ASML HOLDING N.V., A NETHERLANDS CORPORATION

Organization

VELDHOVEN, NL

Ticker Symbols

NASDAQ:ASML

SPECIAL INDUSTRY MACHINERY, NEC
Business Address
DE RUN 6501 DR VELDHOVEN P7 5504 31402683000
Mailing Address
P.O. BOX 324 AH VELDHOVEN P7 5500
State Location
P7
State of Incorporation

Organizations

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Patents Grantslast 30 patents

Information Patent Grant
Apparatus for positioning and clamped curing
- Patent number 12,271,108
- Issue date Apr 8, 2025
- ASML Netherlands B.V.
- Martin Dieter Nico Peters
- B65 - CONVEYING PACKING STORING HANDLING THIN OR FILAMENTARY MATERIAL
Information Patent Grant
Method and apparatus for predicting substrate image
- Patent number 12,271,114
- Issue date Apr 8, 2025
- ASML Netherlands B.V.
- Scott Anderson Middlebrooks
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Reflector manufacturing method and associated reflector
- Patent number 12,269,229
- Issue date Apr 8, 2025
- ASML Netherlands B.V.
- Sander Bas Roobol
- B29 - WORKING OF PLASTICS WORKING OF SUBSTANCES IN A PLASTIC STATE, IN GENERAL
Information Patent Grant
Transmissive diffusor
- Patent number 12,271,008
- Issue date Apr 8, 2025
- ASML Netherlands B.V.
- Andrey Nikipelov
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Method for calibration of an optical measurement system and optical...
- Patent number 12,270,647
- Issue date Apr 8, 2025
- ASML Netherlands B.V.
- Maarten Jozef Jansen
- G01 - MEASURING TESTING
Information Patent Grant
Target delivery system
- Patent number 12,273,986
- Issue date Apr 8, 2025
- ASML Netherlands B.V.
- Georgiy Olegovich Vaschenko
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Compact dual pass interferometer for a plane mirror interferometer
- Patent number 12,270,644
- Issue date Apr 8, 2025
- ASML Netherlands B.V.
- Maarten Jozef Jansen
- G02 - OPTICS
Information Patent Grant
Method and apparatus for coherence scrambling in metrology applicat...
- Patent number 12,265,229
- Issue date Apr 1, 2025
- ASML Netherlands B.V.
- Zili Zhou
- G02 - OPTICS
Information Patent Grant
Exposure apparatus
- Patent number 12,265,337
- Issue date Apr 1, 2025
- ASML Netherlands B.V.
- Junichi Kanehara
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Micromirror arrays
- Patent number 12,259,546
- Issue date Mar 25, 2025
- ASML Netherlands B.V.
- Alexandre Halbach
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Method of designing an alignment mark
- Patent number 12,259,664
- Issue date Mar 25, 2025
- ASML Netherlands B.V.
- Jigang Ma
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Aligning a distorted image
- Patent number 12,259,659
- Issue date Mar 25, 2025
- ASML Netherlands B.V.
- Coen Adrianus Verschuren
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Apparatus and method for property joint interpolation and prediction
- Patent number 12,254,392
- Issue date Mar 18, 2025
- ASML Netherlands B.V.
- Faegheh Hasibi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Height measurement method and height measurement system
- Patent number 12,253,807
- Issue date Mar 18, 2025
- ASML Netherlands B.V.
- Andrey Valerievich Rogachevskiy
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Numerically compensating SEM-induced charging using diffusion-based...
- Patent number 12,255,042
- Issue date Mar 18, 2025
- ASML Netherlands B.V.
- Thomas Jarik Huisman
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Stage anti-fretting mechanism for roller bearing lifetime improvement
- Patent number 12,249,481
- Issue date Mar 11, 2025
- ASML Netherlands B.V.
- Mark Henricus Wilhelmus Van Gerven
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Substrate holder for use in a lithographic apparatus
- Patent number 12,249,535
- Issue date Mar 11, 2025
- ASML Netherlands B.V.
- Niek Jacobus Johannes Roset
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Wavelength tracking system, method to calibrate a wavelength tracki...
- Patent number 12,247,883
- Issue date Mar 11, 2025
- ASML Netherlands B.V.
- Engelbertus Antonius Fransiscus Van Der Pasch
- G01 - MEASURING TESTING
Information Patent Grant
Fluid transfer system in a charged particle system
- Patent number 12,249,480
- Issue date Mar 11, 2025
- ASML Netherlands B.V.
- Marcus Adrianus Van De Kerkhof
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Grant
Differential measurement system
- Patent number 12,248,255
- Issue date Mar 11, 2025
- ASML Netherlands B.V.
- Hubert Matthieu Richard Steijns
- G01 - MEASURING TESTING
Information Patent Grant
Determining hot spot ranking based on wafer measurement
- Patent number 12,242,201
- Issue date Mar 4, 2025
- ASML Netherlands B.V.
- Youping Zhang
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method for preparing a substrate and lithographic apparatus
- Patent number 12,242,206
- Issue date Mar 4, 2025
- ASML Netherlands B.V.
- Dennis Dominic Van Der Voort
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Lens designs
- Patent number 12,243,714
- Issue date Mar 4, 2025
- ASML Netherlands B.V.
- Laura Del Tin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus using multiple charged particle beams
- Patent number 12,243,709
- Issue date Mar 4, 2025
- ASML Netherlands B.V.
- Weiming Ren
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Target for measuring a parameter of a lithographic process
- Patent number 12,242,203
- Issue date Mar 4, 2025
- ASML Netherlands B.V.
- Maurits Van Der Schaar
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Optical isolation module
- Patent number 12,245,350
- Issue date Mar 4, 2025
- ASML Netherlands B.V.
- Yezheng Tao
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Lithography apparatus and a method of manufacturing a device
- Patent number 12,242,200
- Issue date Mar 4, 2025
- ASML Netherlands B.V.
- Erik Henricus Egidius Catharina Eummelen
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Substrate support, lithographic apparatus, method for manipulating...
- Patent number 12,242,204
- Issue date Mar 4, 2025
- ASML Netherlands B.V.
- Ruud Antonius Catharina Maria Beerens
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Substrate holder for use in a lithographic apparatus and a device m...
- Patent number 12,243,768
- Issue date Mar 4, 2025
- ASML Netherlands B.V.
- Johannes Josephus Maassen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Object holder, electrostatic sheet and method for making an electro...
- Patent number 12,235,592
- Issue date Feb 25, 2025
- ASML Netherlands B.V.
- Bastiaan Lambertus Wilhelmus Marinus Van De Ven
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Patents Applicationslast 30 patents

