ATOMIKA Instruments GmbH

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Organization

D-85763 Oberschleissheim, DE

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Patents Grantslast 30 patents

Information Patent Grant
Secondary ion mass spectrometer with aperture mask
- Patent number 6,080,986
- Issue date Jun 27, 2000
- Atomika Instruments GmbH
- Mark Graeme Dowsett
- G01 - MEASURING TESTING
Information Patent Grant
Process for analysis of a sample
- Patent number 6,078,045
- Issue date Jun 20, 2000
- Atomika Instruments GmbH
- Johann L. Maul
- G01 - MEASURING TESTING

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Trademarklast 30 trademarks

Information Trademark
75049755 - ATOMIKA
- Serial number 75049755
- Registration number 2085435
- Filing date Jan 29, 1996
- ATOMIKA Instruments GmbH
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments