ADVANCED INQUIRY SYSTEMS INC

Organization

HILLSBORO, OR, US

Business Address
7865 SW CIRRUS DRIVE BEAVERTON OR 97008 503-726-4700
Mailing Address
7865 SW CIRRUS DRIVE BEAVERTON OR 97008
State Location
OR
State of Incorporation
DE

Organizations

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Patents Grantslast 30 patents

Information Patent Grant
Apparatus for thinning, testing and singulating a semiconductor wafer
- Patent number 8,889,526
- Issue date Nov 18, 2014
- Advanced Inquiry Systems, Inc.
- Morgan T. Johnson
- G01 - MEASURING TESTING
Information Patent Grant
Wafer testing system and associated methods of use and manufacture
- Patent number 8,872,533
- Issue date Oct 28, 2014
- Advanced Inquiry Systems, Inc.
- Aaron Durbin
- G01 - MEASURING TESTING
Information Patent Grant
Translators coupleable to opposing surfaces of microelectronic subs...
- Patent number 8,779,789
- Issue date Jul 15, 2014
- Advanced Inquiry Systems, Inc.
- Morgan T. Johnson
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for multi-planar edge-extended wafer translator
- Patent number 8,704,544
- Issue date Apr 22, 2014
- Advanced Inquiry Systems, Inc.
- Morgan T. Johnson
- G01 - MEASURING TESTING
Information Patent Grant
Methods of adding pads and one or more interconnect layers to the p...
- Patent number 8,697,456
- Issue date Apr 15, 2014
- Advanced Inquiry Systems, Inc.
- Morgan T Johnson
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Chemical removal of oxide layer from chip pads
- Patent number 8,536,062
- Issue date Sep 17, 2013
- Advanced Inquiry Systems, Inc.
- Jens Ruffler
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Methods of adding pads and one or more interconnect layers to the p...
- Patent number 8,476,630
- Issue date Jul 2, 2013
- Advanced Inquiry Systems, Inc.
- Morgan T. Johnson
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Methods and apparatus for thinning, testing and singulating a semic...
- Patent number 8,461,024
- Issue date Jun 11, 2013
- Advanced Inquiry Systems, Inc.
- Morgan T. Johnson
- G01 - MEASURING TESTING
Information Patent Grant
Wafer testing systems and associated methods of use and manufacture
- Patent number 8,405,414
- Issue date Mar 26, 2013
- Advanced Inquiry Systems, Inc.
- Aaron Durbin
- G01 - MEASURING TESTING
Information Patent Grant
Maintaining a wafer/wafer translator pair in an attached state free...
- Patent number 8,362,797
- Issue date Jan 29, 2013
- Advanced Inquiry Systems, Inc.
- Aaron Durbin
- G01 - MEASURING TESTING
Information Patent Grant
Methods and apparatus for thinning, testing and singulating a semic...
- Patent number 8,076,216
- Issue date Dec 13, 2011
- Advanced Inquiry Systems, Inc.
- Morgan T. Johnson
- G01 - MEASURING TESTING
Information Patent Grant
Methods and apparatus for multi-modal wafer testing
- Patent number 7,960,986
- Issue date Jun 14, 2011
- Advanced Inquiry Systems, Inc.
- Morgan T. Johnson
- G01 - MEASURING TESTING
Information Patent Grant
Wafer translator having a silicon core isolated from signal paths b...
- Patent number 7,791,174
- Issue date Sep 7, 2010
- Advanced Inquiry Systems, Inc.
- Morgan T. Johnson
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Methods and apparatus for collecting process characterization data...
- Patent number 7,786,724
- Issue date Aug 31, 2010
- Advanced Inquiry Systems, Inc.
- Morgan T. Johnson
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for single-sided extension of electrical condu...
- Patent number 7,786,745
- Issue date Aug 31, 2010
- Advanced Inquiry Systems, Inc.
- Morgan T. Johnson
- G01 - MEASURING TESTING
Information Patent Grant
Fully tested wafers having bond pads undamaged by probing and appli...
- Patent number 7,723,980
- Issue date May 25, 2010
- Advanced Inquiry Systems, Inc.
