ASPECTRICS, INC

Organization

PLEASANTON, CA, US

Business Address
6900 KOLL CENTER PARKWAY SUITE 401 PLEASANTON CA 94566 9259319270
Mailing Address
6900 KOLL CENTER PARKWAY SUITE 401 PLEASANTON CA 94566
State Location
CA
State of Incorporation

Organizations

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Patents Grantslast 30 patents

Information Patent Grant
Two-dimensional spatial radiation modulator
- Patent number 7,466,468
- Issue date Dec 16, 2008
- Aspectrics, Inc.
- Thomas W. Hagler
- G01 - MEASURING TESTING
Information Patent Grant
Encoder spectrograph with optimized diffraction grating
- Patent number 7,430,044
- Issue date Sep 30, 2008
- Aspectrics, Inc.
- Thomas W. Hagler
- G01 - MEASURING TESTING
Information Patent Grant
Calibration training for spectrometer
- Patent number 7,426,446
- Issue date Sep 16, 2008
- Aspectrics, Inc.
- Thomas W. Hagler
- G01 - MEASURING TESTING
Information Patent Grant
Encoded photometric infrared spectroscopy analyzer with orthogonal-...
- Patent number 7,423,749
- Issue date Sep 9, 2008
- Aspectrics, Inc.
- Thomas W. Hagler
- G01 - MEASURING TESTING
Information Patent Grant
Encoder spectrograph and modulator for use therewith
- Patent number 7,423,748
- Issue date Sep 9, 2008
- Aspectrics, Inc.
- Thomas W. Hagler
- G01 - MEASURING TESTING
Information Patent Grant
Spatial radiation modulator pattern generation
- Patent number 7,420,673
- Issue date Sep 2, 2008
- Aspectrics, Inc.
- Thomas W. Hagler
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for radiation analysis and encoder
- Patent number 7,330,253
- Issue date Feb 12, 2008
- Aspectrics, Inc.
- Thomas W. Hagler
- G01 - MEASURING TESTING
Information Patent Grant
Encoder spectrograph for analyzing radiation using spatial modulati...
- Patent number 7,262,846
- Issue date Aug 28, 2007
- Aspectrics, Inc.
- Thomas W. Hagler
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for radiation analysis and encoder
- Patent number 6,999,165
- Issue date Feb 14, 2006
- Aspectrics, Inc.
- Thomas W. Hagler
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for radiation encoding and analysis
- Patent number 6,995,840
- Issue date Feb 7, 2006
- Aspectrics, Inc.
- Thomas W. Hagler
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for spectrum analysis and encoder
- Patent number 6,982,788
- Issue date Jan 3, 2006
- Aspectrics, Inc.
- Thomas W. Hagler
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Chemometric Analyzer with a Spatial Radiation Modulator Having a Pl...
- Publication number 20080218752
- Publication date Sep 11, 2008
- Aspectrics, Inc.
- Thomas W. Hagler
- G01 - MEASURING TESTING
Information Patent Application
Spatial radiation modulator pattern generation
- Publication number 20080100836
- Publication date May 1, 2008
- Aspectrics, Inc.
- Thomas W. Hagler
- G01 - MEASURING TESTING
Information Patent Application
Two-Dimensional Spatial Radiation Modulator
- Publication number 20080043314
- Publication date Feb 21, 2008
- Aspectrics, Inc.
- Thomas W. Hagler
- G01 - MEASURING TESTING
Information Patent Application
ENCODER SPECTROGRAPH AND MODULATOR FOR USE THEREWITH
- Publication number 20070273876
- Publication date Nov 29, 2007
- Aspectrics, Inc.
- Thomas W. Hagler
- G01 - MEASURING TESTING
Information Patent Application
CALIBRATION TRAINING FOR SPECTROMETER
- Publication number 20070271055
- Publication date Nov 22, 2007
- Aspectrics, Inc.
- Thomas W. Hagler
- G01 - MEASURING TESTING
Information Patent Application
ENCODER SPECTROGRAPH WITH OPTIMIZED DIFFRACTION GRATING
- Publication number 20070268486
- Publication date Nov 22, 2007
- Aspectrics, Inc.
- Thomas W. Hagler
- G01 - MEASURING TESTING
Information Patent Application
EPIR ANALYZER WITH ORTHOGONAL-ENCODED COMPONENTS
- Publication number 20070268487
- Publication date Nov 22, 2007
- Aspectrics, Inc.
- Thomas W. Hagler
- G01 - MEASURING TESTING

Trademarklast 30 trademarks

Information Trademark
78747333
- Serial number 78747333
- Registration number 3301857
- Filing date Nov 4, 2005
- Aspectrics, Inc.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
78530916 - ASPECTRICS
- Serial number 78530916
- Registration number 3134211
- Filing date Dec 10, 2004
- Advanced Photometrics, Inc.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments

ASPECTRICS, INC

Organization

Business Address

Mailing Address

State Location

State of Incorporation

Patents Grantslast 30 patents

Two-dimensional spatial radiation modulator

Encoder spectrograph with optimized diffraction grating

Calibration training for spectrometer

Encoded photometric infrared spectroscopy analyzer with orthogonal-...

Encoder spectrograph and modulator for use therewith

Spatial radiation modulator pattern generation

Method and apparatus for radiation analysis and encoder

Encoder spectrograph for analyzing radiation using spatial modulati...

Method and apparatus for radiation analysis and encoder

Method and apparatus for radiation encoding and analysis

Method and apparatus for spectrum analysis and encoder

Patents Applicationslast 30 patents

Chemometric Analyzer with a Spatial Radiation Modulator Having a Pl...

Spatial radiation modulator pattern generation

Two-Dimensional Spatial Radiation Modulator

ENCODER SPECTROGRAPH AND MODULATOR FOR USE THEREWITH

CALIBRATION TRAINING FOR SPECTROMETER

ENCODER SPECTROGRAPH WITH OPTIMIZED DIFFRACTION GRATING

EPIR ANALYZER WITH ORTHOGONAL-ENCODED COMPONENTS

Trademarklast 30 trademarks

78747333

78530916 - ASPECTRICS