ATT ADVANCED TEMPERATURE TEST SYSTEM GMBH

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Planegg, DE

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Patents Grantslast 30 patents

Information Patent Grant
Method for open-loop or closed-loop control of the temperature of a...
- Patent number 11,821,941
- Issue date Nov 21, 2023
- ATT ADVANCED TEMPERATURE TEST SYSTEM GMBH
- Markus Eibl
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
MODULAR WAFER-CHUCK SYSTEM
- Publication number 20240063037
- Publication date Feb 22, 2024
- ATT Advanced Temperature Test Systems GmbH
- Markus Eibl
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TEMPERATURE-CONTROL DEVICE, SYSTEM, AND METHOD FOR CONTROLLING THE...
- Publication number 20230207346
- Publication date Jun 29, 2023
- ATT Advanced Temperature Test Systems GmbH
- Markus Eibl
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR OPEN-LOOP OR CLOSED-LOOP CONTROL OF THE TEMPERATURE OF A...
- Publication number 20220334174
- Publication date Oct 20, 2022
- ATT Advanced Temperature Test Systems GmbH
- Markus Eibl
- G01 - MEASURING TESTING

Trademarklast 30 trademarks