Anasys Instruments Corp.

Organization

Santa Barbara, CA, US

Organizations

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Patents Grantslast 30 patents

Information Patent Grant
Method and apparatus for infrared scattering scanning near-field op...
- Patent number 9,778,282
- Issue date Oct 3, 2017
- Anasys Instruments
- Honghua Yang
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for infrared scattering scanning near-field op...
- Patent number 9,658,247
- Issue date May 23, 2017
- Anasys Instruments
- Honghua Yang
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for infrared scattering scanning near-field op...
- Patent number 9,372,154
- Issue date Jun 21, 2016
- Anasys Instruments
- Craig Prater
- G01 - MEASURING TESTING
Information Patent Grant
Stimulated raman nanospectroscopy
- Patent number 9,046,492
- Issue date Jun 2, 2015
- Anasys Instruments Corp.
- Craig Prater
- G01 - MEASURING TESTING
Information Patent Grant
Magnetic actuation and thermal cantilevers for temperature and freq...
- Patent number 8,914,911
- Issue date Dec 16, 2014
- The Board of Trustees of the University of Illinois
- William P. King
- B82 - NANO-TECHNOLOGY
Information Patent Grant
High frequency deflection measurement of IR absorption
- Patent number 8,869,602
- Issue date Oct 28, 2014
- Anasys Instruments Corp.
- Mikhail Belkin
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for infrared scattering scanning near-field op...
- Patent number 8,793,811
- Issue date Jul 29, 2014
- Anasys Instruments
- Craig Prater
- G01 - MEASURING TESTING
Information Patent Grant
High frequency deflection measurement of IR absorption with a modul...
- Patent number 8,680,467
- Issue date Mar 25, 2014
- Anasys Instruments Corp.
- Craig Prater
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Dynamic power control for nanoscale spectroscopy
- Patent number 8,646,319
- Issue date Feb 11, 2014
- Anasys Instruments Corp.
- Craig Prater
- B82 - NANO-TECHNOLOGY
Information Patent Grant
High frequency deflection measurement of IR absorption
- Patent number 8,607,622
- Issue date Dec 17, 2013
- Anasys Instruments Corporation
- Alexandre Dazzi
- B82 - NANO-TECHNOLOGY
Information Patent Grant
High frequency deflection measurement of IR absorption
- Patent number 8,418,538
- Issue date Apr 16, 2013
- Anasys Instruments Inc.
- A. Dazzi Dazzi
- B82 - NANO-TECHNOLOGY
Information Patent Grant
High frequency deflection measurement of IR absorption
- Patent number 8,402,819
- Issue date Mar 26, 2013
- Anasys Instruments, Inc.
- A. Dazzi Dazzi
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Microcantilever with reduced second harmonic while in contact with...
- Patent number 8,387,443
- Issue date Mar 5, 2013
- The Board of Trustees of the University of Illinois
- William P. King
- G01 - MEASURING TESTING
Information Patent Grant
Dynamic power control, beam alignment and focus for nanoscale spect...
- Patent number 8,242,448
- Issue date Aug 14, 2012
- Anasys Instruments Corporation
- Craig Prater
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Transition temperature microscopy
- Patent number 8,177,422
- Issue date May 15, 2012
- Anasys Instruments
- Kevin Kjoller
- B82 - NANO-TECHNOLOGY
Information Patent Grant
High frequency deflection measurement of IR absorption
- Patent number 8,001,830
- Issue date Aug 23, 2011
- Anasys Instruments, Inc.
- Alexandre Dazzi
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Infrared imaging using thermal radiation from a scanning probe tip
- Patent number 7,977,636
- Issue date Jul 12, 2011
- Anasys Instruments, Inc.
- Markus B. Raschke
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Probe with embedded heater for nanoscale analysis
- Patent number 7,497,613
- Issue date Mar 3, 2009
- Anasys Instruments
- William P. King
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
METHOD AND APARATUS FOR INFRARED SCANNING NEAR-FIELD OPTICAL MICROS...
- Publication number 20180259553
- Publication date Sep 13, 2018
- Anasys Instruments Corp.
- Honghua Yang
- G01 - MEASURING TESTING
Information Patent Application
Method and Apparatus for Infrared Scattering Scanning Near-field Op...
- Publication number 20180203039
- Publication date Jul 19, 2018
- ANASYS INSTRUMENTS
- Honghua Yang
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR RESOLUTION AND SENSITIVITY ENHANCED ATOMIC...
- Publication number 20180120344
- Publication date May 3, 2018
- ANASYS INSTRUMENTS
- Craig Prater
- G01 - MEASURING TESTING
Information Patent Application
Method and Apparatus for Infrared Scattering Scanning Near-field Op...
- Publication number 20170219622
- Publication date Aug 3, 2017
- ANASYS INSTRUMENTS
- Honghua Yang
- G01 - MEASURING TESTING
Information Patent Application
Method and Apparatus for Infrared Scattering Scanning Near-field Op...
- Publication number 20170003316
- Publication date Jan 5, 2017
- ANASYS INSTRUMENTS
- Honghua Yang
- G01 - MEASURING TESTING
Information Patent Application
Method and Apparatus for Infrared Scattering Scanning Near-field Op...
- Publication number 20160003868
- Publication date Jan 7, 2016
- ANASYS INSTRUMENTS
- Craig Prater
- G01 - MEASURING TESTING
Information Patent Application
Dynamic power control, beam alignment and focus for nanoscale spect...
- Publication number 20110205527
- Publication date Aug 25, 2011
- Anasys Instruments Inc.
- Craig Prater
- G01 - MEASURING TESTING

