Advanced Monitoring Systems, Inc.

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Cupertino, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Methods, kits, electrodes and compositions for assessing the level...
- Patent number 6,212,418
- Issue date Apr 3, 2001
- Advanced Monitoring Systems Ltd.
- Irina Even-Tov
- G01 - MEASURING TESTING

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Patents Applicationslast 30 patents

Information Patent Application
Systems and methods of generating diagnostic images for structural...
- Publication number 20070265806
- Publication date Nov 15, 2007
- Advanced Monitoring Systems, Inc.
- Hyeung-Yun Kim
- G01 - MEASURING TESTING
Information Patent Application
Systems and methods of prognosticating damage for structural health...
- Publication number 20070265808
- Publication date Nov 15, 2007
- Advanced Monitoring Systems, Inc.
- Hyeung-Yun Kim
- G01 - MEASURING TESTING
Information Patent Application
Systems and methods of generating diagnostic images for structural...
- Publication number 20070260425
- Publication date Nov 8, 2007
- Advanced Monitoring Systems, Inc.
- Hyeung-Yun Kim
- G01 - MEASURING TESTING
Information Patent Application
Systems and methods for identifying damage in a structure
- Publication number 20070260427
- Publication date Nov 8, 2007
- Advanced Monitoring Systems, Inc.
- Hyeung-Yun Kim
- G01 - MEASURING TESTING
Information Patent Application
Solid-state ion selective electrodes and methods of producing the same
- Publication number 20020038762
- Publication date Apr 4, 2002
- ADVANCED MONITORING SYSTEMS LTD.
- Irina Eventov
- G01 - MEASURING TESTING