Advanced Metrology Systems, LLC

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Austin, TX, US

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Patents Grantslast 30 patents

Information Patent Grant
Method of measuring deep trenches with model-based optical spectros...
- Patent number 7,839,509
- Issue date Nov 23, 2010
- Advanced Metrology Systems LLC
- Peter Rosenthal
- G01 - MEASURING TESTING
Information Patent Grant
Method of measuring sub-micron trench structures
- Patent number 7,499,183
- Issue date Mar 3, 2009
- Advanced Metrology Systems, LLC
- Alexei Maznev
- G01 - MEASURING TESTING
Information Patent Grant
Method of determining properties of patterned thin film metal struc...
- Patent number 7,365,864
- Issue date Apr 29, 2008
- Advanced Metrology Systems LLC
- Michael Gostein
- G01 - MEASURING TESTING
Information Patent Grant
Opto-acoustic apparatus with optical heterodyning for measuring sol...
- Patent number 7,327,468
- Issue date Feb 5, 2008
- Advanced Metrology Systems LLC
- Alexei Maznev
- G01 - MEASURING TESTING

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Patents Applicationslast 30 patents

Information Patent Application
METHOD AND APPARATUS FOR REDUCING PROBE WAVELENGTH IN LASER EXCITED...
- Publication number 20090303496
- Publication date Dec 10, 2009
- Advanced Metrology Systems, LLC
- Alexander Mazurenko
- G01 - MEASURING TESTING
Information Patent Application
Method of Measuring Sub-Micron Trench Structures
- Publication number 20080123080
- Publication date May 29, 2008
- ADVANCED METROLOGY SYSTEMS LLC
- Alexei Maznev
- G01 - MEASURING TESTING

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Trademarklast 30 trademarks

Information Trademark
77232732 - SURFACEWAVE
- Serial number 77232732
- Filing date Jul 18, 2007
- Advanced Metrology Systems LLC
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments