Ahbee 1, L.P.

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San Jose, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
System, method and apparatus for forming multiple layers in a singl...
- Patent number 8,372,687
- Issue date Feb 12, 2013
- Ahbee1, LP
- Aiguo Feng
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Non contact method and apparatus for measurement of sheet resistanc...
- Patent number 7,741,833
- Issue date Jun 22, 2010
- Ahbee 1, L.P.
- Vladimir Faifer
- G01 - MEASURING TESTING
Information Patent Grant
Non contact method and apparatus for measurement of sheet resistanc...
- Patent number 7,737,680
- Issue date Jun 15, 2010
- Ahbee 1, L.P.
- Vladimir Faifer
- G01 - MEASURING TESTING
Information Patent Grant
Non contact method and apparatus for measurement of sheet resistanc...
- Patent number 7,737,681
- Issue date Jun 15, 2010
- Ahbee 1, L.P.
- Vladimir Faifer
- G01 - MEASURING TESTING
Information Patent Grant
Non-contact method and apparatus for measurement of leakage current...
- Patent number 7,642,772
- Issue date Jan 5, 2010
- Ahbee 1, L.P.
- Vladimir Faifer
- G01 - MEASURING TESTING
Information Patent Grant
Solar cell array
- Patent number D601087
- Issue date Sep 29, 2009
- Ahbee 1, L.P.
- Aiguo Feng
- D13 - Equipment for production, distribution, or transformation of energy
Information Patent Grant
Solar cell
- Patent number D590768
- Issue date Apr 21, 2009
- Ahbee 1, L.P.
- Aiguo Feng
- D13 - Equipment for production, distribution, or transformation of energy
Information Patent Grant
Temperature insensitive low coherence based optical metrology for n...
- Patent number 7,502,121
- Issue date Mar 10, 2009
- Ahbee 1, L.P.
- Wojciech Walecki
- G01 - MEASURING TESTING
Information Patent Grant
Non contact method and apparatus for measurement of sheet resistanc...
- Patent number 7,362,088
- Issue date Apr 22, 2008
- Ahbee 1, L.P.
- Vladimir Faifer
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for adhesion testing of thin film materials
- Patent number 6,567,541
- Issue date May 20, 2003
- Ahbee 1, L.P.
- Phuc Van
- G01 - MEASURING TESTING

Ahbee 1, L.P.

Organization

Patents Grantslast 30 patents

System, method and apparatus for forming multiple layers in a singl...

Non contact method and apparatus for measurement of sheet resistanc...

Non contact method and apparatus for measurement of sheet resistanc...

Non contact method and apparatus for measurement of sheet resistanc...

Non-contact method and apparatus for measurement of leakage current...

Solar cell array

Solar cell

Temperature insensitive low coherence based optical metrology for n...

Non contact method and apparatus for measurement of sheet resistanc...

Method and apparatus for adhesion testing of thin film materials

Patents Applicationslast 30 patents

Trademarklast 30 trademarks