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Amber Engineering, Inc.
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Goleta, CA, US
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Patents Grants
last 30 patents
Information
Patent Grant
Infrared imaging system employing on-focal plane nonuniformity corr...
Patent number
RE40249
Issue date
Apr 22, 2008
Amber Engineering, Inc.
Robert F. Cannata
250 - Radiant energy
Information
Patent Grant
Method and apparatus for formation of HgCdTe infrared detection lay...
Patent number
5,846,319
Issue date
Dec 8, 1998
Amber Engineering, Inc.
Jeffrey Brian Barton
C30 - CRYSTAL GROWTH
Information
Patent Grant
Infrared imaging system employing on-focal plane nonuniformity corr...
Patent number
5,811,808
Issue date
Sep 22, 1998
Amber Engineering, Inc.
Robert F. Cannata
G01 - MEASURING TESTING
Information
Patent Grant
Thermal mismatch accommodated infrared detector hybrid array
Patent number
5,308,980
Issue date
May 3, 1994
Amber Engineering, Inc.
Jeffrey Barton
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Infrared detector hybrid array with improved thermal cycle reliabil...
Patent number
5,264,699
Issue date
Nov 23, 1993
Amber Engineering, Inc.
Jeffrey Barton
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Massively parallel digital image data processor using pixel-mapped...
Patent number
5,253,308
Issue date
Oct 12, 1993
Amber Engineering, Inc.
William K. Johnson
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Method for wafer scale testing of redundant integrated circuit dies
Patent number
5,053,700
Issue date
Oct 1, 1991
Amber Engineering, Inc.
William J. Parrish
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Wafer scale testing of redundant integrated circuit dies
Patent number
4,956,602
Issue date
Sep 11, 1990
Amber Engineering, Inc.
William J. Parrish
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Open-tube, benign-environment annealing method for compound semicon...
Patent number
4,898,834
Issue date
Feb 6, 1990
Amber Engineering, Inc.
Arthur H. Lockwood
H01 - BASIC ELECTRIC ELEMENTS
Patents Applications
last 30 patents
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last 30 trademarks