Applied Nanostructures, inc.

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Santa Clara, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Micro heater integrated with thermal sensing assembly
- Patent number 10,352,781
- Issue date Jul 16, 2019
- Applied Nanostructures, Inc.
- Gary D. Aden
- G01 - MEASURING TESTING
Information Patent Grant
Vertical embedded sensor and process of manufacturing thereof
- Patent number 9,389,244
- Issue date Jul 12, 2016
- Applied Nanostructures, Inc.
- Jeremy J. Goeckeritz
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Scanning probe having integrated silicon tip with cantilever
- Patent number 8,828,243
- Issue date Sep 9, 2014
- Applied Nanostructures, Inc.
- Rakesh Poddar
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Scanning probe devices
- Patent number 8,397,555
- Issue date Mar 19, 2013
- Applied Nanostructures, Inc.
- Ami Chand
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Method of forming semiconductor devices in wafer assembly
- Patent number 8,003,534
- Issue date Aug 23, 2011
- Applied Nanostructures, Inc.
- Ami Chand
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Scanning probe devices and methods for fabricating same
- Patent number 7,913,544
- Issue date Mar 29, 2011
- Applied Nanostructures, Inc.
- Ami Chand
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Semiconductor device in wafer assembly
- Patent number 7,884,445
- Issue date Feb 8, 2011
- Applied Nanostructures, Inc.
- Ami Chand
- B81 - MICRO-STRUCTURAL TECHNOLOGY

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Patents Applicationslast 30 patents

Information Patent Application
PROBE DEVICE FOR SCANNING PROBE MICROSCOPES AND METHOD OF MANUFACTU...
- Publication number 20170184631
- Publication date Jun 29, 2017
- APPLIED NANOSTRUCTURES, INC.
- Ami Chand
- G01 - MEASURING TESTING
Information Patent Application
MICRO HEATER INTEGRATED WITH THERMAL SENSING ASSEMBLY
- Publication number 20150204734
- Publication date Jul 23, 2015
- APPLIED NANOSTRUCTURES, INC.
- Gary D. Aden
- G01 - MEASURING TESTING
Information Patent Application
Vertical Embedded Sensor and Process of Manufacturing Thereof
- Publication number 20140338075
- Publication date Nov 13, 2014
- APPLIED NANOSTRUCTURES, INC.
- Jeremy J. Goeckeritz
- B82 - NANO-TECHNOLOGY
Information Patent Application
Scanning probe having integrated silicon tip with cantilever
- Publication number 20120060244
- Publication date Mar 8, 2012
- Applied NanoStructures, Inc.
- Rakesh Poddar
- G01 - MEASURING TESTING
Information Patent Application
Method of forming semiconductor devices in wafer assembly
- Publication number 20110092046
- Publication date Apr 21, 2011
- Applied NanoStructures, Inc.
- Ami Chand
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
Semiconductor device in wafer assembly
- Publication number 20080116533
- Publication date May 22, 2008
- Applied NanoStructures, Inc.
- Ami Chand
- B81 - MICRO-STRUCTURAL TECHNOLOGY

NSF Awardslast 12 months

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Count: 2

NSF Awards

Information NSF Award
SBIR Phase II: Integrated Thermal Scanning Probe Development
- Award Id 1256640
- Effective date Mar 1, 2013
Information NSF Award
SBIR Phase I: Integrated Thermal Scanning Probe Development
- Award Id 1113523
- Effective date Jul 1, 2011