ACT Advanced Circuit Testing Gesellschaft fur Testsystementwicklung mbH

Organization

  • Munich, DE

Patents Grantslast 30 patents

  • Information Patent Grant

    Detector objective lens

    • Patent number 5,895,917
    • Issue date Apr 20, 1999
    • ACT Advanced Circuit Testing Gesellschaft fur Testsystementwicklung mbH
    • Koshi Ueda
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    Deflection system

    • Patent number 5,847,399
    • Issue date Dec 8, 1998
    • ACT Advanced Circuit Testing Gesellschaft fur Testsystementwicklung mbH
    • Reinhold Schmitt
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    Apparatus for generating an electron beam

    • Patent number 5,808,309
    • Issue date Sep 15, 1998
    • ACT Advanced Circuit Testing Gesellschaft fur Testsystementwicklung mbH
    • Rainer Spehr
    • H01 - BASIC ELECTRIC ELEMENTS