductors by inserting interfacial...

Strained semiconductor using elastic edge relaxation of a stressor...

MIS contact structure with metal oxide conductor

Insulated gate field effect transistor having passivated schottky b...

OFDM receiver with time domain channel estimation

Metal contacts to group IV semiconductors by inserting interfacial...

Method for depinning the Fermi level of a semiconductor at an elect...

Method for depinning the Fermi level of a semiconductor at an elect...

Strained semiconductor using elastic edge relaxation of a stressor...

Metal contacts to group IV semiconductors by inserting interfacial...

Block time domain channel estimation in OFDM system

Tensile strained semiconductor photon emission and detection device...

Method for depinning the fermi level of a semiconductor at an elect...

Non-linear time domain channel estimation in OFDM systems

Method and system for activation of performance enhancements for mo...

Transistor with longitudinal strain in channel induced by buried st...

Tensile strained semiconductor photon emission and detection device...

Strain-enhanced silicon photon-to-electron conversion devices

Patents Applicationslast 30 patents

SOI WAFERS AND DEVICES WITH BURIED STRESSOR

TENSILE STRAINED SEMICONDUCTOR PHOTON EMISSION AND DETECTION DEVICE...

NANOWIRE TRANSISTOR WITH SOURCE AND DRAIN INDUCED BY ELECTRICAL CON...

MIS CONTACT STRUCTURE WITH METAL OXIDE CONDUCTOR

STRAINED SEMICONDUCTOR USING ELASTIC EDGE RELAXATION OF A STRESSOR...

METHOD FOR DEPINNING THE FERMI LEVEL OF A SEMICONDUCTOR AT AN ELECT...

STRAINED SEMICONDUCTOR-ON-INSULATOR BY DEFORMATION OF BURIED INSULA...

METHOD FOR DEPINNING THE FERMI LEVEL OF A SEMICONDUCTOR AT AN ELECT...

NANOWIRE TRANSISTOR WITH SOURCE AND DRAIN INDUCED BY ELECTRICAL CON...

MIS CONTACT STRUCTURE WITH METAL OXIDE CONDUCTOR

TENSILE STRAINED SEMICONDUCTOR PHOTON EMISSION AND DETECTION DEVICE...

METHOD FOR DEPINNING THE FERMI LEVEL OF A SEMICONDUCTOR AT AN ELECT...

METAL CONTACTS TO GROUP IV SEMICONDUCTORS BY INSERTING INTERFACIAL...

SOI WAFERS AND DEVICES WITH BURIED STRESSOR

STRAINED SEMICONDUCTOR USING ELASTIC EDGE RELAXATION OF A STRESSOR...

INSULATED GATE FIELD EFFECT TRANSISTOR HAVING PASSIVATED SCHOTTKY B...

Communication System Determining Time of Arrival Using Matching Pur...

METHOD FOR DEPINNING THE FERMI LEVEL OF A SEMICONDUCTOR AT AN ELECT...

STRAINED SEMICONDUCTOR USING ELASTIC EDGE RELAXATION OF A STRESSOR...

METAL CONTACTS TO GROUP IV SEMICONDUCTORS BY INSERTING INTERFACIAL...

STRAINED SEMICONDUCTOR USING ELASTIC EDGE RELAXATION OF A STRESSOR...

Least Squares Channel Identification for OFDM Systems

TENSILE STRAINED SEMICONDUCTOR PHOTON EMISSION AND DETECTION DEVICE...

METHOD FOR DEPINNING THE FERMI LEVEL OF A SEMICONDUCTOR AT AN ELECT...

METHOD FOR DEPINNING THE FERMI LEVEL OF A SEMICONDUCTOR AT AN ELECT...

METAL CONTACTS TO GROUP IV SEMICONDUCTORS BY INSERTING INTERFACIAL...

Least Squares Channel Identification for OFDM Systems

METHOD FOR DEPINNING THE FERMI LEVEL OF A SEMICONDUCTOR AT AN ELECT...

Tensile Strained Semiconductor Photon Emission and Detection Device...

BLOCK TIME DOMAIN CHANNEL ESTIMATION IN OFDM SYSTEM

Trademarklast 30 trademarks

90385768 - TRUE NORTON

90385766 - GEO NORTON

90385771 - NORTLOCATION

88637858 - PHY WIRELESS

85151514 - HELLAPHY

77042526 - AXFET

78629222 - XMOS