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Ora-gun, JP
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last 30 patents
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Information
Patent Application
Semiconductor device testing apparatus and device interface board
Publication number
20080191731
Publication date
Aug 14, 2008
Advantes Corporation
Hiroshi Ezoe
G01 - MEASURING TESTING
Information
Patent Application
Method and apparatus for improving the frequency resolution of a di...
Publication number
20050248374
Publication date
Nov 10, 2005
ADVANTES CORPORATION
Eric Barr Kushnick
G06 - COMPUTING CALCULATING COUNTING
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