Asylum Research Corp.

Organization

Santa Barbara, CA, US

Organizations

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Patents Grantslast 30 patents

Information Patent Grant
Material property measurements using multiple frequency atomic fore...
- Patent number 8,555,711
- Issue date Oct 15, 2013
- Asylum Research Corporation
- Roger Proksch
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Modular atomic force microscope
- Patent number 8,370,960
- Issue date Feb 5, 2013
- Asylum Research Corporation
- Roger Proksch
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Active damping of high speed scanning probe microscope components
- Patent number 8,302,456
- Issue date Nov 6, 2012
- Asylum Research Corporation
- Roger Proksch
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Linear variable differential transformer with digital electronics
- Patent number 8,269,485
- Issue date Sep 18, 2012
- Asylum Research Corporation
- Dan Bocek
- G01 - MEASURING TESTING
Information Patent Grant
Fully digitally controller for cantilever-based instruments
- Patent number 8,205,488
- Issue date Jun 26, 2012
- Asylum Research Corporation
- Roger Proksch
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Nanoindenter
- Patent number 8,196,458
- Issue date Jun 12, 2012
- Asylum Research Corporation
- Flavio Alejandro Bonilla
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Digital Q control for enhanced measurement capability in cantilever...
- Patent number 8,042,383
- Issue date Oct 25, 2011
- Asylum Research Corporation
- Dan Bocek
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Material property measurements using multiple frequency atomic forc...
- Patent number 8,024,963
- Issue date Sep 27, 2011
- Asylum Research Corporation
- Roger Proksch
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Fully digitally controller for cantilever-based instruments
- Patent number 7,937,991
- Issue date May 10, 2011
- Asylum Research Corporation
- Roger Proksch
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Variable density scanning
- Patent number 7,941,286
- Issue date May 10, 2011
- Asylum Research Corporation
- Roger B. Proksch
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Method for microfabricating a probe with integrated handle, cantile...
- Patent number 7,861,315
- Issue date Dec 28, 2010
- Asylum Research Corporation
- Roger Proksch
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Apparatus and method for scanning capacitance microscopy and spectr...
- Patent number 7,856,665
- Issue date Dec 21, 2010
- Asylum Research Corporation
- Maarten Rutgers
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Nanoindenter
- Patent number 7,685,869
- Issue date Mar 30, 2010
- Asylum Research Corporation
- Flavio Alejandro Bonilla
- G01 - MEASURING TESTING
Information Patent Grant
Multiple frequency atomic force microscopy
- Patent number 7,603,891
- Issue date Oct 20, 2009
- Asylum Research Corporation
- Roger B. Proksch
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for determining cantilever parameters
- Patent number 7,434,445
- Issue date Oct 14, 2008
- Asylum Research Corporation
- Roger Proksch
- G01 - MEASURING TESTING
Information Patent Grant
Digital Q control for enhanced measurement capability in cantilever...
- Patent number 7,387,017
- Issue date Jun 17, 2008
- Asylum Research Corporation
- Dan Bocek
- G01 - MEASURING TESTING
Information Patent Grant
Linear force detecting element formed without ferromagnetic materia...
- Patent number 7,372,254
- Issue date May 13, 2008
- Asylum Research Corporation
- Roger Proksch
- G01 - MEASURING TESTING
Information Patent Grant
Linear variable differential transformers for high precision positi...
- Patent number 7,271,582
- Issue date Sep 18, 2007
- Asylum Research Corporation
- Roger Proksch
- G01 - MEASURING TESTING
Information Patent Grant
Tactile force and/or position feedback for cantilever-based force m...
- Patent number 7,266,997
- Issue date Sep 11, 2007
- Asylum Research Corporation
- Roger Proksch
- G01 - MEASURING TESTING
Information Patent Grant
Linear variable differential transformers for high precision positi...
- Patent number 7,262,592
- Issue date Aug 28, 2007
- Asylum Research Corporation
- Roger Proksch
- G01 - MEASURING TESTING
Information Patent Grant
Fully digital controller for cantilever-based instruments
- Patent number 7,234,342
- Issue date Jun 26, 2007
- Asylum Research Corporation
- Roger Proksch
- G01 - MEASURING TESTING
Information Patent Grant
Position sensing assembly with sychronizing capability
- Patent number 7,233,140
- Issue date Jun 19, 2007
- Asylum Research Corporation
- Roger Proksch
- G01 - MEASURING TESTING
Information Patent Grant
Digital control of quality factor in resonant systems including can...
- Patent number 7,165,445
- Issue date Jan 23, 2007
- Asylum Research Corporation
- Dan Bocek
- G01 - MEASURING TESTING
Information Patent Grant
Diffractive optical position detector in an atomic force microscope...
- Patent number 7,084,384
- Issue date Aug 1, 2006
- Asylum Research Corporation
- Roger Proksch
- G01 - MEASURING TESTING
Information Patent Grant
Noncontact sensitivity and compliance calibration method for cantil...
- Patent number 7,066,005
- Issue date Jun 27, 2006
- Asylum Research Corporation
- Roger Proksch
- G01 - MEASURING TESTING
Information Patent Grant
Linear variable differential transformers for high precision positi...
- Patent number 7,038,443
- Issue date May 2, 2006
- Asylum Research Corporation
- Roger Proksch
- G01 - MEASURING TESTING
Information Patent Grant
Diffractive optical position detector
- Patent number 6,884,981
- Issue date Apr 26, 2005
- Asylum Research Corp.
- Roger Proksch
- G01 - MEASURING TESTING