Information Patent Application
METHOD OF ASSESSING A SAMPLE, APPARATUS FOR ASSESSING A SAMPLE
- Publication number 20250116587
- Publication date Apr 10, 2025
- ASML NETHERLANDS B.V.
- Marco Jan-Jaco WIELAND
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
LITHOGRAPHIC APPARATUS CONTROLLER SYSTEM
- Publication number 20250116944
- Publication date Apr 10, 2025
- ASML NETHERLANDS B.V.
- Bas Johannes Petrus ROSET
- G05 - CONTROLLING REGULATING
Information Patent Application
ACTIVE LEARNING TO IMPROVE WAFER DEFECT CLASSIFICATION
- Publication number 20250117921
- Publication date Apr 10, 2025
- ASML NETHERLANDS B.V.
- Blagorodna ILIEVSKA ALCHEVA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
OPTICAL APPARATUS
- Publication number 20250116943
- Publication date Apr 10, 2025
- ASML NETHERLANDS B.V.
- Debashis DE MUNSHI
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
CHARGED PARTICLE ASSESSMENT SYSTEM AND METHOD
- Publication number 20250118528
- Publication date Apr 10, 2025
- ASML NETHERLANDS B.V.
- Marco Jan-Jaco WIELAND
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
A SUPERCONTINUUM RADIATION SOURCE AND ASSOCIATED METROLOGY DEVICES
- Publication number 20250110381
- Publication date Apr 3, 2025
- ASML NETHERLANDS B.V.
- Yongfeng Ni
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
APPARATUS OF PLURAL CHARGED-PARTICLE BEAMS
- Publication number 20250112023
- Publication date Apr 3, 2025
- ASML NETHERLANDS B.V.
- Weiming REN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
A FRAMEWORK FOR CONDITION TUNING AND IMAGE PROCESSING FOR METROLOGY...
- Publication number 20250102923
- Publication date Mar 27, 2025
- ASML NETHERLANDS B.V.
- Lingling PU
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
METHOD FOR CONTROLLING A PRODUCTION SYSTEM AND METHOD FOR THERMALLY...
- Publication number 20250103855
- Publication date Mar 27, 2025
- ASML NETHERLANDS B.V.
- Wenjie JIN
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD AND SYSTEM OF DEFECT DETECTION FOR INSPECTION SAMPLE BASED O...
- Publication number 20250104210
- Publication date Mar 27, 2025
- ASML NETHERLANDS B.V.
- Lingling PU
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ASSEMBLY FOR A LITHOGRAPHIC APPARATUS
- Publication number 20250102902
- Publication date Mar 27, 2025
- ASML NETHERLANDS B.V.
- Tim Willem Johan VAN DE GOOR
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
TRAINING A MODEL TO GENERATE PREDICTIVE DATA
- Publication number 20250103964
- Publication date Mar 27, 2025
- ASML NETHERLANDS B.V.
- Maxim PISARENCO
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ELECTRON-OPTICAL DEVICE
- Publication number 20250095950
- Publication date Mar 20, 2025
- ASML NETHERLANDS B.V.
- Paul IJmert SCHEFFERS
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF PROCESSING DATA DERIVED FROM A SAMPLE
- Publication number 20250095133
- Publication date Mar 20, 2025
- ASML NETHERLANDS B.V.
- Vincent Sylvester KUIPER
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
RESIST UNDER-LAYER FOR USE IN A LITHOGRAPHIC APPARATUS
- Publication number 20250093774
- Publication date Mar 20, 2025
- ASML NETHERLANDS B.V.
- Sander Frederik WUISTER
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
IMAGE ENHANCEMENT IN CHARGED PARTICLE INSPECTION
- Publication number 20250095116
