ANTON PAAR OPTOTEC GMBH

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Seelze-Letter, DE

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Patents Grantslast 30 patents

Information Patent Grant
Determining polarization rotation characteristics of a sample takin...
- Patent number 10,267,727
- Issue date Apr 23, 2019
- Anton Paar Optotec GmbH
- Martin Ostermeyer
- G01 - MEASURING TESTING
Information Patent Grant
Temperature calibration for a measuring apparatus
- Patent number 10,018,520
- Issue date Jul 10, 2018
- Anton Paar Optotec GmbH
- Martin Ostermeyer
- G01 - MEASURING TESTING
Information Patent Grant
Wavelength calibration for refractometers
- Patent number 9,927,358
- Issue date Mar 27, 2018
- Anton Paar Optotec GmbH
- Martin Ostermeyer
- G01 - MEASURING TESTING
Information Patent Grant
Temperature modulated refractive index measurement
- Patent number 8,928,872
- Issue date Jan 6, 2015
- Anton Paar Optotec GmbH
- Ulrich Muller
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
COMMUNICATION BETWEEN AN OPTICAL MEASURING DEVICE AND TWO MEASURING...
- Publication number 20230341333
- Publication date Oct 26, 2023
- ANTON PAAR OPTOTEC GMBH
- Martin Ostermeyer
- G01 - MEASURING TESTING
Information Patent Application
Temperature Calibration for a Measuring Apparatus
- Publication number 20160320252
- Publication date Nov 3, 2016
- ANTON PAAR OPTOTEC GMBH
- Martin Ostermeyer
- G01 - MEASURING TESTING
Information Patent Application
Wavelength Calibration for Refractometers
- Publication number 20160320297
- Publication date Nov 3, 2016
- ANTON PAAR OPTOTEC GMBH
- Martin Ostermeyer
- G01 - MEASURING TESTING
Information Patent Application
Temperature Modulated Refractive Index Measurement
- Publication number 20130155395
- Publication date Jun 20, 2013
- ANTON PAAR OPTOTEC GMBH
- Ulrich Muller
- G01 - MEASURING TESTING

Trademarklast 30 trademarks