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Patents Applicationslast 30 patents

Information Patent Application
Thermal Measurements Using Multiple Frequency Atomic Force Microscopy
- Publication number 20170313583
- Publication date Nov 2, 2017
- ASYLUM RESEARCH CORPORATION
- Roger Proksch
- B82 - NANO-TECHNOLOGY
Information Patent Application
Thermal Measurements Using Multiple Frequency Atomic Force Microscopy
- Publication number 20150013037
- Publication date Jan 8, 2015
- ASYLUM RESEARCH CORPORATION
- Roger Proksch
- B82 - NANO-TECHNOLOGY
Information Patent Application
Multiple Frequency Atomic Force Microscopy
- Publication number 20130340126
- Publication date Dec 19, 2013
- ASYLUM RESEARCH CORPORATION
- Roger B. Proksch
- B82 - NANO-TECHNOLOGY
Information Patent Application
Quantitative measurements using multiple frequency atomic force mic...
- Publication number 20130117895
- Publication date May 9, 2013
- ASYLUM RESEARCH CORPORATION
- Roger B. Proksch
- B82 - NANO-TECHNOLOGY
Information Patent Application
Active Damping of High Speed Scanning Probe Microscope Components
- Publication number 20130061356
- Publication date Mar 7, 2013
- ASYLUM RESEARCH CORPORATION
- Roger Proksch
- B82 - NANO-TECHNOLOGY
Information Patent Application
Linear Variable Differential Transformer with Digital Electronics
- Publication number 20130024162
- Publication date Jan 24, 2013
- ASYLUM RESEARCH CORPORATION
- Dan Bocek
- G01 - MEASURING TESTING
Information Patent Application
Nanoindenter
- Publication number 20120272411
- Publication date Oct 25, 2012
- ASYLUM RESEARCH CORPORATION
- Flavio Alejandro Bonilla
- G01 - MEASURING TESTING
Information Patent Application
Fully Digitally Controller for Cantilever-Based Instruments
- Publication number 20120266336
- Publication date Oct 18, 2012
- ASYLUM RESEARCH CORPORATION
- Roger Proksch
- G01 - MEASURING TESTING
Information Patent Application
Digital Q control for enhanced measurement capability in cantilever...
- Publication number 20120216322
- Publication date Aug 23, 2012
- ASYLUM RESEARCH CORPORATION
- Dan Bocek
- G01 - MEASURING TESTING
Information Patent Application
Material Property Measurements Using Multiple Frequency Atomic Fore...
- Publication number 20120079631
- Publication date Mar 29, 2012
- ASYLUM RESEARCH CORPORATION
- Roger Proksch
- G01 - MEASURING TESTING
Information Patent Application
Variable Density Scanning
- Publication number 20110219479
- Publication date Sep 8, 2011
- ASYLUM RESEARCH CORPORATION
- Roger B. Proksch
- G01 - MEASURING TESTING
Information Patent Application
Fully Digitally Controller for Cantilever-Based Instruments
- Publication number 20100333240
- Publication date Dec 30, 2010
- ASYLUM RESEARCH CORPORATION
- Roger Proksch
- G01 - MEASURING TESTING
Information Patent Application
Nanoindenter
- Publication number 20100180356
- Publication date Jul 15, 2010
- ASYLUM RESEARCH CORPORATION
- Flavio Alejandro Bonilla
- G01 - MEASURING TESTING
Information Patent Application
Multiple Frequency Atomic Force Microscopy
- Publication number 20100043107
- Publication date Feb 18, 2010
- ASYLUM RESEARCH CORPORATION
- Roger B. Proksch
- G01 - MEASURING TESTING
Information Patent Application
Method for microfabricating a probe with integrated handle, cantile...
- Publication number 20090178166
- Publication date Jul 9, 2009
- ASYLUM RESEARCH CORPORATION
- Roger Proksch
- G01 - MEASURING TESTING
Information Patent Application
Digital Q Control for enhanced Measurement Capability in Cantilever...
- Publication number 20080245141
- Publication date Oct 9, 2008
- ASYLUM RESEARCH CORPORATION
- Dan Bocek
- G01 - MEASURING TESTING
Information Patent Application
Fully digitally controller for cantilever-based instruments
- Publication number 20080011067
- Publication date Jan 17, 2008
- ASYLUM RESEARCH CORPORATION
- Roger Proksch
- G01 - MEASURING TESTING
Information Patent Application
Active Damping of High Speed Scanning Probe Microscope Components
- Publication number 20070214864
- Publication date Sep 20, 2007
- ASYLUM RESEARCH CORPORATION
- Roger Proksch
- G01 - MEASURING TESTING
Information Patent Application
Position Sensing Assembly with Synchronizing Capability
- Publication number 20070200559
- Publication date Aug 30, 2007
- ASYLUM RESEARCH CORPORATION
- Roger Proksch
- G01 - MEASURING TESTING
Information Patent Application
Diffractive optical position detector
- Publication number 20060072185
- Publication date Apr 6, 2006
- Asylum Research Corp.
- Roger Proksch
- G02 - OPTICS
Information Patent Application
Linear variable differential transformers for high precision positi...
- Publication number 20040075428
- Publication date Apr 22, 2004
- Asylum Research Corporation, a Delaware corporation
- Roger Proksch
- G01 - MEASURING TESTING