- Publication date Mar 20, 2025
- ASML NETHERLANDS B.V.
- Hairong LEI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
TEMPERATURE MEASUREMENT OF OPTICAL ELEMENTS IN AN OPTICAL APPARATUS
- Publication number 20250085172
- Publication date Mar 13, 2025
- ASML Netherland B.V.
- Koen Martin Willem Jan BOS
- G01 - MEASURING TESTING
Information Patent Application
DATA PROCESSING DEVICE AND METHOD, CHARGED PARTICLE ASSESSMENT SYST...
- Publication number 20250087444
- Publication date Mar 13, 2025
- ASML NETHERLANDS B.V.
- Marco Jan-Jaco WIELAND
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEMS AND METHODS FOR GENERATING MULTIPLE ILLUMINATION SPOTS FROM...
- Publication number 20250085646
- Publication date Mar 13, 2025
- ASML NETHERLANDS B.V.
- Kirill Urievich SOBOLEV
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
CHARGED PARTICLE-OPTICAL APPARATUS
- Publication number 20250087445
- Publication date Mar 13, 2025
- ASML NETHERLANDS B.V.
- Marco Jan-Jaco WIELAND
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CALIBRATION SYSTEM FOR AN EXTREME ULTRAVIOLET LIGHT SOURCE
- Publication number 20250085641
- Publication date Mar 13, 2025
- ASML NETHERLANDS B.V.
- Daniel Jason Riggs
- G01 - MEASURING TESTING
Information Patent Application
CLEANING A STRUCTURE SURFACE IN AN EUV CHAMBER
- Publication number 20250085643
- Publication date Mar 13, 2025
- ASML NETHERLANDS B.V.
- Chunguang Xia
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
UTILIZE MACHINE LEARNING IN SELECTING HIGH QUALITY AVERAGED SEM IMA...
- Publication number 20250078244
- Publication date Mar 6, 2025
- ASML NETHERLANDS B.V.
- Chen ZHANG
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
FULLY AUTOMATED SEM SAMPLING SYSTEM FOR E-BEAM IMAGE ENHANCEMENT
- Publication number 20250078478
- Publication date Mar 6, 2025
- ASML NETHERLANDS B.V.
- Wentian ZHOU
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MECHANICALLY CONTROLLED STRESS-ENGINEERED OPTICAL SYSTEMS AND METHODS
- Publication number 20250068090
- Publication date Feb 27, 2025
- ASML NETHERLANDS B.V.
- Adel JOOBEUR
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
ELEMENT OF AN AFM TOOL
- Publication number 20250067768
- Publication date Feb 27, 2025
- ASML NETHERLANDS B.V.
- Mustafa Ümit ARABUL
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
SUBSTRATE TABLE, LITHOGRAPHIC APPARATUS, STICKER, COVER RING AND ME...
- Publication number 20250068085
- Publication date Feb 27, 2025
- ASML NETHERLANDS B.V.
- Gijs KRAMER
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
OBJECT HOLDER, LITHOGRAPHIC APPARATUS COMPRISING SUCH OBJECT HOLDER...
- Publication number 20250069932
- Publication date Feb 27, 2025
- ASML NETHERLANDS B.V.
- Martinus Cornelis REIJNEN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
GENERATING AN ALIGNMENT SIGNAL WITHOUT DEDICATED ALIGNMENT STRUCTURES
- Publication number 20250060680
- Publication date Feb 20, 2025
- ASML NETHERLANDS B.V.
- Aabid PATEL
- G01 - MEASURING TESTING
Information Patent Application
LITHOGRAPHIC APPARATUS, ILLUMINATION SYSTEM, AND CONNECTION SEALING...
- Publication number 20250060682
- Publication date Feb 20, 2025
- ASML NETHERLANDS B.V.
- Armin Bernhard RIDINGER
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Trademarklast 30 trademarks

