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last 30 patents
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Patent Grant
Method and system for optimal source impedance matching at the inpu...
Patent number
8,269,508
Issue date
Sep 18, 2012
AMCAD Engineering
Tony Gasseling
G01 - MEASURING TESTING
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last 30 patents
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METHOD FOR CHARACTERIZING IN PULSE MODE A III-V SEMICONDUCTOR TRANS...
Publication number
20240410931
Publication date
Dec 12, 2024
AMCAD Engineering
Christophe CHARBONNIAUD
G01 - MEASURING TESTING
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Patent Application
Method and System for Optimal Source Impedance Matching at the Inpu...
Publication number
20100321033
Publication date
Dec 23, 2010
AMCAD Engineering
Tony Gasseling
G01 - MEASURING TESTING