Asylum Research Corp.

Organization

Patents Grantslast 30 patents

Material property measurements using multiple frequency atomic fore...

Modular atomic force microscope

Active damping of high speed scanning probe microscope components

Linear variable differential transformer with digital electronics

Fully digitally controller for cantilever-based instruments

Nanoindenter

Digital Q control for enhanced measurement capability in cantilever...

Material property measurements using multiple frequency atomic forc...

Fully digitally controller for cantilever-based instruments

Variable density scanning

Method for microfabricating a probe with integrated handle, cantile...

Apparatus and method for scanning capacitance microscopy and spectr...

Nanoindenter

Multiple frequency atomic force microscopy

Apparatus for determining cantilever parameters

Digital Q control for enhanced measurement capability in cantilever...

Linear force detecting element formed without ferromagnetic materia...

Linear variable differential transformers for high precision positi...

Tactile force and/or position feedback for cantilever-based force m...

Linear variable differential transformers for high precision positi...

Fully digital controller for cantilever-based instruments

Position sensing assembly with sychronizing capability

Digital control of quality factor in resonant systems including can...

Diffractive optical position detector in an atomic force microscope...

Noncontact sensitivity and compliance calibration method for cantil...

Linear variable differential transformers for high precision positi...

Diffractive optical position detector

Patents Applicationslast 30 patents

Thermal Measurements Using Multiple Frequency Atomic Force Microscopy

Thermal Measurements Using Multiple Frequency Atomic Force Microscopy

Multiple Frequency Atomic Force Microscopy

Quantitative measurements using multiple frequency atomic force mic...

Active Damping of High Speed Scanning Probe Microscope Components

Linear Variable Differential Transformer with Digital Electronics

Nanoindenter

Fully Digitally Controller for Cantilever-Based Instruments

Digital Q control for enhanced measurement capability in cantilever...

Material Property Measurements Using Multiple Frequency Atomic Fore...

Variable Density Scanning

Fully Digitally Controller for Cantilever-Based Instruments

Nanoindenter

Multiple Frequency Atomic Force Microscopy

Method for microfabricating a probe with integrated handle, cantile...

Digital Q Control for enhanced Measurement Capability in Cantilever...

Fully digitally controller for cantilever-based instruments

Active Damping of High Speed Scanning Probe Microscope Components

Position Sensing Assembly with Synchronizing Capability

Diffractive optical position detector

Linear variable differential transformers for high precision positi...