Information Trademark
79420468 - HMI EP5
- Serial number 79420468
- Filing date Feb 11, 2025
- ASML Netherlands B.V.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
79408421 - TWINSCAN NXT
- Serial number 79408421
- Filing date Oct 8, 2024
- ASML Netherlands B.V.
- 7 - Machines and machine tools
Information Trademark
79408422 - HMI HERMES MICROVISION
- Serial number 79408422
- Filing date Sep 26, 2024
- ASML Netherlands B.V.
- 7 - Machines and machine tools
Information Trademark
79402998 - EP5
- Serial number 79402998
- Filing date Jul 12, 2024
- ASML Netherlands B.V.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
79369208 - ASML PAS
- Serial number 79369208
- Registration number 7477162
- Filing date Mar 20, 2023
- ASML Netherlands B.V.
- 7 - Machines and machine tools
Information Trademark
79364681 - LITHO INSIGHT
- Serial number 79364681
- Registration number 7256954
- Filing date Feb 2, 2023
- ASML Netherlands B.V.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
97575508 - BASELINER
- Serial number 97575508
- Registration number 7477680
- Filing date Sep 1, 2022
- ASML Netherlands B.V.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
79333573 - ASML LITHO INSIGHT
- Serial number 79333573
- Registration number 7070688
- Filing date Nov 4, 2021
- ASML Netherlands B.V.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
79302796 - PAS
- Serial number 79302796
- Registration number 6937986
- Filing date Dec 1, 2020
- ASML Netherlands B.V.
- 37 - Building construction
Information Trademark
79246209 - NEWRON
- Serial number 79246209
- Registration number 5899588
- Filing date Oct 4, 2018
- ASML Netherlands B.V.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
87616939 - NXT
- Serial number 87616939
- Registration number 5583933
- Filing date Sep 21, 2017
- ASML Netherlands B.V.
- 7 - Machines and machine tools
Information Trademark
79218081 - ECLIPSE
- Serial number 79218081
- Registration number 5420764
- Filing date Jul 31, 2017
- ASML Netherlands B.V.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
79207952 - ASML
- Serial number 79207952
- Registration number 5388921
- Filing date Mar 30, 2017
- ASML Netherlands B.V.
- 7 - Machines and machine tools
Information Trademark
79179604 - FLEXRAY
- Serial number 79179604
- Registration number 5066468
- Filing date Oct 29, 2015
- ASML Netherlands B.V.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
79172665 - MDR
- Serial number 79172665
- Registration number 4962096
- Filing date Jun 5, 2015
- ASML Netherlands B.V.
- 7 - Machines and machine tools
Information Trademark
79155497 - YIELDSTAR
- Serial number 79155497
- Registration number 4810631
- Filing date Aug 7, 2014
- ASML Netherlands B.V.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
79135966 - QXT
- Serial number 79135966
- Registration number 4603707
- Filing date Dec 20, 2012
- ASML Netherlands B.V.
- 7 - Machines and machine tools
Information Trademark
79138492 - QXE
- Serial number 79138492
- Registration number 4496751
- Filing date Dec 20, 2012
- ASML Netherlands B.V.
- 7 - Machines and machine tools
Information Trademark
85717858 - HMI
- Serial number 85717858
- Registration number 4417088
- Filing date Aug 31, 2012
- HERMES MICROVISION, INC.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
85717861 - HMI
- Serial number 85717861
- Registration number 4420737
- Filing date Aug 31, 2012
- HERMES MICROVISION, INC.
- 37 - Building construction
Information Trademark
85717863 - HMI
- Serial number 85717863
- Registration number 4420738
- Filing date Aug 31, 2012
- HERMES MICROVISION, INC.
- 42 - Scientific and technological services and research and design relating thereto
Information Trademark
79112054
- Serial number 79112054
- Registration number 4394334
- Filing date Feb 10, 2012
- ASML Netherlands B.V.
- 7 - Machines and machine tools
Information Trademark
79112053 - ASML
- Serial number 79112053
- Registration number 4412631
- Filing date Feb 10, 2012
- ASML Netherlands B.V.
- 7 - Machines and machine tools
Information Trademark
79105125 - LITHOINSIGHT
- Serial number 79105125
- Registration number 4212110
- Filing date Sep 20, 2011
- ASML Netherlands B.V.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
79094688 - FLEXPOL
- Serial number 79094688
- Registration number 4107314
- Filing date Jan 27, 2011
- ASML Netherlands B.V.
- 7 - Machines and machine tools
Information Trademark
79095092 - FLEXWAVE
- Serial number 79095092
- Registration number 4231857
- Filing date Jan 27, 2011
- ASML Netherlands B.V.
- 7 - Machines and machine tools
Information Trademark
79086855 - TWINSCAN NXE
- Serial number 79086855
- Registration number 4021237
- Filing date May 21, 2010
- ASML Netherlands B.V.
- 7 - Machines and machine tools
Information Trademark
79084612 - BASELINER
- Serial number 79084612
- Registration number 3968820
- Filing date Jan 26, 2010
- ASML Netherlands B.V.
- 7 - Machines and machine tools
Information Trademark
79080547 - ECLIPSE
- Serial number 79080547
- Registration number 3922222
- Filing date Jan 26, 2010
- ASML Netherlands B.V.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
79068541 - LITHOTUNER
- Serial number 79068541
- Registration number 3793259
- Filing date Apr 16, 2009
- ASML Netherlands B.V.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments

ASML HOLDING N.V., A NETHERLANDS CORPORATION

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Mailing Address

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State of Incorporation

Patents Grantslast 30 patents

Apparatus for positioning and clamped curing

Method and apparatus for predicting substrate image

Reflector manufacturing method and associated reflector

Transmissive diffusor

Method for calibration of an optical measurement system and optical...

Target delivery system

Compact dual pass interferometer for a plane mirror interferometer

Method and apparatus for coherence scrambling in metrology applicat...

Exposure apparatus

Micromirror arrays

Method of designing an alignment mark

Aligning a distorted image

Apparatus and method for property joint interpolation and prediction

Height measurement method and height measurement system

Numerically compensating SEM-induced charging using diffusion-based...

Stage anti-fretting mechanism for roller bearing lifetime improvement

Substrate holder for use in a lithographic apparatus

Wavelength tracking system, method to calibrate a wavelength tracki...

Fluid transfer system in a charged particle system

Differential measurement system

Determining hot spot ranking based on wafer measurement

Method for preparing a substrate and lithographic apparatus

Lens designs

Apparatus using multiple charged particle beams

Target for measuring a parameter of a lithographic process

Optical isolation module

Lithography apparatus and a method of manufacturing a device

Substrate support, lithographic apparatus, method for manipulating...

Substrate holder for use in a lithographic apparatus and a device m...

Object holder, electrostatic sheet and method for making an electro...

Patents Applicationslast 30 patents

METHOD OF ASSESSING A SAMPLE, APPARATUS FOR ASSESSING A SAMPLE

LITHOGRAPHIC APPARATUS CONTROLLER SYSTEM

ACTIVE LEARNING TO IMPROVE WAFER DEFECT CLASSIFICATION

OPTICAL APPARATUS

CHARGED PARTICLE ASSESSMENT SYSTEM AND METHOD

A SUPERCONTINUUM RADIATION SOURCE AND ASSOCIATED METROLOGY DEVICES

APPARATUS OF PLURAL CHARGED-PARTICLE BEAMS

A FRAMEWORK FOR CONDITION TUNING AND IMAGE PROCESSING FOR METROLOGY...

METHOD FOR CONTROLLING A PRODUCTION SYSTEM AND METHOD FOR THERMALLY...

METHOD AND SYSTEM OF DEFECT DETECTION FOR INSPECTION SAMPLE BASED O...

ASSEMBLY FOR A LITHOGRAPHIC APPARATUS

TRAINING A MODEL TO GENERATE PREDICTIVE DATA

ELECTRON-OPTICAL DEVICE

METHOD OF PROCESSING DATA DERIVED FROM A SAMPLE

RESIST UNDER-LAYER FOR USE IN A LITHOGRAPHIC APPARATUS

IMAGE ENHANCEMENT IN CHARGED PARTICLE INSPECTION

TEMPERATURE MEASUREMENT OF OPTICAL ELEMENTS IN AN OPTICAL APPARATUS

DATA PROCESSING DEVICE AND METHOD, CHARGED PARTICLE ASSESSMENT SYST...

SYSTEMS AND METHODS FOR GENERATING MULTIPLE ILLUMINATION SPOTS FROM...

CHARGED PARTICLE-OPTICAL APPARATUS

CALIBRATION SYSTEM FOR AN EXTREME ULTRAVIOLET LIGHT SOURCE

CLEANING A STRUCTURE SURFACE IN AN EUV CHAMBER

UTILIZE MACHINE LEARNING IN SELECTING HIGH QUALITY AVERAGED SEM IMA...

FULLY AUTOMATED SEM SAMPLING SYSTEM FOR E-BEAM IMAGE ENHANCEMENT

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