Applejack 199 L.P.

Organization

Los Altos, CA, US

Organizations

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Patents Grantslast 30 patents

Information Patent Grant
Focusing of optical devices
- Patent number 11,163,144
- Issue date Nov 2, 2021
- APPLEJACK 199 L.P.
- Mihail Mihaylov
- G02 - OPTICS
Information Patent Grant
Multi-probe gauge for slab characterization
- Patent number 11,112,234
- Issue date Sep 7, 2021
- APPLEJACK 199 L.P.
- Wojciech J. Walecki
- G01 - MEASURING TESTING
Information Patent Grant
Non-contact measurement of a stress in a film on substrate
- Patent number 11,105,611
- Issue date Aug 31, 2021
- APPLEJACK 199 L.P.
- Wojciech J Walecki
- G01 - MEASURING TESTING
Information Patent Grant
Multi-probe gauge for slab characterization
- Patent number 11,073,372
- Issue date Jul 27, 2021
- APPLEJACK 199 L.P.
- Wojciech J. Walecki
- G01 - MEASURING TESTING
Information Patent Grant
Non-contact measurement of a stress in a film on a substrate
- Patent number 10,964,730
- Issue date Mar 30, 2021
- APPLEJACK 199 L.P.
- Oanh Nguyen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Focusing of optical devices
- Patent number 10,935,777
- Issue date Mar 2, 2021
- APPLEJACK 199 L.P.
- Mihail Mihaylov
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Inspecting a multilayer sample
- Patent number 10,890,434
- Issue date Jan 12, 2021
- APPLEJACK 199 L.P.
- Wojciech Jan Walecki
- G01 - MEASURING TESTING
Information Patent Grant
Inspecting a multilayer sample
- Patent number 10,655,949
- Issue date May 19, 2020
- APPLEJACK 199 L.P.
- Wojciech Jan Walecki
- G01 - MEASURING TESTING
Information Patent Grant
Characterization of specular surfaces
- Patent number 10,621,739
- Issue date Apr 14, 2020
- APPLEJACK 199 L.P.
- Wojciech J Walecki
- G01 - MEASURING TESTING
Information Patent Grant
Hybrid silicon-metal anode using microparticles for lithium-ion bat...
- Patent number 10,593,934
- Issue date Mar 17, 2020
- APPLEJACK 199 L.P.
- Wenming Li
- B22 - CASTING POWDER METALLURGY
Information Patent Grant
Error reduction in measurement of samples of materials
- Patent number 10,584,958
- Issue date Mar 10, 2020
- APPLEJACK 199 L.P.
- Wojciech Jan Walecki
- G01 - MEASURING TESTING
Information Patent Grant
Dual-sensor arrangment for inspecting slab of material
- Patent number 10,563,975
- Issue date Feb 18, 2020
- APPLEJACK 199 L.P.
- Wojciech J. Walecki
- G01 - MEASURING TESTING
Information Patent Grant
Non-contact measurement of a stress in a film on a substrate
- Patent number 10,553,623
- Issue date Feb 4, 2020
- APPLEJACK 199 L.P.
- Wojciech Jan Walecki
- G01 - MEASURING TESTING
Information Patent Grant
Multi-probe gauge for slab characterization
- Patent number 10,551,163
- Issue date Feb 4, 2020
- APPLEJACK 199 L.P.
- Wojciech J. Walecki
- G01 - MEASURING TESTING
Information Patent Grant
System, method and apparatus for forming a thin film lithium ion ba...
- Patent number 10,535,868
- Issue date Jan 14, 2020
- APPLEJACK 199 L.P.
- Wenming Li
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Measurement of surface topography of a work-piece
- Patent number 10,533,841
- Issue date Jan 14, 2020
- APPLEJACK 199 L.P.
- Wojciech J. Walecki
- G01 - MEASURING TESTING
Information Patent Grant
Inspecting a slab of material
- Patent number 10,480,925
- Issue date Nov 19, 2019
- APPLEJACK 199 L.P.
- Wojciech Jan Walecki
- G01 - MEASURING TESTING
Information Patent Grant
Focusing of optical devices
- Patent number 10,416,430
- Issue date Sep 17, 2019
- Applejack 199 L.P.
- Wojciech J Walecki
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Multi-probe gauge for slab characterization
- Patent number 10,209,058
- Issue date Feb 19, 2019
- APPLEJACK 199 L.P.
- Wojciech J. Walecki
- G01 - MEASURING TESTING
Information Patent Grant
Measurement of surface topography of a work-piece
- Patent number 10,203,198
- Issue date Feb 12, 2019
- APPLEJACK 199 L.P.
- Wojciech J. Walecki
- G01 - MEASURING TESTING
Information Patent Grant
Inspecting a slab of material
- Patent number 10,168,138
- Issue date Jan 1, 2019
- APPLEJACK 199 L.P.
- Wojciech Jan Walecki
- G01 - MEASURING TESTING
Information Patent Grant
Inspecting a multilayer sample
- Patent number 10,113,860
- Issue date Oct 30, 2018
- APPLEJACK 199, L.P.
- Wojciech Jan Walecki
- G01 - MEASURING TESTING
Information Patent Grant
Inspecting a slab of material
- Patent number 10,036,624
- Issue date Jul 31, 2018
- Applejack 199 L.P.
- Wojciech Jan Walecki
- G01 - MEASURING TESTING
Information Patent Grant
Inspecting a slab of material
- Patent number 9,915,564
- Issue date Mar 13, 2018
- APPLEJACK 199, L.P.
- Wojciech Jan Walecki
- G01 - MEASURING TESTING
Information Patent Grant
Porous, thin film electrodes for lithium-ion batteries
- Patent number 9,748,569
- Issue date Aug 29, 2017
- Applejack 199 L.P.
- Wenming Li
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
System, method and apparatus for forming a thin film lithium ion ba...
- Patent number 9,478,797
- Issue date Oct 25, 2016
- Applejack 199 L.P.
- Wenming Li
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and system for measuring patterned substrates
- Patent number 9,316,490
- Issue date Apr 19, 2016
- Applejack 199 L.P.
- Arun Ananth Aiyer
- G01 - MEASURING TESTING
Information Patent Grant
System, method and apparatus for capturing and training a swing mov...
- Patent number 9,272,199
- Issue date Mar 1, 2016
- Applejack 199 L.P.
- Uwe Richter
- A63 - SPORTS GAMES AMUSEMENTS

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Patents Applicationslast 30 patents

Information Patent Application
FOCUSING OF OPTICAL DEVICES
- Publication number 20210132355
- Publication date May 6, 2021
- Applejack 199 L.P.
- Mihail MIHAYLOV
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
CHARACTERIZATION OF SPECULAR SURFACES
- Publication number 20200320724
- Publication date Oct 8, 2020
- Applejack 199 L.P.
- Wojciech J WALECKI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
HYBRID SILICON-METAL ANODE USING MICROPARTICLES FOR LITHIUM-ION BAT...
- Publication number 20200266427
- Publication date Aug 20, 2020
- Applejack 199 L.P.
- Wenming Li
- B22 - CASTING POWDER METALLURGY
Information Patent Application
INSPECTING A SLAB OF MATERIAL
- Publication number 20200191550
- Publication date Jun 18, 2020
- Applejack 199 L.P.
- Wojciech Jan WALECKI
- G01 - MEASURING TESTING
Information Patent Application
DUAL-SENSOR ARRANGMENT FOR INSPECTING SLAB OF MATERIAL
- Publication number 20200182607
- Publication date Jun 11, 2020
- Applejack 199 L.P.
- Wojciech J. WALECKI
- G01 - MEASURING TESTING
Information Patent Application
MULTI-PROBE GAUGE FOR SLAB CHARACTERIZATION
- Publication number 20200149867
- Publication date May 14, 2020
- Applejack 199 L.P.
- Wojciech J. WALECKI
- G01 - MEASURING TESTING
Information Patent Application
MULTI-PROBE GAUGE FOR SLAB CHARACTERIZATION
- Publication number 20200149866
- Publication date May 14, 2020
- Applejack 199 L.P.
- Wojciech J. WALECKI
- G01 - MEASURING TESTING
Information Patent Application
NON-CONTACT MEASUREMENT OF A STRESS IN A FILM ON A SUBSTRATE
- Publication number 20200152783
- Publication date May 14, 2020
- Applejack 199 L.P.
- Oanh Nguyen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ERROR REDUCTION IN MEASUREMENT OF SAMPLES OF MATERIALS
- Publication number 20200049488
- Publication date Feb 13, 2020
- Applejack 199 L.P.
- Wojciech Jan WALECKI
- G01 - MEASURING TESTING
Information Patent Application
FOCUSING OF OPTICAL DEVICES
- Publication number 20200033578
- Publication date Jan 30, 2020
- Applejack 199 L.P.
- Mihail MIHAYLOV
- G02 - OPTICS
Information Patent Application
DUAL-SENSOR ARRANGMENT FOR INSPECTING SLAB OF MATERIAL
- Publication number 20200033114
- Publication date Jan 30, 2020
- Applejack 199 L.P.
- Wojciech J. WALECKI
- G01 - MEASURING TESTING
Information Patent Application
NON-CONTACT MEASUREMENT OF A STRESS IN A FILM ON SUBSTRATE
- Publication number 20190353475
- Publication date Nov 21, 2019
- Applejack 199 L.P.
- Wojciech J. WALECKI
- G01 - MEASURING TESTING
Information Patent Application
CHARACTERIZATION OF SPECULAR SURFACES
- Publication number 20190304110
- Publication date Oct 3, 2019
- Applejack 199 L.P.
- Wojciech J WALECKI
- G01 - MEASURING TESTING
Information Patent Application
MULTI-PROBE GAUGE FOR SLAB CHARACTERIZATION
- Publication number 20190277622
- Publication date Sep 12, 2019
- Applejack 199 L.P.
- Wojciech J. WALECKI
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL DEVICE EMPLOYING ELECTRICALLY ADDRESSED SPATIAL LIGHT MODUL...
- Publication number 20190243148
