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Active Impulse Systems, Inc.
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Natick, MA, US
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Patents Grants
last 30 patents
Information
Patent Grant
Method and device for measuring the thickness of opaque and transpa...
Patent number
6,348,967
Issue date
Feb 19, 2002
Active Impulse Systems, Inc.
Keith A. Nelson
G01 - MEASURING TESTING
Information
Patent Grant
Method and device for measuring the thickness of thin films near a...
Patent number
6,256,100
Issue date
Jul 3, 2001
Active Impulse Systems, Inc.
Matthew J. Banet
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for measuring material properties using transi...
Patent number
6,175,421
Issue date
Jan 16, 2001
Active Impulse Systems
Martin Fuchs
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for measuring the concentration of ions implan...
Patent number
6,118,533
Issue date
Sep 12, 2000
Active Impulse Systems, Inc.
Matthew J. Banet
G01 - MEASURING TESTING
Information
Patent Grant
Method and device for measuring the thickness of opaque and transpa...
Patent number
6,081,330
Issue date
Jun 27, 2000
Active Impulse Systems, Inc.
Keith A. Nelson
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for measuring material properties using transi...
Patent number
6,075,602
Issue date
Jun 13, 2000
Active Impulse Systems, Inc.
Martin Fuchs
G01 - MEASURING TESTING
Information
Patent Grant
Method and device for simultaneously measuring the thickness of mul...
Patent number
6,069,703
Issue date
May 30, 2000
Active Impulse Systems, Inc.
Matthew J. Banet
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for measuring the concentration of ions implan...
Patent number
6,052,185
Issue date
Apr 18, 2000
Active Impulse Systems Inc.
Matthew J. Banet
G01 - MEASURING TESTING
Information
Patent Grant
Method and device for measuring the thickness of opaque and transpa...
Patent number
5,812,261
Issue date
Sep 22, 1998
Active Impulse Systems, Inc.
Keith A. Nelson
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
Method and device for measuring the thickness of thin films near a...
Publication number
20030058449
Publication date
Mar 27, 2003
Active Impulse Systems
Matthew J. Banet
G01 - MEASURING TESTING
Trademark
last 30 trademarks