Ahbee 2, L.P., A California Limited Partnership

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San Jose, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Apparatus for measuring of thin dielectric layer properties on semi...
- Patent number 7,034,563
- Issue date Apr 25, 2006
- Ahbee 2, L.P., A California Limited Partnership
- Vitali Souchkov
- G01 - MEASURING TESTING
Information Patent Grant
Determination of minority carrier diffusion length in solid state m...
- Patent number 6,922,067
- Issue date Jul 26, 2005
- Ahbee 2, L.P.
- Phuc Van
- G01 - MEASURING TESTING