- Publication date Aug 8, 2019
- Applejack 199 L.P.
- Wojciech J. WALECKI
- G01 - MEASURING TESTING
Information Patent Application
MEASUREMENT OF SURFACE TOPOGRAPHY OF A WORK-PIECE
- Publication number 20190170505
- Publication date Jun 6, 2019
- Applejack 199 L.P.
- Wojciech J. WALECKI
- G01 - MEASURING TESTING
Information Patent Application
INSPECTING A MULTILAYER SAMPLE
- Publication number 20190120611
- Publication date Apr 25, 2019
- Applejack 199 L.P.
- WOJCIECH JAN WALECKI
- G01 - MEASURING TESTING
Information Patent Application
INSPECTING A MULTILAYER SAMPLE
- Publication number 20190094012
- Publication date Mar 28, 2019
- Applejack 199 L.P.
- Wojciech Jan WALECKI
- G01 - MEASURING TESTING
Information Patent Application
INSPECTING A SLAB OF MATERIAL
- Publication number 20190086191
- Publication date Mar 21, 2019
- Applejack 199 L.P.
- Wojciech Jan WALECKI
- G01 - MEASURING TESTING
Information Patent Application
INSPECTING A SLAB OF MATERIAL
- Publication number 20190025041
- Publication date Jan 24, 2019
- Applejack 199 L.P.
- WOJCIECH JAN WALECKI
- G01 - MEASURING TESTING
Information Patent Application
MEASUREMENT OF SURFACE TOPOGRAPHY OF A WORK-PIECE
- Publication number 20180335295
- Publication date Nov 22, 2018
- Applejack 199 L.P.
- Wojciech J. WALECKI
- G01 - MEASURING TESTING
Information Patent Application
FOCUSING OF OPTICAL DEVICES
- Publication number 20180329192
- Publication date Nov 15, 2018
- Applejack 199 L.P.
- Wojciech J. WALECKI
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
NON-CONTACT MEASUREMENT OF A STRESS IN A FILM ON A SUBSTRATE
- Publication number 20180308971
- Publication date Oct 25, 2018
- Applejack 199 L.P.
- Wojciech Jan Walecki
- G01 - MEASURING TESTING
Information Patent Application
INSPECTING A MULTILAYER SAMPLE
- Publication number 20180299255
- Publication date Oct 18, 2018
- Applejack 199 L.P.
- WOJCIECH JAN WALECKI
- G01 - MEASURING TESTING
Information Patent Application
INSPECTING A SLAB OF MATERIAL
- Publication number 20180202794
- Publication date Jul 19, 2018
- Applejack 199 L.P.
- WOJCIECH JAN WALECKI
- G01 - MEASURING TESTING
Information Patent Application
HYBRID SILICON-METAL ANODE USING MICROPARTICLES FOR LITHIUM-ION BAT...
- Publication number 20170194639
- Publication date Jul 6, 2017
- Applejack 199 L.P.
- Wenming Li
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Application
SYSTEM, METHOD AND APPARATUS FOR FORMING A THIN FILM LITHIUM ION BA...
- Publication number 20170040595
- Publication date Feb 9, 2017
- Applejack 199 L.P.
- Wenming LI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INTERFEROMETER
- Publication number 20160334205
- Publication date Nov 17, 2016
- Applejack 199 L.P.
- ARUN ANANTH AIYER
- G01 - MEASURING TESTING
Information Patent Application
WEARABLE DEVICES
- Publication number 20160070296
- Publication date Mar 10, 2016
- Applejack 199 L.P.
- Ann KOO
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MEASURING DEVICE FOR DETECTING A HITTING MOVEMENT OF A HITTING IMPL...
- Publication number 20150343293
- Publication date Dec 3, 2015
- Applejack 199 L.P.
- Ann KOO
- G01 - MEASURING TESTING

