ANCHOR SEMICONDUCTOR, INC

Organization

SUNNYVALE, CA, US

Organizations

Please log in for detailed analytics

Patents Grantslast 30 patents

Information Patent Grant
Pattern centric process control
- Patent number 11,694,009
- Issue date Jul 4, 2023
- Anchor Semiconductor, Inc.
- Chenmin Hu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Pattern centric process control
- Patent number 10,997,340
- Issue date May 4, 2021
- Anchor Semiconductor Inc.
- Chenmin Hu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Pattern centric process control
- Patent number 10,546,085
- Issue date Jan 28, 2020
- Anchor Semiconductor Inc.
- Chenmin Hu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Pattern weakness and strength detection and tracking during a semic...
- Patent number 10,062,160
- Issue date Aug 28, 2018
- Anchor Semiconductor Inc.
- Khurram Zafar
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Pattern weakness and strength detection and tracking during a semic...
- Patent number 9,846,934
- Issue date Dec 19, 2017
- Anchor Semiconductor Inc.
- Khurram Zafar
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Pattern match based optical proximity correction and verification o...
- Patent number 7,765,515
- Issue date Jul 27, 2010
- Anchor Semiconductor, Inc.
- Changsheng Ying
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method of checking optical proximity correction data
- Patent number 7,275,227
- Issue date Sep 25, 2007
- Anchor Semiconductor Inc.
- ChangSheng Ying
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Please log in for detailed analytics

Patents Applicationslast 30 patents

Information Patent Application
PATTERN CENTRIC PROCESS CONTROL
- Publication number 20210326505
- Publication date Oct 21, 2021
- Anchor Semiconductor Inc.
- Chenmin Hu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
PATTERN CENTRIC PROCESS CONTROL
- Publication number 20200097621
- Publication date Mar 26, 2020
- Anchor Semiconductor Inc.
- Chenmin Hu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
PATTERN CENTRIC PROCESS CONTROL
- Publication number 20180300434
- Publication date Oct 18, 2018
- Anchor Semiconductor Inc.
- Chenmin Hu
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
PATTERN WEAKNESS AND STRENGTH DETECTION AND TRACKING DURING A SEMIC...
- Publication number 20180033132
- Publication date Feb 1, 2018
- Anchor Semiconductor Inc.
- Khurram Zafar
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
PATTERN WEAKNESS AND STRENGTH DETECTION AND TRACKING DURING A SEMIC...
- Publication number 20160300338
- Publication date Oct 13, 2016
- Anchor Semiconductor Inc.
- Khurram Zafar
- G06 - COMPUTING CALCULATING COUNTING

Please log in for detailed analytics

Trademarklast 30 trademarks

Information Trademark
78105551 - NANOSCOPE
- Serial number 78105551
- Filing date Jan 29, 2002
- Anchor Semiconductor, Inc.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments

ANCHOR SEMICONDUCTOR, INC

Organization

Patents Grantslast 30 patents

Pattern centric process control

Pattern centric process control

Pattern centric process control

Pattern weakness and strength detection and tracking during a semic...

Pattern weakness and strength detection and tracking during a semic...

Pattern match based optical proximity correction and verification o...

Method of checking optical proximity correction data

Patents Applicationslast 30 patents

PATTERN CENTRIC PROCESS CONTROL

PATTERN CENTRIC PROCESS CONTROL

PATTERN CENTRIC PROCESS CONTROL

PATTERN WEAKNESS AND STRENGTH DETECTION AND TRACKING DURING A SEMIC...

PATTERN WEAKNESS AND STRENGTH DETECTION AND TRACKING DURING A SEMIC...

Trademarklast 30 trademarks

78105551 - NANOSCOPE