AEM SINGAPORE PTE. LTD.

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Singapore, SG

Organizations

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Patents Grantslast 30 patents

Information Patent Grant
Thermal control wafer with integrated heating-sensing elements
- Patent number 12,085,609
- Issue date Sep 10, 2024
- AEM SINGAPORE PTE. LTD.
- Carl L. Ostrowski
- G01 - MEASURING TESTING
Information Patent Grant
Integrated heater and temperature measurement
- Patent number 12,061,227
- Issue date Aug 13, 2024
- AEM SINGAPORE PTE. LTD.
- Carl L. Ostrowski
- G01 - MEASURING TESTING
Information Patent Grant
Thermal control wafer with integrated heating-sensing elements
- Patent number 12,013,432
- Issue date Jun 18, 2024
- AEM SINGAPORE PTE. LTD.
- Carl L. Ostrowski
- G01 - MEASURING TESTING
Information Patent Grant
Multiplexed thermal control wafer and coldplate
- Patent number 12,000,885
- Issue date Jun 4, 2024
- AEM SINGAPORE PTE. LTD.
- Samer Kabbani
- G01 - MEASURING TESTING
Information Patent Grant
Cold plate with porous thermal conductive structure
- Patent number 11,706,902
- Issue date Jul 18, 2023
- AEM SINGAPORE PTE. LTD.
- See Jean Chan
- F28 - HEAT EXCHANGE IN GENERAL
Information Patent Grant
Thermal test head for an integrated circuit device
- Patent number 11,454,666
- Issue date Sep 27, 2022
- AEM SINGAPORE PTE. LTD.
- See Jean Chan
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Thermal test head for an integrated circuit device
- Patent number 11,378,615
- Issue date Jul 5, 2022
- AEM SINGAPORE PTE. LTD.
- See Jean Chan
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Compact tester
- Patent number 11,181,575
- Issue date Nov 23, 2021
- AEM SINGAPORE PTE. LTD.
- See Jean Chan
- G01 - MEASURING TESTING
Information Patent Grant
Cold plate with porus thermal conductive structure
- Patent number 11,129,297
- Issue date Sep 21, 2021
- AEM SINGAPORE PTE. LTD.
- See Jean Chan
- F28 - HEAT EXCHANGE IN GENERAL
Information Patent Grant
System and method for temporal signal measurement of device under t...
- Patent number 10,989,758
- Issue date Apr 27, 2021
- AEM SINGAPORE PTE. LTD.
- Harshang Nileshkumar Pandya
- G01 - MEASURING TESTING
Information Patent Grant
Configurable electronic device tester system
- Patent number 9,927,478
- Issue date Mar 27, 2018
- AEM SINGAPORE PTE. LTD.
- Boon Hua How
- G01 - MEASURING TESTING

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Patents Applicationslast 30 patents

Information Patent Application
DEVICE AND THERMAL TESTER FOR THERMAL TESTING DIES OF AN INTEGRATED...
- Publication number 20240385237
- Publication date Nov 21, 2024
- AEM SINGAPORE PTE. LTD.
- See Jean Chan
- G01 - MEASURING TESTING
Information Patent Application
INTEGRATED HEATER AND TEMPERATURE MEASUREMENT
- Publication number 20240369621
- Publication date Nov 7, 2024
- AEM SINGAPORE PTE. LTD.
- Carl L. OSTROWSKI
- G01 - MEASURING TESTING
Information Patent Application
THERMAL HEAD COMPRISING A PLURALITY OF ADAPTERS FOR INDEPENDENT THE...
- Publication number 20240329120
- Publication date Oct 3, 2024
- AEM SINGAPORE PTE. LTD.
- Thomas P. JONES
- G01 - MEASURING TESTING
Information Patent Application
THERMAL HEAD COMPRISING A PLURALITY OF ADAPTERS FOR INDEPENDENT THE...
- Publication number 20240230752
- Publication date Jul 11, 2024
- AEM Singapore Pte, LTD.
- Thomas P. JONES
- G01 - MEASURING TESTING
Information Patent Application
Illuminator Method and Device for Semiconductor Package Testing
- Publication number 20220390510
- Publication date Dec 8, 2022
- UTAC Headquarters Pte. Ltd.
- Boon Chew Goh
- G01 - MEASURING TESTING
Information Patent Application
COLD PLATE AND A METHOD OF MANUFACTURE THEREOF
- Publication number 20210385968
- Publication date Dec 9, 2021
- AEM SINGAPORE PTE. LTD.
- See Jean Chan
- F28 - HEAT EXCHANGE IN GENERAL
Information Patent Application
THERMAL TEST HEAD FOR AN INTEGRATED CIRCUIT DEVICE
- Publication number 20210325453
- Publication date Oct 21, 2021
- AEM SINGAPORE PTE. LTD.
- See Jean CHAN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
THERMAL TEST HEAD FOR AN INTEGRATED CIRCUIT DEVICE
- Publication number 20210325452
- Publication date Oct 21, 2021
- AEM SINGAPORE PTE. LTD.
- See Jean CHAN
- G01 - MEASURING TESTING
Information Patent Application
COMPACT TESTER
- Publication number 20210011078
- Publication date Jan 14, 2021
- AEM SINGAPORE PTE. LTD.
- See Jean Chan
- G01 - MEASURING TESTING
Information Patent Application
COLD PLATE AND A METHOD OF MANUFACTURE THEREOF
- Publication number 20200383238
- Publication date Dec 3, 2020
- AEM SINGAPORE PTE. LTD.
- See Jean Chan
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
SYSTEM AND METHOD FOR TEMPORAL SIGNAL MEASUREMENT OF DEVICE UNDER T...
- Publication number 20200096568
- Publication date Mar 26, 2020
- AEM SINGAPORE PTE. LTD.
- Harshang Nileshkumar Pandya
- G01 - MEASURING TESTING
Information Patent Application
AUTOMATED PICKING APPARATUS WITH MAGNETIC REPULSION FOR PICKING AN...
- Publication number 20180354142
- Publication date Dec 13, 2018
- AEM SINGAPORE PTE. LTD.
- See Jean Chan
- B65 - CONVEYING PACKING STORING HANDLING THIN OR FILAMENTARY MATERIAL
Information Patent Application
CONFIGURABLE ELECTRONIC DEVICE TESTER SYSTEM
- Publication number 20170010313
- Publication date Jan 12, 2017
- AEM SINGAPORE PTE. LTD.
- Boon Hua HOW
- G01 - MEASURING TESTING

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Trademarklast 30 trademarks

Information Trademark
79405755 - PIXL
- Serial number 79405755
- Filing date Aug 13, 2024
- AEM Singapore Pte. Ltd.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
79380966 - AEM
- Serial number 79380966
- Filing date Jul 18, 2023
- AEM Singapore Pte. Ltd.
- 7 - Machines and machine tools
Information Trademark
79380967 - AEM
- Serial number 79380967
- Filing date Jul 18, 2023
- AEM Singapore Pte. Ltd.
- 7 - Machines and machine tools
Information Trademark
79323061 - HEATLET
- Serial number 79323061
- Registration number 7317989
- Filing date Sep 8, 2021
- AEM SINGAPORE PTE. LTD.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
79246334 - TESTPRO
- Serial number 79246334
- Filing date Jul 26, 2018
- AEM Singapore Pte. Ltd.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments

AEM SINGAPORE PTE. LTD.

Organization

Patents Grantslast 30 patents

Thermal control wafer with integrated heating-sensing elements

Integrated heater and temperature measurement

Thermal control wafer with integrated heating-sensing elements

Multiplexed thermal control wafer and coldplate

Cold plate with porous thermal conductive structure

Thermal test head for an integrated circuit device

Thermal test head for an integrated circuit device

Compact tester

Cold plate with porus thermal conductive structure

System and method for temporal signal measurement of device under t...

Configurable electronic device tester system

Patents Applicationslast 30 patents

DEVICE AND THERMAL TESTER FOR THERMAL TESTING DIES OF AN INTEGRATED...

INTEGRATED HEATER AND TEMPERATURE MEASUREMENT

THERMAL HEAD COMPRISING A PLURALITY OF ADAPTERS FOR INDEPENDENT THE...

THERMAL HEAD COMPRISING A PLURALITY OF ADAPTERS FOR INDEPENDENT THE...

Illuminator Method and Device for Semiconductor Package Testing

COLD PLATE AND A METHOD OF MANUFACTURE THEREOF

THERMAL TEST HEAD FOR AN INTEGRATED CIRCUIT DEVICE

THERMAL TEST HEAD FOR AN INTEGRATED CIRCUIT DEVICE

COMPACT TESTER

COLD PLATE AND A METHOD OF MANUFACTURE THEREOF

SYSTEM AND METHOD FOR TEMPORAL SIGNAL MEASUREMENT OF DEVICE UNDER T...

AUTOMATED PICKING APPARATUS WITH MAGNETIC REPULSION FOR PICKING AN...

CONFIGURABLE ELECTRONIC DEVICE TESTER SYSTEM

Trademarklast 30 trademarks

79405755 - PIXL

79380966 - AEM

79380967 - AEM

79323061 - HEATLET

79246334 - TESTPRO