Applejack 199 L.P.

Organization

Patents Grantslast 30 patents

Focusing of optical devices

Multi-probe gauge for slab characterization

Non-contact measurement of a stress in a film on substrate

Multi-probe gauge for slab characterization

Non-contact measurement of a stress in a film on a substrate

Focusing of optical devices

Inspecting a multilayer sample

Inspecting a multilayer sample

Characterization of specular surfaces

Hybrid silicon-metal anode using microparticles for lithium-ion bat...

Error reduction in measurement of samples of materials

Dual-sensor arrangment for inspecting slab of material

Non-contact measurement of a stress in a film on a substrate

Multi-probe gauge for slab characterization

System, method and apparatus for forming a thin film lithium ion ba...

Measurement of surface topography of a work-piece

Inspecting a slab of material

Focusing of optical devices

Multi-probe gauge for slab characterization

Measurement of surface topography of a work-piece

Inspecting a slab of material

Inspecting a multilayer sample

Inspecting a slab of material

Inspecting a slab of material

Porous, thin film electrodes for lithium-ion batteries

System, method and apparatus for forming a thin film lithium ion ba...

Method and system for measuring patterned substrates

System, method and apparatus for capturing and training a swing mov...

Patents Applicationslast 30 patents

FOCUSING OF OPTICAL DEVICES

CHARACTERIZATION OF SPECULAR SURFACES

HYBRID SILICON-METAL ANODE USING MICROPARTICLES FOR LITHIUM-ION BAT...

INSPECTING A SLAB OF MATERIAL

DUAL-SENSOR ARRANGMENT FOR INSPECTING SLAB OF MATERIAL

MULTI-PROBE GAUGE FOR SLAB CHARACTERIZATION

MULTI-PROBE GAUGE FOR SLAB CHARACTERIZATION

NON-CONTACT MEASUREMENT OF A STRESS IN A FILM ON A SUBSTRATE

ERROR REDUCTION IN MEASUREMENT OF SAMPLES OF MATERIALS

FOCUSING OF OPTICAL DEVICES

DUAL-SENSOR ARRANGMENT FOR INSPECTING SLAB OF MATERIAL

NON-CONTACT MEASUREMENT OF A STRESS IN A FILM ON SUBSTRATE

CHARACTERIZATION OF SPECULAR SURFACES

MULTI-PROBE GAUGE FOR SLAB CHARACTERIZATION

OPTICAL DEVICE EMPLOYING ELECTRICALLY ADDRESSED SPATIAL LIGHT MODUL...

MEASUREMENT OF SURFACE TOPOGRAPHY OF A WORK-PIECE

INSPECTING A MULTILAYER SAMPLE

INSPECTING A MULTILAYER SAMPLE

INSPECTING A SLAB OF MATERIAL

INSPECTING A SLAB OF MATERIAL

MEASUREMENT OF SURFACE TOPOGRAPHY OF A WORK-PIECE

FOCUSING OF OPTICAL DEVICES

NON-CONTACT MEASUREMENT OF A STRESS IN A FILM ON A SUBSTRATE

INSPECTING A MULTILAYER SAMPLE

INSPECTING A SLAB OF MATERIAL

HYBRID SILICON-METAL ANODE USING MICROPARTICLES FOR LITHIUM-ION BAT...

SYSTEM, METHOD AND APPARATUS FOR FORMING A THIN FILM LITHIUM ION BA...

INTERFEROMETER

WEARABLE DEVICES

MEASURING DEVICE FOR DETECTING A HITTING MOVEMENT OF A HITTING IMPL...