Trademarklast 30 trademarks

Information Trademark
87628858 - MIRAGE
- Serial number 87628858
- Registration number 5571972
- Filing date Sep 29, 2017
- PHOTOTHERMAL SPECTROSCOPY CORP.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
85467587 - AFM+
- Serial number 85467587
- Registration number 4219402
- Filing date Nov 8, 2011
- Anasys Instruments Corp
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
85382664 - NU-DMA
- Serial number 85382664
- Filing date Jul 27, 2011
- Anasys Instruments
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
78809463 - NANO-TMA
- Serial number 78809463
- Filing date Feb 7, 2006
- Anasys Instruments Corp.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
78809475 - NANO-CAL
- Serial number 78809475
- Filing date Feb 7, 2006
- Anasys Instruments Corp.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
78809253 - NANO-TA
- Serial number 78809253
- Filing date Feb 7, 2006
- Anasys Instruments Corp.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments

Anasys Instruments Corp.

Organization

Patents Grantslast 30 patents

Method and apparatus for infrared scattering scanning near-field op...

Method and apparatus for infrared scattering scanning near-field op...

Method and apparatus for infrared scattering scanning near-field op...

Stimulated raman nanospectroscopy

Magnetic actuation and thermal cantilevers for temperature and freq...

High frequency deflection measurement of IR absorption

Method and apparatus for infrared scattering scanning near-field op...

High frequency deflection measurement of IR absorption with a modul...

Dynamic power control for nanoscale spectroscopy

High frequency deflection measurement of IR absorption

High frequency deflection measurement of IR absorption

High frequency deflection measurement of IR absorption

Microcantilever with reduced second harmonic while in contact with...

Dynamic power control, beam alignment and focus for nanoscale spect...

Transition temperature microscopy

High frequency deflection measurement of IR absorption

Infrared imaging using thermal radiation from a scanning probe tip

Probe with embedded heater for nanoscale analysis

Patents Applicationslast 30 patents

METHOD AND APARATUS FOR INFRARED SCANNING NEAR-FIELD OPTICAL MICROS...

Method and Apparatus for Infrared Scattering Scanning Near-field Op...

METHOD AND APPARATUS FOR RESOLUTION AND SENSITIVITY ENHANCED ATOMIC...

Method and Apparatus for Infrared Scattering Scanning Near-field Op...

Method and Apparatus for Infrared Scattering Scanning Near-field Op...

Method and Apparatus for Infrared Scattering Scanning Near-field Op...

Dynamic power control, beam alignment and focus for nanoscale spect...

Trademarklast 30 trademarks

87628858 - MIRAGE

85467587 - AFM+

85382664 - NU-DMA

78809463 - NANO-TMA

78809475 - NANO-CAL

78809253 - NANO-TA