ANRITSU INFIVIS CO., LTD

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KANAGAWA, JP

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Patents Grantslast 30 patents

Information Patent Grant
Metal detection apparatus
- Patent number 10,996,363
- Issue date May 4, 2021
- ANRITSU INFIVIS CO., LTD.
- Yuki Hayakawa
- G01 - MEASURING TESTING
Information Patent Grant
X-ray tube and X-ray generation device
- Patent number 10,999,918
- Issue date May 4, 2021
- ANRITSU INFIVIS CO., LTD.
- Hiroyuki Koba
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
X-ray inspection apparatus
- Patent number 10,866,331
- Issue date Dec 15, 2020
- ANRITSU INFIVIS CO., LTD.
- Naoya Saito
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
X-ray inspection device
- Patent number 10,790,067
- Issue date Sep 29, 2020
- ANRITSU INFIVIS CO., LTD.
- Koji Omori
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
X-ray inspection apparatus and correction method for X-ray inspecti...
- Patent number 10,718,725
- Issue date Jul 21, 2020
- ANRITSU INFIVIS CO., LTD.
- Itaru Miyazaki
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Metal detection apparatus and metal detection method
- Patent number 10,338,260
- Issue date Jul 2, 2019
- ANRITSU INFIVIS CO., LTD.
- Yoshifumi Takahashi
- G01 - MEASURING TESTING
Information Patent Grant
X-ray inspection device
- Patent number 10,292,251
- Issue date May 14, 2019
- ANRITSU INFIVIS CO., LTD.
- Toshiaki Kikuchi
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR

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Patents Applicationslast 30 patents

Information Patent Application
X-RAY TUBE AND X-RAY GENERATION DEVICE
- Publication number 20210092823
- Publication date Mar 25, 2021
- ANRITSU INFIVIS CO., LTD.
- Hiroyuki KOBA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ARTICLE INSPECTION APPARATUS
- Publication number 20200191642
- Publication date Jun 18, 2020
- ANRITSU INFIVIS CO., LTD.
- Junichi TAMURA
- G01 - MEASURING TESTING
Information Patent Application
ARTICLE INSPECTION INFORMATION MANAGEMENT APPARATUS, PROGRAM FOR TH...
- Publication number 20200184619
- Publication date Jun 11, 2020
- ANRITSU INFIVIS CO., LTD.
- Osamu TAKATA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
X-RAY INSPECTION APPARATUS
- Publication number 20200116877
- Publication date Apr 16, 2020
- ANRITSU INFIVIS CO., LTD.
- Naoya SAITO
- G01 - MEASURING TESTING
Information Patent Application
METAL DETECTION APPARATUS
- Publication number 20200073007
- Publication date Mar 5, 2020
- ANRITSU INFIVIS CO., LTD.
- Yuki HAYAKAWA
- G01 - MEASURING TESTING
Information Patent Application
ARTICLE SORTING APPARATUS
- Publication number 20200023410
- Publication date Jan 23, 2020
- ANRITSU INFIVIS CO., LTD.
- Junichi TAMURA
- G01 - MEASURING TESTING
Information Patent Application
ARTICLE INSPECTION APPARATUS, ARTICLE INSPECTION SYSTEM, AND NON-TR...
- Publication number 20190376912
- Publication date Dec 12, 2019
- ANRITSU INFIVIS CO., LTD.
- Osamu TAKATA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ARTICLE INSPECTION APPARATUS
- Publication number 20190197090
- Publication date Jun 27, 2019
- ANRITSU INFIVIS CO., LTD.
- Takamasa Ito
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METAL DETECTION APPARATUS AND METAL DETECTION METHOD
- Publication number 20190041537
- Publication date Feb 7, 2019
- ANRITSU INFIVIS CO., LTD.
- Yoshifumi TAKAHASHI
- G01 - MEASURING TESTING
Information Patent Application
X-RAY INSPECTION APPARATUS AND CORRECTION METHOD FOR X-RAY INSPECTI...
- Publication number 20190003989
- Publication date Jan 3, 2019
- ANRITSU INFIVIS CO., LTD.
- Itaru MIYAZAKI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
X-RAY INSPECTION DEVICE
- Publication number 20180122526
- Publication date May 3, 2018
- ANRITSU INFIVIS CO., LTD.
- Koji OMORI
- G01 - MEASURING TESTING
Information Patent Application
X-RAY INSPECTION DEVICE
- Publication number 20170171953
- Publication date Jun 15, 2017
- ANRITSU INFIVIS CO., LTD.
- Toshiaki KIKUCHI
- G01 - MEASURING TESTING

ANRITSU INFIVIS CO., LTD

Organization

Patents Grantslast 30 patents

Metal detection apparatus

X-ray tube and X-ray generation device

X-ray inspection apparatus

X-ray inspection device

X-ray inspection apparatus and correction method for X-ray inspecti...

Metal detection apparatus and metal detection method

X-ray inspection device

Patents Applicationslast 30 patents

X-RAY TUBE AND X-RAY GENERATION DEVICE

ARTICLE INSPECTION APPARATUS

ARTICLE INSPECTION INFORMATION MANAGEMENT APPARATUS, PROGRAM FOR TH...

X-RAY INSPECTION APPARATUS

METAL DETECTION APPARATUS

ARTICLE SORTING APPARATUS

ARTICLE INSPECTION APPARATUS, ARTICLE INSPECTION SYSTEM, AND NON-TR...

ARTICLE INSPECTION APPARATUS

METAL DETECTION APPARATUS AND METAL DETECTION METHOD

X-RAY INSPECTION APPARATUS AND CORRECTION METHOD FOR X-RAY INSPECTI...

X-RAY INSPECTION DEVICE

X-RAY INSPECTION DEVICE