- Morgan T. Johnson
- G01 - MEASURING TESTING
Information Patent Grant
Methods and apparatus for translated wafer stand-in tester
- Patent number 7,724,018
- Issue date May 25, 2010
- Advanced Inquiry Systems, Inc.
- Morgan T. Johnson
- G01 - MEASURING TESTING
Information Patent Grant
Methods and apparatus for planar extension of electrical conductors...
- Patent number 7,724,008
- Issue date May 25, 2010
- Advanced Inquiry Systems, Inc.
- Morgan T. Johnson
- G01 - MEASURING TESTING
Information Patent Grant
Full-wafer test and burn-in mechanism
- Patent number 7,719,298
- Issue date May 18, 2010
- Advanced Inquiry Systems, Inc.
- Morgan T. Johnson
- G01 - MEASURING TESTING
Information Patent Grant
Methods and apparatus for addition of electrical conductors to prev...
- Patent number 7,638,366
- Issue date Dec 29, 2009
- Advanced Inquiry Systems, Inc.
- Morgan T. Johnson
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Wafer translator having metallization pattern providing high densit...
- Patent number 7,579,852
- Issue date Aug 25, 2009
- Advanced Inquiry Systems, Inc.
- Morgan T. Johnson
- G01 - MEASURING TESTING
Information Patent Grant
Methods and apparatus for flexible extension of electrical conducto...
- Patent number 7,572,132
- Issue date Aug 11, 2009
- Advanced Inquiry Systems, Inc.
- Morgan T. Johnson
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for translated wafer stand-in tester
- Patent number 7,532,021
- Issue date May 12, 2009
- Advanced Inquiry Systems, Inc.
- Morgan T. Johnson
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for fixed-form multi-planar extension of electrical condu...
- Patent number 7,532,022
- Issue date May 12, 2009
- Advanced Inquiry Systems, Inc.
- Morgan T. Johnson
- G01 - MEASURING TESTING
Information Patent Grant
Methods and apparatus for rotationally accessed tester interface
- Patent number 7,498,800
- Issue date Mar 3, 2009
- Advanced Inquiry Systems, Inc.
- Kenneth S. Whiteman
- G01 - MEASURING TESTING
Information Patent Grant
Methods for access to a plurality of unsingulated integrated circui...
- Patent number 7,489,148
- Issue date Feb 10, 2009
- Advanced Inquiry Systems, Inc.
- Morgan T. Johnson
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for providing electrical access to one or more pads of th...
- Patent number 7,459,924
- Issue date Dec 2, 2008
- Advanced Inquiry Systems, Inc.
- Morgan T. Johnson
- G01 - MEASURING TESTING
Information Patent Grant
Fiber-based optical alignment system
- Patent number 7,460,752
- Issue date Dec 2, 2008
- Advanced Inquiry Systems, Inc.
- Morgan T. Johnson
- G01 - MEASURING TESTING
Information Patent Grant
Methods for multi-modal wafer testing using edge-extended wafer tra...
- Patent number 7,456,643
- Issue date Nov 25, 2008
- Advanced Inquiry Systems, Inc.
- Morgan T. Johnson
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for full-wafer test and burn-in mechanism
- Patent number 7,453,277
- Issue date Nov 18, 2008
- Advanced Inquiry Systems, Inc.
- Morgan T. Johnson
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
METHODS AND APPARATUS FOR THINNING, TESTING AND SINGULATING A SEMIC...
- Publication number 20150293171
- Publication date Oct 15, 2015
- ADVANCED INQUIRY SYSTEMS, INC.
- Morgan T. Johnson
- G01 - MEASURING TESTING
Information Patent Application
WAFER TESTING SYSTEM AND ASSOCIATED METHODS OF USE AND MANUFACTURE
- Publication number 20150015292
- Publication date Jan 15, 2015
- ADVANCED INQUIRY SYSTEMS, INC.
- Aaron Durbin
- G01 - MEASURING TESTING
Information Patent Application
TRANSLATORS COUPLEABLE TO OPPOSING SURFACES OF MICROELECTRONIC SUBS...
- Publication number 20150015299
- Publication date Jan 15, 2015
- ADVANCED INQUIRY SYSTEMS, INC.
- Morgan T. Johnson
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR MULTI-PLANAR EDGE-EXTENDED WAFER TRANSLATOR
- Publication number 20140347086
- Publication date Nov 27, 2014
- ADVANCED INQUIRY SYSTEMS, INC.
- Morgan T. Johnson
- G01 - MEASURING TESTING
Information Patent Application
MAINTAINING A WAFER/WAFER TRANSLATOR PAIR IN AN ATTACHED STATE FREE...
- Publication number 20140197858
- Publication date Jul 17, 2014
- ADVANCED INQUIRY SYSTEMS, INC.
- Aaron Durbin
- G01 - MEASURING TESTING
Information Patent Application
DESIGNED ASPERITY CONTACTORS, INCLUDING NANOSPIKES, FOR SEMICONDUCT...
- Publication number 20140179031
- Publication date Jun 26, 2014
- ADVANCED INQUIRY SYSTEMS, INC.
- Douglas A. Preston
- G01 - MEASURING TESTING
Information Patent Application
DESIGNED ASPERITY CONTACTORS, INCLUDING NANOSPIKES FOR SEMICONDUCTO...
- Publication number 20140176174
- Publication date Jun 26, 2014
- ADVANCED INQUIRY SYSTEMS, INC.
- Douglas A. Preston
- G01 - MEASURING TESTING
Information Patent Application
METHODS OF ADDING PADS AND ONE OR MORE INTERCONNECT LAYERS TO THE P...
- Publication number 20130337587
- Publication date Dec 19, 2013
- ADVANCED INQUIRY SYSTEMS, INC.
- Morgan T. Johnson
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
WAFER TESTING SYSTEM AND ASSOCIATED METHODS OF USE AND MANUFACTURE
- Publication number 20130314115
- Publication date Nov 28, 2013
- ADVANCED INQUIRY SYSTEMS, INC.
- Aaron Durbin
- G01 - MEASURING TESTING
Information Patent Application
TRANSLATORS COUPLEABLE TO OPPOSING SURFACES OF MICROELECTRONIC SUBS...
- Publication number 20130265071
- Publication date Oct 10, 2013
- ADVANCED INQUIRY SYSTEMS, INC.
- Morgan Johnson
- G01 - MEASURING TESTING
Information Patent Application
MAINTAINING A WAFER/WAFER TRANSLATOR PAIR IN AN ATTACHED STATE FREE...
- Publication number 20130187675
- Publication date Jul 25, 2013
- ADVANCED INQUIRY SYSTEMS, INC.
- Aaron Durbin
- G01 - MEASURING TESTING
Information Patent Application
Wafer prober integrated with full-wafer contacter
- Publication number 20130021052
- Publication date Jan 24, 2013
- Advanced Inquiry Systems, Inc.
- Morgan T. Johnson
- G01 - MEASURING TESTING
Information Patent Application
METHODS OF ADDING PADS AND ONE OR MORE INTERCONNECT LAYERS TO THE P...
- Publication number 20120156811
- Publication date Jun 21, 2012
- Advanced Inquiry Systems, Inc.
- Morgan T. Johnson
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHODS AND APPARATUS FOR THINNING, TESTING AND SINGULATING A SEMIC...
- Publication number 20120149134
- Publication date Jun 14, 2012
- Advanced Inquiry Systems, Inc.
- Morgan T. Johnson
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for multi-planar edge-extended wafer translator
- Publication number 20120139575
- Publication date Jun 7, 2012
- Advanced Inquiry Systems, Inc.
- Morgan T. Johnson
- G01 - MEASURING TESTING
Information Patent Application
WAFER TESTING SYSTEMS AND ASSOCIATED METHODS OF USE AND MANUFACTURE
- Publication number 20120074976
- Publication date Mar 29, 2012
- Advanced Inquiry Systems, Inc.
- Aaron Durbin
- G01 - MEASURING TESTING
Information Patent Application
Wafer translator having a silicon core fabricated with printed circ...
- Publication number 20090224410
- Publication date Sep 10, 2009
- Advanced Inquiry Systems, Inc.
- Morgan T. Johnson
- G01 - MEASURING TESTING
Information Patent Application
Wafer translator having a silicon core isolated from signal paths b...
- Publication number 20090224372
- Publication date Sep 10, 2009
- Advanced Inquiry Systems, Inc.
- Morgan T. Johnson
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Fully tested wafers having bond pads undamaged by probing and appli...
- Publication number 20080230927
- Publication date Sep 25, 2008
- Advanced Inquiry Systems, Inc.
- Morgan T. Johnson
- G01 - MEASURING TESTING

Trademarklast 30 trademarks

Information Trademark
86477720
- Serial number 86477720
- Registration number 5069270
- Filing date Dec 11, 2014
- Advanced Inquiry Systems Inc
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
86372909 - TRANSLARITY
- Serial number 86372909
- Registration number 5032432
- Filing date Aug 21, 2014
- Advanced Inquiry Systems Inc
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
77585167 - ONETOUCH
- Serial number 77585167
- Filing date Oct 3, 2008
- Advanced Inquiry Systems, Inc.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
77487822 - TRANSLATED WAFER
- Serial number 77487822
- Registration number 3710671
- Filing date May 30, 2008
- Advanced Inquiry Systems, Inc.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
77243857 - AI ADVANCED INQUIRY SYSTEMS
- Serial number 77243857
- Registration number 3725997
- Filing date Aug 1, 2007
- Octavian Scientific, Incorporated
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments

ADVANCED INQUIRY SYSTEMS INC

Organization

Business Address

Mailing Address

State Location

State of Incorporation

Patents Grantslast 30 patents

Apparatus for thinning, testing and singulating a semiconductor wafer

Wafer testing system and associated methods of use and manufacture

Translators coupleable to opposing surfaces of microelectronic subs...

Method and apparatus for multi-planar edge-extended wafer translator

Methods of adding pads and one or more interconnect layers to the p...

Chemical removal of oxide layer from chip pads

Methods of adding pads and one or more interconnect layers to the p...

Methods and apparatus for thinning, testing and singulating a semic...

Wafer testing systems and associated methods of use and manufacture

Maintaining a wafer/wafer translator pair in an attached state free...

Methods and apparatus for thinning, testing and singulating a semic...

Methods and apparatus for multi-modal wafer testing

Wafer translator having a silicon core isolated from signal paths b...

Methods and apparatus for collecting process characterization data...

Method and apparatus for single-sided extension of electrical condu...

Fully tested wafers having bond pads undamaged by probing and appli...

Methods and apparatus for translated wafer stand-in tester

Methods and apparatus for planar extension of electrical conductors...

Full-wafer test and burn-in mechanism

Methods and apparatus for addition of electrical conductors to prev...

Wafer translator having metallization pattern providing high densit...

Methods and apparatus for flexible extension of electrical conducto...

Apparatus for translated wafer stand-in tester

Apparatus for fixed-form multi-planar extension of electrical condu...

Methods and apparatus for rotationally accessed tester interface

Methods for access to a plurality of unsingulated integrated circui...

Apparatus for providing electrical access to one or more pads of th...

Fiber-based optical alignment system

Methods for multi-modal wafer testing using edge-extended wafer tra...

Apparatus for full-wafer test and burn-in mechanism

Patents Applicationslast 30 patents

METHODS AND APPARATUS FOR THINNING, TESTING AND SINGULATING A SEMIC...

WAFER TESTING SYSTEM AND ASSOCIATED METHODS OF USE AND MANUFACTURE

TRANSLATORS COUPLEABLE TO OPPOSING SURFACES OF MICROELECTRONIC SUBS...

METHOD AND APPARATUS FOR MULTI-PLANAR EDGE-EXTENDED WAFER TRANSLATOR

MAINTAINING A WAFER/WAFER TRANSLATOR PAIR IN AN ATTACHED STATE FREE...

DESIGNED ASPERITY CONTACTORS, INCLUDING NANOSPIKES, FOR SEMICONDUCT...

DESIGNED ASPERITY CONTACTORS, INCLUDING NANOSPIKES FOR SEMICONDUCTO...

METHODS OF ADDING PADS AND ONE OR MORE INTERCONNECT LAYERS TO THE P...

WAFER TESTING SYSTEM AND ASSOCIATED METHODS OF USE AND MANUFACTURE

TRANSLATORS COUPLEABLE TO OPPOSING SURFACES OF MICROELECTRONIC SUBS...

MAINTAINING A WAFER/WAFER TRANSLATOR PAIR IN AN ATTACHED STATE FREE...

Wafer prober integrated with full-wafer contacter

METHODS OF ADDING PADS AND ONE OR MORE INTERCONNECT LAYERS TO THE P...

METHODS AND APPARATUS FOR THINNING, TESTING AND SINGULATING A SEMIC...

Method and apparatus for multi-planar edge-extended wafer translator

WAFER TESTING SYSTEMS AND ASSOCIATED METHODS OF USE AND MANUFACTURE

Wafer translator having a silicon core fabricated with printed circ...

Wafer translator having a silicon core isolated from signal paths b...

Fully tested wafers having bond pads undamaged by probing and appli...

Trademarklast 30 trademarks

86477720

86372909 - TRANSLARITY

77585167 - ONETOUCH

77487822 - TRANSLATED WAFER

77243857 - AI ADVANCED INQUIRY SYSTEMS